JPH0469945A - Apparatus for arranging very small metallic ball - Google Patents

Apparatus for arranging very small metallic ball

Info

Publication number
JPH0469945A
JPH0469945A JP2183645A JP18364590A JPH0469945A JP H0469945 A JPH0469945 A JP H0469945A JP 2183645 A JP2183645 A JP 2183645A JP 18364590 A JP18364590 A JP 18364590A JP H0469945 A JPH0469945 A JP H0469945A
Authority
JP
Japan
Prior art keywords
hole
bump
substrate
fine metal
diameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2183645A
Other languages
Japanese (ja)
Other versions
JPH0727929B2 (en
Inventor
Tadakatsu Maruyama
忠克 丸山
Tomohiro Uno
智裕 宇野
Yasuhiro Suzuki
康弘 鈴木
Takahide Ono
恭秀 大野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP2183645A priority Critical patent/JPH0727929B2/en
Priority to MYPI91000398A priority patent/MY106135A/en
Priority to EP91302037A priority patent/EP0447170B1/en
Priority to DE69132891T priority patent/DE69132891T2/en
Priority to US07/669,189 priority patent/US5114878A/en
Priority to KR1019910004083A priority patent/KR940004247B1/en
Publication of JPH0469945A publication Critical patent/JPH0469945A/en
Publication of JPH0727929B2 publication Critical patent/JPH0727929B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits

Landscapes

  • Wire Bonding (AREA)

Abstract

PURPOSE:To prevent a plurality of very small metallic balls from being caught in a through-hole and to enable a replication, surely arranging bumps at predetermined positions, by forming a through-hole on the surface side of a base board so that its diameter is slightly larger than the one of the very small metallic ball. CONSTITUTION:The diameter of a through-hole 13a is formed so as to be slightly larger than the one of a bump 2. For example, when using the bump of 80mum in diameter, the diameter of the through-hole 13a is desirable to be about 90-100mum. Also, since a through-hole 13b plays the role to sucking the bump 2 into the through-hole 13a by a suction force, the only necessity is to have the size smaller than that of the bump 2. Moreover, a base board 12a is formed so that a part of the bump is protruded from the surface of the base board 12a when the bump is caught in the through-hole 13a. Since the slightly larger through-hole than the bump is formed in the base board, the bump 2 is caught in a state that it is caught in the through-hole 13a of the base board 12a. Also, only one bump 2 can fit in each through-hole 13a, and therefore, there is no possibility of the two or more bumps falling together in the same through-hole 13a.

Description

【発明の詳細な説明】[Detailed description of the invention]

〔産業上の利用分野〕 本発明は、ICチップのt掻と外部リードとの接続法の
一種であるT A B (Tape Automate
d Bonding)法において、微細金属球(以下バ
ンプとも称する。)を所定の配列パターンに従って配列
してTABテープのリード先端部に転写する際に使用す
る微細金属球の配列装置に関するものである。 〔従来の技術〕 TAB法は、ICチップの電極部へのリード配線を、T
ABテープ上にパターン化されて形成されているリード
の先端部分とICチップのi!穫部とを、バンプと呼ば
れる接合用の金属突起を介して接合する方法である。バ
ンプは予めTABテープのリード側か、もしくはICチ
ップの電極側かのいずれかに取り付けて置き、TABテ
ープとICチップの接合は、ボンディングマシンを使っ
て加熱・加圧することにより行う。 バンプをICチップ側でなくTABテープのすド側に形
成j2ζ゛おく方法は、バ2/グ接r)中(、ごlC千
ノブを傷める心配の無いことから、近・;I広く1iわ
れるよ・)にな、旨゛、きた4、バ/シイ=t jき′
T″A、 +3イブの従来の製造方法に1.−11、す
〜1・゛りjシーめ(、,1□゛作。 アJ7き、バ、・ア41X′なる部勺だ(、j4残1−
5(他4.l、ソ〕−ング等C5より薄く削り取るノ」
”)“;ミや1、−Yめガフ、ξ等の基板!−にメツキ
で゛作製1.とおいノ、!ハング4−1、ソー1先端部
1..′転写すイ)71′法等がある。但151、′れ
らの方法ご作製i″本れたバ5・′ブイ・]き’r A
 I算i−’ニア’は、バングの形状が矩形(、ン::
6いイ) (2) (!−I iイ、イ、ため、バンブ
の高さがiE鱈i、ご1仙、了いないと、べ/)゛、l
Ic−7ソゾの電極との接合1.、、”バーシラ」が4
1゜i−′や寸゛いとい・)欠点かあ、また。 オ発明者笠は先1.こ、′■゛A1(ア  ブのリ ト
“先端部ζ、ご球形状のバンブ4形成する新しい方法を
、特訓”F 1−23491 ’7ζ・]2゜−シ、(
′出願j2、た1、ζ、の方法番:j1バンブを配列1
べき位置に合わゼC貫通人イ′設けた基板の裏側を真空
に吸引しζ=1−?き、4貫通穴部分にバ′、・ブとな
る金属球を吸い寄せこ′仮固定jまた径・に、“T” 
A Bう・−グのり−1・と基板J二仁′配列・(1に
固定6′されこいる金属hiiとを車ね自わ已7二接合
S1−るものである。 〔発明が解決j、よ・う5I4る課題〕■、8形状O)
パンツ゛は1、′6号・N11:で“の、ンリ゛フス基
机等の1(1、□゛メソ1で形成され)、・矩形のパン
ツ°C,パ比べで゛協形1、や“I=−< 、+m合の
点ごはイ1利なものCあイ:)918カ1、なノ)X 
1ll)、1 ノ4’ LS: Jl、ζハング≦、・
形成すz:)場合し、ば1、始めから配列“4べき所定
の位置を特定しく′形成′4る、“、!−が゛(ネきる
のに対し0 、球形状のパンツ゛はバ7バシの状1i1
゜(−ご作製さ第1る人8め、す■定の位置に如何t:
′: t、、、、、−<′6)、;率良く配列14” 
J)か、さら(、,1はl゛Δ1(〕 −ノ°lのリ 
ド部分に如何IJ″L ”(容易に転′5゛4るかが大
きな問題となる。 本発明は1、記事情C5づ、%−jい′となされたちの
Cあり、効率良く、j、かも這実にパンy’ li1’
(7i定の位置に配セ!l !、、、、、、−f“転与
する。、r−aができる微細金属球(ハ配列装置FiJ
 、i桿供づ′るごとを!′:1的−4−るものである
。 C課題4解決4るためC1り手段〕 I記Cり [−1的を達成するための本定1リロ、係る
微細金属球の配列5j1〒置は、微細金属f)(を配列
i゛る〃板と、該基板の微細金属11(の配列バタ :
/ (、:対応イ゛る位置乙こ穿謹11.\れた貫通穴
ごあ> −’c 11つ;111記基板の表面側(、J
微細金属球の直IYより僅かに大きく、、前記基板の裏
面側は微細金属15i +2)内径よりも小さく形成さ
れた貫通穴2::、 l、 Mif記恭机の裏1fii
に取着され貫通穴(ご対向する吸引用の開1−1部を表
面t、′:イj4る1引部と2該!!!弓1部内を減H
E ’i−る排気ゴ段とを備え、前記貫i重穴に吸引さ
れた微細金属球の・部分が前記基板の表mから突出づ−
るように構成(7たS”とを特徴とするものCある。 また、前記基板は2枚の1′板イ、二重ね合ね干て形成
し、11つ表面側の平板には微細金属球の直径より僅か
L7大きい表面側11通穴を1、塵血便の平板には微細
金属球の直径より小さい裏面側貫通穴を形成j1.でも
よい。 〔作用〕 本発明は前記の構成+2ごまって、基板の表面側の貫通
穴を微細金属球の的径より僅かに大きく形成し、たこと
により、各貫通穴〇、7は1個の微細金属球し、か入る
ことができない、これC1“より、−の貫通穴に複数i
uaの微細金属I斗(が捕捉されイ:)のを防11−4
る。、I:た、4吸引され六iE+ lll1金属f・
)(の殆どの部分は基板内Gこ胛土2”、)ようになる
ので、−追捕擢i″はれた倣岬−、1シ属球が他の夕(
的要因、たとえば他の微細金属球の衝突や震動等ここよ
り、11通〉
[Industrial Field of Application] The present invention is directed to TAB (Tape Automate), which is a type of connection method between an IC chip's taper and an external lead.
The present invention relates to a fine metal ball arranging device used for arranging fine metal balls (hereinafter also referred to as bumps) according to a predetermined arrangement pattern and transferring them to the lead tips of a TAB tape in the d Bonding method. [Conventional technology] The TAB method connects lead wires to the electrodes of an IC chip using a TAB method.
The tip of the lead patterned on the AB tape and the i! of the IC chip. In this method, the metal protrusions called bumps are used to join the metal protrusions called bumps. The bumps are attached in advance to either the lead side of the TAB tape or the electrode side of the IC chip, and the TAB tape and the IC chip are bonded by applying heat and pressure using a bonding machine. The method of forming bumps on the side of the TAB tape instead of on the IC chip side is widely used in the near future as there is no need to worry about damaging the knob during contact. yo・)に、し゛、きた4、ba/sii=t jki'
T″A、+3 Eve's conventional manufacturing method is 1.-11、Su~1・゛rij seame(,,1□゛made. j4 remaining 1-
5 (other 4. l, song, etc.) Scrape off thinner than C5.
”)“; Boards such as Mi, 1, -Y Megaff, ξ, etc.! - Fabrication by plating 1. Tooi no! Hang 4-1, saw 1 tip 1. .. There are methods such as 71' method. However, 151, ``These methods can be made i''.
I calculation i-'near' means that the shape of the bang is rectangular (,n::
6) (2) (!-I i, i, tame, the height of the bump is iE cod i, you're 1 sen, you have to finish, be/)゛, l
Bonding with Ic-7 Sozo electrode 1. ,,"Bersilla" is 4
1゜i-′ and size゛itoi・) Shortcomings, again. Inventor Kasa is first 1. This,'■゛A1(F1-23491 '7ζ・]2゜-shi,(
'Method number of application j2, ta1, ζ: j1 bump array 1
Align it to the desired position and vacuum the back side of the board where ζ = 1-? Then, temporarily fix the metal ball that will become the bulb in the 4 through-hole part.
The A B glue 1 and the metal 6' fixed to the board J2' array (1) are connected to the car by 72 joints S1. j, Yo・U5I4Ru assignment〕■, 8 shape O)
The pants are 1, No. 6, N11: 1 (formed by 1, □゛ meso 1), rectangular pants °C, and 1 is the same shape as the pa. “I=-< , +m combination is 1 advantageous C:)918 KA1, nano)X
1ll), 1 no 4' LS: Jl, ζ hang≦,・
Form z:) If 1, specify the predetermined position of the array ``4'' from the beginning, ``form''4,'',! - is ゛ (0 for the neck, spherical pants ゛ is a 7-bashi shape 1i1
゜(-Please make the first person 8, how about in the fixed position?
′: t, , , , -<'6), ; Good arrangement 14"
J) or Sara(,,1 is l゛Δ1() - no°l
The big problem is how to easily transfer IJ"L" (easily) to the C part.The present invention has 1, article information C5, %-j', and can be efficiently and j , Kamohori-ni bread y'li1'
(7i Arrange in a fixed position! l !, , , , -f" transfer., ra can be made fine metal spheres (c Array device FiJ
, i-kakuzu'rugoto! ': 1-4-. C1 Means for Solving Problem 4] I Note C [Required 1 to achieve target -1, the arrangement of the fine metal balls 5j1 is the arrangement of the fine metal f) (i) Arrangement pattern of the plate and the fine metal 11 of the substrate:
/ (, : Corresponding position ゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛゛Diare〇 11.㼼Drilled through hole〉 -'c 11; 111 on the surface side of the board (゜J
Slightly larger than the diameter IY of the fine metal ball, the back side of the substrate is formed with a fine metal 15i +2) A through hole 2 formed smaller than the inner diameter::, l, the back side of the Mif recording desk 1fii
It is attached to the through hole (the opening 1-1 for suction facing the surface t,': I j4, 1 pull part and 2!!! Bow 1 part inside is reduced H)
A part of the fine metal sphere sucked into the through-hole protrudes from the surface of the substrate.
There is a type C which is characterized by a structure (7S).The substrate is made of two 1' plates, double folded and dried, and the 11th flat plate on the front side is coated with fine metal. It is also possible to form an 11 through hole on the front side that is slightly L7 larger than the diameter of the ball, and a through hole on the back side that is smaller than the diameter of the fine metal ball on the flat plate of dust and blood. [Function] The present invention has the above configuration +2. Then, the through holes on the front surface side of the substrate were formed slightly larger than the target diameter of the fine metal balls, so that each through hole 〇 and 7 contained one fine metal ball, which could not enter. From C1", there are multiple i in the - through hole.
Preventing UA's fine metal Ito (I:) from being captured 11-4
Ru. ,I:ta,4 attracted 6iE+ lll1 metal f・
) (Most of the parts of the substrate are covered with 2",), so that - the traced cape -, one genus sphere is the other (
factors, such as collisions with other fine metal balls, vibrations, etc. From here, 11 letters>

【から飛び出イことばない。 また、表面側貫通穴と兜面側pf浦六)苓それイ!れ別
個の平板C穿設L2、これらの1パ板庖重ね合わせて与
板を形成づるごとにより、基板の加丁が容易になる。 [実施例] 以tにオ発明の一実施例を第1図乃?第3図を参照り、
C説明4る。第1図は本発明の一′に施例である微細金
属LFの配列装置く以下バング配列装置とも称する。)
の配列部の概略斜視図、第2図はその配列部の概略断面
図、第3図はその微細金属球の配列装置”を用いたバ/
プ転r3′装置の檀略橘成図である。本実施例においζ
はパンツ“aしてf1行80μmの球形状のもの−4た
と拭ば、金球を使用している。 第3図に示すバンプ転写装置は、バンプ2を吸引して所
定の位置に配列するバンプ配列装置4と、TABテープ
22を送り出す機構(不図示)と、TABテープ22の
リード26の先端部にバンプ2を転写するために加熱・
加圧するボンディングツール30とを有するものである
。 バンプの配列装置4は、配列部10と排気部20とから
なる。配列部10は、第1図及び第2図に示すようにバ
ンプ配列用の2枚の基板12a。 12bと、排気部20により内部が減圧される吸引部1
4とからなる。また、配列部10と、排気部20とは排
気管18を介して繋がれている。 本実施例の配列部10においては、基板12a。 !2bは共にニッケル類のものを使用し、基板12aの
厚さAは60μm、基板12bの厚さBは30amであ
る。基板12a、12bにはバンプ2を配列すべき全て
の位置にそれぞれ貫通穴13が設けられている。基板1
2aの貫通穴(表面側貫通穴) 13aは直径Cが11
00pに、基板12bの貫通穴(裏面側貫通穴) 13
bは直径りが60μmに形成されている。吸引部14に
は貫通穴13a、13bに対応して開口部15が形成さ
れている。 貫通穴13aの直径をバンプ2の直径より僅かに大きく
形成しているのは貫通穴13aにバンプが一つだけ入る
ようにするためである。したがって、たとえば本実施例
におけるように直径80μmのバンプを使用する場合に
は、貫通穴13aの径は90〜100μm程度が望まし
い、また、貫通穴13bは吸引力によりバンプ2を貫通
穴13a内に吸引する役割を担うので、ハンプ2の大き
さより小さく形成すればよい、尚、基板12aは、バン
プを貫通穴13aに捕捉したときにバンプの一部分が基
板12aの表面から突出するように形成されている。本
実施例では基板12aの上面からのバンプの突出高さは
約7μmであるが、−船釣にこの突出高さはバンブ直径
の1/2以下となるようにすることが望ましい。 本装置を用いてバンプを所定パターンに配列しTABテ
ープに転写するには、先ず排気部20を作動させて排気
管16を介して、吸引部14内を減圧状態にする。これ
により、貫通穴13bを介して貫通穴13aに吸引力を
発生させることができる。この状態のときに、たとえば
基板12a上にバンプ2をふりかけるような方法でバン
プ2を貫通穴13aに吸引させて、所定のパターンに配
列する。また、バンプの配列部10を多数のバンプが載
っている受は皿等のバンブ供給機構部(不図示)の近く
に寄せて、バンプを貫通穴13a内に吸引するようにし
てもよい。 ところで、基板12aがない場合には、バンプは吸引力
だけで基板上に配列されているので、震動等が生じたと
きには定位置に収まったバンプが動いて外れてしまうこ
とがある。また、第4図に示すように複数のバンプが同
一の貫通穴に捕捉されてしまうこともある。このような
バンプの欠落や捕捉があると、転写不良が生じ、転写の
際の歩留りが著しく低下する。 本実施例においては、基板にバンプよりも僅かに大きな
穴を形成したことにより、第2図に示すようにバンプ2
は基板12aの貫通穴13aに落ち込んだ状態で捕捉さ
れる。したがって、たとえば震動等によりバンプ2が)
ぷり動かされたとしてもバンプ2は貫通穴13aの周縁
によって保持されているので、バンプが貫通穴13から
飛び出して、欠落することはない。また、貫通穴13a
はバンプの直径(80μm)より僅かに大きいだけであ
るので、各貫通穴13aには1個のバンプ2しか入るこ
とができず、したがって、2個以上のバンプが一つの貫
通穴13に集まることはない。 バンプ2を吸引して配列した後は、バンブ配列装置4の
基板12はボンディング受は部の役割を果たすことにな
る。先ず、ポリイミド等の絶縁物からなるフィルムキャ
リア24上にリード26が形成されたTABテープ22
と基板12aとの間の位置を、図示しない位置合わせ調
整機構部を用いて調整する。バンプ配列装置4の位置が
決まったら、適当な温度に加熱されているボンディング
ツール30により一定の荷重を作用させることにより、
貫通穴13aに吸引されていたバンプ2を”r A B
 )−グの7まれたり・−ド26の先端部に転写・接合
(る。 また、基板12は1.貫通穴13 a心、1引されたバ
ンブ2の 部が基板12aの表面から突出4るよ)むこ
形成されている。ごれt、′より、バ/′グt′I゛A
Be  グに転ち4る1稈に;l−;いズ、パンツ°2
が変形し2、“Cも、基板12がり−h′26に接触1
.?リード264−…傷し、ないようにしζいる。 バングシ)を写し、取られたバング配列′装置4は川び
バンブを配列する1稈に戻り、同時仁ゾ丁A Bラージ
22が一ニア7分込られ”ζ♀IIたム゛ル−・ノアが
転゛す信置に送ら叫する。ぞし2て、[記と同様にバン
グ配列装置40’)4J置を調整1−、た篠・、バンブ
24、TΔ13ブー・グ22のリード26の先端部Cご
転′ら″・接合4゛る。 このようにバンブを配列す゛る上程、ハンゾ各′1゛A
、 B y5・−ブに転′す4る1程、’1’ABテー
グる−27送るI丁程梳連続的に動作、トセることがご
きるので、′】゛へ1(メーーブのリード先端部へ・の
バングの転写・接合を極め°C能率的に行うこまがごき
る。 本実施例のバング配列装置におい°(′は、η、−板1
26J−・つのバングだけ・を捕1足4′るH通人13
aを設(1jたこと【6゛より、 j1捕)Fされたバ
ングが外的唱“因、た2、えば他のハンプ2の衝突や農
動等?、、: cJ:り外部に飛び出4−”の4防j1
するJ72がごきる。さらi、: 、、複数個のハンプ
が同・の貫通穴13に捕捉されるの苓ILf月1−する
こμ、ができるのζゝ、ハンプを所定の配列位置に値失
(、υつずり配列ζることができる。したが、C、ハン
プ゛をTへ13う− グのソー1先端部に転゛1ツζる
際の歩留り遺著[、り向1−1させるここが−ごきる。 第5図は本実施例(、,4用いられる配列部の他の例を
小4”概略斜視図ごある。第り図に示1配列部1001
48角形状に形成されζいる。s!枚のバンブ配列用の
基板120a、120bにば貫通穴130a、130 
bが1記の実施例と同様に形成されζいる。耕気管16
0は回転軸をも兼ねこおり、Jul気部20に腎がっ゛
こいる。この配列部100を用いる場合は、たとえば配
列部100のF力にハンプ供給機構を設置しておくこと
にまり、容品にバンブを吸引・配列することができる。 バンブの配列装置100を回転し5て11部に来た基板
120aがボンディング受G〕部の役割を果釘。そし、
゛(前述と同様にして基枦、120−十に配列されたバ
ングがl” A 11う−ブのリード先端部ら′転′ら
゛される。 向、上記の実施例では、異なる大きさの貫通穴を有ぐる
2枚の平板を重ね合わせて基板を形成L7た場合に・)
いて説明したが、本発明はこれζに限定されるものでは
なく、第6図(2示4−よ−> Cご一枚の基板12に
直径の異なる2つの同心状の穴4形成と7でもよい。 また8−1−記の実施例では、異なる人きさの貫通穴4
7段状に形成し、た場合についご説明したが、この貫通
穴は、たとえばラーバー状に形成し2”−こもよい。 史に、1記の実施例では、吸引部の上面に1つの大きな
開口部を設&Jた場合についこ説明したが、関I]部は
基板の貫通穴の配列パターンに対向4るようζざ溝状に
、形成L ’7もよい。 〔発明の効果) 以J説明(7たA、うに4発明−よれば、吸引された微
細金属球は、イの殆どの部分が基板内に埠まるようにな
るので、微細金属l↓を効]シよく所定の(◇置に確実
に一つずつ配列することができ、し“たがっ“で例えば
微細金属球を゛1゛八F3う グのり・1部に転)づる
際の歩%7りを著しく向jさせることができる微細金属
球の配列装置を・提供壇ることができる。
[There are no words that jump out at me. Also, there is a through hole on the front side and a PF on the helmet side. By forming separate flat plates C perforated L2 and overlapping these two plates to form a covering plate, the cutting of the substrate becomes easy. [Example] An example of the invention is shown in Figure 1 below. Referring to Figure 3,
CExplanation 4. FIG. 1 shows a device for arranging fine metal LF, which is a first embodiment of the present invention, hereinafter also referred to as a bang arranging device. )
Fig. 2 is a schematic cross-sectional view of the arrangement part, and Fig. 3 is a schematic perspective view of the arrangement part of the microscopic metal spheres.
FIG. 3 is a schematic diagram of the configuration of the printer r3' device. In this example, the odor ζ
The gold ball is used in the pants as shown in Figure 3, which is a spherical ball with a row of f1 of 80 μm.The bump transfer device shown in FIG. A bump arrangement device 4, a mechanism (not shown) for sending out the TAB tape 22, and a heating and
It has a bonding tool 30 that applies pressure. The bump arrangement device 4 includes an arrangement section 10 and an exhaust section 20. The arrangement section 10 includes two substrates 12a for bump arrangement, as shown in FIGS. 1 and 2. 12b, and a suction section 1 whose interior is depressurized by the exhaust section 20.
It consists of 4. Furthermore, the array section 10 and the exhaust section 20 are connected via an exhaust pipe 18. In the array section 10 of this embodiment, the substrate 12a. ! Both substrates 2b are made of nickel, and the thickness A of the substrate 12a is 60 μm, and the thickness B of the substrate 12b is 30 am. Through holes 13 are provided in each of the substrates 12a and 12b at all positions where the bumps 2 are to be arranged. Board 1
Through hole 2a (front side through hole) 13a has a diameter C of 11
00p, through hole of board 12b (back side through hole) 13
b is formed to have a diameter of 60 μm. An opening 15 is formed in the suction portion 14 in correspondence with the through holes 13a and 13b. The reason why the diameter of the through hole 13a is made slightly larger than the diameter of the bump 2 is to allow only one bump to fit into the through hole 13a. Therefore, for example, when using a bump with a diameter of 80 μm as in this embodiment, the diameter of the through hole 13a is desirably about 90 to 100 μm, and the through hole 13b allows the bump 2 to be pulled into the through hole 13a by suction force. Since it plays the role of suction, it is sufficient to form the hump 2 smaller than the size of the hump 2. The substrate 12a is formed so that a portion of the bump protrudes from the surface of the substrate 12a when the bump is captured in the through hole 13a. There is. In this embodiment, the height of the protrusion of the bump from the upper surface of the substrate 12a is approximately 7 μm, but for boat fishing it is desirable that the height of the protrusion be less than 1/2 of the diameter of the bump. In order to arrange bumps in a predetermined pattern and transfer them onto a TAB tape using this device, first, the exhaust section 20 is operated to bring the inside of the suction section 14 into a reduced pressure state via the exhaust pipe 16. Thereby, suction force can be generated in the through hole 13a via the through hole 13b. In this state, the bumps 2 are drawn into the through holes 13a by, for example, sprinkling them on the substrate 12a, and arranged in a predetermined pattern. Further, the bump array section 10 may be placed near a bump supply mechanism section (not shown) such as a plate so that the bumps are sucked into the through hole 13a. By the way, in the absence of the substrate 12a, the bumps are arranged on the substrate only by suction force, so that when vibrations or the like occur, the bumps that have been placed in a fixed position may move and come off. Further, as shown in FIG. 4, a plurality of bumps may be trapped in the same through hole. If such bumps are missing or captured, a transfer failure occurs and the yield during transfer is significantly reduced. In this example, by forming a hole slightly larger than the bump in the substrate, the bump 2 is formed as shown in FIG.
is trapped in the state of falling into the through hole 13a of the substrate 12a. Therefore, for example, bump 2 due to vibration etc.)
Even if the bump 2 is moved, the bump 2 is held by the periphery of the through hole 13a, so the bump will not jump out of the through hole 13 and be lost. In addition, the through hole 13a
is only slightly larger than the diameter of the bump (80 μm), so only one bump 2 can fit into each through hole 13a, and therefore two or more bumps can gather in one through hole 13. There isn't. After the bumps 2 are attracted and arranged, the substrate 12 of the bump arrangement device 4 serves as a bonding receiver. First, a TAB tape 22 with leads 26 formed on a film carrier 24 made of an insulating material such as polyimide is formed.
The position between the substrate 12a and the substrate 12a is adjusted using an alignment adjustment mechanism (not shown). Once the position of the bump arrangement device 4 is determined, by applying a constant load to the bonding tool 30 heated to an appropriate temperature,
The bump 2 that was attracted to the through hole 13a is
7 of the board 12 is transferred and bonded to the tip of the board 26. In addition, the board 12 has a center 1 through hole 13a, and the part of the bump 2 drawn by 1 protrudes from the surface of the board 12a. ) The mucosa is formed. Gore t,'from ba/'gt'I゛A
Be turned into a 4 culm;l-;Izu, pants °2
is deformed and 2, "C also contacts the board 12 - h'26 1
.. ? Lead 264--...Take care not to damage it. The removed bhang array device 4 returns to one culm for arranging the river bhang, and at the same time, the A B large 22 is inserted for 7 minutes and the ``ζ♀II'' mul. Noah sends it to the transfer station and shouts. Then, adjust the 4J position (bang arrangement device 40' as described above) 1-, Tashino, bam 24, TΔ13 boog 22 lead 26 There is a 4" joint at the tip of C. In the process of arranging the bumps like this, Hanzo each '1'A
, B y5. The top moves to transfer and bond the bangs to the tip extremely efficiently. In the bang arrangement device of this embodiment,
26J-・H-passer 13 who catches only one bang
A was set (1j) [From 6゛, j1 caught] The bang that was F was caused by an external chant ``Cause, for example, a collision with another hump 2, agricultural movement, etc.?'' cJ: 4-”4 defense j1
J72 is here. In addition, when multiple humps are captured in the same through hole 13, it is possible to set the humps at a predetermined array position (, υ). However, when transferring the hump to T to the tip of the saw 1 of the 13-movement, there is a yield difference [, where the direction is 1-1. Figure 5 is a schematic perspective view of another example of the array section used in this embodiment.
It is formed in a 48-sided shape. s! Through holes 130a and 130 are provided in the bump array substrates 120a and 120b.
b is formed in the same manner as in the first embodiment. Cultivation pipe 16
0 also serves as the rotation axis, and the kidney is located in the Jul air section 20. When using this arrangement section 100, for example, a hump supply mechanism is installed in the F force of the arrangement section 100, and the bumps can be sucked and arranged on the container. After rotating the bump arrangement device 100, the board 120a that came to the 11th part plays the role of the bonding receiver G]. stop,
(In the same manner as described above, the bangs arranged in a 120-10 pattern are rotated from the lead tip of the 11th wave. When a board is formed by overlapping two flat plates with through-holes L7...)
However, the present invention is not limited to ζ, and as shown in FIG. In addition, in the embodiment described in 8-1-, the through holes 4 of different humanities
Although we have explained the case where the through hole is formed in seven steps, it is also possible to form the through hole in a rubber shape and have a diameter of 2". As explained above in the case where an opening is provided, the section I] may also be formed in the shape of a groove L'7 so as to face the arrangement pattern of the through holes of the substrate. [Effects of the Invention] According to the explanation (7. It is possible to reliably arrange them one by one in each location, and it can significantly improve the step rate when rolling, for example, fine metal balls (1, 8 F3, 1 part). It is possible to provide an arrangement device for fine metal spheres.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の−・実施例Cある微細金属球の配列装
置の配列部の概略斜視しl、第2図はその配列部の概略
断面図、第3図CJその微細金属球の配列装置不用いた
バンブ転写装置の概略構成し1、第4図はバングをVl
!する貫通穴4イ1しない基板を使用した場合のバング
の配置状態を説明するノ、−めの図、第51ffiは本
実施例GX、用いられる配列部の他の例を示J−概略斜
視図、第6図は配列部の基板の他の例を示ψ°閏である
4、 2・・・バング、4・・・ハンプ配列装置、12a、1
2b、−,7A板、 13 a。 14・・・ 16・・・ 22 ・・・ 24 ・・・ 30 ・・・ 13b・・・貫通穴・ 吸引部、15・・・開口部、 排気管、20・・・排気部、 TABテープ、 フィルムキャリア、26・・・ ボンディングツール。 リード、
Fig. 1 is a schematic perspective view of the arrangement section of a certain micro metal ball arrangement device according to embodiment C of the present invention, Fig. 2 is a schematic sectional view of the arrangement section, and Fig. 3 CJ is the arrangement of the micro metal spheres. The schematic configuration of a bump transfer device that does not require a device is shown in Figures 1 and 4.
! Fig. 51 is a diagram illustrating the arrangement of the bangs when a board without through holes 4 and 1 is used; Fig. 51ffi is the present embodiment GX; Fig. 51 is a schematic perspective view showing another example of the arrangement section to be used; , FIG. 6 shows another example of the substrate of the array section.
2b, -, 7A plate, 13a. 14... 16... 22... 24... 30... 13b... Through hole/suction part, 15... Opening part, exhaust pipe, 20... Exhaust part, TAB tape, Film carrier, 26... Bonding tool. lead,

Claims (2)

【特許請求の範囲】[Claims] (1)微細金属球を配列する基板と、該基板の微細金属
球の配列パターンに対応する位置に穿設された貫通穴で
あって且つ前記基板の表面側は微細金属球の直径より僅
かに大きく、前記基板の裏面側は微細金属球の直径より
も小さく形成された貫通穴と、前記基板の裏面に取着さ
れ貫通穴に対向する吸引用の開口部を表面に有する吸引
部と、該吸引部内を減圧する排気手段とを備え、前記貫
通穴に吸引された微細金属球の一部分が前記基板の表面
から突出するように構成したことを特徴とする微細金属
球の配列装置。
(1) A substrate on which fine metal spheres are arranged, and a through hole drilled at a position corresponding to the arrangement pattern of the fine metal spheres on the substrate, and the surface side of the substrate is slightly smaller than the diameter of the fine metal spheres. a through hole formed on the back side of the substrate to be smaller than the diameter of the fine metal sphere; a suction section attached to the back side of the substrate and having a suction opening facing the through hole on the surface; What is claimed is: 1. An arrangement device for fine metal spheres, comprising: an exhaust means for reducing the pressure in the suction section, and configured such that a portion of the fine metal spheres sucked into the through hole protrudes from the surface of the substrate.
(2)前記基板は2枚の平板が重ね合わされて形成され
、且つ表面側の平板には微細金属球の直径より僅かに大
きい表面側貫通穴が、裏面側の平板には微細金属球の直
径より小さい裏面側貫通穴が形成されている請求項1記
載の微細金属球の配列装置。
(2) The substrate is formed by overlapping two flat plates, and the front side flat plate has a through hole slightly larger than the diameter of the fine metal sphere, and the back side flat plate has a through hole slightly larger than the diameter of the fine metal sphere. 2. The arrangement device for fine metal balls according to claim 1, wherein a smaller through-hole is formed on the back side.
JP2183645A 1989-09-11 1990-07-10 Arrangement device of fine metal balls Expired - Lifetime JPH0727929B2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2183645A JPH0727929B2 (en) 1990-07-10 1990-07-10 Arrangement device of fine metal balls
MYPI91000398A MY106135A (en) 1990-03-14 1991-03-12 Method of bonding bumps to leads of tab tape and an apparatus for arranging bumps used for the same.
EP91302037A EP0447170B1 (en) 1990-03-14 1991-03-12 Method of bonding bumps to leads of tab tape and an apparatus for arranging bumps used for the same
DE69132891T DE69132891T2 (en) 1990-03-14 1991-03-12 Method for connecting bumps on TAB carrier conductors and an apparatus for arranging bumps
US07/669,189 US5114878A (en) 1989-09-11 1991-03-13 Method of bonding bumps to leads of tab tape and an apparatus for arranging bumps used for the same
KR1019910004083A KR940004247B1 (en) 1990-03-14 1991-03-14 Bump arranging equipment and method for connecting bump to lead of tab tape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2183645A JPH0727929B2 (en) 1990-07-10 1990-07-10 Arrangement device of fine metal balls

Publications (2)

Publication Number Publication Date
JPH0469945A true JPH0469945A (en) 1992-03-05
JPH0727929B2 JPH0727929B2 (en) 1995-03-29

Family

ID=16139419

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2183645A Expired - Lifetime JPH0727929B2 (en) 1989-09-11 1990-07-10 Arrangement device of fine metal balls

Country Status (1)

Country Link
JP (1) JPH0727929B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6107181A (en) * 1997-09-08 2000-08-22 Fujitsu Limited Method of forming bumps and template used for forming bumps
US6320158B1 (en) 1998-01-29 2001-11-20 Fujitsu Limited Method and apparatus of fabricating perforated plate
US6906427B2 (en) 1997-04-17 2005-06-14 Sekisui Chemical Co., Ltd. Conductive particles and method and device for manufacturing the same, anisotropic conductive adhesive and conductive connection structure, and electronic circuit components and method of manufacturing the same
JP2005328017A (en) * 2004-04-16 2005-11-24 Hitachi Metals Ltd Equipment for arranging electroconductive particles

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005243723A (en) * 2004-02-24 2005-09-08 Ibiden Co Ltd Mask for settling conductive ball

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6906427B2 (en) 1997-04-17 2005-06-14 Sekisui Chemical Co., Ltd. Conductive particles and method and device for manufacturing the same, anisotropic conductive adhesive and conductive connection structure, and electronic circuit components and method of manufacturing the same
KR100574215B1 (en) * 1997-04-17 2006-04-27 세키스이가가쿠 고교가부시키가이샤 Conductive particles
US6107181A (en) * 1997-09-08 2000-08-22 Fujitsu Limited Method of forming bumps and template used for forming bumps
US6432806B1 (en) 1997-09-08 2002-08-13 Fujitsu Limited Method of forming bumps and template used for forming bumps
US6320158B1 (en) 1998-01-29 2001-11-20 Fujitsu Limited Method and apparatus of fabricating perforated plate
JP2005328017A (en) * 2004-04-16 2005-11-24 Hitachi Metals Ltd Equipment for arranging electroconductive particles

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