JPH0466582U - - Google Patents
Info
- Publication number
- JPH0466582U JPH0466582U JP10959490U JP10959490U JPH0466582U JP H0466582 U JPH0466582 U JP H0466582U JP 10959490 U JP10959490 U JP 10959490U JP 10959490 U JP10959490 U JP 10959490U JP H0466582 U JPH0466582 U JP H0466582U
- Authority
- JP
- Japan
- Prior art keywords
- measurement jig
- probe head
- width
- microstrip line
- stub
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 7
- 239000000523 sample Substances 0.000 claims description 4
- 239000004020 conductor Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第1図は本考案の一実施例の外観図、第2図は
本方式で中心導体をテーパ型に幅を変換した説明
図、第3図は本方式でラジアルスタブを扇形にし
た説明図、第4図は測定説明図、第5図は従来例
の測定治具の外観図、第6図は第5図の断面図、
第7図は他の従来例の外観図。
1……測定治具、2……マイクロストリツプラ
イン、5……誘電体基板、6……地導体、7……
プローブヘツド、9……半円状ラジアルスタブ、
11……扇形ラジアルスタブ。
Fig. 1 is an external view of an embodiment of the present invention, Fig. 2 is an explanatory drawing in which the width of the center conductor is converted into a tapered type using this method, and Fig. 3 is an explanatory drawing in which the radial stub is made into a fan shape using this method. Fig. 4 is a measurement explanatory diagram, Fig. 5 is an external view of a conventional measurement jig, Fig. 6 is a sectional view of Fig. 5,
FIG. 7 is an external view of another conventional example. 1... Measuring jig, 2... Microstrip line, 5... Dielectric substrate, 6... Ground conductor, 7...
Probe head, 9... semicircular radial stub,
11...Sector-shaped radial stub.
Claims (1)
測定治具のマイクロストリツプライン端部の幅を
ステツプ又はテーパ状にして前記プローブヘツド
の中心導体に一致させ、また、プローブヘツドの
グランドラインに対しては、半円状又は半円に近
い扇形のラジアルスタブによる等価的なグランド
を前記ストリツプラインの先端近傍に設けて対応
させ、かつこのスタブ半径を測定周波数の下限の
約1/2波長の実効長としたことを特徴とするマイ
クロストリツプライン回路測定治具。 At the probe head connection part of the measurement jig,
The width of the end of the microstrip line of the measurement jig is stepped or tapered to match the center conductor of the probe head, and the width of the end of the microstrip line of the measurement jig is made into a semicircular shape or a fan shape close to a semicircle with respect to the ground line of the probe head. An equivalent ground formed by a radial stub is provided near the tip of the stripline, and the radius of the stub is set to an effective length of about 1/2 wavelength of the lower limit of the measurement frequency. Pline circuit measurement jig.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10959490U JP2507797Y2 (en) | 1990-10-19 | 1990-10-19 | Microstrip line circuit measurement jig |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10959490U JP2507797Y2 (en) | 1990-10-19 | 1990-10-19 | Microstrip line circuit measurement jig |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0466582U true JPH0466582U (en) | 1992-06-11 |
JP2507797Y2 JP2507797Y2 (en) | 1996-08-21 |
Family
ID=31856820
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10959490U Expired - Lifetime JP2507797Y2 (en) | 1990-10-19 | 1990-10-19 | Microstrip line circuit measurement jig |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2507797Y2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009157563A1 (en) * | 2008-06-27 | 2009-12-30 | マスプロ電工株式会社 | Measuring device for transmission line boards and high-frequency parts |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3526517B2 (en) | 1997-09-18 | 2004-05-17 | 京セラ株式会社 | High frequency measurement board |
-
1990
- 1990-10-19 JP JP10959490U patent/JP2507797Y2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009157563A1 (en) * | 2008-06-27 | 2009-12-30 | マスプロ電工株式会社 | Measuring device for transmission line boards and high-frequency parts |
JP2010008275A (en) * | 2008-06-27 | 2010-01-14 | Maspro Denkoh Corp | Transmission line board and measuring device of high-frequency component |
Also Published As
Publication number | Publication date |
---|---|
JP2507797Y2 (en) | 1996-08-21 |