JPH0438456A - Apparatus for inspecting surface state - Google Patents

Apparatus for inspecting surface state

Info

Publication number
JPH0438456A
JPH0438456A JP2144977A JP14497790A JPH0438456A JP H0438456 A JPH0438456 A JP H0438456A JP 2144977 A JP2144977 A JP 2144977A JP 14497790 A JP14497790 A JP 14497790A JP H0438456 A JPH0438456 A JP H0438456A
Authority
JP
Japan
Prior art keywords
inspected
image data
frequency distribution
standard deviation
imaging device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2144977A
Other languages
Japanese (ja)
Inventor
Yoichi Sato
洋一 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sekisui Chemical Co Ltd
Original Assignee
Sekisui Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sekisui Chemical Co Ltd filed Critical Sekisui Chemical Co Ltd
Priority to JP2144977A priority Critical patent/JPH0438456A/en
Publication of JPH0438456A publication Critical patent/JPH0438456A/en
Pending legal-status Critical Current

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  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To inspect the surface state of an object to be inspected by obtaining a large number of adaptation coefficients F with respect to the successively inputted image data of respective objects to be inspected to form the frequency distribution thereof and comparing the adaptation coefficient F of each object to be inspected with the threshold value determined from the mean value and standard deviation thereof. CONSTITUTION:A television camera 10 transmits a multilevel image sampled in a pixel unit to an inspection apparatus 20. A large number of adaptation coefficients F are obtained with respect to the successively inputted image data of respective objects to be inspected to form the frequency distribution thereof and the mean value Fmu and standard deviation Fsigma of the frequency distribution are calculated to determine a threshold value according to T=Fmu + Fsigma and the adaptation coefficient F calculated with respect to each object to be inspected with the threshold value T to inspect the surface state of the object to be inspected.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、表面に存在するキズ、ごみ、ざらつき、色む
ら(色調の濃淡)等、表面状態を検出する表面状態検査
装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a surface condition inspection device that detects surface conditions such as scratches, dust, roughness, and uneven color (shading of color tone) existing on a surface.

[従来の技術] 従来、表面キズ検査装置として、被検査体の表面にHe
 −Neレーザー光を照射し、これかキズの凹凸によっ
て、散乱される程度により、表面におけるキズの存在を
検出するものかある。
[Prior art] Conventionally, as a surface flaw inspection device, He was applied to the surface of an object to be inspected.
-Ne laser light is irradiated, and the presence of scratches on the surface is detected based on the degree to which it is scattered by the unevenness of the scratches.

[発明が解決しようとする課題〕 然しながら、上記従来の光照射−散乱方式による表面キ
ズ検査装置には、下記■〜■の問題点がある。
[Problems to be Solved by the Invention] However, the above conventional surface flaw inspection apparatus using the light irradiation-scattering method has the following problems (1) to (4).

■光学系か複雑であり、装置が大型となる。■The optical system is complicated and the device is large.

■表面の凹凸を伴なわない色むら等の表面状態は検出で
きない。
■Surface conditions such as color unevenness that are not accompanied by surface irregularities cannot be detected.

■検出結果と、人間の目でとらえた感覚が必ずしも一致
しない。
■Detection results do not necessarily match the sense perceived by the human eye.

本発明は、コンパクトな装置構成により、色むら等も含
めた表面状態を、人間に近い感覚て確実に検査すること
を目的とする。
An object of the present invention is to use a compact device configuration to reliably inspect surface conditions, including color unevenness, with a feeling similar to that of humans.

[課題を解決するための手段] 本発明は、被検査体の表面を撮像する撮像装置と、撮像
装置の撮像結果に基づいて被検査体の表面状態を検定す
る検定装置と、検定装置の検定結果を出力する出力装置
とを有して構成される表面状態検査装置てあって、検定
装置は、撮像装置か撮像した画像データに対する濃度ヒ
ストクラムn (K)を求め、該濃度ヒストグラムn 
(K)に基づく平均値μ、標準偏差σを求め、上記平均
値μ、標準偏差σをもつ正規分布に従う各濃度の理論度
数g (K)を求め、上記濃度ヒストクラムn (K)
と上記理論度数g (K)との差に相当する適合係数F
を求め、この適合係数Fを求める演算動作な撮像装置か
ら次々と入力される各被検査体の画像データについて行
なうことにて多数の適合係数Fを得てその度数分布を作
成し、その度数分布の平均値Fμと標準偏差Fσを求め
、しきい値をT=Fμ+Fσにて定め、各被検査体につ
いて求めた適合係数Fを上記しきい値Tと比較すること
により、被検査体の表面状態を検定するようにしだもの
である。
[Means for Solving the Problems] The present invention provides an imaging device that images the surface of an object to be inspected, a verification device that verifies the surface state of the object to be inspected based on the imaging result of the imaging device, and a verification device for the verification device. There is a surface condition inspection device configured to include an output device that outputs a result, and the verification device calculates a density histogram n (K) for image data captured by an imaging device, and calculates the density histogram n
(K), calculate the theoretical frequency g (K) of each concentration that follows a normal distribution with the above average value μ and standard deviation σ, and calculate the above concentration histogram n (K).
The compatibility coefficient F corresponds to the difference between the theoretical frequency g (K) and the above theoretical frequency g (K)
The calculation operation for calculating the compatibility coefficient F is performed on the image data of each inspected object that is input one after another from the imaging device, thereby obtaining a large number of compatibility coefficients F and creating their frequency distribution. The surface condition of the object to be inspected can be determined by determining the average value Fμ and standard deviation Fσ of It is designed to test the

[作用コ 本発明によれば、下記■〜■の作用がある。[Action Co. According to the present invention, the following effects (1) to (4) are achieved.

■テレビカメラ等の汎用性のある撮像装置を用いて表面
状態を検出てき、装置構成をコンパクトにてきる。
■The surface condition can be detected using a versatile imaging device such as a television camera, and the device configuration can be made more compact.

0表面の濃度分布状態により表面状態を検出するもので
あるため、色むら等も含めた表面状態を人間に近い感覚
て検出てきる。
Since the surface condition is detected based on the concentration distribution state of the 0 surface, the surface condition including color unevenness can be detected with a sense similar to that of humans.

■多数の画像データについて、濃度ヒストクラムn (
K)と理論度数g (K)との差に相当する適合係数F
を求め、その度数分布の平均値Fμと標準偏差Fσに基
づいて定めたしきい値Tにより、各被検査体について求
めた適合係数Fを比較し、被検査体の表面状態を検定す
ることとした。これにより、被検査体の良否を確実に分
離し、検定精度を向上てきる。
■Concentration histogram n (
compatibility coefficient F corresponding to the difference between K) and the theoretical frequency g (K)
is determined, and the conformity coefficient F determined for each object to be inspected is compared using a threshold value T determined based on the average value Fμ and standard deviation Fσ of the frequency distribution, and the surface condition of the object to be inspected is verified. did. Thereby, it is possible to reliably separate whether the object to be inspected is good or bad, and to improve the accuracy of the test.

又、検定の基準となるしきい値の設定を自動で行なえる
In addition, threshold values that serve as standards for verification can be automatically set.

[実施例] 第1図は本発明の検査装置の一例を示すブロック図、第
2図は画像データを示す模式図、第3図は本発明による
検査手順を示す流れ図、第4図は適合係数の度数分布を
示す模式図である。
[Example] Fig. 1 is a block diagram showing an example of the inspection device of the present invention, Fig. 2 is a schematic diagram showing image data, Fig. 3 is a flowchart showing the inspection procedure according to the present invention, and Fig. 4 is a compatibility coefficient. FIG. 2 is a schematic diagram showing the frequency distribution of .

表面状態検査装置1は、テレビカメラ10(撮像装置)
と、検定装置20と、出力装置3oとを有し、被検査体
である例えば熱可塑性発泡体シートの表面の異常の有無
を検査する。
The surface condition inspection device 1 includes a television camera 10 (imaging device)
, a verification device 20, and an output device 3o, and inspects the surface of an object to be inspected, such as a thermoplastic foam sheet, for abnormalities.

表面状態検査装置〕の基本的動作は下記(1)〜(4)
である。
The basic operations of the surface condition inspection device are as follows (1) to (4).
It is.

(1)テレビカメラ10により、発泡体シートの表面を
撮像する。
(1) The surface of the foam sheet is imaged by the television camera 10.

テレビカメラ10は、画素単位てサンプリングした多値
画像を検定装置20に転送する。
The television camera 10 transfers a multivalued image sampled pixel by pixel to the test device 20.

(2)検定装置20は、テレビカメラ10の撮像データ
をA/D変換器21て例えば8ビツト(256階調)に
て量子化し、MXN画素のデジタル画像を作り、これを
画像メモリ22に入力する。
(2) The verification device 20 quantizes the image data of the television camera 10 using the A/D converter 21, for example, at 8 bits (256 gradations), creates a digital image of MXN pixels, and inputs this into the image memory 22. do.

(3)検定袋W20は、画像メモリ22に入力された画
像に基づいて、CPU23により表面の異常の有無を検
定する。
(3) Based on the image input to the image memory 22, the inspection bag W20 is inspected by the CPU 23 to see if there is any abnormality on its surface.

(4)出力装置30は、検定装置20の検定結果を表示
し、必要により警報を発生せしめる。
(4) The output device 30 displays the test results of the test device 20 and generates an alarm if necessary.

尚、撮像装置(10)としては、テレビカメラの代わり
に、M個の空間分解能を持つラインセンサを用いても良
く、この場合には、ラインセンサと被検査体とを相対移
動させ、得られるN個群のデータを画像メモリに蓄える
Note that as the imaging device (10), a line sensor having M spatial resolution may be used instead of the television camera. In this case, the line sensor and the object to be inspected are moved relative to each other, N groups of data are stored in the image memory.

検定装置20は、必すしも画像メモリ22を用いず、A
/D変換器21の出力データを直接的にCPU23に入
力しても良い。
The verification device 20 does not necessarily use the image memory 22, and the
The output data of the /D converter 21 may be input directly to the CPU 23.

然るに、上記検定装置20による検定動作は下記■〜■
の如くなされる(第3図参照)。
However, the verification operation by the verification device 20 is as follows.
This is done as follows (see Figure 3).

■MXN画素の画像データに対して、濃度ヒストグラム
n (k)を求める(k:濃度値、n:度数)。
(2) Obtain a density histogram n (k) for the image data of MXN pixels (k: density value, n: frequency).

この濃度ヒストグラムn (k)の作成に際しては、被
検査体において予め予想される異常部分の大きさ、或い
はテレビカメラ10によるサンプリング密度によっては
、検定装置20に入力されたMXN画素全てを使わなく
とも、その中のmXn(n5M、n≦N)画素(第2図
(A)参照)や、又例えばNが偶数の画素(第2図(B
)参照)のようにMXN画素の一部を用いても良い。
When creating this density histogram n (k), depending on the size of the abnormal part predicted in advance in the test object or the sampling density by the television camera 10, it may not be necessary to use all MXN pixels input to the verification device 20. , mXn (n5M, n≦N) pixels (see Figure 2 (A)), or pixels where N is an even number (Figure 2 (B)).
) may also be used as part of the MXN pixels.

■ヒストグラムを滑らかにするため各濃度値を隣同士で
平均化する。例えば、濃度値にの度数n ’ (K)を n’(K)= In (k−2) + 2 n (K−
1)+ 3 n (K) + 2 n (K+1)+ 
 n  (k+2)   コ / 9        
  ・・・ (1)で置き換える。
■Average each density value next to each other to make the histogram smooth. For example, the frequency n' (K) for the density value is n' (K) = In (k-2) + 2 n (K-
1) + 3 n (K) + 2 n (K+1) +
n (k+2) ko / 9
...Replace with (1).

■上記平均化した濃度ヒストグラムn′(K)に基づき
、その平均値μ、標準偏差σを求める。
(2) Based on the averaged density histogram n'(K), find its average value μ and standard deviation σ.

Σ k−n’(K) Σn ’ (K)             ・・・(
3)■濃度ヒストクラムn ’ (K)の平均値μ、標
準偏差σをもつ正規分布N(μ、σ2)に従う各濃度の
理論度数g (K)を算出する。
Σ k−n'(K) Σn' (K) ...(
3) ■ Calculate the theoretical frequency g (K) of each concentration according to the normal distribution N (μ, σ2) with the average value μ and standard deviation σ of the concentration histogram n ′ (K).

■濃度ヒストグラムn ’ (K)と理論度数g (K
)との差に相当する適合係数Fを下記(4)式又は(5
)式により求める。但し、この適合係数Fは、g (K
)≠0の濃度値について求め、又(4)式と(5)式に
おいてiビット量子化ならばL=2421である。
■Concentration histogram n' (K) and theoretical frequency g (K
) is calculated using the following formula (4) or (5).
) is calculated using the formula. However, this compatibility coefficient F is g (K
)≠0, and in equations (4) and (5), if i-bit quantization is performed, L=2421.

g (K) ・・・(4) g (K)           ・・・(5)■上記
■の適合係数Fを求める演算動作をテレビカメラ10か
ら次々と入力される各被検査体の画像データについて行
なうことにて多数の適合係数Fを得てその度数分布を作
成する。
g (K) ... (4) g (K) ... (5) ■ The calculation operation for determining the conformity coefficient F described in (■) above is performed on the image data of each object to be inspected that is input one after another from the television camera 10. In this way, a large number of compatibility coefficients F are obtained and a frequency distribution thereof is created.

■上記■て求めた度数分布の平均値Fμと標準偏差Fσ
を求める。そして、しきい値Tを下記(6)式にて定め
る。
■Mean value Fμ and standard deviation Fσ of the frequency distribution obtained by ■ above
seek. Then, the threshold value T is determined by the following equation (6).

T=Fμ+cFσ(cは定数)   −(6)■各被検
査体について求めた適合係数Fを上記しきい値Tと比較
し、 F≦T   :良品 F>T    :不良品      ・・・(7)と判
定し、結果を出力する(第4図参照)。
T=Fμ+cFσ (c is a constant) - (6) ■Compare the conformity coefficient F obtained for each object to be inspected with the above threshold T, F≦T: Good product F>T: Defective product ... (7) The result is output (see Figure 4).

次に、上記実施例の作用について説明する。Next, the operation of the above embodiment will be explained.

■テレビカメラ10等の汎用性のある撮像装置を用いて
表面状態を検出でき、装置構成をコンパクトにてきる。
- Surface conditions can be detected using a versatile imaging device such as the television camera 10, and the device configuration can be made compact.

又、処理内容が単純てあって、表面状態を短時間て検定
てき被検査体の搬送ライン上でも検査を完了できる。
Moreover, the processing contents are simple, and the surface condition can be verified in a short time, and the inspection can be completed even on the conveyance line of the object to be inspected.

■表面の濃度分布状態により表面状態を検出するもので
あるため、色むら等も含めた表面状態を、人間に近い感
覚て検出できる。
■Since the surface condition is detected based on the surface concentration distribution, it is possible to detect the surface condition, including color unevenness, with a sense similar to that of humans.

■多数の画像データについて、濃度ヒストグラムn ’
 (K)と理論度数g (Kl との差に相当する適合
係数Fを求め、その度数分布の平均値Fμと標準偏差F
σに基づいて定めたしきい値Tにより、各被検査体につ
いて求めた適合係数Fを比較し、被検査体の表面状態を
検定することとした。これにより、被検査体の良否を確
実に分離し、検定精度を向上てきる。
■Density histogram n' for a large number of image data
(K) and the theoretical frequency g (Kl), and calculate the mean value Fμ and standard deviation F of the frequency distribution.
The conformity coefficient F obtained for each object to be inspected was compared using a threshold value T determined based on σ, and the surface condition of the object to be inspected was verified. Thereby, it is possible to reliably separate whether the object to be inspected is good or bad, and to improve the accuracy of the test.

又、検定の基準となるしきい値の設定を自動で行なえる
In addition, threshold values that serve as standards for verification can be automatically set.

[発明の効果コ 以上のように本発明によれば、コンパクトな装置構成に
より、色むら等も含めた表面状態を、人間に近い感覚で
確実に検査てきる。
[Effects of the Invention] As described above, according to the present invention, surface conditions including color unevenness etc. can be reliably inspected with a sense similar to that of humans using a compact device configuration.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の検査装置の一例を示すブロック図、第
2図は画像データを示す模式図、第3図は本発明による
検査手順を示す流れ図、第4図は適合係数の度数分布を
示す模式図である。 10・・・撮像装置、 0・・・検定装置、 30・・・出力装犀。
Fig. 1 is a block diagram showing an example of the inspection device of the present invention, Fig. 2 is a schematic diagram showing image data, Fig. 3 is a flowchart showing the inspection procedure according to the invention, and Fig. 4 shows the frequency distribution of the conformity coefficient. FIG. 10... Imaging device, 0... Verification device, 30... Output equipment.

Claims (1)

【特許請求の範囲】[Claims] (1)被検査体の表面を撮像する撮像装置と、撮像装置
の撮像結果に基づいて被検査体の表面状態を検定する検
定装置と、検定装置の検定結果を出力する出力装置とを
有して構成される表面状態検査装置であって、検定装置
は、撮像装置が撮像した画像データに対する濃度ヒスト
グラムn(K)を求め、該濃度ヒストグラムn(K)に
基づく平均値μ、標準偏差σを求め、上記平均値μ、標
準偏差σをもつ正規分布に従う各濃度の理論度数g(K
)を求め、上記濃度ヒストグラムn(K)と上記理論度
数g(K)との差に相当する適合係数Fを求め、この適
合係数Fを求める演算動作を撮像装置から次々と入力さ
れる各被検査体の画像データについて行なうことにて多
数の適合係数Fを得てその度数分布を作成し、その度数
分布の平均値Fμと標準偏差Fσを求め、しきい値をT
=Fμ+Fσにて定め、各被検査体について求めた適合
係数Fを上記しきい値Tと比較することにより、被検査
体の表面状態を検定するものである表面状態検査装置。
(1) It has an imaging device that images the surface of the object to be inspected, a test device that tests the surface condition of the test object based on the imaging results of the imaging device, and an output device that outputs the test results of the test device. The verification device obtains a density histogram n(K) for the image data captured by the imaging device, and calculates the average value μ and standard deviation σ based on the density histogram n(K). The theoretical frequency g(K
) is calculated, and a fitting coefficient F corresponding to the difference between the density histogram n(K) and the theoretical frequency g(K) is calculated, and the calculation operation for calculating the fitting coefficient F is performed for each object input one after another from the imaging device. By performing this on the image data of the inspection object, a large number of conformity coefficients F are obtained and a frequency distribution thereof is created.The average value Fμ and standard deviation Fσ of the frequency distribution are determined, and the threshold value is set as T.
A surface condition inspection apparatus that verifies the surface condition of an object to be inspected by comparing the conformity coefficient F determined for each object to the above threshold T, determined by =Fμ+Fσ.
JP2144977A 1990-06-01 1990-06-01 Apparatus for inspecting surface state Pending JPH0438456A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2144977A JPH0438456A (en) 1990-06-01 1990-06-01 Apparatus for inspecting surface state

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2144977A JPH0438456A (en) 1990-06-01 1990-06-01 Apparatus for inspecting surface state

Publications (1)

Publication Number Publication Date
JPH0438456A true JPH0438456A (en) 1992-02-07

Family

ID=15374608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2144977A Pending JPH0438456A (en) 1990-06-01 1990-06-01 Apparatus for inspecting surface state

Country Status (1)

Country Link
JP (1) JPH0438456A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993018471A1 (en) * 1992-03-06 1993-09-16 Omron Corporation Image processor, method therefor and apparatus using the image processor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993018471A1 (en) * 1992-03-06 1993-09-16 Omron Corporation Image processor, method therefor and apparatus using the image processor

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