JPH0451675U - - Google Patents
Info
- Publication number
- JPH0451675U JPH0451675U JP9348390U JP9348390U JPH0451675U JP H0451675 U JPH0451675 U JP H0451675U JP 9348390 U JP9348390 U JP 9348390U JP 9348390 U JP9348390 U JP 9348390U JP H0451675 U JPH0451675 U JP H0451675U
- Authority
- JP
- Japan
- Prior art keywords
- main body
- movable plate
- opening
- contact
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000037431 insertion Effects 0.000 claims 1
- 238000003780 insertion Methods 0.000 claims 1
- 239000011810 insulating material Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Connecting Device With Holders (AREA)
Description
第１図は、この考案の実施例の外観を簡略に、
示した斜視図、第２図はこの考案の実施例を示す
断面図、第３図は第２図の実施例にＩＣ素子を装
着した状態を示す断面図、第４図は従来のＩＣソ
ケツトを示す断面図、第５図は第４図のＩＣソケ
ツトにＩＣ素子を装着した時のリードと接触子と
の接触状態を示す図である。
Figure 1 shows a simplified appearance of an embodiment of this invention.
2 is a sectional view showing an embodiment of this invention, FIG. 3 is a sectional view showing an IC element mounted on the embodiment of FIG. 2, and FIG. 4 is a sectional view showing a conventional IC socket. The sectional view shown in FIG. 5 is a diagram showing the state of contact between the leads and the contacts when the IC element is mounted in the IC socket of FIG. 4.
Claims (1)
た絶縁材の本体と、 その本体の上記開口の一側内面に沿つて配列さ
れて上記本体に取付けられ、上記挿脱方向に延長
された複数の接触子と、 上記本体内において、上記開口と対向して移動
自在に配された可動板と、 その可動板を上記開口側へ偏倚するばねと、 一端部が上記接触子の対応するものにそれぞれ固
定され、他端部が上記可動板と係合された剛体よ
りなる複数の連結バーとを有し、 上記接触子は、上記ばねによる上記可動板の偏倚
力により上記連結バーを介して上記本体の内面側
に位置して上記ＩＣ素子の挿入時にＩＣ素子とほ
ぼ接触しない状態にあり、 上記ＩＣ素子の挿入により上記連結バーが上記
バネの偏倚力に抗して回動されて上記接触子が内
側に変位して上記ＩＣ素子のリードと接触するよ
うにされている測定用ＩＣソケツト。[Claims for Utility Model Registration] A main body made of an insulating material having an opening formed on one side for inserting and removing an IC element, and a main body arranged along the inner surface of one side of the opening of the main body, a plurality of contacts extending in the insertion/removal direction; a movable plate movably disposed within the main body facing the opening; a spring biasing the movable plate toward the opening; are each fixed to a corresponding one of the contacts, and have a plurality of connecting bars made of a rigid body whose other end is engaged with the movable plate, and the contactor is configured to deflect the movable plate by the spring. Due to the force, the connecting bar is positioned on the inner surface side of the main body through the connecting bar, and is in a state where it is almost not in contact with the IC element when the IC element is inserted, and when the IC element is inserted, the connecting bar resists the biasing force of the spring. A measuring IC socket, which is rotated so that the contact element is displaced inward and comes into contact with a lead of the IC element.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9348390U JPH0451675U (en) | 1990-09-05 | 1990-09-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9348390U JPH0451675U (en) | 1990-09-05 | 1990-09-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0451675U true JPH0451675U (en) | 1992-04-30 |
Family
ID=31830740
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9348390U Pending JPH0451675U (en) | 1990-09-05 | 1990-09-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0451675U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012524905A (en) * | 2009-04-21 | 2012-10-18 | ジョンステック インターナショナル コーポレーション | Conductive Kelvin contacts for microcircuit testers |
| US8988090B2 (en) | 2009-04-21 | 2015-03-24 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |
| US9329204B2 (en) | 2009-04-21 | 2016-05-03 | Johnstech International Corporation | Electrically conductive Kelvin contacts for microcircuit tester |
-
1990
- 1990-09-05 JP JP9348390U patent/JPH0451675U/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012524905A (en) * | 2009-04-21 | 2012-10-18 | ジョンステック インターナショナル コーポレーション | Conductive Kelvin contacts for microcircuit testers |
| US8988090B2 (en) | 2009-04-21 | 2015-03-24 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |
| US9329204B2 (en) | 2009-04-21 | 2016-05-03 | Johnstech International Corporation | Electrically conductive Kelvin contacts for microcircuit tester |
| US9500673B2 (en) | 2009-04-21 | 2016-11-22 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |
| US10247755B2 (en) | 2009-04-21 | 2019-04-02 | Johnstech International Corporation | Electrically conductive kelvin contacts for microcircuit tester |