JPH0434794A - Memory control circuit - Google Patents
Memory control circuitInfo
- Publication number
- JPH0434794A JPH0434794A JP2142088A JP14208890A JPH0434794A JP H0434794 A JPH0434794 A JP H0434794A JP 2142088 A JP2142088 A JP 2142088A JP 14208890 A JP14208890 A JP 14208890A JP H0434794 A JPH0434794 A JP H0434794A
- Authority
- JP
- Japan
- Prior art keywords
- memory
- storage holding
- holding operation
- retention operation
- memory retention
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000014759 maintenance of location Effects 0.000 claims description 93
- 230000033228 biological regulation Effects 0.000 abstract description 5
- 230000005540 biological transmission Effects 0.000 abstract description 4
- 238000005265 energy consumption Methods 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 6
- 230000004044 response Effects 0.000 description 2
- 230000000717 retained effect Effects 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Landscapes
- Dram (AREA)
Abstract
Description
【発明の詳細な説明】
技術分野
本発明はメモリ制御回路に関し、特にメモリに対して記
憶保持動作(リフレッシュ動作)を行うメモリ制御回路
に関する。TECHNICAL FIELD The present invention relates to a memory control circuit, and more particularly to a memory control circuit that performs a memory retention operation (refresh operation) on a memory.
従来技術
一般に、D RA M (Dynamic RAM )
等は記憶内容を保持するために記憶保持動作を行う必要
がある。その記憶保持動作を行う従来のメモリ制御回路
の主要部分の構成を第3図のブロック図に示す。Conventional technology Generally, DRAM (Dynamic RAM)
etc., it is necessary to perform a memory retention operation in order to retain the memory contents. The configuration of the main parts of a conventional memory control circuit that performs the memory retention operation is shown in the block diagram of FIG.
図において、記憶保持動作要求信号(Ref resh
Request ) 10がデコード手段100に入力
されると記憶保持動作アドレス信号(Rerresh
Address )20(1〜n)に対応したメモリセ
ル群1〜nのうちのいずれかに対するアドレス毎記憶保
持動作要求信号、例えば、llBが発生し、メモリセル
111を含む記憶セル群1に対して記憶保持動作が実施
される。In the figure, a memory retention operation request signal (Ref refresh
When Request) 10 is input to the decoding means 100, the memory retention operation address signal (Rerresh
Address) 20 (1 to n) corresponds to one of the memory cell groups 1 to n, and an address-by-address memory retention operation request signal, for example, 11B, is generated and the memory cell group 1 including the memory cell 111 is A memory retention operation is performed.
この場合、記憶保持動作は、各記憶保持動作アドレス毎
に、一定周期毎に実施される。すなわち、記憶保持動作
の実施周期はメモリの全てのメモリセルが記憶保持可能
であるように最悪のメモリセルの記憶保持能力にあわせ
て一定に規定されている。つまり、全メモリセルのうち
、記憶保持時間が最短のものの記憶保持時間に応じて実
施周期が予め設定されていたのである。In this case, the memory retention operation is performed at regular intervals for each memory retention operation address. In other words, the execution period of the memory retention operation is fixed in accordance with the memory retention capacity of the worst memory cell so that all the memory cells of the memory can retain the memory. In other words, the implementation period was set in advance according to the memory retention time of the memory cell with the shortest memory retention time among all the memory cells.
しかしながら、はとんどのメモリセルは上述のように規
定された記憶保持動作周期を充分上回る記憶保持能力を
持っている。したがって、これらの充分な記憶保持能力
をもつほとんどの記憶セルに対しても不要な記憶保持動
作が行われているため、余分な電力を消費することにな
るという欠点がある。However, most memory cells have a memory retention capacity that sufficiently exceeds the memory retention operation period defined above. Therefore, unnecessary memory retention operations are performed even for most of these memory cells having sufficient memory retention capacity, resulting in the disadvantage of consuming excess power.
発明の目的
本発明は上述した従来の欠点を解決するためになされた
ものであり、その目的は余分な消費電力を省くことがで
きるメモリ制御回路を提供することである。OBJECTS OF THE INVENTION The present invention has been made to solve the above-mentioned conventional drawbacks, and its purpose is to provide a memory control circuit that can eliminate unnecessary power consumption.
発明の構成
本発明によるメモリ制御回路は、夫々が複数のメモリセ
ルからなるメモリセル群を複数含んで構成されたメモリ
を、これらメモリセル群毎に所定周期でリフレッシュ動
作を行うリフレッシュ手段と、前記メモリセル群の各々
に対して、該メモリ群内のメモリセルのうち、記憶保持
時間が最短のもののメモリセルの記憶保持時間に応じて
該メモリセル群についてのリフレッシュ周期を夫々指定
するリフレッシュ周期指定手段とを有することを特徴と
する。Structure of the Invention A memory control circuit according to the present invention includes a refresh means for refreshing a memory including a plurality of memory cell groups each consisting of a plurality of memory cells at a predetermined period for each memory cell group; Refresh cycle designation for each memory cell group, specifying a refresh cycle for the memory cell group according to the memory retention time of the memory cell with the shortest memory retention time among the memory cells in the memory cell group. It is characterized by having a means.
実施例 次に、本発明について図面を参照して説明する。Example Next, the present invention will be explained with reference to the drawings.
第1図は本発明によるメモリ制御回路の一実施例の主要
部分の構成を示すブロック図であり、第3図と同等部分
は同一符号により示されている。FIG. 1 is a block diagram showing the configuration of main parts of an embodiment of a memory control circuit according to the present invention, and parts equivalent to those in FIG. 3 are designated by the same reference numerals.
図において、本発明の一実施例によるメモリ制御回路は
、全ての記憶保持動作アドレスに1対1に対応して最大
マスク数値信号を出力する数値登録手段800と、全て
の記憶保持動作アドレスに1対1に対応する記憶保持動
作要求許可手段200と、記憶保持動作要求信号10の
デコード結果を伝達許可するゲート手段400とを有し
ており、記憶保持動作を行う周期を変化できるように構
成されている。In the figure, a memory control circuit according to an embodiment of the present invention includes a numerical value registration means 800 that outputs a maximum mask numerical signal in one-to-one correspondence to all memory retention operation addresses, and It has memory retention operation request permission means 200 corresponding to pair 1, and gate means 400 for permitting transmission of the decoding result of the memory retention operation request signal 10, and is configured to be able to change the cycle of performing the memory retention operation. ing.
数値登録手段300には、各記憶保持動作アドレス毎に
、その記憶保持動作の対象となるメモリセル群の全ての
メモリセルが規定のm(rr、>1)倍の記憶保持動作
周期でも記憶保持可能な記憶保持動作アドレスに対して
の最大マスク数値信号をセットしておく。For each memory retention operation address, the numerical registering means 300 stores information such that all memory cells in the memory cell group targeted for the memory retention operation can retain memory even if the memory retention operation cycle is m (rr, > 1) times the specified number. Set the maximum mask value signal for possible memory retention operation addresses.
そして、記憶保持動作要求許可手段200は、記憶保持
動作アドレス毎に、記憶保持動作要求信号10のデコー
ド結果及び最大マスク数値信号を入力とし、記憶保持動
作要求信号10のデコード結果の入力毎に、その記憶保
持動作アドレスに対応する計数値をインクリメントする
動作を行う。その計数値が記憶保持動作アドレスに対応
する最大マスク数値信号の入力値に達したときには記憶
保持動作許可信号をセットして出力する。それとともに
、次回の記憶保持動作要求の入力時には計数値をリセッ
トするように動作する。Then, the memory retention operation request permission means 200 inputs the decoding result of the memory retention operation request signal 10 and the maximum mask value signal for each memory retention operation address, and each time the decoding result of the memory retention operation request signal 10 is input, An operation is performed to increment the count value corresponding to the memory retention operation address. When the counted value reaches the input value of the maximum mask numerical signal corresponding to the memory retention operation address, a memory retention operation permission signal is set and output. At the same time, it operates to reset the count value when the next memory retention operation request is input.
ゲート手段400は、記憶保持動作アドレス毎に、記憶
保持動作要求信号のデコード結果及び記憶保持動作許可
信号を入力とし、記憶保持動作許可信号がセットされて
いる場合には各記憶保持動作アドレス毎に記憶保持動作
アドレスに対する記憶保持動作要求信号を伝達許可する
。The gate means 400 inputs the decoding result of the memory retention operation request signal and the memory retention operation enable signal for each memory retention operation address, and when the memory retention operation permission signal is set, the decoding result of the memory retention operation request signal and the memory retention operation permission signal are input for each memory retention operation address. Transmission of a memory retention operation request signal to a memory retention operation address is permitted.
これにより、規定のm倍以上の記憶保持能力をもつメモ
リセル群を対象とする記憶保持動作アドレスについては
、リフレッシュ周期を規定のm倍にして記憶保持動作が
実施されることになる。As a result, for a memory retention operation address that targets a memory cell group having a memory retention capacity m times greater than the prescribed value, the memory retention operation is performed with the refresh period m times the prescribed value.
なお、このmの値は、各メモリセル群1〜口内のメモリ
セルのうち最悪の記憶保持能力(すなわち、記憶保持時
間が最短)のものに応じて予め設定されるものとする。It is assumed that the value of m is set in advance according to the memory cell with the worst memory retention capacity (that is, the shortest memory retention time) among the memory cells in each memory cell group 1 to 1.
かかる構成において、記憶保持動作要求信号10がデコ
ード手段100に入力されることにより、n本の記憶保
持動作アドレス信号20に対応してメモリセル群1〜n
のうちのいずれかに対するアドレス毎記憶保持動作要求
信号(例えば、11a)を発生させ、記憶保持動作要求
許可手段200及びゲート手段400のそれぞれの記憶
保持動作アドレス信号20、すなわちメモリセル群1〜
nのうちのいずれかに対応するビット位置に送出する。In this configuration, by inputting the memory retention operation request signal 10 to the decoding means 100, memory cell groups 1 to n are input in response to n memory retention operation address signals 20.
A memory retention operation request signal (for example, 11a) for each address is generated for any one of the memory retention operation address signals 20 of the memory retention operation request permission means 200 and the gate means 400, that is, memory cell groups 1 to 1.
It is sent to the bit position corresponding to any one of n.
一方、数値登録手段300には、予め各記憶保持動作ア
ドレス信号20、すなわち記憶保持動作の対象となるメ
モリセル群1〜n毎に、メモリセル群の全てのメモリセ
ルか規定のm倍の記憶保持動作周期でも記憶保持可能な
場合−にはその記憶保持動作アドレス信号20、すなわ
ちメモリセル群1〜nに対応するビット位置に対して最
大マスク数値(m−1)をセットしておく。この数値登
録手段300の出力は最大マスク数値信号(例えば、3
1a)として、記憶保持動作要求許可手段200への記
憶保持動作アドレス信号20に対応、すなわちメモリセ
ル群1〜nのうちのいずれかに対応するビット位置に送
出される。On the other hand, the numerical registering means 300 stores in advance each memory retention operation address signal 20, that is, for each memory cell group 1 to n that is the target of the memory retention operation, all memory cells in the memory cell group or m times the prescribed number of memory cells. If the memory can be retained even during the retention operation cycle, the maximum mask value (m-1) is set for the memory retention operation address signal 20, that is, the bit position corresponding to the memory cell groups 1 to n. The output of this numerical value registration means 300 is the maximum mask numerical signal (for example, 3
1a), it is sent to a bit position corresponding to the memory retention operation address signal 20 to the memory retention operation request permission means 200, that is, corresponding to any one of the memory cell groups 1 to n.
記憶保持動作要求許可手段200は各ビット毎のアドレ
ス毎記憶保持動作要求信号(例えば、11a)の入力毎
に計数値をインクリメントし、計数値が最大マスク数値
信号(例えば、31a)の入力値以上になった時は記憶
保持動作許可信号(例えば、21a)をセットし、ゲー
ト手段400の記憶保持動作アドレス信号20、すなわ
ちメモリセル群1〜nのうちのいずれかに対応するビ・
ソト位置に出力する。さらに次回のアドレス毎記憶保持
動作要求信号(例えば、11a)の入力に対してはその
計数値をリセットする。The memory retention operation request permission means 200 increments the count value each time a memory retention operation request signal for each bit and address (for example, 11a) is input, and when the count value is greater than or equal to the input value of the maximum mask numerical signal (for example, 31a). When the memory retention operation enable signal (for example, 21a) is set, the memory retention operation address signal 20 of the gate means 400, that is, the memory retention operation enable signal 21a, that is, the memory retention operation enable signal 21a, which corresponds to one of the memory cell groups 1 to n, is set.
Output to the soto position. Furthermore, the count value is reset in response to the input of the next address-by-address storage holding operation request signal (for example, 11a).
そして、ゲート手段400は、それぞれ記憶保持動作ア
ドレス信号20、すなわちメモリセル群1〜nのうちの
いずれかに対応するビット毎に入力される記憶保持動作
許可信号(例えば、21a)がセットされている場合に
はアドレス毎記憶保持動作要求信号(例えば、11a)
を伝達許可する。The gate means 400 is set with a memory retention operation address signal 20, that is, a memory retention operation enable signal (for example, 21a) inputted for each bit corresponding to one of the memory cell groups 1 to n. If there is a memory retention operation request signal for each address (for example, 11a)
Permit transmission.
このようにして、規定のm倍以上の記憶保持能力をもつ
メモリセル群を対象とする記憶保持動作アドレスについ
ては記憶保持動作周期を規定のm倍にして実施するよう
にしたアドレス毎記憶保持動作要求信号(例えば、11
b)を前記記憶保持動作アドレス信号20(1〜n)に
対応するメモリセル群1〜nのうちのいずれか、例えば
、記憶保持動作アドレス信号20が“1″の場合には記
憶セル群1に対して出力して記憶保持動作を実施する。In this way, the memory retention operation for each address is performed with the memory retention operation cycle m times the regulation for memory retention operation addresses that target a memory cell group having a memory retention capacity of m or more than the regulation. request signal (e.g. 11
b) to one of the memory cell groups 1 to n corresponding to the memory retention operation address signal 20 (1 to n), for example, when the memory retention operation address signal 20 is "1", the memory cell group 1 The memory retention operation is performed by outputting the data to
次に、第1図中の記憶保持動作要求許可手段200の内
部構成について第2図を用いて説明する。Next, the internal configuration of the memory retention operation request permission means 200 shown in FIG. 1 will be explained using FIG. 2.
第2図は第1図に示されているメモリ制御回路の記憶保
持動作要求許可手段200の構成を示すブロック図であ
る。図には各ビットの一例として、記憶保持アドレス信
号20が“1”、すなわち記憶セル群1に対応する1ビ
ット分の記憶保持動作要求許可手段201が示されてい
る。FIG. 2 is a block diagram showing the configuration of the memory retention operation request permission means 200 of the memory control circuit shown in FIG. 1. In the figure, as an example of each bit, the memory retention address signal 20 is "1", that is, the memory retention operation request permission means 201 for one bit corresponding to the memory cell group 1 is shown.
図において、計数手段221は記憶保持動作要求信号1
1aの入力により計数値をインクリメントし、計数値信
号22aを比較手段211に出力する。In the figure, the counting means 221 receives the memory holding operation request signal 1.
1a, the count value is incremented and a count value signal 22a is output to the comparison means 211.
比較手段211には、計数値信号22gと最大マスク数
値信号31aとが入力されており、計数値信号22aの
値が最大マスク数値信号31aの入力値と一致した際に
は記憶保持動作許可信号21aがセットされ、出力され
る。また、記憶保持動作許可信号21aは計数手段22
1のリセット端子へも出力される。したがって、計数値
信号22aの値が最大マスク数値信号31aの入力値に
達した後には計数手段221の計数値がリセットされる
ことになる。The comparison means 211 receives the count value signal 22g and the maximum mask value signal 31a, and when the value of the count value signal 22a matches the input value of the maximum mask value signal 31a, the storage operation permission signal 21a is output. is set and output. Further, the memory retention operation permission signal 21a is transmitted to the counting means 22.
It is also output to the reset terminal of No.1. Therefore, after the value of the count value signal 22a reaches the input value of the maximum mask value signal 31a, the count value of the counting means 221 is reset.
以上の構成からなるメモリ制御回路を用いて、記憶保持
動作が必要なメモリの記憶保持動作を行えば、従来の規
定のm倍以上の記憶保持能力をもつほとんどのメモリセ
ルに対しては不要な記憶保持動作を省くように選択的に
記憶保持動作周期を上述の規定のm倍にすることにより
、全体としては記憶保持動作の回数を低減できるため、
平均的には記憶保持動作のための消費電流を低減でき、
余分な電力消費を抑えることができるのである。If the memory control circuit with the above configuration is used to perform a memory retention operation for a memory that requires a memory retention operation, it will not be necessary for most memory cells that have a memory retention capacity of m or more than the conventional regulation. By selectively increasing the memory retention operation cycle by m times the above prescribed value so as to omit the memory retention operation, the overall number of memory retention operations can be reduced.
On average, current consumption for memory retention operation can be reduced,
This makes it possible to suppress excess power consumption.
なお、数値登録手段の保持値を外部から書換えることが
できるように構成すれば、より柔軟にリフレッシュ周期
を変えることができる。Note that if the value held in the numerical value registration means is configured to be able to be rewritten from the outside, the refresh cycle can be changed more flexibly.
発明の詳細
な説明したように、本発明によれば、記憶保持動作の実
施周期を最大にすることができ、消費電力を低減するこ
とができるという効果がある。As described in detail, according to the present invention, it is possible to maximize the execution cycle of the memory retention operation and reduce power consumption.
第1図は本発明の実施例によるメモリ制御回路の構成を
示すブロック図、第2図は記憶保持動作要求許可手段の
内部構成を示すブロック図、第3図は従来のメモリ制御
回路の構成を示すブロック図である。
主要部分の符号の説明
100・・・・・デコード手段
200・・・・・・記憶保持動作要求許可手段300・
・・・・・数値登録手段
400・・・・・・ゲート手段FIG. 1 is a block diagram showing the configuration of a memory control circuit according to an embodiment of the present invention, FIG. 2 is a block diagram showing the internal configuration of a memory retention operation request permission means, and FIG. 3 is a block diagram showing the configuration of a conventional memory control circuit. FIG. Explanation of symbols of main parts 100...Decoding means 200...Memory retention operation request permission means 300.
... Numerical registration means 400 ... Gate means
Claims (1)
複数含んで構成されたメモリを、これらメモリセル群毎
に所定周期でリフレッシュ動作を行うリフレッシュ手段
と、前記メモリセル群の各々に対して、該メモリ群内の
メモリセルのうち、記憶保持時間が最短のもののメモリ
セルの記憶保持時間に応じて該メモリセル群についての
リフレッシュ周期を夫々指定するリフレッシュ周期指定
手段とを有することを特徴とするメモリ制御回路。(1) Refreshing means for refreshing a memory including a plurality of memory cell groups each consisting of a plurality of memory cells at a predetermined period for each of these memory cell groups; , refresh cycle designating means for respectively designating the refresh cycle for the memory cell group according to the memory retention time of the memory cell whose memory retention time is the shortest among the memory cells in the memory group. memory control circuit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2142088A JP2959046B2 (en) | 1990-05-31 | 1990-05-31 | Memory control circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2142088A JP2959046B2 (en) | 1990-05-31 | 1990-05-31 | Memory control circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0434794A true JPH0434794A (en) | 1992-02-05 |
JP2959046B2 JP2959046B2 (en) | 1999-10-06 |
Family
ID=15307153
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2142088A Expired - Fee Related JP2959046B2 (en) | 1990-05-31 | 1990-05-31 | Memory control circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2959046B2 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5623451A (en) * | 1995-10-04 | 1997-04-22 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device |
EP0790620A2 (en) * | 1996-02-14 | 1997-08-20 | United Memories, Inc. | "Bimodal" refresh circuit and method for using same to reduce standby current and enhance yields of dynamic memory products |
WO2004093089A1 (en) * | 2003-04-15 | 2004-10-28 | International Business Machines Corporation | Dynamic semiconductor storage device |
JP2007133712A (en) * | 2005-11-11 | 2007-05-31 | Hitachi Ltd | Disk array apparatus |
JP2007287314A (en) * | 2006-04-14 | 2007-11-01 | Hynix Semiconductor Inc | Semiconductor memory element, and method of driving thereof |
US7324399B2 (en) | 2005-07-19 | 2008-01-29 | Samsung Electronics Co., Ltd | Refresh control circuit and method for performing a repetition refresh operation and semiconductor memory device having the same |
-
1990
- 1990-05-31 JP JP2142088A patent/JP2959046B2/en not_active Expired - Fee Related
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5623451A (en) * | 1995-10-04 | 1997-04-22 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device |
EP0790620A2 (en) * | 1996-02-14 | 1997-08-20 | United Memories, Inc. | "Bimodal" refresh circuit and method for using same to reduce standby current and enhance yields of dynamic memory products |
EP0790620A3 (en) * | 1996-02-14 | 1999-01-27 | United Memories, Inc. | "Bimodal" refresh circuit and method for using same to reduce standby current and enhance yields of dynamic memory products |
WO2004093089A1 (en) * | 2003-04-15 | 2004-10-28 | International Business Machines Corporation | Dynamic semiconductor storage device |
US7313045B2 (en) | 2003-04-15 | 2007-12-25 | International Business Machines Corporation | Dynamic semiconductor storage device |
US7324399B2 (en) | 2005-07-19 | 2008-01-29 | Samsung Electronics Co., Ltd | Refresh control circuit and method for performing a repetition refresh operation and semiconductor memory device having the same |
JP2007133712A (en) * | 2005-11-11 | 2007-05-31 | Hitachi Ltd | Disk array apparatus |
JP2007287314A (en) * | 2006-04-14 | 2007-11-01 | Hynix Semiconductor Inc | Semiconductor memory element, and method of driving thereof |
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