JPH0472630U - - Google Patents

Info

Publication number
JPH0472630U
JPH0472630U JP11700890U JP11700890U JPH0472630U JP H0472630 U JPH0472630 U JP H0472630U JP 11700890 U JP11700890 U JP 11700890U JP 11700890 U JP11700890 U JP 11700890U JP H0472630 U JPH0472630 U JP H0472630U
Authority
JP
Japan
Prior art keywords
shield box
prober
closing mechanism
gas damper
registration request
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11700890U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11700890U priority Critical patent/JPH0472630U/ja
Publication of JPH0472630U publication Critical patent/JPH0472630U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11700890U 1990-11-06 1990-11-06 Pending JPH0472630U (pt)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11700890U JPH0472630U (pt) 1990-11-06 1990-11-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11700890U JPH0472630U (pt) 1990-11-06 1990-11-06

Publications (1)

Publication Number Publication Date
JPH0472630U true JPH0472630U (pt) 1992-06-26

Family

ID=31864876

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11700890U Pending JPH0472630U (pt) 1990-11-06 1990-11-06

Country Status (1)

Country Link
JP (1) JPH0472630U (pt)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008131048A (ja) * 2006-11-17 2008-06-05 Suss Microtec Test Systems Gmbh Emiシールド機能を有する半導体検査用プローブステーション

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008131048A (ja) * 2006-11-17 2008-06-05 Suss Microtec Test Systems Gmbh Emiシールド機能を有する半導体検査用プローブステーション

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