JPH04355211A - Magnetic head and production thereof - Google Patents

Magnetic head and production thereof

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Publication number
JPH04355211A
JPH04355211A JP12920191A JP12920191A JPH04355211A JP H04355211 A JPH04355211 A JP H04355211A JP 12920191 A JP12920191 A JP 12920191A JP 12920191 A JP12920191 A JP 12920191A JP H04355211 A JPH04355211 A JP H04355211A
Authority
JP
Japan
Prior art keywords
bias
resistance
magnetic field
magnetic head
bias magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12920191A
Other languages
Japanese (ja)
Inventor
Kazuji Sato
佐藤 和司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP12920191A priority Critical patent/JPH04355211A/en
Publication of JPH04355211A publication Critical patent/JPH04355211A/en
Pending legal-status Critical Current

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  • Magnetic Heads (AREA)

Abstract

PURPOSE:To prevent the generation of the defect by the trouble of a bias magnetic field by regulating the magnitude of a bias resistance by the post working of a resistance circuit for regulation. CONSTITUTION:A bias wire 2 and an MR element 4 are connected in parallel by an electrode terminal part 7. After bias magnetic field intensity HBias is checked in a stage for inspecting the characteristics of the MR magnetic head, plural resistance wires 8 are cut by a laser beam of a micropost or a prober for cutting. The resistance value of a bias circuit is merely required to be lowered and the bias current to be increased when the bias magnetic field after the characteristic inspection is weak. The bias magnetic field to be impressed to the element 4 can be regulated by cutting the resistance wires even if there are fluctuations in the respective element values of the MR type magnetic head, by which the generation of the defect by the trouble of the bias magnetic field is obviated.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は磁気信号再生用の磁気抵
抗効果型磁気ヘッド(以下MRヘッドと称する)に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magnetoresistive magnetic head (hereinafter referred to as MR head) for reproducing magnetic signals.

【0002】0002

【従来の技術】従来、MRヘッドにより得られる再生出
力波形を目的にあった波形に調整する方法の1つとして
バイアス磁界を印加する方法が用いられている。
2. Description of the Related Art Conventionally, a method of applying a bias magnetic field has been used as one of the methods for adjusting the reproduced output waveform obtained by an MR head to a waveform suitable for a purpose.

【0003】以下に、この種の従来のMRヘッドを図面
を参照しながら説明する。図6に一般的な磁気抵抗素子
の構成を示す。素子の長さ方向に磁化容易軸をもつ磁気
抵抗効果素子(以下MR素子と称する)に磁化容易軸と
直角方向に信号磁界HSおよびバイアス磁界HBが印加
されるよう構成されている。また図7は図6の磁気ヘッ
ドに交流の信号磁界HSが印加された場合、出力(抵抗
変化量ΔR)がバイアス磁界HBにより変化する動作状
態を示している。所望の出力波形、例えば最も波形歪み
の少ない出力を得るためには、図7の(b)の状態にバ
イアス磁界HBを設定する必要がある。
[0003] This type of conventional MR head will be explained below with reference to the drawings. FIG. 6 shows the configuration of a general magnetoresistive element. A signal magnetic field HS and a bias magnetic field HB are applied to a magnetoresistive element (hereinafter referred to as an MR element) having an axis of easy magnetization in the length direction of the element in a direction perpendicular to the axis of easy magnetization. Further, FIG. 7 shows an operating state in which when an alternating current signal magnetic field HS is applied to the magnetic head of FIG. 6, the output (resistance change amount ΔR) changes depending on the bias magnetic field HB. In order to obtain a desired output waveform, for example, an output with the least waveform distortion, it is necessary to set the bias magnetic field HB to the state shown in FIG. 7(b).

【0004】図8に従来のMR素子の一例を示す。この
ようなバイアス磁界はHBの印加方法の一例としてMR
素子としてのNi−Fe合金(以下パーマロイと称する
)4とバイアス線11としてのTi薄膜を同じ形状のパ
ターンとして積層する。この端子12間に一定の電流I
を流すことにより、MR素子4の抵抗RMRとバイアス
線の抵抗RBiasに反比例した電流に分流され、各々
、MR電流IMRとバイアス電流IBiasとが流れる
。この時、図9に示すように、バイアス線13には、I
Biasに相当する磁界HBiasが発生する。
FIG. 8 shows an example of a conventional MR element. Such a bias magnetic field is used in MR as an example of a method of applying HB.
A Ni--Fe alloy (hereinafter referred to as permalloy) 4 as an element and a Ti thin film as a bias line 11 are laminated in a pattern having the same shape. A constant current I between this terminal 12
By flowing, the current is divided into currents that are inversely proportional to the resistance RMR of the MR element 4 and the resistance RBias of the bias line, and the MR current IMR and bias current IBias flow, respectively. At this time, as shown in FIG.
A magnetic field HBias corresponding to Bias is generated.

【0005】そしてこのような構造のMRヘッドでは、
MR素子とバイアス線を共通端子としバイアス磁界を与
えるため、特別な電気回路を別に設けなくて良いという
特徴がある。
[0005] In an MR head with such a structure,
Since the MR element and the bias line are connected to a common terminal and a bias magnetic field is applied, there is no need to separately provide a special electric circuit.

【0006】[0006]

【発明が解決しようとする課題】しかし、このような従
来の構成では、バイアス磁界HBiasの強度は、MR
抵抗RMRとバイアス線抵抗RBiasが、各々、膜の
比抵抗と膜の厚みが製造工程上、製造ロットごとに変動
し、必ずしも常に理想的なバイアス状態とならず、所望
の出力波形特性が得られない不良素子が発生するという
問題があった。
However, in such a conventional configuration, the strength of the bias magnetic field HBias is
Resistance RMR and bias line resistance RBias, respectively, the specific resistance of the film and the thickness of the film vary from production lot to production lot due to the manufacturing process, so the bias state is not always ideal and the desired output waveform characteristics cannot be obtained. There was a problem in that some defective elements were generated.

【0007】本発明はこのような課題を解決するもので
、常に一定のバイアス電流が得られ、所望の出力波形を
有するMR型磁気ヘッドを歩留りよく生産する製造方法
を提供することを目的とするものである。
SUMMARY OF THE INVENTION The present invention has been made to solve these problems, and an object of the present invention is to provide a manufacturing method that can produce an MR magnetic head with a high yield and a constant bias current and a desired output waveform. It is something.

【0008】[0008]

【課題を解決するための手段】この課題を解決するため
に本発明のMR型磁気ヘッドは、MR素子とバイアス抵
抗線を絶縁層により分離し、バイアス線本体とは別のバ
イアス抵抗調整用抵抗パターンをMR素子のパターン領
域外に設け、端子部で各々の抵抗線を並列に接合するよ
う構成し、MRヘッドの特性測定後、最適バイアス磁界
強度になるように、バイアス抵抗調整用抵抗線を切断あ
るいはパターン幅を削り込むなどの後加工を行なうよう
にしたものである。
[Means for Solving the Problem] In order to solve this problem, the MR type magnetic head of the present invention separates the MR element and the bias resistance wire by an insulating layer, and uses a bias resistance adjustment resistor separate from the bias wire main body. The pattern is provided outside the pattern area of the MR element, each resistance wire is connected in parallel at the terminal part, and after measuring the characteristics of the MR head, the resistance wire for bias resistance adjustment is connected so as to obtain the optimum bias magnetic field strength. Post-processing such as cutting or shaving the pattern width is performed.

【0009】[0009]

【作用】バイアス抵抗RBiasの大きさを、バイアス
抵抗調整用抵抗回路の後加工により調整することにより
最適の出力特性になるようバイアス磁界を形成すること
ができる。
[Operation] By adjusting the size of the bias resistor RBias by post-processing the bias resistor adjusting resistor circuit, it is possible to form a bias magnetic field so as to provide optimum output characteristics.

【0010】0010

【実施例】以下に本発明の一実施例を図面を参照しなが
ら説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

【0011】図1に、本発明の一実施例の磁気抵抗効果
型磁気ヘッドの構成を示す。図に示すように、基板1上
にバイアス線2とAl2O3などからなる絶縁層3とM
R素子4を積層して形成し、MR素子の領域5外にバイ
アス抵抗調整用パターン6をバイアス線2と同層で、バ
イアス線と並列に連結するように形成したものである。 バイアス線2とMR素子4は電極端子部7により並列に
接合されている。このMR磁気ヘッドの特性検査工程に
おいて、バイアス磁界強度HBiasを確認した後、複
数の抵抗線8を微小ポストのレーザ光、あるいはカッテ
ィング用プローバで切断する。バイアス抵抗調整用パタ
ーンの1本の抵抗線8の抵抗をR1とすれば、図2(A
)に示すように、n本の抵抗の合計はR1/nであり、
その中の1本を切断することにより、図2(B)に示す
ようにR1/(n−1)となり、抵抗は増加する。図3
に示すようにここで、中心規格値よりズレなくヘッドを
製造し、適性なバイアス磁界となるバイアス線全体の抵
抗を(数1)とする。これは、バイアス抵抗調整線をm
本切断した場合に対応する抵抗である。
FIG. 1 shows the structure of a magnetoresistive magnetic head according to an embodiment of the present invention. As shown in the figure, a bias line 2, an insulating layer 3 made of Al2O3, etc., and an M
It is formed by stacking R elements 4, and a bias resistance adjustment pattern 6 is formed outside the region 5 of the MR element in the same layer as the bias line 2 and connected in parallel with the bias line. The bias line 2 and the MR element 4 are connected in parallel by an electrode terminal portion 7. In this MR magnetic head characteristic testing step, after confirming the bias magnetic field strength HBias, the plurality of resistance wires 8 are cut with a laser beam from a micro post or a cutting prober. If the resistance of one resistance line 8 of the bias resistance adjustment pattern is R1, then FIG.
), the total of n resistors is R1/n,
By cutting one of them, the resistance becomes R1/(n-1) as shown in FIG. 2(B), and the resistance increases. Figure 3
As shown in Figure 2, the head is manufactured without deviation from the central standard value, and the resistance of the entire bias line that provides an appropriate bias magnetic field is expressed as (Equation 1). This changes the bias resistance adjustment line to m
This is the resistance corresponding to the case of main cutting.

【0012】MR素子とバイアス層全体に流れる電流と
バイアス電流はそれぞれ(数2),(数3),(数4)
で与えられる。
The current flowing through the MR element and the entire bias layer and the bias current are (Equation 2), (Equation 3), and (Equation 4), respectively.
is given by

【0013】[0013]

【数1】[Math 1]

【0014】[0014]

【数2】[Math 2]

【0015】[0015]

【数3】[Math 3]

【0016】[0016]

【数4】[Math 4]

【0017】もし、特性検査後、バイアス磁界が弱いと
判定される場合には、バイアス回路の抵抗値を下げ、バ
イアス電流を増加させれば良い。この特性検査時にはバ
イアス用の抵抗調整線は、通常調整する範囲の本数(切
断本数:m±l本)より、少なくとも抵抗線を1本多い
状態としておく。ここでl本は整数で切断本数の幅を示
す。また多くの場合には、図4に示すように、このテス
ト時に、バイアス調整線に事前の加工は行なわなくとも
、出力波形の状態を把握することにより、実験データか
ら容易に最終修正本数が推定可能である。仮に設定する
場合には、バイアス回路の抵抗値を下げるよう、切断本
数をm本とすれば良い。逆に、バイアス磁界が強すぎる
と推定される場合には、切断本数を多くすれば良い。
If it is determined that the bias magnetic field is weak after the characteristic test, the resistance value of the bias circuit may be lowered and the bias current may be increased. At the time of this characteristic test, the number of bias resistance adjustment wires is set to be at least one more than the number of wires in the normal adjustment range (number of wires cut: m±l wires). Here, l is an integer and indicates the width of the number of cuts. In addition, in many cases, as shown in Figure 4, the final number of lines to be corrected can be easily estimated from experimental data by understanding the state of the output waveform during this test, even without pre-processing the bias adjustment line. It is possible. If set, the number of cuts may be m to lower the resistance value of the bias circuit. Conversely, if the bias magnetic field is estimated to be too strong, the number of cuts may be increased.

【0018】なお、本発明のバイアス調整は上記の実施
例に限定されるものではなく、図5(A),(B)に示
すように、抵抗パターン9,10の幅をレーザ光で削除
し、抵抗値を変えてもよい。
It should be noted that the bias adjustment of the present invention is not limited to the above embodiment, and as shown in FIGS. , the resistance value may be changed.

【0019】[0019]

【発明の効果】以上の実施例の説明からも明らかなよう
に、本発明のMR型磁気ヘッドは、MR素子に印加する
バイアス磁界を、MR型磁気ヘッドの各要素値にバラツ
キがあっても抵抗線の切断により調整できるため、バイ
アス磁界の不具合による不良が発生しない。
As is clear from the above description of the embodiments, the MR type magnetic head of the present invention can control the bias magnetic field applied to the MR element even if there are variations in the values of each element of the MR type magnetic head. Adjustment can be made by cutting the resistance wire, so defects due to bias magnetic field problems do not occur.

【0020】また、バイアス調整用抵抗パターンの幅を
レーザ光などにより削除し、抵抗を変える方法でも上記
と同様の効果を得ることができる。
The same effect as described above can also be obtained by changing the resistance by removing the width of the resistance pattern for bias adjustment using a laser beam or the like.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の一実施例のMR型磁気ヘッドの斜視図
FIG. 1 is a perspective view of an MR magnetic head according to an embodiment of the present invention.

【図2】(A)は同バイアス抵抗修正前の回路図(B)
は同バイアス抵抗修正後の回路図
[Figure 2] (A) is the circuit diagram before bias resistance modification (B)
is the circuit diagram after bias resistance correction

【図3】同バイアス抵
抗修正後の回路図
[Figure 3] Circuit diagram after bias resistance correction

【図4】バイアス抵抗調整パターンの
本数とバイアス磁界強度の関係を示すグラフ
[Figure 4] Graph showing the relationship between the number of bias resistance adjustment patterns and bias magnetic field strength

【図5】(A)は本発明の別の実施例のMR型磁気ヘッ
ドの斜視図 (B)は同バイアス抵抗パターンの平面図
FIG. 5(A) is a perspective view of an MR magnetic head according to another embodiment of the present invention; FIG. 5(B) is a plan view of the same bias resistance pattern;

【図6】従来
のMR型磁気ヘッドの構成図
[Figure 6] Configuration diagram of a conventional MR type magnetic head

【図7】同バイアス磁界強
度と出力の関係を示すグラフ
[Figure 7] Graph showing the relationship between bias magnetic field strength and output

【図8】同MR型ヘッドの
斜視図
[Figure 8] Perspective view of the MR type head

【図9】同バイアス電流とバイアス磁界の関係を示す斜
視図
[Figure 9] A perspective view showing the relationship between the bias current and bias magnetic field.

【符号の説明】[Explanation of symbols]

1  基板 2  バイアス層 3  絶縁層 4  MR素子 6,9  バイアス抵抗調整用パターン7  端子 8  抵抗線 1 Board 2 Bias layer 3 Insulating layer 4 MR element 6, 9 Bias resistance adjustment pattern 7 Terminal 8 Resistance wire

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】互いに絶縁された磁気抵抗素子およびバイ
アス電流線を備えたヘッドチップに、バイアス電流線と
同膜,同層で、並列に抵抗パターンを設けた磁気ヘッド
1. A magnetic head in which a head chip is provided with a magnetoresistive element and a bias current line that are insulated from each other, and a resistance pattern is provided in parallel in the same film and layer as the bias current line.
【請求項2】互いに絶縁された磁気抵抗素子およびバイ
アス電流線を備えたヘッドチップに、バイアス電流線と
同膜,同層で、並列に抵抗パターンを設けた磁気ヘッド
において、並列に設けた抵抗パターンのパターン本数ま
たはパターン幅を後加工することによりバイアス抵抗を
独立自在に可変する磁気ヘッドの製造方法。
2. A magnetic head in which a resistor pattern is provided in parallel in the same film and layer as the bias current line on a head chip that includes a magnetoresistive element and a bias current line that are insulated from each other. A method of manufacturing a magnetic head in which bias resistance can be independently varied by post-processing the number of patterns or pattern width.
JP12920191A 1991-05-31 1991-05-31 Magnetic head and production thereof Pending JPH04355211A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12920191A JPH04355211A (en) 1991-05-31 1991-05-31 Magnetic head and production thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12920191A JPH04355211A (en) 1991-05-31 1991-05-31 Magnetic head and production thereof

Publications (1)

Publication Number Publication Date
JPH04355211A true JPH04355211A (en) 1992-12-09

Family

ID=15003645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12920191A Pending JPH04355211A (en) 1991-05-31 1991-05-31 Magnetic head and production thereof

Country Status (1)

Country Link
JP (1) JPH04355211A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1243569A2 (en) 1994-04-11 2002-09-25 Dowa Mining Co., Ltd. Electrical circuit having a metal-bonded-ceramic material or MBC component as an insulating substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1243569A2 (en) 1994-04-11 2002-09-25 Dowa Mining Co., Ltd. Electrical circuit having a metal-bonded-ceramic material or MBC component as an insulating substrate

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