JPH04305144A - Outer circumference chipping inspector for contact lens - Google Patents

Outer circumference chipping inspector for contact lens

Info

Publication number
JPH04305144A
JPH04305144A JP3068287A JP6828791A JPH04305144A JP H04305144 A JPH04305144 A JP H04305144A JP 3068287 A JP3068287 A JP 3068287A JP 6828791 A JP6828791 A JP 6828791A JP H04305144 A JPH04305144 A JP H04305144A
Authority
JP
Japan
Prior art keywords
contact lens
chipping
outer periphery
inspection
outer circumference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3068287A
Other languages
Japanese (ja)
Inventor
Takamasa Ishikawa
石川隆雅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP3068287A priority Critical patent/JPH04305144A/en
Publication of JPH04305144A publication Critical patent/JPH04305144A/en
Pending legal-status Critical Current

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  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Eyeglasses (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

PURPOSE:To achieve automatic inspection of a chipping as generated in the outer circumference of a contact lens at a high speed and accurately. CONSTITUTION:This inspector is made up of a contact lens detection means A to convert an image of contact lens 1 into an electrical signal, an image processing means B which coverts the electrical signal into a video signal to extract an outer circumference part alone of the contact lens, an arithmetic processing/judging means C which performs an arithmetic processing of the extracted part to judge an outer circumferential chipping detect of the contact lens searching an outer circumferential chipping and a moving means D to move the contact lens to a position which allows the detection of a part to be detected of the contact lens.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明はコンタクトレンズの外周
に発生する欠けを検査する装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for inspecting chips on the outer periphery of contact lenses.

【0002】0002

【従来の技術】従来のコンタクトレンズ外周欠け検査は
、人間がピンセット等でコンタクトレンズを保持し、ル
ーペ等を用いて目視により外周欠けを検出していた。
BACKGROUND OF THE INVENTION In conventional contact lens peripheral chipping inspection, a person holds the contact lens with tweezers or the like and visually detects peripheral chipping using a magnifying glass or the like.

【0003】0003

【発明が解決しようとする課題】しかし前述の従来技術
では人間が目視により検査を行っていたために、検査の
所要時間がかかる上に個人の検出能力差が大きく、30
ミクロン程度の微細な欠けは見落としてしまうことがあ
った。またピンセットでコンタクトレンズを保持した際
に,誤ってコンタクトレンズを落下させて紛失してしま
うことがあった。そこで本発明はこのような課題を解決
するもので,その目的とするところはコンタクトレンズ
の外周に発生する欠けを高速かつ確実に自動検査するこ
とのできるコンタクトレンズ外周欠け検査装置を提供す
るところにある。
[Problems to be Solved by the Invention] However, in the above-mentioned conventional technology, since the inspection was performed visually by a human, it took a long time to conduct the inspection, and there was a large difference in detection ability between individuals.
Small chips on the order of microns were sometimes overlooked. Additionally, when holding a contact lens with tweezers, the contact lens could be accidentally dropped and lost. SUMMARY OF THE INVENTION The present invention is intended to solve these problems, and its purpose is to provide a contact lens outer periphery chipping inspection device that can automatically inspect chips occurring on the outer periphery of a contact lens at high speed and reliably. be.

【0004】0004

【課題を解決するための手段】本発明のコンタクトレン
ズ外周欠け検査装置は,図1の機能ブロックに示す様に
,コンタクトレンズ1の画像を電気信号に変換するコン
タクトレンズ検出手段Aと,該電気信号を映像信号に変
換してコンタクトレンズの外周部分のみを抽出する画像
処理手段Bと,該抽出部分に演算処理を施して外周欠け
を検索しコンタクトレンズの外周欠け不良を判断する演
算処理判定手段Cと,コンタクトレンズを該コンタクト
レンズ検出部が検出できる位置まで移動する移動手段D
によって構成されることを特徴とする。
[Means for Solving the Problems] The contact lens outer periphery chipping inspection device of the present invention, as shown in the functional block diagram of FIG. Image processing means B that converts a signal into a video signal and extracts only the outer circumferential portion of the contact lens, and arithmetic processing determining means that performs arithmetic processing on the extracted portion to search for outer circumferential chipping and determine whether the outer circumferential chipping of the contact lens is defective. C, and a moving means D for moving the contact lens to a position where the contact lens detection unit can detect the contact lens.
It is characterized by being composed of.

【0005】[0005]

【実施例】以下,本発明について図面に基づいて詳細に
説明する。図2は本発明の一実施例を示す概略図である
。図中符号1はコンタクトレンズであり,検査用移動装
置6によって検査位置まで移動した状態にある。照明装
置7に照らされたコンタクトレンズ1の拡大画像はカメ
ラレンズ2によってITVカメラ3内に結像し電気信号
に変換される。ここでカメラレンズは5−10倍の顕微
鏡用対物レンズを用い,ITVカメラは36万画素程度
の固体撮像素子を用いることにより,20μm程度の欠
けも識別出来る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be explained in detail below with reference to the drawings. FIG. 2 is a schematic diagram showing an embodiment of the present invention. Reference numeral 1 in the figure indicates a contact lens, which has been moved to an inspection position by an inspection moving device 6. The enlarged image of the contact lens 1 illuminated by the illumination device 7 is formed into an image within the ITV camera 3 by the camera lens 2 and converted into an electrical signal. Here, the camera lens uses a microscope objective lens with a magnification of 5 to 10 times, and the ITV camera uses a solid-state image sensor with about 360,000 pixels, so that even a chip of about 20 μm can be identified.

【0006】図中符号4は画像処理装置であり,ITV
カメラ3からの電気信号を入力して映像信号に変換しコ
ンタクトレンズ1のエッジ部分を抽出して座標データに
変換する。図中符号5はパーソナルコンピュータであり
,該座標データを画像処理装置4から受け取り,演算処
理を施して外周欠けを検索する。次にパーソナルコンピ
ュータから回転信号を検査用移動装置6に送り,未検索
部分の画像がITVカメラで取り込める様コンタクトレ
ンズ1を回転させ、全周に渡り外周欠けを検出する。 ここで予めコンタクトレンズの外径とカメラレンズの倍
率およびITVカメラの視野をパーソナルコンピュータ
に入力しておくことにより,パーソナルコンピュータは
コンタクトレンズの最適な回転角度および全周の画像を
取り込むために必要な繰り返し数を計算し,それに応じ
て検査用移動装置に信号を送るために検査所要時間が短
縮される。またコンタクトレンズの外径中心と検査用移
動装置の回転軸中心が一致しない場合,コンタクトレン
ズを回転するとエッジの位置がITVカメラの視野中心
からずれてしまい,最悪の場合回転を繰り返すうちにエ
ッジが検出できなくなってしまう。従って,画像処理装
置はコンタクトレンズのエッジの位置も検出し,エッジ
が常にITVカメラの視野中心付近にくる様に検査用移
動装置に信号を送る。
[0006] Reference numeral 4 in the figure is an image processing device, and the ITV
An electrical signal from the camera 3 is input and converted into a video signal, and the edge portion of the contact lens 1 is extracted and converted into coordinate data. Reference numeral 5 in the figure is a personal computer, which receives the coordinate data from the image processing device 4, performs arithmetic processing, and searches for peripheral defects. Next, a rotation signal is sent from the personal computer to the inspection moving device 6, and the contact lens 1 is rotated so that an image of the unsearched portion can be captured by the ITV camera, thereby detecting the outer periphery chipping over the entire circumference. By inputting the outer diameter of the contact lens, the magnification of the camera lens, and the field of view of the ITV camera into the personal computer in advance, the personal computer can determine the optimal rotation angle of the contact lens and the necessary information to capture images of the entire circumference. Inspection time is reduced because the number of repetitions is calculated and signals are sent to the inspection mobile device accordingly. In addition, if the center of the outer diameter of the contact lens does not match the center of the rotation axis of the inspection moving device, rotating the contact lens will cause the edge position to shift from the center of the ITV camera's field of view, and in the worst case, repeated rotations will cause the edge to shift. It becomes undetectable. Therefore, the image processing device also detects the position of the edge of the contact lens and sends a signal to the inspection moving device so that the edge is always near the center of the field of view of the ITV camera.

【0007】全周に渡って検出終了後,パーソナルコン
ピュータはコンタクトレンズ全周のデータから外周欠け
不良を判断する。
[0007] After the detection is completed over the entire circumference, the personal computer determines whether the outer circumference is chipped or not from the data on the entire circumference of the contact lens.

【0008】図3は検出手段を複数設けた場合の実施例
である。ITVカメラ3およびカメラレンズ2をコンタ
クトレンズの外周上に等分するよう複数個接続し,入力
するITVカメラを画像処理装置で切り替えることによ
り,全周の画像を取り込むために必要な繰り返し数を減
らし検査所要時間を短縮することが出来る。
FIG. 3 shows an embodiment in which a plurality of detection means are provided. By connecting multiple ITV cameras 3 and camera lenses 2 so that they are equally distributed on the outer circumference of the contact lens, and switching the input ITV camera using an image processing device, the number of repetitions required to capture images of the entire circumference can be reduced. The time required for inspection can be shortened.

【0009】図4はコンタクトレンズの断面図の端部拡
大図である。図5はコンタクトレンズの頂点上方からみ
た平面図の端部拡大図である。2種類の曲率の異なるカ
ーブの終点位置が各々異なるため,頂点上方から見ると
エッジ曲線が2本見える。図6および図9は画像処理装
置4の出力例であり,各々外周欠けがないコンタクトレ
ンズと外周欠けがあるコンタクトレンズの処理前の画像
である。また図7および図10は各々外周欠けがないコ
ンタクトレンズと外周欠けがあるコンタクトレンズの画
像処理後の画像であり,エッジ部分のみが抽出されてい
る。図8および図11は各々外周欠けがないコンタクト
レンズと外周欠けがあるコンタクトレンズのパーソナル
コンピュータによる演算結果である。最小自乗法を用い
てエッジの位置座標の2次曲線近似を行い,求めた曲線
とエッジの位置座標との差をプロットした図である。図
11は外周欠けがあるため外周欠けの部分だけ異なった
特性を示している。従って検査基準値8をパーソナルコ
ンピュータ上で適切に設定しておくことにより,パーソ
ナルコンピュータは外周欠け不良を確実に判断すること
ができる。また当然のことながら1ヶ所でも欠けがあれ
ばそのコンタクトレンズは不良である。従ってパーソナ
ルコンピュータは全周のデータを取り込んでから判定を
下すのではなく,外周欠けの部分を検出した時点で不良
の判定を下し,残りの部分の検出を省略する事により検
査時間の短縮が図られる。
FIG. 4 is an enlarged end view of a cross-sectional view of a contact lens. FIG. 5 is an enlarged end view of a plan view seen from above the apex of the contact lens. Since the end points of the two types of curves with different curvatures are different, two edge curves are visible when viewed from above the apex. 6 and 9 are output examples of the image processing device 4, and are images before processing of a contact lens without a chip on the outer periphery and a contact lens with a chip on the outer periphery, respectively. Further, FIGS. 7 and 10 are images after image processing of a contact lens without a chip on the outer periphery and a contact lens with a chip on the outer periphery, respectively, and only the edge portions are extracted. FIGS. 8 and 11 show the calculation results of a contact lens without a chip on the outer periphery and a contact lens with a chip on the outer periphery using a personal computer, respectively. FIG. 6 is a diagram in which quadratic curve approximation of the edge position coordinates is performed using the least squares method, and the difference between the obtained curve and the edge position coordinates is plotted. In FIG. 11, since there is a chip on the outer periphery, only the part with the chip on the outer periphery shows different characteristics. Therefore, by appropriately setting the inspection reference value 8 on the personal computer, the personal computer can reliably determine the outer periphery chipping defect. Also, as a matter of course, if there is a chip in even one place, the contact lens is defective. Therefore, instead of making a judgment after taking in data from the entire circumference, a personal computer makes a judgment of failure when it detects the chipped part of the outer periphery, and by omitting detection of the remaining part, the inspection time can be shortened. It will be planned.

【0010】図12は検査移動装置にコンタクトレンズ
ステージ9を設けた概略図である。カメラレンズが高倍
率の場合,コンタクトレンズの種類によってエッジから
頂点までの高さが異なるためピントが甘くなってしまい
,微小な欠けを見落としてしまうことがある。従って検
査移動装置に上下移動機能とコンタクトレンズステージ
を設けることにより,コンタクトレンズの種類によらず
エッジの高さ方向の位置が一定になりピントずれは発生
しない。
FIG. 12 is a schematic diagram of a contact lens stage 9 provided in an inspection moving device. When a camera lens has a high magnification, the height from the edge to the apex varies depending on the type of contact lens, making it difficult to focus and causing small defects to be overlooked. Therefore, by providing the inspection moving device with a vertical movement function and a contact lens stage, the position of the edge in the height direction is constant regardless of the type of contact lens, and no out-of-focus occurs.

【0011】[0011]

【発明の効果】本発明は以上説明したように,目と直接
に接する医療機器であるコンタクトレンズの外周欠けを
コンタクトレンズ検出手段と画像処理手段と演算処理判
定手段と移動手段によって構成されるコンタクトレンズ
外周欠け検査装置によって検査することにより,人間が
時として行う見落しもなく確実でかつ目視よりも高速な
自動検査が可能になり,安全性が高く安心して使えるコ
ンタクトレンズが提供できるという効果がある。
Effects of the Invention As explained above, the present invention is a medical device that comes into direct contact with the eye, and is capable of detecting chipping on the outer periphery of a contact lens. Inspecting with a lens peripheral chipping inspection device enables automatic inspection that is reliable and faster than visual inspection, without the oversights that humans sometimes make, and has the effect of providing contact lenses that are highly safe and can be used with peace of mind. be.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明のコンタクトレンズ外周欠け検査装置の
構成を明示するためのブロック図。
FIG. 1 is a block diagram for clearly showing the configuration of a contact lens peripheral chipping inspection apparatus according to the present invention.

【図2】本発明のコンタクトレンズ外周欠け検査装置の
一実施例を示す概略図。
FIG. 2 is a schematic diagram showing an embodiment of the contact lens peripheral chipping inspection apparatus of the present invention.

【図3】本発明のコンタクトレンズ外周欠け検査装置の
検出手段を複数設けた場合の一実施例を示す概略図。
FIG. 3 is a schematic diagram showing an embodiment of the contact lens outer periphery chipping inspection apparatus of the present invention in which a plurality of detection means are provided.

【図4】コンタクトレンズの断面図の端部拡大図。FIG. 4 is an enlarged end view of a cross-sectional view of a contact lens.

【図5】コンタクトレンズの頂点上方からみた平面図の
端部拡大図。
FIG. 5 is an enlarged end view of a plan view seen from above the apex of the contact lens.

【図6】外周欠けがないコンタクトレンズの画像処理前
の画像出力図。
FIG. 6 is an image output diagram of a contact lens without peripheral chipping before image processing.

【図7】外周欠けがないコンタクトレンズの画像処理後
の画像出力図。
FIG. 7 is an image output diagram after image processing of a contact lens without peripheral chipping.

【図8】外周欠けがないコンタクトレンズのパーソナル
コンピュータによる演算結果出力図。
FIG. 8 is an output diagram of a calculation result by a personal computer of a contact lens with no peripheral chipping.

【図9】外周欠けがあるコンタクトレンズの画像処理前
の画像出力図。
FIG. 9 is an image output diagram before image processing of a contact lens with a chipped outer periphery.

【図10】外周欠けがあるコンタクトレンズの画像処理
後の画像出力図。
FIG. 10 is an image output diagram after image processing of a contact lens with a chipped outer periphery.

【図11】外周欠けがあるコンタクトレンズのパーソナ
ルコンピュータによる演算結果出力図。
FIG. 11 is an output diagram of calculation results obtained by a personal computer for a contact lens with a chipped outer periphery.

【図12】検査移動装置にコンタクトレンズステージを
設けた概略図
[Figure 12] Schematic diagram of a contact lens stage installed in the inspection moving device

【符号の説明】[Explanation of symbols]

1  コンタクトレンズ 2  カメラレンズ 3  ITVカメラ 4  画像処理装置 5  パーソナルコンピュータ 6  検査用移動装置 7  照明装置 8  検査基準値 9  コンタクトレンズステージ 1 Contact lenses 2 Camera lens 3 ITV camera 4 Image processing device 5 Personal computer 6 Transfer device for inspection 7. Lighting device 8 Inspection standard values 9 Contact lens stage

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  コンタクトレンズの画像を電気信号に
変換するコンタクトレンズ検出手段と,該電気信号を映
像信号に変換してコンタクトレンズの外周部分のみを抽
出する画像処理手段と,該抽出部分に演算処理を施して
外周欠けを検索しコンタクトレンズの外周欠け不良を判
断する演算処理判定手段と,コンタクトレンズを該コン
タクトレンズ検出部が検出できる位置まで移動する移動
手段によって構成されることを特徴とするコンタクトレ
ンズ外周欠け検査装置。
Claim 1: contact lens detection means for converting an image of a contact lens into an electrical signal; image processing means for converting the electrical signal into a video signal and extracting only the outer peripheral portion of the contact lens; The present invention is characterized by comprising: arithmetic processing determining means for performing processing to search for outer periphery chipping and determining whether the outer periphery chipping of the contact lens is defective; and a moving means for moving the contact lens to a position where the contact lens detecting section can detect the contact lens. Contact lens peripheral chipping inspection device.
JP3068287A 1991-04-01 1991-04-01 Outer circumference chipping inspector for contact lens Pending JPH04305144A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3068287A JPH04305144A (en) 1991-04-01 1991-04-01 Outer circumference chipping inspector for contact lens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3068287A JPH04305144A (en) 1991-04-01 1991-04-01 Outer circumference chipping inspector for contact lens

Publications (1)

Publication Number Publication Date
JPH04305144A true JPH04305144A (en) 1992-10-28

Family

ID=13369405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3068287A Pending JPH04305144A (en) 1991-04-01 1991-04-01 Outer circumference chipping inspector for contact lens

Country Status (1)

Country Link
JP (1) JPH04305144A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996030745A1 (en) * 1995-03-30 1996-10-03 Wesley-Jessen Corporation Inspection of optical components
US5717781A (en) * 1992-12-21 1998-02-10 Johnson & Johnson Vision Products, Inc. Ophthalmic lens inspection method and apparatus
US6134342A (en) * 1993-12-27 2000-10-17 Menicon Co., Ltd. Visual inspection method and apparatus for contact lenses
US6301005B1 (en) 1993-07-29 2001-10-09 Wesley Jessen Corporation Inspection system for optical components
US6567156B1 (en) * 1998-10-29 2003-05-20 Sarin Technologies Ltd. Apparatus and method for examining the shape of gemstones
US6765661B2 (en) 2001-03-09 2004-07-20 Novartis Ag Lens inspection
JP2006098101A (en) * 2004-09-28 2006-04-13 Canon Chemicals Inc Defect detection method and defect detection device of plate body
EP1674824A1 (en) * 2004-12-22 2006-06-28 Novartis AG Apparatus and method for detecting lens thickness
US9057595B2 (en) 2011-11-30 2015-06-16 Novartis Ag Combination of mirror images to improve signal quality for contact lenses

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5717781A (en) * 1992-12-21 1998-02-10 Johnson & Johnson Vision Products, Inc. Ophthalmic lens inspection method and apparatus
US6301005B1 (en) 1993-07-29 2001-10-09 Wesley Jessen Corporation Inspection system for optical components
US6614516B2 (en) 1993-07-29 2003-09-02 Novartis Ag Inspection system for optical components
US6134342A (en) * 1993-12-27 2000-10-17 Menicon Co., Ltd. Visual inspection method and apparatus for contact lenses
WO1996030745A1 (en) * 1995-03-30 1996-10-03 Wesley-Jessen Corporation Inspection of optical components
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components
US6567156B1 (en) * 1998-10-29 2003-05-20 Sarin Technologies Ltd. Apparatus and method for examining the shape of gemstones
US6765661B2 (en) 2001-03-09 2004-07-20 Novartis Ag Lens inspection
JP2006098101A (en) * 2004-09-28 2006-04-13 Canon Chemicals Inc Defect detection method and defect detection device of plate body
EP1674824A1 (en) * 2004-12-22 2006-06-28 Novartis AG Apparatus and method for detecting lens thickness
US7433027B2 (en) 2004-12-22 2008-10-07 Novartis Ag Apparatus and method for detecting lens thickness
US9057595B2 (en) 2011-11-30 2015-06-16 Novartis Ag Combination of mirror images to improve signal quality for contact lenses

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