JPH0458182B2 - - Google Patents
Info
- Publication number
- JPH0458182B2 JPH0458182B2 JP8891687A JP8891687A JPH0458182B2 JP H0458182 B2 JPH0458182 B2 JP H0458182B2 JP 8891687 A JP8891687 A JP 8891687A JP 8891687 A JP8891687 A JP 8891687A JP H0458182 B2 JPH0458182 B2 JP H0458182B2
- Authority
- JP
- Japan
- Prior art keywords
- opening
- chip
- semiconductor
- package
- solution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 17
- 239000000243 solution Substances 0.000 claims description 14
- 238000002347 injection Methods 0.000 claims description 8
- 239000007924 injection Substances 0.000 claims description 8
- 238000012856 packing Methods 0.000 claims description 5
- 239000007921 spray Substances 0.000 claims description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 16
- 239000007788 liquid Substances 0.000 description 5
- 239000002253 acid Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000002699 waste material Substances 0.000 description 3
- 238000005530 etching Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Description
【発明の詳細な説明】
[産業上の利用分野]
この発明は半導体のオープナー装置に関するも
のである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] This invention relates to a semiconductor opener device.
[従来技術]
従来、半導体(I・C)の不良解析時又は品質
チエツクを行なう際に、半導体のパツケージに溶
解液、例えば、加熱した熱硫酸をあてて内部のチ
ツプを露出させる手段がとられている。[Prior Art] Conventionally, when analyzing defects or checking the quality of semiconductors (I/C), methods have been used to expose the internal chips by applying a dissolving solution, such as heated hot sulfuric acid, to the semiconductor package. ing.
半導体のパツケージは、開封口を有するパツキ
ン上面に密着セツトされ、噴射ノズルより噴射さ
れた溶解液が開封口領域内においてパツケージに
直接あたる構造となつている。 The semiconductor package is tightly set on the upper surface of the package having an opening, and the solution sprayed from the injection nozzle directly hits the package within the opening area.
[発明が解決しようとする問題点]
前記した如く半導体のパツケージは噴射ノズル
から噴射された溶解液があたることで順次溶解さ
れ、内部のチツプが露出するようになるが、この
時のパツケージの開封はパツキンに設けられた開
封口によつて決定される。即ち、開封口はパツキ
ンのほぼ中央部位に設けられた丸孔あるいは角孔
状の貫通孔となつているところから、開封口の領
域のみ溶解液が直接あたるためにワンポイント状
の開封状態が得られるようになる。[Problems to be Solved by the Invention] As mentioned above, the semiconductor package is sequentially melted by the solution sprayed from the spray nozzle, and the chip inside is exposed. is determined by the opening provided in the package. In other words, since the opening is a round or square-shaped through-hole provided almost in the center of the package, the dissolving solution directly hits only the area of the opening, resulting in a one-point opening condition. You will be able to do it.
このために、例えばチツプの実装位置がパツケ
ージの中央部位からずれていたり、あるいはチツ
プの占有面積が大きい場合にはチツプの完全露出
が得られない不具合いが発生する。そこで、前記
不具合を解消する手段として、例えば開封口の径
を大きくすることが考えられるが、300milタイ
プの半導体にあつてはパツケージの巾が約6mmと
小さいため開封口の径を大きくすると開封領域と
なるパツケージの上面だけでなく側面まで溶解す
る結果となり、溶解液が流れ出す恐れがあつた。
溶解液が流れ出すと検知センサが働らいて装置の
作動が停止するため、再度セツトしなおさなけれ
ばならず作業の大巾な遅れにつながる等の問題を
招来する。 For this reason, for example, if the mounting position of the chip is offset from the center of the package, or if the chip occupies a large area, a problem arises in that the chip cannot be completely exposed. Therefore, as a means to solve the above-mentioned problem, it may be possible to increase the diameter of the opening, for example, but in the case of 300 mil type semiconductors, the width of the package is as small as approximately 6 mm, so increasing the diameter of the opening will increase the opening area. As a result, not only the top surface of the package but also the sides were dissolved, and there was a risk that the solution solution would flow out.
If the dissolving solution flows out, the detection sensor is activated and the operation of the device is stopped, so the device must be reset, causing problems such as a significant delay in work.
そこで、この発明は簡単な工夫によつて、チツ
プの実装位置がずれていたり、パツケージに対す
るチツプの占有面積が大きい場合でも確実にチツ
プを露出させることができる半導体のオープナー
装置を提供することを目的としている。 SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a semiconductor opener device that can reliably expose a chip even if the mounting position of the chip is shifted or the chip occupies a large area with respect to the package using a simple device. It is said that
[問題点を解決するための手段〕
前記目的を達成するために、この発明にあつて
は、開封口を有するパキンの上面に載置セツトさ
れた半導体のパツケージに、噴射ノズルから噴射
される溶解液をあててチツプを露出させるオープ
ナー装置において、前記パツキンの開封口を長孔
状に形成すると共に前記噴射ノズルと対応する部
位の開口巾を一般部の開口巾より狭くしてある。[Means for solving the problem] In order to achieve the above-mentioned object, in the present invention, a semiconductor package placed and set on the upper surface of a gasket having an opening is sprayed with molten liquid from a spray nozzle. In the opener device for exposing the chip by applying liquid, the opening of the packing is formed in the shape of a long hole, and the opening width of the portion corresponding to the injection nozzle is narrower than the opening width of the general portion.
[作用]
かかる半導体のオープナー装置において、噴射
ノズルから噴射された溶解液は開封口の領域にお
いて、パツケージに直接あたり、パツケージを順
次溶解しチツプを露出させる。この場合、溶解液
が直接あたる部位にあつては、狭い開口巾によつ
て溶解液があたる量が制限され開封速度が一般部
の開口より遅くなり、一般部の開口とバランスさ
れ長孔状に開封される。この結果、チツプの実装
位置が中心からずれていたり、あるいは、占有面
積が大きいチツプにあつても確実に露出するよう
になる。[Function] In such a semiconductor opener device, the solution sprayed from the spray nozzle directly hits the packages in the area of the opening, sequentially melting the packages and exposing the chips. In this case, in the area where the solution comes into direct contact, the narrow opening width limits the amount of solution that comes in contact with the opening, making the opening speed slower than the opening in the general section, and the opening speed is balanced with the opening in the general section and the opening is shaped like a long hole. It will be opened. As a result, even if the chip is mounted at an off-center position or occupies a large area, the chip will be exposed reliably.
[実施例]
以下、第1図乃至第5図の図面を参照しながら
この発明の一実施例を詳細に説明する。[Embodiment] Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings of FIGS. 1 to 5.
図中1はオープナー装置3の機体を示してい
る。機体1内には半導体開口部5のほかに硫酸を
貯蔵する貯蔵タンク部7と該タンク部7より送ら
れてくる硫酸を約250℃まで加熱する予熱ヒータ
部9と、前記半導体開口部5で仕事を終えた熱硫
酸を約100℃まで冷却フアンで冷却する排液冷却
部11と、その排液を一時貯蔵する排液タンク部
13とが配置されている。 In the figure, 1 indicates the body of the opener device 3. In addition to the semiconductor opening 5, the fuselage 1 includes a storage tank section 7 for storing sulfuric acid, a preheating heater section 9 for heating the sulfuric acid sent from the tank section 7 to about 250°C, and a A waste liquid cooling section 11 that cools the heated sulfuric acid that has finished its work to about 100° C. using a cooling fan, and a waste liquid tank section 13 that temporarily stores the waste liquid are arranged.
半導体開口部5は、エツチブロツク15と該ブ
ロツク15の下位に配置されたケーシング17
と、該ケーシング17内に配置されたポンプ装置
19とからなつている。 The semiconductor opening 5 is formed by an etching block 15 and a casing 17 disposed below the block 15.
and a pump device 19 disposed within the casing 17.
ケーシング17は磁力を透し、かつ耐熱耐酸性
の材質で形成された硫酸が所定量溜られる貯溜槽
となつている。ケーシング17には予熱ヒータ部
9を介して貯蔵タンク部7へ続く取入口23と排
液冷却部11を介して排液タンク部13へ続く取
出口25が設けられている。 The casing 17 is made of a material that is permeable to magnetic force and is heat-resistant and acid-resistant, and serves as a storage tank in which a predetermined amount of sulfuric acid is stored. The casing 17 is provided with an intake port 23 that connects to the storage tank section 7 via the preheating heater section 9 and an outlet port 25 that continues to the drain tank section 13 via the drain cooling section 11 .
取入口23から送り込まれるケーシング17内
の硫酸はヒータ(図示していない)によつて約
290℃に高められる。なお、ヒータの電源部は温
度センサ(図示省略)によつて硫酸が約290℃に
なるように管理制御される。 The sulfuric acid in the casing 17 fed through the intake port 23 is heated to approximately
Raised to 290℃. Note that the power supply section of the heater is managed and controlled by a temperature sensor (not shown) so that the temperature of the sulfuric acid is approximately 290°C.
ケーシング17の底部下位には駆動モータ27
の出力軸29に回転磁石31が装着支持されてい
る。そして、前記磁石31と対向し、かつ、ケー
シング17内には磁石33aが埋設された羽根車
33が配置されている。 A drive motor 27 is located at the bottom of the casing 17.
A rotating magnet 31 is mounted and supported on the output shaft 29 of the motor. Further, an impeller 33 is disposed facing the magnet 31 and having a magnet 33a embedded within the casing 17.
羽根車33は回転磁石31の磁力によつて回転
すると共に、耐熱耐酸性の合成樹脂の材質で形成
されている。 The impeller 33 is rotated by the magnetic force of the rotating magnet 31 and is made of a heat-resistant and acid-resistant synthetic resin material.
羽根車33の本体上方は円錐部37となつてい
て下方には中央部の凸部39より放射方向に翼板
41が設けられている。 The upper part of the main body of the impeller 33 is a conical part 37, and a vane plate 41 is provided below in a radial direction from a convex part 39 in the central part.
翼板41は回転時において案内ケース35の底
部に設けられた取入口(図示していない)より取
入れられた硫酸を上方へ送り出す形状となつてい
る。案内ケース35は磁力を透す材質で羽根車3
3に沿う形状となつており、先端の噴射ノズル4
3は前記エツチブロツク15の貫通孔45の下位
に望んでいる。 The vane plate 41 is shaped to send upward the sulfuric acid taken in from an intake port (not shown) provided at the bottom of the guide case 35 when it rotates. The guide case 35 is made of a material that allows magnetic force to pass through, and the impeller 3
3, and the injection nozzle 4 at the tip
3 is located below the through hole 45 of the etching block 15.
噴射ノズル43の先端が望む貫通孔45はパツ
キン49が組入れられた組付凹部47の底部中央
部位に設けられている。 The through hole 45 through which the tip of the injection nozzle 43 is visible is provided at the center of the bottom of the assembly recess 47 into which the packing 49 is assembled.
パツキン49は耐熱耐酸性のゴム製で円板状に
形成されている。パツキン49には貫通した長孔
状の開封口51が設けられ、前記噴射ノズル43
と対応し合う開封口51の開口巾aは一般部の開
口巾bより狭く設定されている。 The gasket 49 is made of heat-resistant and acid-resistant rubber and is shaped like a disk. The gasket 49 is provided with an opening 51 in the form of a long hole passing through it, and the injection nozzle 43
The opening width a of the unsealing opening 51 corresponding to the opening 51 is set to be narrower than the opening width b of the general portion.
なお、53はヒンジ55を支点として開閉可能
な操作蓋、57はICガイド、59は半導体Wを
保持するICホルダをそれぞれ示している。 Note that 53 indicates an operation lid that can be opened and closed using the hinge 55 as a fulcrum, 57 indicates an IC guide, and 59 indicates an IC holder that holds the semiconductor W.
このように構成されたオープナー装置におい
て、半導体Wのパツケージpをパツキン49の上
面に密着セツトし、噴射ノズル43から噴射した
溶解液をパツケージpにあてて順次溶解していき
チツプTを露出させる。この場合、溶解液が直接
あたる部位は狭くなつた開口巾aによつて溶解液
があたる量が制限されて開封速度が一般部の開口
より遅くなる。したがつて、開口巾bと開封速度
がバランスされて、長孔状に開封される。この結
果、第3図に示す如くチツプの実装位置が中心か
らずれていたり、あるいは占有面積が大きいチツ
プにあつても、確実に露出するようになる。 In the opener device constructed in this way, the package p of the semiconductor W is set tightly on the upper surface of the packing 49, and the solution jetted from the injection nozzle 43 is applied to the package p to sequentially melt it and expose the chip T. In this case, the opening width a that is narrower limits the amount of the solution to which the solution directly hits the area, and the unsealing speed is slower than that of the opening in the general section. Therefore, the opening width b and the opening speed are balanced, and the bag is opened in the shape of a long hole. As a result, even if the mounting position of the chip is off-center as shown in FIG. 3, or if the chip occupies a large area, it will be exposed reliably.
なお、64kビツトD−RAMにおいて、一般部
の開口巾bを約2.5mm、縮小部の開口巾aを約1
mmとし、また、256kビツトD−RAMにあつて
は、一般部の開口巾bを約4mm、縮小部の開口巾
aを約2mmに設定して実験した所、良好な長孔状
の開封状態が得られた。 In addition, in a 64k-bit D-RAM, the opening width b of the general part is approximately 2.5 mm, and the opening width a of the reduced part is approximately 1 mm.
In addition, in the case of a 256k-bit D-RAM, an experiment was conducted with the opening width b of the general part set to approximately 4 mm and the opening width a of the reduced part set to approximately 2 mm, and a good elongated hole-shaped opening state was obtained. was gotten.
[発明の効果]
以上説明した通りこの発明のオープナー装置に
よれば、チツプの実装位置が中心部からずれてい
たり、占有面積が大きいチツプにあつても確実に
露出できるようになる。[Effects of the Invention] As explained above, according to the opener device of the present invention, even if the chip is mounted at a position shifted from the center or the chip occupies a large area, it can be exposed reliably.
第1図はこの発明のオープナー装置のパツキン
の平面図、第2図は第1図の−線断面図、第
3図はチツプが露出した状態の半導体の斜視図、
第4図は一部分を切欠したオープナー装置の側面
図、第5図は同上の平面図である。
主要な図面符号の説明 43……噴射ノズル、
49……パツキン、51……開封口、W……半導
体。
FIG. 1 is a plan view of the gasket of the opener device of the present invention, FIG. 2 is a sectional view taken along the line -- in FIG. 1, and FIG. 3 is a perspective view of the semiconductor with the chip exposed.
FIG. 4 is a partially cutaway side view of the opener device, and FIG. 5 is a plan view of the same. Explanation of main drawing symbols 43...Injection nozzle,
49...Packkin, 51...Opening mouth, W...Semiconductor.
Claims (1)
された半導体のパツケージに、噴射ノズルから噴
射される溶解液をあててチツプを露出させるオー
プナー装置において、前記パツキンの開封口を長
孔状に形成すると共に前記噴射ノズルと対応する
部位の開口巾を一般部の開口巾より狭くしたこと
を特徴とする半導体のオープナー装置。1. In an opener device that exposes a chip by applying a solution sprayed from a spray nozzle to a semiconductor package placed on the upper surface of a packing having an opening, the opening of the packing is formed in the shape of a long hole. A semiconductor opener device characterized in that an opening width of a portion corresponding to the injection nozzle is narrower than an opening width of a general portion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8891687A JPS63254740A (en) | 1987-04-13 | 1987-04-13 | Opener for semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8891687A JPS63254740A (en) | 1987-04-13 | 1987-04-13 | Opener for semiconductor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63254740A JPS63254740A (en) | 1988-10-21 |
JPH0458182B2 true JPH0458182B2 (en) | 1992-09-16 |
Family
ID=13956248
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8891687A Granted JPS63254740A (en) | 1987-04-13 | 1987-04-13 | Opener for semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63254740A (en) |
-
1987
- 1987-04-13 JP JP8891687A patent/JPS63254740A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS63254740A (en) | 1988-10-21 |
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