JPH044274U - - Google Patents

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Publication number
JPH044274U
JPH044274U JP4595190U JP4595190U JPH044274U JP H044274 U JPH044274 U JP H044274U JP 4595190 U JP4595190 U JP 4595190U JP 4595190 U JP4595190 U JP 4595190U JP H044274 U JPH044274 U JP H044274U
Authority
JP
Japan
Prior art keywords
sample
liquid level
container
liquid
optical detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4595190U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4595190U priority Critical patent/JPH044274U/ja
Publication of JPH044274U publication Critical patent/JPH044274U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Sampling And Sample Adjustment (AREA)
JP4595190U 1990-04-27 1990-04-27 Pending JPH044274U (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4595190U JPH044274U (OSRAM) 1990-04-27 1990-04-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4595190U JPH044274U (OSRAM) 1990-04-27 1990-04-27

Publications (1)

Publication Number Publication Date
JPH044274U true JPH044274U (OSRAM) 1992-01-16

Family

ID=31560594

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4595190U Pending JPH044274U (OSRAM) 1990-04-27 1990-04-27

Country Status (1)

Country Link
JP (1) JPH044274U (OSRAM)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001311736A (ja) * 2000-04-28 2001-11-09 Seiko Instruments Inc Ｉｃｐ分析装置用のオートサンプラー及びサンプリング方法
WO2010087119A1 (ja) * 2009-01-29 2010-08-05 株式会社 日立ハイテクノロジーズ 自動分析装置
JP2012026732A (ja) * 2010-07-20 2012-02-09 Hitachi High-Technologies Corp 自動分析装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001311736A (ja) * 2000-04-28 2001-11-09 Seiko Instruments Inc Ｉｃｐ分析装置用のオートサンプラー及びサンプリング方法
WO2010087119A1 (ja) * 2009-01-29 2010-08-05 株式会社 日立ハイテクノロジーズ 自動分析装置
CN102301240A (zh) * 2009-01-29 2011-12-28 株式会社日立高新技术 自动分析装置
US8753572B2 (en) 2009-01-29 2014-06-17 Hitachi High-Technologies Corporation Automated analyzer
JP5544308B2 (ja) * 2009-01-29 2014-07-09 株式会社日立ハイテクノロジーズ 自動分析装置
JP2014139589A (ja) * 2009-01-29 2014-07-31 Hitachi High-Technologies Corp 自動分析装置
JP2012026732A (ja) * 2010-07-20 2012-02-09 Hitachi High-Technologies Corp 自動分析装置

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