JPH0440667B2 - - Google Patents

Info

Publication number
JPH0440667B2
JPH0440667B2 JP56000291A JP29181A JPH0440667B2 JP H0440667 B2 JPH0440667 B2 JP H0440667B2 JP 56000291 A JP56000291 A JP 56000291A JP 29181 A JP29181 A JP 29181A JP H0440667 B2 JPH0440667 B2 JP H0440667B2
Authority
JP
Japan
Prior art keywords
driver
line
semiconductor
output
speed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56000291A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57113377A (en
Inventor
Akira Yamagiwa
Ryozo Yoshino
Takashi Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56000291A priority Critical patent/JPS57113377A/ja
Publication of JPS57113377A publication Critical patent/JPS57113377A/ja
Publication of JPH0440667B2 publication Critical patent/JPH0440667B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP56000291A 1981-01-07 1981-01-07 Semiconductor testing device Granted JPS57113377A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56000291A JPS57113377A (en) 1981-01-07 1981-01-07 Semiconductor testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56000291A JPS57113377A (en) 1981-01-07 1981-01-07 Semiconductor testing device

Publications (2)

Publication Number Publication Date
JPS57113377A JPS57113377A (en) 1982-07-14
JPH0440667B2 true JPH0440667B2 (show.php) 1992-07-03

Family

ID=11469798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56000291A Granted JPS57113377A (en) 1981-01-07 1981-01-07 Semiconductor testing device

Country Status (1)

Country Link
JP (1) JPS57113377A (show.php)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4588945A (en) * 1983-06-13 1986-05-13 Hewlett-Packard Company High throughput circuit tester and test technique avoiding overdriving damage
EP0230766A1 (en) * 1985-12-23 1987-08-05 Tektronix, Inc. Wafer probes
US8368422B1 (en) * 2012-05-04 2013-02-05 Nanya Technology Corp. System and method for testing off-chip driver impedance

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5824797Y2 (ja) * 1978-01-06 1983-05-27 株式会社日立製作所 テスタ接続装置

Also Published As

Publication number Publication date
JPS57113377A (en) 1982-07-14

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