JPH04296435A - Neutral particle energy analyzer - Google Patents

Neutral particle energy analyzer

Info

Publication number
JPH04296435A
JPH04296435A JP3063417A JP6341791A JPH04296435A JP H04296435 A JPH04296435 A JP H04296435A JP 3063417 A JP3063417 A JP 3063417A JP 6341791 A JP6341791 A JP 6341791A JP H04296435 A JPH04296435 A JP H04296435A
Authority
JP
Japan
Prior art keywords
charged particle
charged
energy
charged particles
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3063417A
Other languages
Japanese (ja)
Other versions
JP3112965B2 (en
Inventor
Hiroshi Takeuchi
浩 竹内
Kenji Hida
飛田 健次
Yoshio Kita
好夫 北
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Japan Atomic Energy Agency
Original Assignee
Toshiba Corp
Japan Atomic Energy Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Japan Atomic Energy Research Institute filed Critical Toshiba Corp
Priority to JP03063417A priority Critical patent/JP3112965B2/en
Publication of JPH04296435A publication Critical patent/JPH04296435A/en
Application granted granted Critical
Publication of JP3112965B2 publication Critical patent/JP3112965B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To solve problems of a fixing space, fixing dimension and the like by detecting different energy of charged particles by the use of one charged particle detector. CONSTITUTION:On an output side of a charged particle exchanger, there are provided a pair of magnets 21 having deflection sides of an almost quadratic curve in order to deflect charged particles according to their energy so as to converge them to one point through different orbits. One detector 27 is disposed on a convergent point of the charged particle, for detection of the charged particle having different energy.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は中性粒子を測定してその
エネルギーを求める中性粒子エネルギー分析器の改良に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement in a neutral particle energy analyzer for measuring neutral particles and determining their energy.

【0002】0002

【従来の技術】従来、この種の中性粒子エネルギー分析
器は、図5に示すように中性粒子源1のプラズマ2から
放出された中性粒子3を真空接続管4を経て真空容器5
内の荷電粒子交換器としてのストリッピングセル6へ導
入し、ここで内部のガスによりイオン化して荷電粒子に
変換した後、荷電粒子偏向器7に入射する。この荷電粒
子偏向器7は電場または磁場を与えることにより荷電粒
子を、その粒子エネルギーに応じて偏向させて異なる位
置に出射する。
2. Description of the Related Art Conventionally, this type of neutral particle energy analyzer has been designed to collect neutral particles 3 emitted from plasma 2 of a neutral particle source 1 through a vacuum connection tube 4 into a vacuum vessel 5, as shown in FIG.
The particles are introduced into a stripping cell 6 as a charged particle exchanger in the interior, where they are ionized by an internal gas and converted into charged particles, and then enter a charged particle deflector 7. This charged particle deflector 7 applies an electric field or a magnetic field to deflect charged particles according to their particle energy and emit them to different positions.

【0003】さらに、異なるエネルギーを持った荷電粒
子の到達点に荷電粒子検出器8……を配置して荷電粒子
を検出するとともに、各荷電粒子検出器8ごとにディス
クリミネータ9、アンプ10を経てカウタ11で荷電粒
子数をカウントすることにより、図6に示すようなエネ
ルギースペクトルを得、このエネルギースペクトルの形
状から中性粒子エネルギーを求めている。
Furthermore, charged particle detectors 8 are arranged at the arrival points of charged particles having different energies to detect charged particles, and a discriminator 9 and an amplifier 10 are installed for each charged particle detector 8. Then, by counting the number of charged particles with the counter 11, an energy spectrum as shown in FIG. 6 is obtained, and the neutral particle energy is determined from the shape of this energy spectrum.

【0004】従って、以上のような装置においては、荷
重粒子の各エネルギーごとに荷電粒子検出器8……を設
置しているので、多数の荷電粒子検出器8……が必要で
あり、かつ、それらの検出器8……にそれぞれディスク
リミネータ9……、アンプ10……、カウンタ11……
を接続する必要があった。
Therefore, in the above-mentioned apparatus, a charged particle detector 8 is installed for each energy of the loaded particle, so a large number of charged particle detectors 8 are required, and Each of these detectors 8... has a discriminator 9..., an amplifier 10..., a counter 11...
needed to be connected.

【0005】[0005]

【発明が解決しようとする課題】従って、以上のような
装置においては、荷電粒子検出器8……のほか、多数の
信号処理回路が必要であるために、価格的に高価である
ばかりか、全体の回路構成が複雑であり、また十分な取
付けスペースの確保および多数の荷電粒子検出器8……
の取付け寸法の正確性等を考慮する必要があることから
、設計上非常に煩雑である。
[Problems to be Solved by the Invention] Therefore, in the above-mentioned device, in addition to the charged particle detector 8..., a large number of signal processing circuits are required, so that it is not only expensive, but also expensive. The overall circuit configuration is complex, and sufficient installation space must be secured and a large number of charged particle detectors 8...
Since it is necessary to consider the accuracy of the mounting dimensions, etc., the design is extremely complicated.

【0006】本発明は上記実情に鑑みてなされたもので
、異なるエネルギーの荷電粒子を1個の荷電粒子検出器
によって検出可能とし、コスト的な安価に実現し得、取
付けスペースおよび取付け寸法等の厄介な問題を容易に
解決し得る中性粒子エネルギー分析器を提供することを
目的とする。
The present invention has been made in view of the above-mentioned circumstances, and allows charged particles of different energies to be detected by a single charged particle detector, which can be realized at low cost and saves installation space, installation dimensions, etc. The purpose is to provide a neutral particle energy analyzer that can easily solve difficult problems.

【0007】[0007]

【課題を解決するための手段】本発明に係わる中性粒子
エネルギーの分析器は上記課題を解決するために、荷電
粒子交換器の出力側に、前記荷電粒子のエネルギーに応
じて偏向させて異なる軌道を通って一点に収束させるた
めに、ほぼ2次曲線の形状とした偏向辺をそれぞれ持つ
一対の磁石体を配置し、かつ、前記荷電粒子の収束点に
検出器を設けることにより、1個の荷電粒子検出器で異
なるエネルギーの荷電粒子を検出する構成である。
[Means for Solving the Problems] In order to solve the above-mentioned problems, the neutral particle energy analyzer according to the present invention has different polarities on the output side of the charged particle exchanger depending on the energy of the charged particles. In order to converge the charged particles on one point through the trajectory, a pair of magnets each having a deflection side in the shape of an approximately quadratic curve is arranged, and a detector is provided at the convergence point of the charged particles. The charged particle detector is configured to detect charged particles of different energies.

【0008】[0008]

【作用】従って、本発明は以上のような手段を講じるこ
とにより、荷電粒子偏向側の辺をほぼ2次曲線を持った
一対の磁石体を配置し荷電粒子のエネルギーに応じて各
荷電粒子の軌道を変えながらある特定の軌道上で収束さ
せることにより、この収束点に1個の荷電粒子検出器を
配置して荷電粒子を検出でき、かつ、この荷電粒子検出
器の出力から所定時間内で異なるエネルギーの荷電粒子
数を取得して中性粒子のエネルギースペクトルを得るも
のである。
[Operation] Therefore, by taking the above-mentioned measures, the present invention arranges a pair of magnet bodies whose side on the charged particle deflection side has a substantially quadratic curve, and deflects each charged particle according to the energy of the charged particle. By converging on a certain orbit while changing the orbit, it is possible to detect charged particles by placing one charged particle detector at this convergence point, and to detect charged particles within a predetermined time from the output of this charged particle detector. This method obtains the energy spectrum of neutral particles by acquiring the number of charged particles with different energies.

【0009】[0009]

【実施例】以下、本発明装置の一実施例について図面を
参照して説明する。図1は荷電粒子偏向器を示す図であ
って、これは後述するような所定形状の一対の電磁石体
21によって構成されている。この電磁石体21は、具
体的には荷電粒子交換器としてのストリッピングセルか
ら送られてくる荷電粒子22の入射軸(X軸)に対して
非偏向側となる辺23が入射軸に平行に形成され、また
前記荷電粒子22の入射端側の辺24が前記入射軸と直
交する軸(Y軸)と水平に形成され、かつ、その辺24
の長さが比較的短く形成されている。更に、前記辺23
と反対側つまり入射軸に対して偏向側となる辺25は前
記辺24の下端から所定点Pまで入射軸と平行に形成さ
れ、かつ、そのP点から荷電粒子22のエネルギーに応
じて軌道を変えながら一点に収束するような偏向カーブ
を得るためにほぼ2次曲線の形状に形成されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the apparatus of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a charged particle deflector, which is constituted by a pair of electromagnetic bodies 21 of a predetermined shape as described later. Specifically, this electromagnetic body 21 has a side 23 on the non-deflecting side with respect to the incident axis (X axis) of charged particles 22 sent from a stripping cell serving as a charged particle exchanger, parallel to the incident axis. The side 24 on the incident end side of the charged particles 22 is formed horizontally to the axis (Y axis) perpendicular to the incident axis, and the side 24
The length is relatively short. Furthermore, the side 23
A side 25 on the opposite side, that is, on the deflection side with respect to the incident axis, is formed parallel to the incident axis from the lower end of the side 24 to a predetermined point P, and changes the trajectory from the point P according to the energy of the charged particle 22. In order to obtain a deflection curve that converges to one point while changing, it is formed into a substantially quadratic curve shape.

【0010】そして、この電磁石体21の残りの辺26
はY軸に平行に形成され、前記辺25との交点部分を便
宜上Q点と特定する。従って、辺25のうちP点とQ点
を結ぶ辺においてほぼ2次曲線の形状に形成される。す
なわち、このP点−Q点間の形状は、具体的には一対の
電極となる電磁石体21に対して図示紙面内側から外側
方向へ磁場を与えることにより、一対の電磁石体21,
21内の荷電粒子22がその粒子エネルギーに応じて偏
向されて異なる軌道を通ってその軌道上の一点(X0 
,Y0 )に収束するものとし、かつ、各エネルギーを
持った荷電粒子22が前記辺25を横切る点の座標を(
X,Y)と設定すると、   X=[X0 ・Y+{X0 2 ・Y2 +(Y0
 2 −Y2 )Y2 }]1/2         
                         
                     /(Y+
Y0 )    の式に基づいて定められる。なお、図
中(イ),(ロ),(ハ),(ニ),(ホ)は60ke
v ,120kev ,180kev ,240kev
 ,300kev のエネルギーを有するH+ イオン
の軌道計算結果を示す。
[0010]The remaining side 26 of this electromagnetic body 21
is formed parallel to the Y axis, and the intersection with the side 25 is specified as point Q for convenience. Therefore, the side 25 connecting points P and Q is formed into a substantially quadratic curve shape. That is, the shape between point P and point Q is determined by applying a magnetic field to the electromagnets 21 serving as the pair of electrodes from the inside to the outside in the drawing paper.
A charged particle 22 in 21 is deflected according to its particle energy and passes through different trajectories until it reaches a point (X0
, Y0 ), and the coordinates of the point where the charged particles 22 with each energy cross the side 25 are (
X, Y), then X = [X0 ・Y + {X0 2 ・Y2 + (Y0
2 −Y2 )Y2 }]1/2

/(Y+
Y0) is determined based on the formula. In addition, (a), (b), (c), (d), and (e) in the figure are 60ke.
v, 120kev, 180kev, 240kev
, 300 keV.

【0011】そして、以上のようにして得られた収束点
に表面障壁半導体検出器SSDやPinダイオード検出
器等の1個の荷電粒子検出器27を配置する。さらに、
この荷電粒子検出器27の出力側には図2に示す如くプ
リアンプ28およびリニアアンプ29を介して波高分析
器30が接続されている。
[0011] Then, one charged particle detector 27 such as a surface barrier semiconductor detector SSD or a Pin diode detector is placed at the convergence point obtained as described above. moreover,
A pulse height analyzer 30 is connected to the output side of the charged particle detector 27 via a preamplifier 28 and a linear amplifier 29, as shown in FIG.

【0012】従って、以上のような実施例の構成によれ
ば、一対の電磁石体21,21を用いるとともに、荷電
粒子偏向器の辺25を所定の形状として所定方向に磁場
を与えて入射荷電粒子22を偏向すると、荷電粒子22
はその粒子エネルギーに応じて図1(b)に示すように
異なる軌道を通って一点(X0 ,Y0 )に収束する
ので、この収束点に荷電粒子検出器27を配置しておけ
ば、各エネルギーに応じた荷電粒子22を検出すること
ができる。さらに、この荷電粒子検出器27の出力をプ
リアンプ28で増幅した後、リエアアンプ29で波形整
形および増幅すると、図3に示すようにエネルギーに応
じた種々の波高値e1 ,e2 ,e3 ,…の出力が
得られるので、波高分析器30である所定時間Δtでの
同じ波高値例えばe1 をカウントし、横軸に波高値、
縦軸にカウント値をプロットすれば図4に示すような中
性粒子エネルギースペクトルを得ることができる。
Therefore, according to the configuration of the embodiment as described above, the pair of electromagnets 21, 21 are used, and the side 25 of the charged particle deflector is given a predetermined shape to apply a magnetic field in a predetermined direction to deflect incident charged particles. When 22 is deflected, the charged particle 22
As shown in FIG. 1(b), the particles converge on a single point (X0, Y0) through different trajectories depending on their energy, so if the charged particle detector 27 is placed at this convergence point, each energy It is possible to detect charged particles 22 according to. Furthermore, when the output of this charged particle detector 27 is amplified by a preamplifier 28 and then waveform-shaped and amplified by a rear amplifier 29, outputs of various peak values e1, e2, e3, ... according to energy as shown in FIG. is obtained, the wave height analyzer 30 counts the same wave height value e1 at a predetermined time Δt, and plots the wave height value on the horizontal axis.
By plotting the count value on the vertical axis, a neutral particle energy spectrum as shown in FIG. 4 can be obtained.

【0013】[0013]

【発明の効果】以上詳記したように本発明によれば、1
個の荷電粒子検出器でエネルギーの異なる荷電粒子を検
出することが可能であり、コストの低減化および非常に
簡単な構成に実現でき、かつ、取付けスペース、取付け
寸法等の問題点を改善し得る中性粒子エネルギー分析器
を提供できる。
[Effects of the Invention] As detailed above, according to the present invention, 1
It is possible to detect charged particles with different energies with a single charged particle detector, which can reduce costs and achieve a very simple configuration, and can improve problems such as installation space and installation dimensions. We can provide neutral particle energy analyzers.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】  本発明機器を概略的に示す構成図であって
、同図(a)は正面図、第1図(b)は側面図。
FIG. 1 is a configuration diagram schematically showing the device of the present invention, with FIG. 1(a) being a front view and FIG. 1(b) being a side view.

【図2】  本発明機器における荷電粒子検出器出力の
信号処理系を示すブロック図。
FIG. 2 is a block diagram showing a signal processing system for charged particle detector output in the device of the present invention.

【図3】  本発明機器における検出エネルギーの波高
値の分布状態図。
FIG. 3 is a distribution diagram of peak values of detected energy in the device of the present invention.

【図4】  本発明機器を説明するエネルギースペクト
ル図。
FIG. 4 is an energy spectrum diagram illustrating the device of the present invention.

【図5】  従来機器の構成図。[Figure 5] Block diagram of conventional equipment.

【図6】  従来機器のエネルルギースペクトル図。[Figure 6] Energy spectrum diagram of conventional equipment.

【符号の説明】 21…電磁石体、22…荷電粒子、25…偏向側の辺、
27…荷電粒子検出器、30…波高分析器。
[Explanation of symbols] 21...Electromagnetic body, 22...Charged particles, 25...Deflection side,
27... Charged particle detector, 30... Wave height analyzer.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  入射中性粒子を荷電粒子交換器により
イオン化して得られる荷電粒子を、その荷電粒子エネル
ギーの違いに応じて偏向させて検出する中性粒子エネル
ギー分析器において、前記荷電粒子交換器の出力側に、
前記荷電粒子のエネルギーに応じて偏向させて異なる軌
道を通って一点に収束させるために、ほぼ2次曲線の形
状とした偏向辺を持つ一対の磁石体を配置するとともに
、前記荷電粒子の収束点に1つの検出器を設けて異なる
エネルギーの荷電粒子を検出することを特徴とする中性
粒子エネルギー分析器。
Claim 1. A neutral particle energy analyzer that detects charged particles obtained by ionizing incident neutral particles with a charged particle exchanger by deflecting them according to differences in their charged particle energies, wherein the charged particle exchanger On the output side of the device,
In order to deflect the charged particles according to their energy and converge them on a single point through different trajectories, a pair of magnet bodies each having a deflection side shaped like a substantially quadratic curve is arranged, and a convergence point of the charged particles is arranged. 1. A neutral particle energy analyzer characterized in that a single detector is provided in the detector to detect charged particles of different energies.
JP03063417A 1991-03-27 1991-03-27 Neutral particle energy analyzer Expired - Fee Related JP3112965B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03063417A JP3112965B2 (en) 1991-03-27 1991-03-27 Neutral particle energy analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03063417A JP3112965B2 (en) 1991-03-27 1991-03-27 Neutral particle energy analyzer

Publications (2)

Publication Number Publication Date
JPH04296435A true JPH04296435A (en) 1992-10-20
JP3112965B2 JP3112965B2 (en) 2000-11-27

Family

ID=13228696

Family Applications (1)

Application Number Title Priority Date Filing Date
JP03063417A Expired - Fee Related JP3112965B2 (en) 1991-03-27 1991-03-27 Neutral particle energy analyzer

Country Status (1)

Country Link
JP (1) JP3112965B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007123000A (en) * 2005-10-27 2007-05-17 Japan Atomic Energy Agency Compact high energy focused ion beam forming device using folding tandem type electrostatic accelerator
CN111965689A (en) * 2020-08-12 2020-11-20 中国科学院国家空间科学中心 Measuring device for neutral atom analysis

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007123000A (en) * 2005-10-27 2007-05-17 Japan Atomic Energy Agency Compact high energy focused ion beam forming device using folding tandem type electrostatic accelerator
CN111965689A (en) * 2020-08-12 2020-11-20 中国科学院国家空间科学中心 Measuring device for neutral atom analysis
CN111965689B (en) * 2020-08-12 2021-04-09 中国科学院国家空间科学中心 Measuring device for neutral atom analysis

Also Published As

Publication number Publication date
JP3112965B2 (en) 2000-11-27

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