JPH0466588U - - Google Patents
Info
- Publication number
- JPH0466588U JPH0466588U JP10943090U JP10943090U JPH0466588U JP H0466588 U JPH0466588 U JP H0466588U JP 10943090 U JP10943090 U JP 10943090U JP 10943090 U JP10943090 U JP 10943090U JP H0466588 U JPH0466588 U JP H0466588U
- Authority
- JP
- Japan
- Prior art keywords
- thermostatic chamber
- test
- outrail
- heat insulating
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007789 sealing Methods 0.000 claims 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10943090U JP2540703Y2 (ja) | 1990-10-19 | 1990-10-19 | Ｉｃ試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10943090U JP2540703Y2 (ja) | 1990-10-19 | 1990-10-19 | Ｉｃ試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0466588U true JPH0466588U (enExample) | 1992-06-11 |
| JP2540703Y2 JP2540703Y2 (ja) | 1997-07-09 |
Family
ID=31856632
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10943090U Expired - Lifetime JP2540703Y2 (ja) | 1990-10-19 | 1990-10-19 | Ｉｃ試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2540703Y2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999045403A1 (en) * | 1998-03-02 | 1999-09-10 | Advantest Corporation | Ic test apparatus |
-
1990
- 1990-10-19 JP JP10943090U patent/JP2540703Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999045403A1 (en) * | 1998-03-02 | 1999-09-10 | Advantest Corporation | Ic test apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2540703Y2 (ja) | 1997-07-09 |