JPH0432618Y2 - - Google Patents

Info

Publication number
JPH0432618Y2
JPH0432618Y2 JP1983012332U JP1233283U JPH0432618Y2 JP H0432618 Y2 JPH0432618 Y2 JP H0432618Y2 JP 1983012332 U JP1983012332 U JP 1983012332U JP 1233283 U JP1233283 U JP 1233283U JP H0432618 Y2 JPH0432618 Y2 JP H0432618Y2
Authority
JP
Japan
Prior art keywords
measurement
time
mode
counter
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983012332U
Other languages
English (en)
Japanese (ja)
Other versions
JPS59117974U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1233283U priority Critical patent/JPS59117974U/ja
Publication of JPS59117974U publication Critical patent/JPS59117974U/ja
Application granted granted Critical
Publication of JPH0432618Y2 publication Critical patent/JPH0432618Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP1233283U 1983-01-31 1983-01-31 測定モ−ド切り換え回路 Granted JPS59117974U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1233283U JPS59117974U (ja) 1983-01-31 1983-01-31 測定モ−ド切り換え回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1233283U JPS59117974U (ja) 1983-01-31 1983-01-31 測定モ−ド切り換え回路

Publications (2)

Publication Number Publication Date
JPS59117974U JPS59117974U (ja) 1984-08-09
JPH0432618Y2 true JPH0432618Y2 (enrdf_load_stackoverflow) 1992-08-05

Family

ID=30143730

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1233283U Granted JPS59117974U (ja) 1983-01-31 1983-01-31 測定モ−ド切り換え回路

Country Status (1)

Country Link
JP (1) JPS59117974U (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012233843A (ja) * 2011-05-09 2012-11-29 Hioki Ee Corp インピーダンス測定装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3105554C2 (de) * 1980-02-25 1983-07-14 Tektronix, Inc., 97077 Beaverton, Oreg. Schaltungsanordnung zur Abtastung mehrerer Signalabschnitte eines Analogsignals mit unterschiedlichen Abtastraten

Also Published As

Publication number Publication date
JPS59117974U (ja) 1984-08-09

Similar Documents

Publication Publication Date Title
US4191864A (en) Method and apparatus for measuring attack and release times of hearing aids
JPH0432618Y2 (enrdf_load_stackoverflow)
EP0693692A2 (en) Voltage and resistance synthesizer using pulse width modulation
JP2003004780A (ja) インピーダンスパラメータの推定方法及び装置
US3577076A (en) Automatic range scale selection apparatus for a measuring device
US4523288A (en) Interval-expanding timer
EP0535124B1 (en) Analog-to-digital converter
US4598375A (en) Time measuring circuit
GB2076547A (en) Resistance Measuring Circuit
JPH0317275Y2 (enrdf_load_stackoverflow)
SU1739316A1 (ru) Измерительный преобразователь интегральных характеристик сигналов
JP3321966B2 (ja) 時間比率検出回路
JPS62143524A (ja) デジタル/アナログ変換装置
SU1370614A1 (ru) Устройство дл автоматического измерени параметров амплитудно-частотных характеристик четырехполюсника
JPS6134474A (ja) ヒステリシス幅の試験方法
JPH0348540Y2 (enrdf_load_stackoverflow)
SU934363A2 (ru) Устройство дл контрол качества материалов
JPS63279178A (ja) 集積回路測定装置
JPH0435812Y2 (enrdf_load_stackoverflow)
RU2204931C2 (ru) Устройство для измерения критической частоты слияния световых мельканий
KR880002625Y1 (ko) 음성합성을 이용한 디지탈 측정기
JPH0441354Y2 (enrdf_load_stackoverflow)
SU951165A1 (ru) Цифровой измеритель коэффициента мощности
JPS58190748A (ja) 木材水分測定装置
SU1406491A1 (ru) Цифровой универсальный измерительный прибор