JPH0451675U - - Google Patents
Info
- Publication number
- JPH0451675U JPH0451675U JP9348390U JP9348390U JPH0451675U JP H0451675 U JPH0451675 U JP H0451675U JP 9348390 U JP9348390 U JP 9348390U JP 9348390 U JP9348390 U JP 9348390U JP H0451675 U JPH0451675 U JP H0451675U
- Authority
- JP
- Japan
- Prior art keywords
- main body
- movable plate
- opening
- contact
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000037431 insertion Effects 0.000 claims 1
- 238000003780 insertion Methods 0.000 claims 1
- 239000011810 insulating material Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Connecting Device With Holders (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9348390U JPH0451675U (es) | 1990-09-05 | 1990-09-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9348390U JPH0451675U (es) | 1990-09-05 | 1990-09-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0451675U true JPH0451675U (es) | 1992-04-30 |
Family
ID=31830740
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9348390U Pending JPH0451675U (es) | 1990-09-05 | 1990-09-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0451675U (es) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012524905A (ja) * | 2009-04-21 | 2012-10-18 | ジョンステック インターナショナル コーポレーション | 超小型回路試験器の導電ケルビン接点 |
| US8988090B2 (en) | 2009-04-21 | 2015-03-24 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |
| US9329204B2 (en) | 2009-04-21 | 2016-05-03 | Johnstech International Corporation | Electrically conductive Kelvin contacts for microcircuit tester |
-
1990
- 1990-09-05 JP JP9348390U patent/JPH0451675U/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012524905A (ja) * | 2009-04-21 | 2012-10-18 | ジョンステック インターナショナル コーポレーション | 超小型回路試験器の導電ケルビン接点 |
| US8988090B2 (en) | 2009-04-21 | 2015-03-24 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |
| US9329204B2 (en) | 2009-04-21 | 2016-05-03 | Johnstech International Corporation | Electrically conductive Kelvin contacts for microcircuit tester |
| US9500673B2 (en) | 2009-04-21 | 2016-11-22 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |
| US10247755B2 (en) | 2009-04-21 | 2019-04-02 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |