JPH0438575U - - Google Patents

Info

Publication number
JPH0438575U
JPH0438575U JP8024190U JP8024190U JPH0438575U JP H0438575 U JPH0438575 U JP H0438575U JP 8024190 U JP8024190 U JP 8024190U JP 8024190 U JP8024190 U JP 8024190U JP H0438575 U JPH0438575 U JP H0438575U
Authority
JP
Japan
Prior art keywords
test
under test
unit
unit under
main body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8024190U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8024190U priority Critical patent/JPH0438575U/ja
Publication of JPH0438575U publication Critical patent/JPH0438575U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP8024190U 1990-07-27 1990-07-27 Pending JPH0438575U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8024190U JPH0438575U (enrdf_load_stackoverflow) 1990-07-27 1990-07-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8024190U JPH0438575U (enrdf_load_stackoverflow) 1990-07-27 1990-07-27

Publications (1)

Publication Number Publication Date
JPH0438575U true JPH0438575U (enrdf_load_stackoverflow) 1992-03-31

Family

ID=31625122

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8024190U Pending JPH0438575U (enrdf_load_stackoverflow) 1990-07-27 1990-07-27

Country Status (1)

Country Link
JP (1) JPH0438575U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0815238A (ja) * 1994-07-05 1996-01-19 Nec Corp Ｉｃパッケージ評価システム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0815238A (ja) * 1994-07-05 1996-01-19 Nec Corp Ｉｃパッケージ評価システム

Similar Documents

Publication Publication Date Title
CA2253339A1 (en) Method and system for administrating of remotely-proctored secure examination
JPH0464781U (enrdf_load_stackoverflow)
JPH0438575U (enrdf_load_stackoverflow)
SE9602557L (sv) Test- och träningsredskap
JPH01152216U (enrdf_load_stackoverflow)
JPS63118541U (enrdf_load_stackoverflow)
JPH01139431U (enrdf_load_stackoverflow)
JPH0459147U (enrdf_load_stackoverflow)
JPH01160504U (enrdf_load_stackoverflow)
JPS62158561U (enrdf_load_stackoverflow)
JPS63106138U (enrdf_load_stackoverflow)
JPS63141475U (enrdf_load_stackoverflow)
JPH03119774U (enrdf_load_stackoverflow)
JPS63181974U (enrdf_load_stackoverflow)
JPH058456U (ja) 試験装置
JPS63152571U (enrdf_load_stackoverflow)
JPS59192839U (ja) ウエハの測定装置
JPS62168437U (enrdf_load_stackoverflow)
JPS58191546U (ja) 車高調整装置の作動検査装置
JPH01140178U (enrdf_load_stackoverflow)
JPH0344672U (enrdf_load_stackoverflow)
JPH0232067U (enrdf_load_stackoverflow)
JPH0411478U (enrdf_load_stackoverflow)
JPH0215600U (enrdf_load_stackoverflow)
JPH0269771U (enrdf_load_stackoverflow)