JPH0466588U - - Google Patents

Info

Publication number
JPH0466588U
JPH0466588U JP10943090U JP10943090U JPH0466588U JP H0466588 U JPH0466588 U JP H0466588U JP 10943090 U JP10943090 U JP 10943090U JP 10943090 U JP10943090 U JP 10943090U JP H0466588 U JPH0466588 U JP H0466588U
Authority
JP
Japan
Prior art keywords
thermostatic chamber
test
outrail
heat insulating
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10943090U
Other languages
English (en)
Japanese (ja)
Other versions
JP2540703Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10943090U priority Critical patent/JP2540703Y2/ja
Publication of JPH0466588U publication Critical patent/JPH0466588U/ja
Application granted granted Critical
Publication of JP2540703Y2 publication Critical patent/JP2540703Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Tests Of Electronic Circuits (AREA)
JP10943090U 1990-10-19 1990-10-19 Ｉｃ試験装置 Expired - Lifetime JP2540703Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10943090U JP2540703Y2 (ja) 1990-10-19 1990-10-19 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10943090U JP2540703Y2 (ja) 1990-10-19 1990-10-19 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0466588U true JPH0466588U (cs) 1992-06-11
JP2540703Y2 JP2540703Y2 (ja) 1997-07-09

Family

ID=31856632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10943090U Expired - Lifetime JP2540703Y2 (ja) 1990-10-19 1990-10-19 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2540703Y2 (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999045403A1 (fr) * 1998-03-02 1999-09-10 Advantest Corporation Appareil de test de ci

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999045403A1 (fr) * 1998-03-02 1999-09-10 Advantest Corporation Appareil de test de ci

Also Published As

Publication number Publication date
JP2540703Y2 (ja) 1997-07-09

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