JPH043322U - - Google Patents
Info
- Publication number
- JPH043322U JPH043322U JP4444090U JP4444090U JPH043322U JP H043322 U JPH043322 U JP H043322U JP 4444090 U JP4444090 U JP 4444090U JP 4444090 U JP4444090 U JP 4444090U JP H043322 U JPH043322 U JP H043322U
- Authority
- JP
- Japan
- Prior art keywords
- waveform
- data
- vibration
- average
- outputting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 4
- 230000005856 abnormality Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Landscapes
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4444090U JPH043322U (OSRAM) | 1990-04-25 | 1990-04-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4444090U JPH043322U (OSRAM) | 1990-04-25 | 1990-04-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH043322U true JPH043322U (OSRAM) | 1992-01-13 |
Family
ID=31557746
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4444090U Pending JPH043322U (OSRAM) | 1990-04-25 | 1990-04-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH043322U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022106583A (ja) * | 2021-01-07 | 2022-07-20 | 株式会社Kelk | 解析装置、解析システム及び解析方法 |
-
1990
- 1990-04-25 JP JP4444090U patent/JPH043322U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022106583A (ja) * | 2021-01-07 | 2022-07-20 | 株式会社Kelk | 解析装置、解析システム及び解析方法 |
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