JPH0466582U - - Google Patents

Info

Publication number
JPH0466582U
JPH0466582U JP10959490U JP10959490U JPH0466582U JP H0466582 U JPH0466582 U JP H0466582U JP 10959490 U JP10959490 U JP 10959490U JP 10959490 U JP10959490 U JP 10959490U JP H0466582 U JPH0466582 U JP H0466582U
Authority
JP
Japan
Prior art keywords
measurement jig
probe head
width
microstrip line
stub
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10959490U
Other languages
Japanese (ja)
Other versions
JP2507797Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10959490U priority Critical patent/JP2507797Y2/en
Publication of JPH0466582U publication Critical patent/JPH0466582U/ja
Application granted granted Critical
Publication of JP2507797Y2 publication Critical patent/JP2507797Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の外観図、第2図は
本方式で中心導体をテーパ型に幅を変換した説明
図、第3図は本方式でラジアルスタブを扇形にし
た説明図、第4図は測定説明図、第5図は従来例
の測定治具の外観図、第6図は第5図の断面図、
第7図は他の従来例の外観図。 1……測定治具、2……マイクロストリツプラ
イン、5……誘電体基板、6……地導体、7……
プローブヘツド、9……半円状ラジアルスタブ、
11……扇形ラジアルスタブ。
Fig. 1 is an external view of an embodiment of the present invention, Fig. 2 is an explanatory drawing in which the width of the center conductor is converted into a tapered type using this method, and Fig. 3 is an explanatory drawing in which the radial stub is made into a fan shape using this method. Fig. 4 is a measurement explanatory diagram, Fig. 5 is an external view of a conventional measurement jig, Fig. 6 is a sectional view of Fig. 5,
FIG. 7 is an external view of another conventional example. 1... Measuring jig, 2... Microstrip line, 5... Dielectric substrate, 6... Ground conductor, 7...
Probe head, 9... semicircular radial stub,
11...Sector-shaped radial stub.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 測定治具のプローブヘツド結合部分において、
測定治具のマイクロストリツプライン端部の幅を
ステツプ又はテーパ状にして前記プローブヘツド
の中心導体に一致させ、また、プローブヘツドの
グランドラインに対しては、半円状又は半円に近
い扇形のラジアルスタブによる等価的なグランド
を前記ストリツプラインの先端近傍に設けて対応
させ、かつこのスタブ半径を測定周波数の下限の
約1/2波長の実効長としたことを特徴とするマイ
クロストリツプライン回路測定治具。
At the probe head connection part of the measurement jig,
The width of the end of the microstrip line of the measurement jig is stepped or tapered to match the center conductor of the probe head, and the width of the end of the microstrip line of the measurement jig is made into a semicircular shape or a fan shape close to a semicircle with respect to the ground line of the probe head. An equivalent ground formed by a radial stub is provided near the tip of the stripline, and the radius of the stub is set to an effective length of about 1/2 wavelength of the lower limit of the measurement frequency. Pline circuit measurement jig.
JP10959490U 1990-10-19 1990-10-19 Microstrip line circuit measurement jig Expired - Lifetime JP2507797Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10959490U JP2507797Y2 (en) 1990-10-19 1990-10-19 Microstrip line circuit measurement jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10959490U JP2507797Y2 (en) 1990-10-19 1990-10-19 Microstrip line circuit measurement jig

Publications (2)

Publication Number Publication Date
JPH0466582U true JPH0466582U (en) 1992-06-11
JP2507797Y2 JP2507797Y2 (en) 1996-08-21

Family

ID=31856820

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10959490U Expired - Lifetime JP2507797Y2 (en) 1990-10-19 1990-10-19 Microstrip line circuit measurement jig

Country Status (1)

Country Link
JP (1) JP2507797Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009157563A1 (en) * 2008-06-27 2009-12-30 マスプロ電工株式会社 Measuring device for transmission line boards and high-frequency parts

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3526517B2 (en) 1997-09-18 2004-05-17 京セラ株式会社 High frequency measurement board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009157563A1 (en) * 2008-06-27 2009-12-30 マスプロ電工株式会社 Measuring device for transmission line boards and high-frequency parts
JP2010008275A (en) * 2008-06-27 2010-01-14 Maspro Denkoh Corp Transmission line board and measuring device of high-frequency component

Also Published As

Publication number Publication date
JP2507797Y2 (en) 1996-08-21

Similar Documents

Publication Publication Date Title
JPH0466582U (en)
JPH0370372U (en)
JPH03111008U (en)
JPS6193004U (en)
JPH0221802U (en)
JPS6333201U (en)
JPS6257169U (en)
JPH0262811U (en)
JPH03115866U (en)
JPH02113409U (en)
JPS62140364U (en)
JPS6277903U (en)
JPS6423101U (en)
JPS6289822U (en)
JPS61104621U (en)
JPS6178423U (en)
JPH0286213U (en)
JPS6011077U (en) probe device
JPS62193304U (en)
JPS6286708U (en)
JPS63121905U (en)
JPS63114506U (en)
JPS6293767U (en)
JPH0185672U (en)
JPH01152266U (en)