JPH0470210B2 - - Google Patents

Info

Publication number
JPH0470210B2
JPH0470210B2 JP61283403A JP28340386A JPH0470210B2 JP H0470210 B2 JPH0470210 B2 JP H0470210B2 JP 61283403 A JP61283403 A JP 61283403A JP 28340386 A JP28340386 A JP 28340386A JP H0470210 B2 JPH0470210 B2 JP H0470210B2
Authority
JP
Japan
Prior art keywords
transport
rail
semiconductor device
roller
conveyance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61283403A
Other languages
Japanese (ja)
Other versions
JPS63134418A (en
Inventor
Mitsuru Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61283403A priority Critical patent/JPS63134418A/en
Publication of JPS63134418A publication Critical patent/JPS63134418A/en
Publication of JPH0470210B2 publication Critical patent/JPH0470210B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Special Conveying (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、水平方向に搬送する半導体装置の分
離供給装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a separating and supplying apparatus for horizontally conveying semiconductor devices.

[従来の技術] 従来、この種の半導体装置の分離供給装置は、
第5図および第6図に示すように構成されてい
る。これを同図に基づいて概略説明すると、同図
において、符号1および2は上下方向に各々が互
いに所定の間隔を隔てて設けられその前方端部に
レール長手方向に延在する溝3,4を有する上下
一対のレール、5はこれら両レール1,2の側方
に移動自在に設けられ半導体装置6を把持する上
下一対のクランプ7,8を有するクランプホルダ
である。このクランプホルダ5の両クランプ7,
8には軟質材によつて形成されたパツド7a,8
aが貼着されている。また、9は前記両レール
1,2間に進退自在に設けられ、半導体装置6の
搬送方向と直角な方向に延在する軸線をもつスト
ツパピン、10は前記クランプホルダ5を案内す
るガイド棒である。なお、このガイド棒10およ
び前記クランプホルダ5には回転止め機能が備え
られている。
[Conventional technology] Conventionally, this type of semiconductor device separation and supply equipment is
It is constructed as shown in FIGS. 5 and 6. This will be briefly explained based on the figure. In the figure, reference numerals 1 and 2 denote grooves 3 and 4, which are provided at a predetermined distance from each other in the vertical direction, and which extend in the longitudinal direction of the rail at the front end thereof. A pair of upper and lower rails 5 are clamp holders having a pair of upper and lower clamps 7 and 8 that are movably provided on the sides of both rails 1 and 2 and grip the semiconductor device 6. Both clamps 7 of this clamp holder 5,
8 includes pads 7a and 8 formed of a soft material.
A is attached. Reference numeral 9 designates a stopper pin that is movably provided between the rails 1 and 2 and has an axis extending in a direction perpendicular to the conveying direction of the semiconductor device 6; and 10 is a guide rod that guides the clamp holder 5. . Note that the guide rod 10 and the clamp holder 5 are provided with a rotation stopping function.

このように構成された半導体装置の分離供給装
置においては、第5図に矢印Aで示す方向にレー
ル2上を移動する最前方の半導体装置6がストツ
パピン9によつて溝4の溝縁上で停止すると、両
クランプ7,8によつて把持され同図にBで示す
方向に移動する。
In the device for separating and supplying semiconductor devices configured in this manner, the frontmost semiconductor device 6 moving on the rail 2 in the direction shown by arrow A in FIG. When it stops, it is gripped by both clamps 7 and 8 and moves in the direction indicated by B in the figure.

このようにして、レール2上を移動する多数の
半導体装置6を連続してレール前方に分離供給す
ることができる。
In this way, a large number of semiconductor devices 6 moving on the rail 2 can be successively separated and supplied to the front of the rail.

なお、溝縁上の半導体装置6は検出器(図示せ
ず)によつて検出される。
Note that the semiconductor device 6 on the groove edge is detected by a detector (not shown).

[発明が解決しようとする問題点] ところで、従来の半導体装置の分離供給装置に
おいては、各々が互いに独立して動作するクラン
プ7,8とストツパピン9を備える構造であるた
め、構造全体を複雑にするという問題があつた。
また、半導体装置6の分離供給を両クランプ7,
8で把持することにより行なうためその把持力が
小さいと搬送ミスが生じたり、把持力が大きいと
クランプ7,8、半導体6を損傷したりするとい
う問題があつた。さらに半導体装置6の分離供給
速度は、クランプホルダ5の移動速度に依存する
ことになり、分離供給における高速化を妨げると
いう不都合があつた。その上、ばりのある半導体
装置ではばり相互に絡み合つて半導体装置の引き
離しが充分行なわれない場合があつた。
[Problems to be Solved by the Invention] Incidentally, in the conventional separation supply device for semiconductor devices, the structure includes clamps 7 and 8 and stopper pins 9, each of which operates independently of the other, which makes the entire structure complicated. There was a problem.
In addition, both clamps 7 separate and supply the semiconductor device 6.
Since this is done by gripping with the clamps 8, there is a problem that if the gripping force is small, a conveyance error may occur, and if the gripping force is large, the clamps 7, 8 and the semiconductor 6 may be damaged. Furthermore, the separation and supply speed of the semiconductor devices 6 depends on the moving speed of the clamp holder 5, which has the disadvantage of preventing high speed separation and supply. Moreover, in semiconductor devices with burrs, the burrs may become entangled with each other, making it difficult to separate the semiconductor devices sufficiently.

本発明はこのような事情に鑑みなされたもの
で、半導体装置の搬送ミスの発生および半導体装
置等の損傷を防止することができ、しかも構造の
簡素化ならびに分離供給の高速化を図ることがで
き、その上、ばりのある半導体装置でも確実に引
き離しができる半導体装置の分離供給装置を提供
するものである。
The present invention was developed in view of the above circumstances, and is capable of preventing the occurrence of transportation errors of semiconductor devices and damage to semiconductor devices, etc., as well as simplifying the structure and speeding up separation and supply. Moreover, it is an object of the present invention to provide a semiconductor device separation/supply device that can reliably separate even semiconductor devices with burrs.

[問題を解決するための手段] 本発明に係る半導体装置の分離供給装置は、可
逆回転搬送ローラーを備えた、半導体装置を移送
する搬送ローラを設け、搬送ローラに続けてその
移送方向と一致するように搬送レールを延在させ
ると共にそのレール搬送面が搬送ローラのローラ
移送面より段差を有して低くなるようにし、この
搬送レールの始端部上方に、空気の噴射方向が上
記レール搬送面に対しつつ移送方向に傾斜するよ
うに開口された空気ノズルを設け、さらに搬送ロ
ーラに載置された半導体装置の最先のものが搬送
ローラから搬送レールに移送されたことを検知す
る検知手段を設けると共に、この検知手段の信号
に基づき、可逆回転搬送ローラを移送方向とは逆
方向に回転させかつ上記空気ノズルから空気を噴
射するような制御手段を備えたものである。
[Means for Solving the Problem] A semiconductor device separation and supply apparatus according to the present invention is provided with a conveyance roller for conveying a semiconductor device, which is equipped with a reversibly rotating conveyance roller, and is provided with a conveyance roller that is continuous with the conveyance direction and coincides with the conveyance direction of the conveyance roller. The transport rail is extended so that the rail transport surface is lower than the roller transport surface of the transport roller with a step, and the direction of air jet is directed above the starting end of the transport rail to the rail transport surface. In contrast, an air nozzle is provided which is opened so as to be inclined in the transport direction, and a detection means is further provided to detect that the first semiconductor device placed on the transport roller has been transferred from the transport roller to the transport rail. The apparatus also includes a control means for rotating the reversibly rotatable conveying roller in a direction opposite to the transport direction and injecting air from the air nozzle based on the signal from the detection means.

[作用] 上記のように構成された半導体装置の分離供給
装置では、搬送レールの搬送面は搬送ローラの移
送面より段差を有し低くなつているので、半導体
装置の最先のものと後続のものはばりが絡まるこ
となく分離される。また最先の半導体装置が搬送
ローラから搬送レール上に移送されると、この移
送検知手段が検知し、この検知手段の信号に基づ
いて、可逆回転搬送ローラが移送方向とは逆方向
に回転され、空気ノズルから空気が噴射されるの
で、逆転駆動される後続の半導体装置と空気噴射
された最先のものとの間に引き離し作用が加わ
り、後続の半導体装置が最先の半導体装置に追随
することが防がれ、さらにはたとえ上記段差によ
つてもばりの絡みが防げなかつた場合でも、上記
引き離し作用によつて半導体装置は確実に分離さ
れる。そして空気噴射による搬送とも相俟つて、
半導体装置の分離供給が、半導体装置の損傷もな
く、高速にかつ確実に達成される。
[Function] In the semiconductor device separation and supply device configured as described above, the conveyance surface of the conveyance rail has a step and is lower than the conveyance surface of the conveyance roller, so that the first semiconductor device and the succeeding semiconductor device are separated. Objects can be separated without any burrs getting tangled. Furthermore, when the first semiconductor device is transferred from the transport roller onto the transport rail, this transport detection means detects it, and based on the signal from this detection means, the reversible rotary transport roller is rotated in the opposite direction to the transport direction. Since air is injected from the air nozzle, a separating effect is applied between the succeeding semiconductor device which is driven in reverse and the first semiconductor device to which air has been injected, causing the succeeding semiconductor device to follow the first semiconductor device. Furthermore, even if the step does not prevent the burrs from becoming entangled, the separating action reliably separates the semiconductor device. Combined with transportation by air jet,
Separate supply of semiconductor devices can be achieved quickly and reliably without damaging the semiconductor devices.

[実施例] 第1図は本発明に係わる半導体装置の分離供給
装置の全体を示す断面図、第2図は同じく半導体
装置の分離供給装置の要部を示す断面図である。
同図において、符号11で示すものは、移送手段
としての複数の搬送ローラで、水平方向に所定の
間隔を隔てて並設されており、ローラ移送面11
a上の半導体装置12を移送するように構成され
ている。またこの実施例では可逆回転搬送ローラ
11bが搬送ローラ11のうちの、半導体装置の
移送方向の最前方のみに配設された例が示されて
いる。13は前記ローラ移送面11aよりS(S
=0.3mm〜0.6mm)だけ低い位置にレール搬送面1
3aを有する搬送レールで、前記搬送ローラ11
の前方に設けられており、その両側にはレール長
手方向に延在する壁部14が一体に設けられてい
る。また、この搬送レール13には前記レール搬
送面13aに開口する貫通孔15が設けられてい
る。この貫通孔15は、前記搬送レール13の始
端部から前方にLだけ間隔を隔てた位置に位置付
けられている。なお、寸法Lは前記半導体装置1
2のパツケージ寸法lより小さい寸法に設定され
ている。16は前記半導体装置12の搬送方向に
延在する案内面16aを有する案内レールで、前
記搬送ローラ11および前記搬送レール13の上
方に所定の間隔を隔てて設けられている。この案
内レール16には前記貫通孔15と同一の軸線方
向に開口する貫通孔17が設けられており、この
貫通孔17の後方にはノズル挿入孔18が設けら
れている。19は前記レール搬送面13a上の半
導体装置12を検出する検出手段としての検出器
で、前記両貫通孔15,17と同一の軸線上に光
軸をもつ発光素子19aと受光素子19bとから
なり、前記搬送レール13の延在方向と直角な方
向に設けられている。20は前記半導体装置12
の搬送方向に開口する噴射口20aを有する空気
ノズルで、先端部が前記ノズル挿入孔18内に臨
み前記搬送レール13の始端部上方に設けられて
いる。この空気ノズル20の空気噴射方向は前記
レール搬送面13aに対しつつレール搬送面13
aからθ(θ=15°〜45°)だけ移送方向に傾斜す
る方向に指向している。また、21は前方端部に
テーパ面21aをもつ案内レールで、前記搬送ロ
ーラ11の両側方に設けられている。なお、前記
搬送ローラ11外周面には半導体装置12の搬送
ミスを防止するためにゴム層が形成されている。
さらに検出器19の信号に基づいて、前記搬送ロ
ーラ11に含めて設けられた可逆回転搬送ローラ
11bを半導体装置12の移送方向とは逆方向に
回転させると共に空気ノズル20から空気を噴出
させる制御手段(図示せず)が設けられている。
[Embodiment] FIG. 1 is a cross-sectional view showing the entire separation and supply apparatus for semiconductor devices according to the present invention, and FIG. 2 is a cross-sectional view showing the main parts of the separation and supply apparatus for semiconductor devices.
In the same figure, a plurality of conveyance rollers as a conveyance means are arranged in parallel at a predetermined interval in the horizontal direction, and are denoted by the reference numeral 11.
The device is configured to transport the semiconductor device 12 on the device a. Further, in this embodiment, an example is shown in which the reversible rotary conveyance roller 11b is disposed only at the frontmost portion of the conveyance rollers 11 in the direction of conveyance of the semiconductor device. 13 is S(S) from the roller transfer surface 11a.
= 0.3mm to 0.6mm) on the rail conveyance surface 1
3a, the conveyance roller 11
A wall portion 14 extending in the longitudinal direction of the rail is integrally provided on both sides of the rail. Further, this transport rail 13 is provided with a through hole 15 that opens to the rail transport surface 13a. The through hole 15 is located at a distance L from the starting end of the transport rail 13 forward. Note that the dimension L is the size of the semiconductor device 1.
The size is set to be smaller than the package size l of No.2. A guide rail 16 has a guide surface 16a extending in the direction of conveyance of the semiconductor device 12, and is provided above the conveyance roller 11 and the conveyance rail 13 at a predetermined interval. This guide rail 16 is provided with a through hole 17 that opens in the same axial direction as the through hole 15, and a nozzle insertion hole 18 is provided behind this through hole 17. A detector 19 serves as a detection means for detecting the semiconductor device 12 on the rail conveyance surface 13a, and is composed of a light emitting element 19a and a light receiving element 19b, each having an optical axis on the same axis as both the through holes 15 and 17. , are provided in a direction perpendicular to the direction in which the transport rail 13 extends. 20 is the semiconductor device 12
The nozzle is an air nozzle having an injection port 20a that opens in the conveyance direction, and the tip thereof faces into the nozzle insertion hole 18 and is provided above the starting end of the conveyance rail 13. The air jetting direction of this air nozzle 20 is directed toward the rail conveying surface 13a and toward the rail conveying surface 13a.
It is oriented in a direction that is inclined toward the transfer direction by θ (θ=15° to 45°) from a. Reference numeral 21 denotes a guide rail having a tapered surface 21a at its front end, and is provided on both sides of the conveyance roller 11. Note that a rubber layer is formed on the outer peripheral surface of the conveyance roller 11 in order to prevent the semiconductor device 12 from being conveyed incorrectly.
Further, based on the signal from the detector 19, a control means for rotating the reversibly rotatable conveying roller 11b included in the conveying roller 11 in a direction opposite to the direction in which the semiconductor device 12 is conveyed and spouting air from the air nozzle 20. (not shown) is provided.

つぎに動作について説明する。 Next, the operation will be explained.

上記のように構成された半導体装置の分離供給
装置において、第3図に矢印で示す方向にローラ
移送面11a上を移動する最前方の半導体装置1
2がレール搬送面13a上に位置付けされると、
空気ノズル20から空気が噴射される。空気ノズ
ル20から噴射された空気は、半導体装置12の
前方に負圧の雰囲気を形成すると共に、半導体装
置12のパツケージ12aを搬送方向に押圧す
る。これにより半導体装置は搬送レール13の前
方に分離供給され、第1図に矢印Cで示す方向に
高速搬送される。
In the semiconductor device separation and supply apparatus configured as described above, the frontmost semiconductor device 1 moves on the roller transfer surface 11a in the direction indicated by the arrow in FIG.
2 is positioned on the rail conveyance surface 13a,
Air is injected from the air nozzle 20. The air injected from the air nozzle 20 forms a negative pressure atmosphere in front of the semiconductor device 12 and presses the package 12a of the semiconductor device 12 in the transport direction. As a result, the semiconductor device is separated and supplied to the front of the transport rail 13, and is transported at high speed in the direction shown by arrow C in FIG.

この場合、本発明においては、搬送レール13
のレール搬送面13aが搬送ローラ11のローラ
移送面11aと段差を有して低く位置付けられて
いるため、第4図aおよびbに示すように半導体
装置12のフレームのばり12bが絡む搬送ミス
の発生を防止することが出来る。そして上記のよ
うにローラ移送面11a上を移動する最前方の半
導体装置12がレール搬送面13a上に位置付け
されるとこれを検出器19が検知し、この検知信
号を制御手段に送る。制御手段は上記検知信号に
基づき、搬送ローラ11のうち可逆回転搬送ロー
ラ11bを、半導体装置12の移送方向とは逆方
向に回転させるとともに空気ノズル20から空気
を噴射させるように制御する。このような動作を
行なうことにより、搬送レール13上に移送され
た半導体装置12は移送方向に動かされ、一方搬
送ローラ11上にある後続の半導体装置12は移
送方向とは逆方向に動かされる。このため、搬送
レール13上に移送された半導体装置12と後続
の半導体装置12とを引き離そうとする作用が加
わる。従つて後続の半導体装置12が最先の半導
体装置に追随することが防がれる。またたとえレ
ール搬送面13aとローラ移送面11aとの間に
設けられた段差によつて半導体装置12のフレー
ムのばり12bの絡みがとれなかつた場合でも、
上記引き離し作用により強制的に半導体装置は分
離されるので、ばり12bの絡みによる搬送ミス
は確実に防止される。
In this case, in the present invention, the transport rail 13
Since the rail conveying surface 13a of the semiconductor device 12 is positioned lower than the roller conveying surface 11a of the conveying roller 11 with a step, it is possible to avoid conveyance errors involving the burrs 12b of the frame of the semiconductor device 12, as shown in FIGS. 4a and 4b. Occurrence can be prevented. When the frontmost semiconductor device 12 moving on the roller transfer surface 11a is positioned on the rail transfer surface 13a as described above, the detector 19 detects this and sends this detection signal to the control means. Based on the detection signal, the control means controls the reversibly rotatable transport roller 11b of the transport rollers 11 to rotate in a direction opposite to the direction in which the semiconductor device 12 is transported and to inject air from the air nozzle 20. By performing such an operation, the semiconductor device 12 transferred onto the transfer rail 13 is moved in the transfer direction, while the subsequent semiconductor device 12 on the transfer roller 11 is moved in the opposite direction to the transfer direction. For this reason, an effect is added that attempts to separate the semiconductor device 12 transferred onto the transport rail 13 from the succeeding semiconductor device 12. Therefore, subsequent semiconductor devices 12 are prevented from following the first semiconductor device. Furthermore, even if the burr 12b of the frame of the semiconductor device 12 cannot be untangled due to the step provided between the rail conveying surface 13a and the roller conveying surface 11a,
Since the semiconductor devices are forcibly separated by the above-mentioned separating action, transport errors due to entanglement of the burrs 12b are reliably prevented.

また本実施例においては、半導体装置12とし
てシングル・インライン・パツケージICを使用
する例を示したが、本発明はこれに限定されるも
のではなく、デユアル・インライン・パツケージ
ICあるいは他のICにも使用できることは勿論で
ある。
Further, in this embodiment, an example is shown in which a single inline package IC is used as the semiconductor device 12, but the present invention is not limited to this.
Of course, it can also be used for ICs or other ICs.

[発明の効果] 以上説明したように本発明によれば、可逆回転
搬送ローラを備えた搬送ローラを設け、搬送ロー
ラに続くレールのレール搬送面が搬送ローラのロ
ーラ移送面より段差を有して低くなるようにし、
半導体装置が搬送ローラから搬送レールに移送さ
れたことを検知した信号に基づき、可逆回転搬送
ローラを移送方向とは逆方向に回転させ、かつこ
の搬送レールの始端部上方に設けられた空気ノズ
ルから空気を噴射するようにし、レール搬送面上
の半導体装置をレール前方に分離供給するように
したので、分離供給装置の構造全体の簡素化のみ
ならず分離供給の高速化を図ることができる。ま
た、空気噴射による半導体装置の分離供給によつ
て搬送ミスの発生や半導体装置等の損傷を防止す
ることができる。さらに、ばりがある半導体装置
であつても確実に引き離しができる。
[Effects of the Invention] As explained above, according to the present invention, a conveyance roller equipped with a reversibly rotating conveyance roller is provided, and the rail conveyance surface of the rail following the conveyance roller has a level difference from the roller transfer surface of the conveyance roller. make it lower,
Based on a signal that detects that the semiconductor device has been transferred from the transport roller to the transport rail, the reversible rotary transport roller is rotated in the opposite direction to the transport direction, and the air nozzle provided above the starting end of the transport rail is Since air is injected to separate and supply the semiconductor devices on the rail transport surface to the front of the rail, it is possible not only to simplify the overall structure of the separation and supply device but also to speed up the separation and supply. Further, by separating and supplying semiconductor devices by air injection, it is possible to prevent transport errors and damage to semiconductor devices and the like. Furthermore, even if a semiconductor device has burrs, it can be reliably separated.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係わる半導体装置の分離供給
装置の全体を示す断面図、第2図は同じく半導体
装置の分離供給装置の要部を示す断面図、第3図
は半導体装置の搬送動作を説明するための斜視
図、第4図aおよびbは半導体装置の搬送動作を
説明するための側面図、第5図および第6図は従
来の半導体装置の分離供給装置を示す断面図であ
る。 図において、11は搬送ローラ、11aはロー
ラ移送面、11bは可逆回転搬送ローラ、12は
半導体装置、13は搬送レール、13aはレール
搬送面、19は検知手段、20は空気ノズル、2
0aは噴射口である。
FIG. 1 is a sectional view showing the entire semiconductor device separation and supply apparatus according to the present invention, FIG. 2 is a sectional view showing the main parts of the semiconductor device separation and supply apparatus, and FIG. 3 is a sectional view showing the semiconductor device transport operation. FIGS. 4A and 4B are side views for explaining the transport operation of semiconductor devices, and FIGS. 5 and 6 are cross-sectional views showing a conventional semiconductor device separation and supply apparatus. In the figure, 11 is a conveyance roller, 11a is a roller conveyance surface, 11b is a reversible rotary conveyance roller, 12 is a semiconductor device, 13 is a conveyance rail, 13a is a rail conveyance surface, 19 is a detection means, 20 is an air nozzle, 2
0a is an injection port.

Claims (1)

【特許請求の範囲】 1 可逆回転搬送ローラーを備える、半導体装置
を載置し移送する搬送ローラよりなる移送手段
と、 この移送手段の搬送ローラに続けて互いに移送
方向が一致するように延在させると共にそのレー
ル搬送面が上記搬送ローラのローラ移送面と段差
を有して低く位置するように配設された搬送レー
ルと、 この搬送レールの始端部上方に設けられ、空気
の噴射方向が上記レール搬送面に対しつつ移送方
向に傾斜するように開口された空気ノズルと、 上記搬送ローラに載置された半導体装置の最先
のものが上記搬送ローラから上記搬送レールに移
送されたことを検知する検知手段と、 この検知手段の信号に基づき、上記可逆回転搬
送ローラを上記移送方向とは逆方向に回転させる
と共に上記空気ノズルから空気を噴射させるよう
に制御する制御手段と、 を備えた半導体装置の分離供給装置。
[Scope of Claims] 1. A transport means comprising a reversible rotary transport roller, on which a semiconductor device is placed and transported, and a transport roller of the transport means that extends so that their transport directions coincide with each other. and a conveyor rail disposed such that the rail conveyance surface has a step with the roller transfer surface of the conveyance roller and is located low; and a conveyance rail provided above the starting end of the conveyance rail, and the air jet direction is aligned with the rail. an air nozzle opened so as to be inclined in the transport direction while facing the transport surface; and detecting that the first semiconductor device placed on the transport roller is transferred from the transport roller to the transport rail. A semiconductor device comprising: a detection means; and a control means for controlling the reversible rotary conveyance roller to rotate in a direction opposite to the transport direction and to inject air from the air nozzle based on a signal from the detection means. Separation and feeding equipment.
JP61283403A 1986-11-27 1986-11-27 Separating feeder apparatus for semiconductor device Granted JPS63134418A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61283403A JPS63134418A (en) 1986-11-27 1986-11-27 Separating feeder apparatus for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61283403A JPS63134418A (en) 1986-11-27 1986-11-27 Separating feeder apparatus for semiconductor device

Publications (2)

Publication Number Publication Date
JPS63134418A JPS63134418A (en) 1988-06-07
JPH0470210B2 true JPH0470210B2 (en) 1992-11-10

Family

ID=17665073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61283403A Granted JPS63134418A (en) 1986-11-27 1986-11-27 Separating feeder apparatus for semiconductor device

Country Status (1)

Country Link
JP (1) JPS63134418A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2797485B2 (en) * 1989-07-24 1998-09-17 ソニー株式会社 Electronic component mounting mechanism
TWI350811B (en) * 2008-07-11 2011-10-21 King Yuan Electronics Co Ltd Segregating apparatus
JP5349884B2 (en) * 2008-09-26 2013-11-20 三菱重工食品包装機械株式会社 Interval forming method and apparatus between articles
ES2444651T3 (en) * 2009-07-07 2014-02-26 Areva Gmbh Insulation installation and associated isolation procedure
JP5182529B2 (en) 2009-11-24 2013-04-17 住友電装株式会社 Dial switch

Also Published As

Publication number Publication date
JPS63134418A (en) 1988-06-07

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