JPH04355374A - Apparatus for inspecting electronic circuit board - Google Patents

Abstract

PURPOSE:To facilitate the test of high density electronic parts by narrowing the interval between test pins by reducing the size and diameter of said pins by driving the test pins by magnetic force to bring the same into contact with the measuring part of an electronic circuit board. CONSTITUTION:The test pins 11 measuring the electric resistance and voltage of the parts mounted on an electronic circuit board 18 are fitted in the holes 21a of a test pin holding plate in a freely slidable manner. The leading end parts of the test pins 11 are made gradually finer and the rear end parts 11b thereof are magnetized or provided with permanent magnets 17 and an N-pole is constituted at the open ends thereof. An electromagnet 13 is provided to the under surface of the support plate 25 above the holding plate 21 in opposed relation to the magnets 17. By allowing a current to flow to the test pins 11 from a power supply part 28 so as to generate an N-pole on the side opposed to the rear end parts 11b of the test pins 11 to magnetize said rear end parts, the test pins 11 are moved in the direction coming into contact with the board 18 by the mutual repulsive force of the N-pole of the magnets 17 and the N-pole of the electromagnet 13.

Description

[Detailed description of the invention]

0001

[Industrial Application Field] The present invention relates to an electronic circuit board testing device, and more particularly, the present invention relates to a test device for testing electronic circuit boards, and in particular, it applies a magnetic force to a test pin to bring the tip of the test pin into contact with a predetermined portion of the electronic circuit board. The present invention relates to an electronic circuit board testing device that eliminates the need for coil springs, enables test pins to be made smaller, particularly smaller in diameter, and is suitable for testing the electrical characteristics of electronic components with extremely small wiring intervals.

0002

2. Description of the Related Art Conventionally, as a method for inspecting whether or not the wiring of an electronic circuit board that has been soldered is correctly performed, a plurality of test pins arranged on a base 1 are used as shown in FIGS. 7 to 9. Electronic circuit board 3 with electronic components mounted on 2
The test pin 2 is brought into contact with the electronic component or the circuit pattern part, and the cylinder 4 is activated to press the electronic circuit board 3 in the direction of arrow A through the pressing plate 5 to increase the contact force and make the contact. After making sure of this, a voltage is applied to the electronic circuit board 3 through the test pin 2, and the measuring device 6 determines whether or not it operates normally.

As shown in FIG. 9, the test pin 2 has a structure in which the test pin 2 is mounted inside a pipe 7, and the tip 2a is inserted into a hole 7b formed in one end 7a of the pipe 7 so as to protrude. The rear end 2b of the test pin 2 is inserted into a hole in a spring receiving plate 8 fixed inside the pipe 7, and guides the test pin 2 sliding in the direction of arrow B or C.

A compression spring 9 is disposed between a large diameter portion 2c formed approximately at the center of the test pin 2 and a spring receiving plate 8, and constantly presses and biases the test pin 2 in the direction of arrow C. However, the difference in height of the electronic components mounted on the electronic circuit board 3, the warpage of the electronic circuit board 3, etc. are absorbed by the compression spring 9, and the spring force of the compression spring 9 ensures the contact.

However, in the conventional electronic circuit board testing device, the test pin 2 has a complicated structure and has a minimum diameter of 1.
It has the disadvantage of being large, from 1.2 mm to 1.2 mm.
As a result, it is becoming impossible to test the electronic circuit board 3 on which electronic components such as chip components are mounted, which have become increasingly smaller and denser in recent years and the lead wire spacing has become narrower.

Furthermore, since the compression spring 9 is built into the pipe 7, the state of the compression spring 9 cannot be seen from the outside.
It is difficult to detect even if a predetermined contact force is not secured due to a weakened or bent spring, and the electronic circuit board 3 acts as if it is defective, which not only reduces work efficiency but also causes damage to the spring. However, there was a drawback that the reliability of the test could be reduced.

[0007]

SUMMARY OF THE INVENTION The present invention has been made to eliminate the drawbacks of the prior art described above, and its purpose is to measure electronic circuit boards by driving test pins with magnetic force. By bringing the test pins into contact with the test pins, it is possible to make the test pins smaller, particularly to make them smaller in diameter, and to arrange the pins with narrower spacing, thereby making it possible to easily test even high-density electronic components. Another purpose is to ensure that the test pins and the measuring portion of the electronic circuit board are in contact with each other with a predetermined contact force, thereby eliminating the need for maintenance work on the testing device and improving work efficiency.

[0008]

[Means for Solving the Problems] In short, the present invention (claim 1) is to hold a plurality of test pins slidably in the axial direction thereof, and to apply the tips of the test pins to predetermined portions of an electronic circuit board. In an electronic circuit board inspection device that tests the electrical characteristics of the electronic circuit board by bringing the electronic circuit board into contact with the electronic circuit board, the electronic circuit board is slidably held in the axial direction of the base at a position opposite to a predetermined test portion of the electronic circuit board and is used for measurement. A plurality of test pins are each electrically connected to the device, and a magnetic force is applied to the test pins to apply an attractive force or a repulsive force to the test pins, so that the tips of the test pins are attached to predetermined portions of the electronic circuit board. and a magnetic force generating device for bringing the test pins into contact with the electronic circuit board, and the test pin is configured to apply the necessary contact force between the test pin and the electronic circuit board to the test pin by the magnetic force from the magnetic force generating device. . The present invention (claim 2) also provides a method for holding a plurality of test pins so as to be slidable in the axial direction thereof, and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board to generate electricity on the electronic circuit board. In an electronic circuit board inspection device for testing characteristics, a magnet is mounted on a base at a position facing a predetermined test portion of the electronic circuit board so as to be slidable in its axial direction, and has a magnet with uniform polarity at its rear end. A plurality of test pins are each fixed and electrically connected to a measuring device, and when the test pins are arranged opposite to the magnets and energized, the same polarity of the magnets face each other and repel the test pins. The electronic circuit board is characterized by comprising an electromagnet that applies force to bring the tip end into contact with a predetermined portion of the electronic circuit board. The present invention (claim 3) also provides a method for holding a plurality of test pins so as to be slidable in the axial direction thereof, and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board to generate electricity on the electronic circuit board. In an electronic circuit board inspection device for testing characteristics, a permanent magnet is fixed to each rear end and is held slidably in the axial direction on a base at a position facing a predetermined test portion of the electronic circuit board. and a plurality of test pins each electrically connected to a measuring device, and another permanent magnet arranged such that the same polarity as the permanent magnet of the test pin is opposite to the permanent magnet of the test pin. The tip end portion is configured to abut against a predetermined portion of the electronic circuit board by a repulsive force between the magnet and the other permanent magnet. Also, the present invention (claim 4)
is an electronic circuit board that tests the electrical characteristics of an electronic circuit board by holding a plurality of test pins slidably in the axial direction and bringing the tips of the test pins into contact with a predetermined part of the electronic circuit board. In the inspection device, a plurality of tests made of a magnetic material are held slidably in the axial direction on a base at a position facing a predetermined inspection portion of the electronic circuit board, and are each electrically connected to the measurement device. A pin is disposed on the back side of the electronic circuit board that the tip of the test pin comes into contact with, and when energized, a suction force is applied to the test pin and the tip is attached to a predetermined portion of the electronic circuit board. The device is characterized in that it includes an electromagnet that is brought into contact with the device. The present invention (claim 5) also provides a method for holding a plurality of test pins so as to be slidable in the axial direction thereof, and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board to generate electricity on the electronic circuit board. In an electronic circuit board inspection device for testing characteristics, the electronic circuit board is slidably held in the axial direction of the base at a position opposite to a predetermined test portion of the electronic circuit board, and is electrically connected to a measuring device. A plurality of test pins made of a magnetic material are arranged on the back side of the electronic circuit board that the tips of the test pins come into contact with, and an attractive force due to magnetic force is applied to the test pins so that the tips of the test pins are attached to the electronic circuit board. A plurality of test pins are slidably held in the axial direction, and the tips of the test pins are brought into contact with predetermined parts of the electronic circuit board. In an electronic circuit board inspection device that tests the electrical characteristics of the electronic circuit board by bringing the electronic circuit board into contact with the electronic circuit board, the electronic circuit board is slidably held in the axial direction of the base at a position opposite to a predetermined test portion of the electronic circuit board and is used for measurement. A plurality of test pins each made of a magnetic material are electrically connected to the device, and a plurality of test pins are disposed on the back side of the electronic circuit board where the tips of the test pins come into contact, and an attractive force due to magnetic force is applied to the test pins. and a permanent magnet that brings the tip end into contact with a predetermined portion of the electronic circuit board. Further, the present invention (claim 6) provides a method for holding a plurality of test pins so as to be slidable in the axial direction thereof, and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board to generate electricity on the electronic circuit board. In inspection equipment for electronic circuit boards that test characteristics,
A test pin in which a magnetized part whose tip part is gradually narrowed and a magnetic force is applied to the rear end part is disposed, and the test pin is held slidably in the axial direction of the test pin and has the same magnetic pole as the magnetic pole of the magnetized part. a test pin holder that fixes and supports permanent magnets arranged so that they face each other, the test pin is protruded by a repulsive force between the magnetized part and the permanent magnet, and the tip part is electronically The device is characterized in that it is configured so as to come into contact with a predetermined portion of the circuit board.

[0009]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be explained below based on embodiments shown in the drawings. 1 to 5, an electronic circuit board inspection device 10 according to the present invention includes a test pin 11, an electromagnet 13 or permanent magnet 14, which is an example of a magnetic force generating device 12, and a test pin holder 15.

First, a first embodiment of the present invention will be explained with reference to FIG. The test pin 11 is used to measure electrical resistance, voltage, etc. by contacting a predetermined part of an electronic circuit board 18 on which an electronic component 16 is mounted. The surface of the circuit board 18 is made of iron with a diameter of 0.3 mm and is plated with gold, for example, so as not to affect the measured values of the electrical characteristics of the circuit board 18. A hole 21a formed at a predetermined position (corresponding to the measurement site of the electronic circuit board 18) of the test pin holding plate 21 which is disposed so as to be fitted into the hole 21a.
A plurality of pieces are fitted to each other so as to be slidable in the vertical direction in the figure.

The tip portion 11a is gradually tapered and has a shape that allows it to contact any narrow portion of the electronic circuit board 18, and that when it makes contact, the contact pressure is sufficiently high to reduce the contact resistance. It has become. The rear end portion 11b is
A magnetized or fixed permanent magnet 17 is provided, for example with a north pole configured at the open end. and each test pin 11
An electric cord 22 is connected to the unit to transmit a signal to a measuring device 23.

The electromagnet 13 is for applying magnetic force to the magnetized permanent magnet 17 of the rear end portion 11b to ensure that the test pin 11 contacts the electronic circuit board 18.
The test pin 11 is attached to the lower surface of the support plate 25 which is fixed above the test pin holding plate 21 via a stud 24.
The conductor 26 disposed opposite the permanent magnet 17 is a known electromagnet wound into a coil, and the conductor 26
is connected to the power supply section 28, and a current is passed from the power supply section 28 to generate magnetic force.

In the present invention, a current is applied from the power source 28 to the side facing the rear end 11b of the test pin 11 to generate an N pole, thereby magnetizing the permanent magnet 17.
The test pin 11 is moved in a direction closer to the electronic circuit board 18 by the repulsive force between the pole and the north pole of the electromagnet 13. In addition, the direction of current from the power supply section 28 is reversed to that described above, and the rear end portion 11b of the test pin 11 is
An S pole is formed on the side opposite to the test pin 11, and the test pin 11 is attracted and detached from the electronic circuit board 18.

Next, a second embodiment of the present invention will be explained with reference to FIG. Since this embodiment only uses a permanent magnet 14 instead of the electromagnet 13 of the first embodiment, the same parts are given the same numbers and detailed explanations will be omitted.

Connect the N pole of the other permanent magnet 14 to the permanent magnet 17 of the test pin 11 whose open end is magnetized to the N pole by arrow D.
By approaching the test pin 11 in the direction shown in FIG. It is also clear that if the S pole of the permanent magnet 14 is opposed to the permanent magnet 17, the test pin 11 will be attracted and detached from the electronic circuit board 18.

Next, a third embodiment of the present invention will be explained with reference to FIG. 3. Similar to the first embodiment, the tip end 11a of the test pin 11 is formed to be gradually narrowed, and the rear end 11a is formed to be gradually narrower.
1b is formed to be thicker than the test pin 11, and is connected to the permanent magnet 17 so that an N pole is formed at the open end.
is fixed. The test pin holder 15 is for storing the test pin 11 and sliding it while guiding it in the direction of arrow H or I, and has a large diameter hole 15a and a small diameter hole 15b formed in the axial direction in the center. small diameter hole 15
A small diameter portion of the test pin 11 is fitted into the hole 15b so as to be slidable in the direction of arrow H or I, and a rear end portion 11b to which a permanent magnet 17 is fixed is housed in the large diameter hole 15a. Larger diameter hole 1
The N pole of another permanent magnet 14 is connected to the test pin 1 at the end of 5a.
The test pin 11 is always fixed by the repulsive force between the N pole of the permanent magnet 17 and the N pole of the permanent magnet 14 at the rear end portion 11b of the test pin 11. It is designed to be biased in the direction of arrow H.

A fourth embodiment of the present invention will be described with reference to FIG. 4. An electromagnet having a conductor 26 wound in a coil shape on a base 19 and connected to a power supply section 28 in the same manner as described in the description of the one in FIG. 13 are arranged. A circuit board support stand 29 is disposed above the electromagnet 13 with a slight gap and is fitted into a guide pin 20 implanted in the base stand 19.

Further above the circuit board support stand 29, a test pin holding plate 21 is provided which is slidably fitted onto the guide pin 20 in the direction of arrow J or K. A plurality of test pins 11 are fitted into holes 21a formed at predetermined positions (corresponding to measurement portions of the electronic circuit board 18) so as to be slidable in the vertical direction in the figure.

The tip 11a of the test pin 11 is gradually tapered so that it can contact any narrow part of the electronic circuit board 18, and when it makes contact, the contact pressure is sufficiently high to reduce the contact resistance. It is shaped like this. The rear end portion 11b is formed as a large diameter portion, and when the test pin holding plate 21 is moved in the direction of arrow K, the large diameter rear end portion 11b engages with the hole 21a and moves along with the test pin holding plate 21 in the direction of the arrow K. Move in the K direction, test pin 11
is detached from the electronic circuit board 18.

Furthermore, each test pin 11 is equipped with a measuring device 23.
An electric cord 22 is connected between the measuring device 23 and
It is designed to transmit signals to the and power supply section 28
By passing a current through the electromagnet 13 to generate magnetic force, the magnetic force is applied to the test pin 11 via the electronic circuit board 18 and is attracted to the test pin 11 and the electronic circuit board 18.
This ensures reliable contact with the measurement site.

Next, a fifth embodiment of the present invention will be explained with reference to FIG. 5. A permanent magnet 14 is used in place of the electromagnet 13 of the fourth embodiment shown in FIG. When the permanent magnet 14 is moved in the direction, the magnetic force of the permanent magnet 14 acts on the test pin 11 via the electronic circuit board 18 and attracts the test pin 11 (in the direction of arrow O), and the test pin 11 and the electronic circuit board 18 are measured. Since it is designed to ensure that the parts are in contact with each other, parts that are the same as those in the fourth embodiment are designated by the same reference numerals in the drawings, and explanations thereof will be omitted.

The present invention is configured as described above,
The effect will be explained below. In the first embodiment of the present invention, in FIGS. 1 and 6, in order to test the electronic circuit board 18, first, a current is passed through the electromagnet 13 from the power supply section 28, and the S pole is placed on the side facing the rear end section 11b. The test pin 11 whose open end is magnetized to the N pole is attracted and moved upward in the figure to retract the tip 11a of the test pin 11 to the extent that it does not interfere with the mounting of the electronic circuit board 18.

Next, after placing the electronic circuit board 18 at a predetermined position on the base 19, when the power to the electromagnet 13 is cut off, the test pin 11 is guided into the hole 21a of the test pin holding plate 21 by its own weight. It descends and lightly touches a predetermined position on the electronic circuit board 18 to be measured.

However, in this state, the contact force between the test pins 11 and the electronic circuit board 18 is weak and insufficient for measuring electrical characteristics. Here, referring also to FIG. 6, the electromagnet 13
At time T1, a current in the opposite direction to the above is applied to the electromagnet 13 from the power source 28 so as to generate an N pole on the side facing the rear end 11b, so that the magnetic force G gradually becomes stronger (that is, the current value is increased). (gradually increases), a repulsive force due to magnetic force is generated between the test pin 11 to which the permanent magnet 17 whose open end is magnetized to the north pole is fixed, and the north pole of the electromagnet 13.
The test pin 11 is pressed and the contact force gradually increases.

After the magnetic field is strengthened until a predetermined contact force is obtained, the current value is kept constant to keep the contact force constant at time T2, and during this time, the electrical characteristics of the electronic circuit board 18 are measured by the measuring device 23. Measure. Thereafter, the current flowing from the power supply unit 28 to the electromagnet 13 is gradually weakened (time T3), and then, as described above, the current is passed in the opposite direction, reversing the polarity of the electromagnet 13, and moving it to the side facing the rear end 11b of the electromagnet 13. The test pin 11 is attracted and pulled up by the electromagnet 13 by generating an S pole, thereby facilitating the removal of the electronic circuit board 18.

As mentioned above, the shape of the test pin 11 can be as long as it is a single pin with the rear end portion 11b magnetized, and since the operation of the test pin 11 is entirely performed by magnetic force, a spring or the like is arranged around the test pin 11. There is no need to install, and the diameter is approximately 0.3
Since the diameter can be made extremely small to 1 mm, the plurality of test pins 11 can be arranged at extremely small pitches to match the leads of high-density electronic components.

In the second embodiment of the present invention, referring to FIG. 2, a test pin 11 whose open end is magnetized to the north pole is used.
By approaching the N pole of the permanent magnet 14 in the direction of the arrow D, a repulsive force is applied to the test pin 11 and the test pin 11 is moved in the direction of the arrow F to ensure contact with the electronic circuit board 18. The electrical characteristics of the electromagnet 13 in the first embodiment are measured.
The only difference is that a permanent magnet 14 is used instead of , so a detailed explanation of the operation will be omitted.

In the third embodiment of the present invention, referring to FIG. 3, the test pin 11, which is slidably held in the test pin holder 15, is arranged so as to face the N pole of the rear end portion 11b. A repulsive force is applied to the test pin 11 by the permanent magnet 14 provided with poles, and the test pin 11 is always biased in the direction of the arrow H. Therefore, the permanent magnet 14 acts in the same manner as the compression spring 9 shown in FIG. However, it can be used in place of the test pin 2 of a conventional electronic circuit board inspection device, and since it has a small diameter, it can be arranged at closer pitches. Further, it goes without saying that the test pin 11 is connected to the measuring device 23 by an electric cord (not shown) so as to transmit a signal to the measuring device 23.

In the fourth embodiment of the present invention, referring to FIG. 4, the test pin holding plate 21 is raised in the direction of arrow K to remove the test pin 11 formed as a large diameter portion.
The electronic circuit board 1 is inserted by engaging the rear end portion 11b with the hole 21a.
After moving the test pins 11 upward so as not to interfere with the insertion of the electronic circuit board 18 and fixing the electronic circuit board 18 in a predetermined position on the circuit board support stand 29, the test pin holding plate 21 is lowered in the direction of arrow J. When the test pin 11 is moved, the test pin 11 also descends due to its own weight, and the tip portion 11a comes into contact with the measurement portion of the electronic circuit board 18.

Next, as described in the explanation of FIG. 6, a current is applied from the power source 28 to the electromagnet 13 to cause magnetic force to act on and attract the test pin 11 via the electronic circuit board 18. And the time T to maintain the current value constant and secure the contact force
2, the electrical characteristics of the electronic circuit board 18 are measured by the measuring device 23.

In the fifth embodiment of the present invention, referring to FIG. 5, an attractive force is applied to the test pin 11 by bringing the permanent magnet 14 close to the test pin 11 from the back surface of the electronic circuit board 18 (in the direction of arrow L). The electromagnet is moved in the direction of arrow O to ensure contact with the electronic circuit board 18, and the electrical characteristics of the electronic circuit board 18 are measured by the measuring device 23, and the rest is the electromagnet in the fourth embodiment. 13
The only difference is that a permanent magnet 14 is used instead of , so a detailed explanation of the operation will be omitted.

[0032]

Effects of the Invention In the present invention, as described above, the test pin is driven by magnetic force to bring it into contact with the measurement part of the electronic circuit board. Therefore, the test pin can be made smaller, especially smaller in diameter, and the pin spacing can be reduced. This has the effect of making it possible to easily test high-density electronic components by narrowly arranging them. Further, the test pin and the measuring portion of the electronic circuit board can be reliably brought into contact with a predetermined contact force, and there is an effect that maintenance work for the inspection device is not required and work efficiency can be improved.

[Brief explanation of drawings]

1 to 6 relate to embodiments of the present invention, and FIG. 1 is a partially longitudinal sectional front view of an electronic circuit board inspection apparatus according to the first embodiment.

FIG. 2 is a vertical cross-sectional front view of a main part of an electronic circuit board inspection apparatus according to a second embodiment.

FIG. 3 is a longitudinal cross-sectional view of a test pin of an electronic circuit board inspection device according to a third embodiment.

FIG. 4 is a partial vertical cross-sectional front view of an electronic circuit board inspection apparatus according to a fourth embodiment.

FIG. 5 is a vertical cross-sectional front view of a main part of an electronic circuit board inspection apparatus according to a fifth embodiment.

FIG. 6 is a diagram showing changes in the magnetic force acting on the test pin.

7 to 9 relate to a conventional example, and FIG. 7 is a front view of an electronic circuit board inspection apparatus.

FIG. 8 is a partial vertical cross-sectional front view showing the operating state of the test pin of the electronic circuit board testing device.

FIG. 9 is a longitudinal sectional view of a test pin of the electronic circuit board inspection device.

[Explanation of symbols]

10 Electronic circuit board inspection device 11 Test pin 11a Tip portion 11b Rear end portion 13 Electromagnet 14 which is an example of a magnetic force generating device
Permanent magnet 15 which is an example of a magnetic force generator Test pin holder 17 Permanent magnet 18 Electronic circuit board 19 Base 22 Electric cord 23 Measuring device

Claims (6)

[Claims] 1. An electronic device that tests the electrical characteristics of an electronic circuit board by holding a plurality of test pins slidably in the axial direction and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board. In a circuit board inspection device, a plurality of test pins are held slidably in an axial direction on a base at a position opposite to a predetermined inspection portion of the electronic circuit board, and each of the test pins is electrically connected to a measuring device; a magnetic force generating device that applies a magnetic force to the test pin to apply an attractive force or a repulsive force to the test pin and brings the tip of the test pin into contact with a predetermined portion of the electronic circuit board, the magnetic force generating device An inspection device for an electronic circuit board, characterized in that the device is configured to apply a necessary contact force between the test pin and the electronic circuit board to the test pin using magnetic force from the device. 2. An electronic device that tests the electrical characteristics of an electronic circuit board by holding a plurality of test pins slidably in the axial direction and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board. In a circuit board inspection device, magnets are held slidably in the axial direction of the base at a position opposite to a predetermined inspection portion of the electronic circuit board, and magnets with uniform polarity are fixed to the rear end portions of the base, respectively, and the measurement device includes: A plurality of test pins are electrically connected to each other, and the test pins are arranged opposite to the magnet, and when energized, the same polarity as the magnet faces each other and imparts a repulsive force to the test pin. An inspection device for an electronic circuit board, comprising: an electromagnet that brings the tip end into contact with a predetermined portion of the electronic circuit board. 3. An electronic device that tests the electrical characteristics of an electronic circuit board by holding a plurality of test pins slidably in the axial direction and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board. In a circuit board inspection device, a permanent magnet is fixed to the rear end portion of the electronic circuit board, and each permanent magnet is slidably held in the axial direction of the base at a position facing a predetermined inspection portion of the electronic circuit board, and is attached to a measuring device. comprising a plurality of electrically connected test pins, and another permanent magnet arranged so that the same poles as the permanent magnet of the test pin face each other,
An apparatus for testing an electronic circuit board, characterized in that the tip is brought into contact with a predetermined portion of the electronic circuit board by a repulsive force between the permanent magnet of the test pin and the other permanent magnet. 4. An electronic device that tests the electrical characteristics of an electronic circuit board by holding a plurality of test pins slidably in the axial direction and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board. In a circuit board inspection device, the electronic circuit board is made of a magnetic material and is slidably held in the axial direction of the base at a position opposite to a predetermined inspection portion of the electronic circuit board, and is electrically connected to the measuring device. multiple test pins,
Disposed on the back side of the electronic circuit board with which the tip of the test pin abuts, and by applying electricity, a suction force is applied to the test pin to bring the tip into contact with a predetermined portion of the electronic circuit board. An inspection device for an electronic circuit board, characterized in that it is equipped with an electromagnet. 5. An electronic device that tests the electrical characteristics of an electronic circuit board by holding a plurality of test pins slidably in the axial direction and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board. In a circuit board inspection device, a plurality of magnetic materials made of magnetic material are held slidably in the axial direction on a base at a position facing a predetermined inspection portion of the electronic circuit board, and are each electrically connected to a measuring device. A test pin is disposed on the back side of the electronic circuit board with which the tip end of the test pin comes into contact, and an attractive force due to magnetic force is applied to the test pin so that the tip end is attached to a predetermined portion of the electronic circuit board. A plurality of test pins are slidably held in the axial direction of the test pins, and the tips of the test pins are brought into contact with predetermined portions of the electronic circuit board. In an electronic circuit board inspection device for testing the electrical characteristics of a circuit board, the electronic circuit board is slidably held in the axial direction of the base at a position opposite to a predetermined test portion of the electronic circuit board, and electrically connected to each measuring device. A plurality of test pins made of a magnetic material connected to a An inspection device for an electronic circuit board, comprising: a permanent magnet brought into contact with a predetermined portion of the electronic circuit board. 6. An electronic device that tests the electrical characteristics of an electronic circuit board by holding a plurality of test pins slidably in the axial direction and bringing the tips of the test pins into contact with predetermined portions of the electronic circuit board. In a circuit board inspection device, a test pin is provided with a magnetized portion whose tip end is gradually narrowed and a magnetic force is applied to the rear end, and the test pin is held slidably in the axial direction and the test pin is attached to the test pin. and a test pin holder that fixes and supports a permanent magnet arranged so that the magnetic poles of the magnetic part and the same poles face each other, and the test pin is protruded by a repulsive force between the magnetized part and the permanent magnet. An inspection device for an electronic circuit board, characterized in that the tip end is brought into contact with a predetermined portion of the electronic circuit board.