JPH0438477A - Method for measuring delay time of audio amplifier - Google Patents

Method for measuring delay time of audio amplifier

Info

Publication number
JPH0438477A
JPH0438477A JP14590490A JP14590490A JPH0438477A JP H0438477 A JPH0438477 A JP H0438477A JP 14590490 A JP14590490 A JP 14590490A JP 14590490 A JP14590490 A JP 14590490A JP H0438477 A JPH0438477 A JP H0438477A
Authority
JP
Japan
Prior art keywords
delay time
audio amplifier
frequency components
measured
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14590490A
Other languages
Japanese (ja)
Inventor
Toshiharu Kasahara
笠原 寿治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP14590490A priority Critical patent/JPH0438477A/en
Publication of JPH0438477A publication Critical patent/JPH0438477A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To shorten a measuring time by subjecting the response output from an audio amplifier due to the input of an impulse wave to discrete Fourier transformation and calculating a phase with respect to respective required frequency components from a complex spectrum to calculate the delay time difference between other respective frequency components to a reference frequency component. CONSTITUTION:An analogue impulse wave is inputted to an audio amplifier 12 to be measured from a signal generator 14. The impulse response output of the audio amplifier 12 to be measured at this time is converted to a digital signal by an A/D converter to be subjected to Fourier transform by a discrete Fourier transformation device 16 like an FFT. The impulse wave is a multiple sine wave having infinite frequency components respectively starting from a zero phase and the complex spectra of respective frequency components are obtained from the transformation device 16. From the real and imaginary parts of the complex spectra with respect to required frequencies among them, for example, 1 kHz, the phases of said frequencies (spectra) are operated and the delay time of these phases is operated. For example, 1 kHz is set to reference frequency and the delay time differences with other frequency components to the reference frequency are respectively calculated. By this method, the delay time of each required frequency can be obtained by one measurement and a measuring time can be markedly shortened. Further, a delay time can be measured even in such a case that the audio amplifier to be measured is digital input and output.

Description

【発明の詳細な説明】 「産業上の利用分野」 この発明はオーディオ増幅器の周波数成分ごとの遅延時
間を、基準周波数の遅延時間、に対する差として求める
オーディオ増幅器の遅延時間測定方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for measuring delay time of an audio amplifier, in which the delay time of each frequency component of the audio amplifier is determined as a difference from the delay time of a reference frequency.

「従来の技術J 従来のオーディオ増幅器の遅延時間測定は第6図に示す
ようにして行われていた。すなわち、信号発生器11か
らある周波数の正弦波信号を発生し、その正弦波信号を
被測定オーディオ増幅器12へ供給し、その被測定オー
ディオ増幅器12の出力と信号発生器11の出力との位
相差を位相計13で測定し、同様にして信号発生器11
の出力正弦波信号の周波数を変更して、いくつかの周波
数について、被測定オーディオ増幅器12の入力信号と
出力信号の各位相差を測定する。その後、各周波数につ
いて測定した位相差から遅延時間をそれぞれ演算し、あ
る一つの周波数に対する遅延時間を基準とし、この遅延
時間と他の各周波数に対する遅延時間との差を求める。
``Prior art J'' Conventional delay time measurement of audio amplifiers was performed as shown in Fig. 6. That is, a sine wave signal of a certain frequency is generated from a signal generator 11, and the sine wave signal is subjected to The signal is supplied to the audio amplifier 12 to be measured, the phase difference between the output of the audio amplifier 12 under test and the output of the signal generator 11 is measured with a phase meter 13, and the signal generator 11 is similarly supplied.
The frequency of the output sine wave signal is changed, and each phase difference between the input signal and output signal of the audio amplifier under test 12 is measured for several frequencies. Thereafter, a delay time is calculated from the phase difference measured for each frequency, and using the delay time for one frequency as a reference, the difference between this delay time and the delay time for each other frequency is determined.

「発明が解決しようとする課題J この従来の測定方法では、複数の周波数についてその一
つずつ正弦波信号を発生して、位相差を測定するもので
あるから、測定に時間がか\る欠点があった。
``Problem to be Solved by the Invention'' In this conventional measurement method, sine wave signals are generated one by one for multiple frequencies and the phase difference is measured, so the disadvantage is that the measurement takes time. was there.

オーディオ増幅器として内部にデジタルイコライザを備
え、その等化周波数特性を適当に設定することができる
ようにされたものがある。このようなオーディオ増幅器
では人力および/または出力がデジタル信号の場合があ
り、このようにデジタル信号で入力または出力するオー
ディオ増幅器に対して第6図に示した測定方法で遅延時
間を測定することはできなかった。
Some audio amplifiers are equipped with an internal digital equalizer so that the equalization frequency characteristics can be set appropriately. In such audio amplifiers, the input and/or output may be digital signals, and it is not possible to measure the delay time using the measurement method shown in Figure 6 for audio amplifiers that input or output digital signals. could not.

「課題を解決するための手段j この発明によれば、被測定オーディオ増幅器にインパル
ス波を入力し、そのオーディオ増幅器からの応答出力を
離散的フーリエ変換し、その変換結果である複素スペク
トルから所要の各周波数成分について位相を求め、これ
ら位相から基準周波数成分に対する他の各周波数成分の
遅延時間差を求める。
According to the present invention, an impulse wave is input to the audio amplifier under test, the response output from the audio amplifier is subjected to discrete Fourier transform, and the required complex spectrum is obtained from the complex spectrum that is the result of the transform. The phase of each frequency component is determined, and the delay time difference of each other frequency component with respect to the reference frequency component is determined from these phases.

「実施例J 第1図はこの発明の実施例を示し、アナログ信号を入出
力とするオーディオ増幅器に、この発明を適用した場合
である。この発明では、信号発生器14からアナログの
インパルス波を発生して被測定オーディオ増幅器12へ
入力する。その時の被測定オーディオ増幅器12の出力
、つまりインパルス応答出力をAD変換器15でデジタ
ル信号に変換し、そのデジタルのインパルス応答信号を
FFT(高速フーリエ変換器)のような離散的ツーエリ
変換器16でフーリエ変換する。
Embodiment J FIG. 1 shows an embodiment of the present invention, in which the present invention is applied to an audio amplifier that inputs and outputs analog signals. The output of the audio amplifier under test 12 at that time, that is, the impulse response output, is converted into a digital signal by the AD converter 15, and the digital impulse response signal is subjected to FFT (fast Fourier transform). Fourier transform is performed using a discrete Two-Elli transformer 16, such as the following.

インパルス波はそれぞれがゼロ位相から始まる無限の周
波数成分をもつ多重正弦波であり、従って離散的ツーエ
リ変換器16から各周波数成分の複素スペクトルが得ら
れる。そのうちの所要の周波数、例えばIK七、2KH
z、3に±、4に七についての複素スペクトルの実部R
e1(i=1,23、−)と、虚部1mi (i=1.
2.3.−)が第2図に示すように得られる。これら実
部Reiと虚部■ll1iとからその周波数(スペクト
ル)の位相θH=tan−’ I mi/ Reiをそ
れぞれ演算する。
The impulse wave is a multiple sine wave with infinite frequency components, each starting from zero phase, so that the discrete Zuerli transformer 16 provides a complex spectrum of each frequency component. The required frequency, e.g. IK7, 2KH
The real part R of the complex spectrum for z, ± 3, 7 ± 4
e1 (i=1, 23, -) and the imaginary part 1mi (i=1.
2.3. -) is obtained as shown in FIG. The phase θH=tan-' I mi/Rei of the frequency (spectrum) is calculated from the real part Rei and the imaginary part ll1i.

これら位相θ、から周波数1KHzの遅延時間τ。From these phases θ, there is a delay time τ at a frequency of 1 KHz.

−−θi (360°X i xlooOセ)をそれぞ
れ演算する。更に一つの周波数、例えばIKI(zを基
準周波数とし、基準周波数成分に対する他の各周波数成
分との遅延時間差τ2−τ1.τ3−τ1.τ。
--θi (360°X i xlooO SE) are calculated respectively. Furthermore, one frequency, for example, IKI (where z is a reference frequency, the delay time difference τ2-τ1.τ3-τ1.τ between the reference frequency component and each other frequency component.

τ1をそれぞれ求める。Find τ1 for each.

このようにしてインパルス波を入力することにより、1
回の測定により、所要とする各周波数成分の基準周波数
成分に対する遅延時間差が得られる。
By inputting the impulse wave in this way, 1
The required delay time difference between each frequency component and the reference frequency component can be obtained by measuring the required times.

第3回は被測定オーディオ増幅器12がデジタル入力、
デジタル出力の場合の実施例である。この場合は信号発
生器17からデジタルのインパルス波を発生して被測定
オーディオ増幅器I2に印加し、その時のデジタルの出
力を離散的フーリエ変換器16へ直接入力すればよい。
In the third time, the audio amplifier 12 under test has digital input,
This is an example in the case of digital output. In this case, a digital impulse wave may be generated from the signal generator 17 and applied to the audio amplifier under test I2, and the digital output at that time may be input directly to the discrete Fourier transformer 16.

第4図は被測定オーディオ増幅器12がデジタル人力、
アナログ出力の場合で、この場合はデジタルのインパル
ス波を被測定オーディオ増幅器12に入力し、その時の
アナログ出力をAD変換器15でデジタル信号に変換し
て離散的フーリエ変換器16へ供給すればよい。第5図
は被測定オーディオ増幅器12がアナログ入力、デジタ
ル出力の場合で、二の場合はアナログのインパルス波を
被測定オーディオ増幅器12へ供給し、その時のデジタ
ルの出力を離散的フーリエ変換器16へ直接供給すれば
よい 「発明の効果」 以上述べたように、この発明によればインパルス波を被
測定オーディオ増幅器へ印加し、その出力をM数的フー
リエ変換することにより、1回の測定で所要の各周波数
成分の遅延時間を得ることができ、従来よりも測定時間
を著しく短くすることができる。また、被測定オーディ
オ増幅器がデジタルの人力および/または出力の場合も
、測定することができる。
In FIG. 4, the audio amplifier 12 under test is digitally powered,
In the case of analog output, in this case, a digital impulse wave is input to the audio amplifier under test 12, and the analog output at that time is converted to a digital signal by the AD converter 15 and then supplied to the discrete Fourier transformer 16. . FIG. 5 shows a case where the audio amplifier under test 12 has analog input and digital output. In the second case, an analog impulse wave is supplied to the audio amplifier under test 12, and the digital output at that time is sent to the discrete Fourier transformer 16. ``Effects of the invention'' that can be supplied directly As described above, according to the present invention, by applying an impulse wave to the audio amplifier under test and subjecting the output to M-number Fourier transform, the required amount can be obtained in one measurement. The delay time of each frequency component can be obtained, and the measurement time can be significantly shortened compared to the conventional method. It is also possible to measure when the audio amplifier under test has digital power and/or output.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の実施例を示すブロック図、第2図は
離散的フーリエ変換により得られた複素スペクトルの実
部と虚部と、位相と、遅延時間とを示す図、第3図乃至
第5図はそれぞれこの発明の他の実施例を示すプロ、り
図、第6回は従来の測定方法を示すブロック図である。 生 1 回 生2医 圃演歌   kHz  kHz kH2 kHz 実部 Re+ ez e3 e4 虚部 rrn m2 m3 m4 !延部間  1延時間差 τ2−τ1 m3−m1 τ4−τ1 牛3図 木5囮 6囮
FIG. 1 is a block diagram showing an embodiment of the present invention, FIG. 2 is a diagram showing the real part and imaginary part, phase, and delay time of a complex spectrum obtained by discrete Fourier transform, and FIGS. FIG. 5 is a schematic diagram showing other embodiments of the present invention, and Part 6 is a block diagram showing a conventional measuring method. Student 1 Student 2 Medical Enka kHz kHz kHz kHz 2 kHz Real part Re+ ez e3 e4 Imaginary part rrn m2 m3 m4! Between Enbe 1 total time difference τ2-τ1 m3-m1 τ4-τ1 Cow 3 figures Trees 5 decoys 6 decoys

Claims (1)

【特許請求の範囲】[Claims] (1)被測定オーディオ増幅器にインパルス波を入力し
、 そのオーディオ増幅器からの応答出力を離散的フーリエ
変換し、 その離散的フーリエ変換結果である複素スペクトルから
所要の各周波数成分について位相を求め、 これら位相から基準周波数成分に対する他の各周波数成
分の遅延時間差を求めることを特徴とするオーディオ増
幅器の遅延時間測定方法。
(1) Input an impulse wave to the audio amplifier under test, perform discrete Fourier transform on the response output from the audio amplifier, calculate the phase of each required frequency component from the complex spectrum that is the result of the discrete Fourier transform, and 1. A method for measuring delay time of an audio amplifier, characterized in that the delay time difference of each other frequency component with respect to a reference frequency component is determined from the phase.
JP14590490A 1990-06-04 1990-06-04 Method for measuring delay time of audio amplifier Pending JPH0438477A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14590490A JPH0438477A (en) 1990-06-04 1990-06-04 Method for measuring delay time of audio amplifier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14590490A JPH0438477A (en) 1990-06-04 1990-06-04 Method for measuring delay time of audio amplifier

Publications (1)

Publication Number Publication Date
JPH0438477A true JPH0438477A (en) 1992-02-07

Family

ID=15395750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14590490A Pending JPH0438477A (en) 1990-06-04 1990-06-04 Method for measuring delay time of audio amplifier

Country Status (1)

Country Link
JP (1) JPH0438477A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004198401A (en) * 2002-12-16 2004-07-15 Samsung Electronics Co Ltd Method of measuring filter characteristics, and measuring device thereof
JP2008302508A (en) * 2007-06-05 2008-12-18 Lihit Lab Inc Binder
WO2009022697A1 (en) * 2007-08-15 2009-02-19 Advantest Corporation Measuring apparatus, testing apparatus and measuring method
CN101930064A (en) * 2009-06-23 2010-12-29 华东电力试验研究院有限公司 Delay measuring method of merging unit and system thereof
CN103837771A (en) * 2014-02-28 2014-06-04 倪兆瑞 Merging unit time delay parameter measurement method of conventional mutual inductor
JP2019090738A (en) * 2017-11-16 2019-06-13 株式会社Dtsインサイト Transfer characteristic analyzer

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004198401A (en) * 2002-12-16 2004-07-15 Samsung Electronics Co Ltd Method of measuring filter characteristics, and measuring device thereof
JP2008302508A (en) * 2007-06-05 2008-12-18 Lihit Lab Inc Binder
WO2009022697A1 (en) * 2007-08-15 2009-02-19 Advantest Corporation Measuring apparatus, testing apparatus and measuring method
JP5225994B2 (en) * 2007-08-15 2013-07-03 株式会社アドバンテスト Measuring apparatus, test apparatus and measuring method
US8581571B2 (en) 2007-08-15 2013-11-12 Advantest Corporation Measuring apparatus, testing apparatus and measuring method
CN101930064A (en) * 2009-06-23 2010-12-29 华东电力试验研究院有限公司 Delay measuring method of merging unit and system thereof
CN103837771A (en) * 2014-02-28 2014-06-04 倪兆瑞 Merging unit time delay parameter measurement method of conventional mutual inductor
JP2019090738A (en) * 2017-11-16 2019-06-13 株式会社Dtsインサイト Transfer characteristic analyzer

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