JPH04351842A - Defect detection device for bulb - Google Patents
Defect detection device for bulbInfo
- Publication number
- JPH04351842A JPH04351842A JP12603191A JP12603191A JPH04351842A JP H04351842 A JPH04351842 A JP H04351842A JP 12603191 A JP12603191 A JP 12603191A JP 12603191 A JP12603191 A JP 12603191A JP H04351842 A JPH04351842 A JP H04351842A
- Authority
- JP
- Japan
- Prior art keywords
- bulb
- light bulb
- detection device
- voltage
- filament
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims description 26
- 230000007547 defect Effects 0.000 title claims description 15
- 239000011521 glass Substances 0.000 claims abstract description 11
- 230000002950 deficient Effects 0.000 abstract description 14
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 230000003647 oxidation Effects 0.000 description 9
- 238000007254 oxidation reaction Methods 0.000 description 9
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 9
- 229910052721 tungsten Inorganic materials 0.000 description 9
- 239000010937 tungsten Substances 0.000 description 9
- 238000007689 inspection Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 230000005856 abnormality Effects 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
Abstract
Description
【０００１】0001
【産業上の利用分野】本発明は電球の製造工程等におい
て電球の不良を検出する装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for detecting defects in light bulbs during the light bulb manufacturing process.
【０００２】0002
【従来の技術】従来、ガラスバルブ内に酸素等の不純ガ
スが残留した電球では、点灯中フィラメントであるタン
グステンが酸化し、電球の寿命が著しく短縮し、不良と
なることが知られている。このような不良の電球を製造
工程において検出する方法として、従来例えば、タング
ステンの酸化によるフィラメントの断線を検出する導通
試験や、フィラメントであるタングステンの酸化による
フィラメントの特性異常（ワット値異常）を検出するワ
ット値測定等の方法が用いられていた。2. Description of the Related Art Conventionally, it has been known that in light bulbs in which impurity gas such as oxygen remains inside the glass bulb, the tungsten filament oxidizes during lighting, significantly shortening the life of the light bulb and causing it to become defective. Conventional methods for detecting such defective light bulbs during the manufacturing process include continuity tests to detect filament breakage due to oxidation of tungsten, and abnormalities in filament characteristics (abnormal wattage) due to oxidation of the tungsten filament. Methods such as wattage measurement were used.
【０００３】0003
【発明が解決しようとする課題】しかしながら、このよ
うな検出方法は検出に要する時間を生産スピード以下に
しなければならないという問題があり、また、フィラメ
ントであるタングステンの酸化が十分に進行していなけ
れば、従来の導通試験やワット値測定ではフィラメント
であるタングステンの酸化に見合った特性異常（ワット
値異常）が検出されないため、検出精度も低いという問
題もあった。[Problems to be Solved by the Invention] However, such a detection method has the problem that the time required for detection must be less than the production speed, and if the oxidation of tungsten, which is the filament, has not progressed sufficiently. However, conventional continuity tests and wattage measurements do not detect characteristic abnormalities (wattage abnormalities) commensurate with the oxidation of the tungsten filament, resulting in low detection accuracy.
【０００４】本発明は、このような問題を解決するため
になされたもので、製造工程等において早期断線に至る
不良の電球を生産スピード以下にすることなく検出でき
、また、その検出の精度を向上させることのできる電球
の不良検出装置を提供するものである。The present invention was made to solve these problems, and it is possible to detect defective light bulbs that lead to premature disconnection during the manufacturing process without slowing down the production speed, and it also improves the accuracy of the detection. It is an object of the present invention to provide a defect detection device for a light bulb that can be improved.
【０００５】[0005]
【課題を解決するための手段】この問題を解決するため
に本発明の電球の不良検出装置は、複数の通電部を有す
る電球搬送装置を備え、各々の通電部が抵抗および直流
電源に対し閉ループを成すような回路を設け、それぞれ
の抵抗の両端に、ガラスバルブ内にフィラメントを有す
る電球に流れた電流に対応する電圧を検出する電圧検出
装置を接続し、この電圧検出装置で検出された電圧の変
化の有無を検出することにより前記電球の良否を判別す
る判別装置を有するものである。[Means for Solving the Problems] In order to solve this problem, the bulb defect detection device of the present invention includes a light bulb conveying device having a plurality of current-carrying parts, and each current-carrying part has a closed loop with respect to a resistor and a DC power source. A voltage detection device is connected to both ends of each resistor to detect the voltage corresponding to the current flowing through a light bulb with a filament inside the glass bulb, and the voltage detected by this voltage detection device is The light bulb has a determination device that determines whether the light bulb is good or bad by detecting the presence or absence of a change in the light bulb.
【０００６】[0006]
【作用】本発明の電球の不良検出装置では、各々の通電
部に抵抗および直流電源が閉ループを成すように回路接
続されているので、これらの回路に電流を流すと、抵抗
の両端に電球に流れた電流に対応した電圧が生じる。そ
して、抵抗の両端にその電圧を検出する電圧検出装置を
接続しているので、この抵抗でフィラメントの酸化に見
合った電圧の変化の有無を検出することにより、電球の
良否を判別することができる。[Operation] In the light bulb defect detection device of the present invention, a resistor and a DC power supply are circuit-connected to each current-carrying part to form a closed loop, so when current is passed through these circuits, the light bulb is connected to both ends of the resistor. A voltage corresponding to the flowing current is generated. Since a voltage detection device that detects the voltage is connected to both ends of the resistor, it is possible to determine whether the bulb is good or bad by detecting whether there is a change in voltage commensurate with the oxidation of the filament. .
【０００７】[0007]
【実施例】以下、本発明の一実施例について図面を用い
て説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.
【０００８】図１に示すように、本発明実施例の電球の
不良検出装置は、複数の一対の通電接点１ａ，１ｂから
なる通電部１を有する電球搬送装置２を備え、各々の通
電部１が抵抗３および直流電源４に対し閉ループを成す
ような回路を設け、それぞれの抵抗３の両端に電球５に
流れた電流に対応する電圧を検出する電圧検出装置、例
えばＡ／Ｄ変換器６を接続し、この電圧検出装置で検出
された電圧の変化の有無を検出することにより電球５の
良否を判別する判別装置、例えばコンピュータ７を有す
る構成となっている。As shown in FIG. 1, the defect detection device for a light bulb according to an embodiment of the present invention includes a light bulb conveying device 2 having a current-carrying section 1 consisting of a plurality of pairs of current-carrying contacts 1a and 1b. A circuit is provided such that the resistor 3 and the DC power source 4 form a closed loop, and a voltage detection device, for example, an A/D converter 6, is installed across each resistor 3 to detect a voltage corresponding to the current flowing through the light bulb 5. The configuration includes a determining device, for example, a computer 7, which is connected to the light bulb 5 and determines whether the light bulb 5 is good or bad by detecting the presence or absence of a change in the voltage detected by the voltage detecting device.
【０００９】電球搬送装置２は電球５を搬送するホルダ
８と通電部１とからなり、ホルダ８が移動して来て所定
位置で停止すると、通電接点１ａが上昇し、かつ、通電
接点１ｂが水平方向に移動して図１に示すように、これ
らが電球５の口金９に接触するようになっている。電球
５はガラスバルブ１０内にタングステンからなるフィラ
メント１１が設けられており、また、ガラスバルブ１０
の端部に口金９が取り付けられている。図１では１個の
電球のみガラスバルブ１０を破断して示している。The light bulb conveying device 2 consists of a holder 8 for conveying the light bulb 5 and a current-carrying section 1. When the holder 8 moves and stops at a predetermined position, the current-carrying contact 1a rises and the current-carrying contact 1b rises. These are moved horizontally so that they come into contact with the cap 9 of the light bulb 5, as shown in FIG. The light bulb 5 has a filament 11 made of tungsten provided inside the glass bulb 10.
A cap 9 is attached to the end of the cap. In FIG. 1, only one light bulb is shown with the glass bulb 10 cut away.
【００１０】次に、上記装置の動作について説明する。
電球搬送装置２のホルダ８が所定位置で停止すると、電
球５の口金９に電球搬送装置２の通電部１が接触する。
その結果、直流電源４、フィラメント１１および抵抗３
からなる閉ループが各々構成される。これにより、直流
電源４からフィラメント１１に電流が流れ電球５が点灯
する。このとき、フィラメント１１の構成材料であるタ
ングステンが酸化していると、フィラメント１１に流れ
る電流は酸化に見合った電流の変化を生じる。したがっ
て、フィラメント１１と同一閉ループ中の抵抗３の両端
には、酸化に見合った電圧を生じる。抵抗３の両端の電
圧はＡ／Ｄ変換器６で検出し、この検出された電圧の変
化はこれに接続されたコンピュータ７で判別する。コン
ピュータ７は前記判別結果を不良品電球除去装置（図示
せず）に伝送し、電球５が不良品であれば不良品電球の
除去を行う。Next, the operation of the above device will be explained. When the holder 8 of the light bulb transport device 2 stops at a predetermined position, the current-carrying portion 1 of the light bulb transport device 2 comes into contact with the base 9 of the light bulb 5. As a result, DC power source 4, filament 11 and resistor 3
A closed loop consisting of the following is constructed. As a result, a current flows from the DC power supply 4 to the filament 11 and the light bulb 5 lights up. At this time, if tungsten, which is a constituent material of the filament 11, is oxidized, the current flowing through the filament 11 changes in proportion to the oxidation. Therefore, a voltage commensurate with oxidation is generated across the resistor 3 in the same closed loop as the filament 11. The voltage across the resistor 3 is detected by an A/D converter 6, and a change in the detected voltage is determined by a computer 7 connected thereto. The computer 7 transmits the determination result to a defective light bulb removal device (not shown), and if the light bulb 5 is defective, the defective light bulb is removed.
【００１１】まず、電球５が良品の場合、すなわち、ガ
ラスバルブ１０内に酸素等の不純ガスが入っていない場
合、図２に示すように、点灯直後電球５に流れるラッシ
ュ電流による影響が終了した後、フィラメント１１の構
成材料であるタングステンが酸化していないため、フィ
ラメント１１を流れる電流が変化しない。したがって、
同一回路中の抵抗３の両端の電圧は時間の経過に対しほ
とんど変化しない。First, when the light bulb 5 is a good product, that is, when there is no impurity gas such as oxygen inside the glass bulb 10, the influence of the rush current flowing through the light bulb 5 ends immediately after it is turned on, as shown in FIG. After that, since the tungsten that is the constituent material of the filament 11 is not oxidized, the current flowing through the filament 11 does not change. therefore,
The voltage across the resistor 3 in the same circuit hardly changes over time.
【００１２】一方、電球５が不良品の場合、例えば電球
５のガラスバルブ１０にクラックが入っている場合、フ
ィラメント１１であるタングステンが電球５の点灯時に
酸化する。図３に示すように、点灯直後電球５に流れる
ラッシュ電流による影響が終了した後、前記酸化に見合
ってフィラメント１１を流れる電流が変化する。したが
って、同一閉ループ中の抵抗３の両端の電圧は時間の経
過に対して変化する。On the other hand, if the light bulb 5 is defective, for example if the glass bulb 10 of the light bulb 5 has a crack, the tungsten that is the filament 11 will oxidize when the light bulb 5 is lit. As shown in FIG. 3, after the influence of the rush current flowing through the light bulb 5 immediately after lighting ends, the current flowing through the filament 11 changes in accordance with the oxidation. Therefore, the voltage across the resistor 3 in the same closed loop changes over time.
【００１３】従来の技術と比較するために、ガラスバル
ブ１０にクラックが入っていることと等価である排気管
１２を故意に折った電球５を２００個作製し、従来のフ
ィラメント１１に流れた電流値の絶対値測定（ワット値
測定）と本発明の電球の不良検出装置とでそれぞれ１０
０個不良検出について試験したところ、表１に示すとお
りの結果が得られた。なお、排気管１２を折ったのは、
試験条件をそろえるためである。In order to compare with the conventional technology, 200 light bulbs 5 were made with the exhaust pipe 12 intentionally broken, which is equivalent to having a crack in the glass bulb 10, and the current flowing through the conventional filament 11 was 10 each for the absolute value measurement (watt value measurement) and the bulb defect detection device of the present invention.
When testing was conducted to detect 0 defects, the results shown in Table 1 were obtained. In addition, the person who broke the exhaust pipe 12 was
This is to align test conditions.
【００１４】[0014]
【表１】[Table 1]
【００１５】表１から明かなように本発明は不良品電球
、例えば電球のガラスバルブにクラックが入っている場
合など、従来と比較し、不良品電球の検出率が約３倍も
向上していることがわかる。また、本発明の電球の不良
検出装置を使用することにより、従来に比べて検査に要
する人員を省くことができるという効果も認められた。As is clear from Table 1, the present invention improves the detection rate of defective light bulbs by about three times compared to the conventional method when detecting defective light bulbs, for example, when the glass bulb of the light bulb has cracks. I know that there is. Furthermore, by using the bulb defect detection device of the present invention, it has been found that the number of personnel required for inspection can be reduced compared to the conventional method.
【００１６】このように、本発明の電球の不良検出装置
は、電球の製造・検査工程において使用され、検査精度
の向上とともに検査工程の自動化を図ることができるも
のである。As described above, the bulb defect detection device of the present invention is used in the bulb manufacturing and inspection process, and can improve inspection accuracy and automate the inspection process.
【００１７】[0017]
【発明の効果】以上説明したように、本発明の電球の不
良検出装置は、従来一部不可能であったフィラメントの
酸化による不良品電球の判別を可能にし、不良品電球の
検出率を従来に比べて大幅に向上することができる。ま
た、本発明の装置は各々の回路に直列に接続した抵抗に
より、電球点灯直後のラッシュ電流を抑制することがで
きるので、前記回路の過渡電流に対する計測機器、例え
ばＡ／Ｄ変換器、回路の電線の焼損等に対する安全性も
高いものである。[Effects of the Invention] As explained above, the bulb defect detection device of the present invention makes it possible to identify defective bulbs due to oxidation of the filament, which was previously impossible. can be significantly improved compared to. Furthermore, since the device of the present invention can suppress rush current immediately after the light bulb is turned on by using a resistor connected in series with each circuit, it is possible to suppress the rush current immediately after the light bulb is turned on. It is also highly safe against burnout of electric wires.
【図１】本発明の一実施例である電球の不良検出装置を
示す構成図FIG. 1 is a configuration diagram showing a defect detection device for a light bulb, which is an embodiment of the present invention.
【図２】本発明の電球の不良検出装置における電圧検出
装置で検出された良品電球の時間の経過に対する電圧の
変化を示す図FIG. 2 is a diagram showing changes in voltage over time of a non-defective light bulb detected by the voltage detection device in the defective light bulb detection device of the present invention.
【図３】本発明の電球の不良検出装置における電圧検出
装置で検出された不良品電球の時間の経過に対する電圧
の変化を示す図FIG. 3 is a diagram showing changes in voltage over time of defective light bulbs detected by the voltage detection device in the defect detection device for light bulbs of the present invention.
【符号の説明】 １ 通電部 １ａ，１ｂ 通電接点 ２ 電球搬送装置 ３ 抵抗 ４ 直流電源 ５ 電球 ６ Ａ／Ｄ変換器 ７ コンピュータ ８ ホルダ ９ 口金 １０ ガラスバルブ １１ フィラメント[Explanation of symbols] 1 Energizing part 1a, 1b Current-carrying contact 2 Light bulb conveyance device 3 Resistance 4 DC power supply 5 Light bulb 6 A/D converter 7 Computer 8 Holder 9 Base 10 Glass bulb 11 Filament
Claims (1)
備え、各々の通電部が抵抗および直流電源に対し閉ルー
プを成すような回路を設け、それぞれの抵抗の両端に、
ガラスバルブ内にフィラメントを有する電球に流れた電
流に対応する電圧を検出する電圧検出装置を接続し、こ
の電圧検出装置で検出された電圧の変化の有無を検出す
ることにより前記電球の良否を判別する判別装置を有す
ることを特徴とする電球の不良検出装置。Claim 1: A light bulb carrying device having a plurality of current-carrying parts, each of the current-carrying parts forming a closed loop with a resistor and a DC power source, with a circuit provided at both ends of each resistor,
A voltage detection device that detects the voltage corresponding to the current flowing through the light bulb having a filament inside the glass bulb is connected, and the quality of the light bulb is determined by detecting the presence or absence of a change in the voltage detected by the voltage detection device. A defect detection device for a light bulb, characterized by having a discrimination device for detecting defects.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12603191A JP2817814B2 (en) | 1991-05-29 | 1991-05-29 | Light bulb failure detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12603191A JP2817814B2 (en) | 1991-05-29 | 1991-05-29 | Light bulb failure detection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04351842A true JPH04351842A (en) | 1992-12-07 |
| JP2817814B2 JP2817814B2 (en) | 1998-10-30 |
Family
ID=14924977
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12603191A Expired - Fee Related JP2817814B2 (en) | 1991-05-29 | 1991-05-29 | Light bulb failure detection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2817814B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011009044A (en) * | 2009-06-25 | 2011-01-13 | Ushio Inc | Lamp lighting device and filament lamp |
-
1991
- 1991-05-29 JP JP12603191A patent/JP2817814B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011009044A (en) * | 2009-06-25 | 2011-01-13 | Ushio Inc | Lamp lighting device and filament lamp |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2817814B2 (en) | 1998-10-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2008270164A (en) | Lamp failure detector | |
| JP2000222686A (en) | Failure detecting device for multiple light type color signal using led for light emission source | |
| JPH0362498A (en) | Lamp burnout detecting device | |
| JPH04351842A (en) | Defect detection device for bulb | |
| JP2002014132A (en) | Device for inspecting circuit board | |
| JPS6243059A (en) | Defect detection of incandescent lamp | |
| JP3194758B2 (en) | Detecting the disconnection of light bulbs for railway traffic lights | |
| JPS62187258A (en) | Inspecting method for circuit board | |
| JPH10188812A (en) | Electric current supply inspection device | |
| US3979897A (en) | Method for locating conductor breaks during the two stage twisting of a communications cable | |
| CN216117452U (en) | Metal wire defect detection device | |
| KR950012282B1 (en) | Rotery trans property checking device and method | |
| CN111077476B (en) | Method for detecting short circuit or electric leakage fault point of equipment | |
| JPH08262096A (en) | Continuous performance inspection apparatus and method for motor stator | |
| JPS6137178Y2 (en) | ||
| JP2006071567A (en) | Method for determining contact state of probe, and method and apparatus for inspecting circuit board | |
| JP2010038756A (en) | Board inspection apparatus and method for acquiring z-axis offset of probe | |
| KR0169243B1 (en) | Measuring apparatus for cut-off voltage of crt | |
| JP4369002B2 (en) | Circuit board inspection equipment | |
| KR910007537Y1 (en) | Detecting apparatus for inferiority between electrodes of color picture tube | |
| JP2002353055A (en) | Device for inspection insulation of coil in coil-winding apparatus | |
| JPS61187087A (en) | Detector for projecting material | |
| JPH08111155A (en) | Disconnection inspecting device of relay coil | |
| JPS625553A (en) | Deficiency detection of incandescent lamp | |
| JPH06174774A (en) | Electric inspection method for tab film carrier tape |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |