JPH04291138A - Marking device for flaw portion on strip - Google Patents

Marking device for flaw portion on strip

Info

Publication number
JPH04291138A
JPH04291138A JP3081919A JP8191991A JPH04291138A JP H04291138 A JPH04291138 A JP H04291138A JP 3081919 A JP3081919 A JP 3081919A JP 8191991 A JP8191991 A JP 8191991A JP H04291138 A JPH04291138 A JP H04291138A
Authority
JP
Japan
Prior art keywords
strip
flaw
marking
tracking
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3081919A
Other languages
Japanese (ja)
Inventor
Masaaki Nakano
中野 公明
Hiroyuki Tanaka
宏幸 田中
Noriyuki Yoshioka
紀幸 吉岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP3081919A priority Critical patent/JPH04291138A/en
Publication of JPH04291138A publication Critical patent/JPH04291138A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable a portion with flaw to be identified easily when inspecting it again. CONSTITUTION:A title item consists of a flaw detection device 6 for detecting a flaw on a strip surface based on an amount of voltage which is obtained by scanning the strip surface with laser beam and then receiving a reflection light with a photoelectric conversion element a tracking device 11 for tracking a travel of any position in length direction of the strip based on a peripheral speed of a strip transport roller, and a marking device 12 for performing marking on the portion with flaw on the strip which is obtained from the flaw data from the flaw detection device and the flaw position traveling data from the tracking device. Since a mark is given to the portion with flaw on the strip, a purchaser of a material can find the portion with flaw easily when uncoiling it.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、冷間圧延によって製造
される鋼板ストリップの表面の疵を検出し、かつその有
疵部にマーキングを施す装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for detecting flaws on the surface of a steel strip manufactured by cold rolling and marking the flawed areas.

【0002】0002

【従来の技術】冷間圧延によって製造される鋼板ストリ
ップは、その品質保証のための疵検査が略全面に渡って
行なわれる。このストリップ表面の疵検査方法としては
、ライン内を走行するストリップ表面をレーザー光にて
幅方向に走査し、この反射波をCCD素子などの光電変
換素子によって電圧強度に変換し、この信号データから
疵の有無を判別する方法が既に確立されている(特開昭
63−62825号公報など参照)。
2. Description of the Related Art Steel plate strips produced by cold rolling are inspected for defects over almost the entire surface to ensure quality. This strip surface inspection method involves scanning the strip surface running in a line in the width direction with a laser beam, converting the reflected waves into voltage intensity using a photoelectric conversion element such as a CCD element, and converting this signal data into voltage intensity. A method for determining the presence or absence of flaws has already been established (see Japanese Patent Laid-Open No. 63-62825, etc.).

【0003】一方、このようにして検査した結果は、一
般に文書にて購入者に提示され、疵についても、その性
質や大きさ、並びにその位置が書類上に示されることが
通例である。
[0003] On the other hand, the results of such inspection are generally presented to the purchaser in writing, and the nature, size, and location of flaws are also usually indicated on the document.

【0004】0004

【発明が解決しようとする課題】従って、ストリップ素
材の購入者は、書類上のデータと突合わせて現品を再度
確認する必要があり、その作業が厄介であるばかりでな
く、場合によっては疵を見落としたまま加工されたりす
る虞れもあった。
[Problem to be Solved by the Invention] Therefore, the purchaser of the strip material needs to reconfirm the actual product by comparing it with the data on the document, which is not only troublesome, but may also cause defects. There was also a risk that the information would be processed without being overlooked.

【0005】本発明は、このような従来技術の不都合を
解消すべく案出されたものであり、その主な目的は、有
疵部を再検査するに際し、容易にその部分を識別可能と
するための有疵部マーキング装置を提供することにある
[0005] The present invention was devised to solve the above-mentioned disadvantages of the prior art, and its main purpose is to enable easy identification of defective parts when re-inspecting them. An object of the present invention is to provide a defect marking device for marking a defective part.

【0006】[0006]

【課題を解決するための手段】このような目的は、スト
リップ表面をレーザー光にて走査し、光電変換素子にて
その反射光を受光して得られた電圧強度に基づいてスト
リップ表面の疵を検出するための疵検出装置と、ストリ
ップ搬送ローラの周速に基づいてストリップの長さ方向
の任意の位置の移動を追跡するためのトラッキング装置
と、疵検出装置からの疵データおよびトラッキング装置
からの疵位置移動データから得られたストリップ上の有
疵部にマークを付すためのマーキング装置とからなるこ
とを特徴とするストリップの有疵部マーキング装置によ
って達成される。
[Means for solving the problem] This purpose is to scan the strip surface with a laser beam, and detect the flaws on the strip surface based on the voltage intensity obtained by receiving the reflected light with a photoelectric conversion element. A flaw detection device for detecting flaws, a tracking device for tracking the movement of any position in the length direction of the strip based on the circumferential speed of the strip conveyance roller, and flaw data from the flaw detection device and flaw data from the tracking device. This is achieved by a marking device for marking a flawed portion of a strip, which is characterized in that it comprises a marking device for marking a flawed portion on the strip obtained from flaw position movement data.

【0007】[0007]

【作用】この装置によれば、疵検出装置にて検出された
有疵部をトラッキング装置にて追跡し、プロセス中の適
宜な位置にて塗料などを有疵部に付着させるなどして明
瞭なマーキングを施すことができる。
[Operation] According to this device, the flawed area detected by the flaw detection device is tracked by the tracking device, and paint or the like is applied to the flawed area at an appropriate position during the process to clearly identify the flawed area. Markings can be applied.

【0008】[0008]

【実施例】以下に添付の図面に示された具体的な実施例
に基づいて本発明の構成を詳細に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The structure of the present invention will be described in detail below based on specific embodiments shown in the accompanying drawings.

【0009】図1は、本発明装置の全体構成を示してい
る。本装置は、He −Ne レーザー投光器1からス
トリップ2の表面に向けてレーザースポットを幅方向に
掃引照射し、これの反射光をフォトマルチプライヤなど
からなる受光器3にて受けることによって得られた電圧
強度信号を処理装置4にて処理し、この電圧波形、もし
くはこれを微分して得られた微分波形からストリップ2
の表面の疵を検出すると共に、CRT画面5上に濃淡画
像として表示するように構成された疵検出装置6と、ス
トリップ2を搬送するハースロール7の回転数をパルス
発信器8にて計数し、これを演算器9にて演算して求め
た板速度と、異材同士の溶接部に設けられたパンチ孔を
光電管10にて検出して得たコイル毎の基準位置とから
ストリップ2の送り出し量を検出するトラッキング装置
11と、疵検出装置6からの疵検出データおよびトラッ
キング装置11からのストリップ送り出し量データから
得られたストリップ2上の有疵部に塗料などをスプレー
するためのマーキング装置12と、各装置からのデータ
の集約並びに各装置の統合制御を行なう集中制御盤13
とからなっている。
FIG. 1 shows the overall configuration of the apparatus of the present invention. This device is a He-Ne laser projector 1 that sweeps a laser spot toward the surface of a strip 2 in the width direction, and the reflected light is received by a light receiver 3 consisting of a photomultiplier or the like. A voltage intensity signal is processed by a processing device 4, and a strip 2 is generated from this voltage waveform or a differential waveform obtained by differentiating this voltage waveform.
A flaw detection device 6 configured to detect flaws on the surface of the strip and display them as a grayscale image on a CRT screen 5 and a pulse generator 8 count the number of revolutions of a hearth roll 7 that conveys the strip 2. , the feeding amount of the strip 2 is calculated from the plate speed calculated by the calculator 9 and the reference position for each coil obtained by detecting the punch hole provided in the welded part of dissimilar materials with the phototube 10. and a marking device 12 for spraying paint or the like onto the flawed portion of the strip 2 obtained from the flaw detection data from the flaw detection device 6 and the strip feed amount data from the tracking device 11. , a centralized control panel 13 that aggregates data from each device and performs integrated control of each device.
It consists of

【0010】先ず、受光器3が発する電圧強度信号から
得た電圧波形、もしくは微分波形を予め定められた許容
値と比較し、許容値を超える信号が処理装置4に入力し
た場合には、警報を発すると共に、ディジタルメモリに
逐次記憶して静止画像をCRT画面5上に表示する。と
同時に、この疵発生信号と疵位置とを集中制御盤13へ
出力する。
First, the voltage waveform or differential waveform obtained from the voltage intensity signal emitted by the light receiver 3 is compared with a predetermined tolerance value, and if a signal exceeding the tolerance value is input to the processing device 4, an alarm is issued. At the same time, the still images are sequentially stored in the digital memory and displayed on the CRT screen 5. At the same time, this flaw occurrence signal and the flaw position are output to the central control panel 13.

【0011】一方、作業者は、疵発生時におけるCRT
画面5上の画像を目視にて判断し、有害疵と判別された
場合には、逐一押釦14などにて有疵判定信号を集中制
御盤13へ出力する。
[0011] On the other hand, the operator should
The image on the screen 5 is visually judged, and if it is determined that there is a harmful defect, a defect determination signal is outputted to the central control panel 13 by pressing buttons 14 or the like.

【0012】他方、ハースロール7の回転数から得られ
るストリップ2の送り長さを基にしてストリップ2上の
任意位置の追跡を行なう。そして有害疵判定信号が発せ
られた疵位置をトラッキングし、かつこれの移動に同期
させて集中制御盤13からマーキング装置12に起動信
号を発する。なお、客先別のコイルは中間部で溶接され
ることがあるため、溶接部のパンチ孔を光電管10で検
出し、これをコイル毎の位置基準とする。
On the other hand, an arbitrary position on the strip 2 is tracked based on the feed length of the strip 2 obtained from the number of revolutions of the hearth roll 7. Then, the flaw position where the harmful flaw determination signal has been emitted is tracked, and an activation signal is emitted from the central control panel 13 to the marking device 12 in synchronization with the movement of the flaw. Incidentally, since the coils for each customer are sometimes welded at the middle part, a punch hole in the welded part is detected by the phototube 10, and this is used as a position reference for each coil.

【0013】しかして、有害と判定された疵がマーキン
グ装置12の設置位置を通過するタイミングに同期して
有疵部分に塗料が噴霧される。それと共に、疵データは
外部記憶装置15に入力され、プリントアウトして検査
成績書に添付したり、あるいは検証データとして保存さ
れる。
[0013]The paint is then sprayed onto the flawed portion in synchronization with the timing at which the flaw determined to be harmful passes the installation position of the marking device 12. At the same time, the flaw data is input to the external storage device 15, printed out and attached to the inspection report, or saved as verification data.

【0014】このようにして、再びコイル16に巻き取
られた素材には、疵位置に明瞭なマークが付けられてい
るため、素材コイルの購入者が加工に際してアンコイル
すれば、疵の有無を容易に判別することができることと
なる。
In this way, the material coiled again into the coil 16 has a clear mark at the location of the flaw, so if the purchaser of the material coil uncoils it during processing, it is easy to check the presence or absence of flaws. This means that it can be determined.

【0015】なお、上記実施例においては、有害疵の判
定に作業者の判断を介入させるものとしたが、疵検出の
精度、あるいは閾値の設定如何によって完全自動化も可
能である。
[0015] In the above embodiment, the operator's judgment is involved in determining harmful defects, but complete automation is also possible depending on the accuracy of defect detection or the setting of threshold values.

【0016】[0016]

【発明の効果】このように本発明によれば、ストリップ
上の有疵部分の位置を追跡し、その位置にマークを付け
るようにすることができるため、素材の購入者はアンコ
イルする際に有疵部を容易に発見することができる。従
って、不良部分の除去を行なうに際して購入者に無用な
負担を強いることがなく、その効果は極めて大である。
As described above, according to the present invention, the position of the flawed part on the strip can be tracked and marked at that position, so that the purchaser of the material can easily track the position of the flawed part on the strip. Defects can be easily discovered. Therefore, when removing defective parts, unnecessary burdens are not imposed on the purchaser, and the effect is extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明に基づく有疵部マーキング装置の概略構
成図である。
FIG. 1 is a schematic configuration diagram of a defect marking device based on the present invention.

【符号の説明】[Explanation of symbols]

1  投光器 2  ストリップ 3  受光器 4  処理装置 5  CRT画面 6  疵検出装置 7  ハースロール 8  パルス発信器 9  演算器 10  光電管 11  トラッキング装置 12  マーキング装置 13  集中制御盤 14  押釦 15  外部記憶装置 16  コイル 1 Floodlight 2 Strip 3 Photo receiver 4 Processing equipment 5 CRT screen 6 Flaw detection device 7 Hearth roll 8 Pulse transmitter 9 Arithmetic unit 10 Phototube 11 Tracking device 12 Marking device 13. Centralized control panel 14 Push button 15 External storage device 16 Coil

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】ストリップ表面をレーザー光にて走査し、
光電変換素子にてその反射光を受光して得られた電圧強
度に基づいてストリップ表面の疵を検出するための疵検
出装置と、ストリップ搬送ローラの周速に基づいてスト
リップの長さ方向の任意の位置の移動を追跡するための
トラッキング装置と、前記疵検出装置からの疵データお
よび前記トラッキング装置からの疵位置移動データから
得られたストリップ上の有疵部にマークを付すためのマ
ーキング装置とからなることを特徴とするストリップの
有疵部マーキング装置。
Claim 1: Scanning the strip surface with a laser beam,
A flaw detection device for detecting flaws on the strip surface based on the voltage intensity obtained by receiving the reflected light with a photoelectric conversion element, and a flaw detection device for detecting flaws in the strip length direction based on the circumferential speed of the strip conveyance roller. a tracking device for tracking movement of the position of the strip; and a marking device for marking a flawed portion on the strip obtained from flaw data from the flaw detection device and flaw position movement data from the tracking device. A device for marking a defective part of a strip, comprising:
JP3081919A 1991-03-20 1991-03-20 Marking device for flaw portion on strip Pending JPH04291138A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3081919A JPH04291138A (en) 1991-03-20 1991-03-20 Marking device for flaw portion on strip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3081919A JPH04291138A (en) 1991-03-20 1991-03-20 Marking device for flaw portion on strip

Publications (1)

Publication Number Publication Date
JPH04291138A true JPH04291138A (en) 1992-10-15

Family

ID=13759866

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3081919A Pending JPH04291138A (en) 1991-03-20 1991-03-20 Marking device for flaw portion on strip

Country Status (1)

Country Link
JP (1) JPH04291138A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003084822A (en) * 2001-09-14 2003-03-19 Kawasaki Steel Corp Quality information managing method for steel product
JP2005024431A (en) * 2003-07-03 2005-01-27 Koyo Seiko Co Ltd Visual inspection apparatus
JP2005074448A (en) * 2003-08-29 2005-03-24 Jfe Steel Kk Coil and its manufacturing method
US7248366B2 (en) 1999-03-18 2007-07-24 Nkk Corporation Method for marking defect and device therefor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0290046A (en) * 1988-09-28 1990-03-29 Toshiba Corp Surface inspecting apparatus
JPH02259454A (en) * 1989-03-31 1990-10-22 Nippon Steel Corp Apparatus for displaying coil steel plate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0290046A (en) * 1988-09-28 1990-03-29 Toshiba Corp Surface inspecting apparatus
JPH02259454A (en) * 1989-03-31 1990-10-22 Nippon Steel Corp Apparatus for displaying coil steel plate

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7248366B2 (en) 1999-03-18 2007-07-24 Nkk Corporation Method for marking defect and device therefor
US7423744B2 (en) 1999-03-18 2008-09-09 Nkk Corporation Method for marking defect and device therefor
US7599052B2 (en) 1999-03-18 2009-10-06 Nkk Corporation Method for marking defect and device therefor
JP2003084822A (en) * 2001-09-14 2003-03-19 Kawasaki Steel Corp Quality information managing method for steel product
JP2005024431A (en) * 2003-07-03 2005-01-27 Koyo Seiko Co Ltd Visual inspection apparatus
JP2005074448A (en) * 2003-08-29 2005-03-24 Jfe Steel Kk Coil and its manufacturing method

Similar Documents

Publication Publication Date Title
JP5471818B2 (en) Method and apparatus for inspecting periodic defects in strip material
JPH04291139A (en) Method for reporting portion with flaw on strip
US3781117A (en) Apparatus for surface inspection of moving material
JPS6333160Y2 (en)
JP2822830B2 (en) Defect detection method for printed sheets
JPH08285780A (en) Method for inspecting flaw on outer surface of steel pipe
JPH06148098A (en) Surface defect inspection apparatus
JP3293587B2 (en) Defect marking method, work method of defect-marked coil, and method of manufacturing defect-marked coil
JPH04291138A (en) Marking device for flaw portion on strip
JP2001188046A (en) Manufacturing method for defect-marked coil
JPS63180323A (en) Method for display and discharge of defective part of metal coil thin plate for can making
JP2827651B2 (en) Defect Hazard Measurement System for Steel Plate
JPH07198627A (en) Metallic surface defect inspection device
JP3243394B2 (en) Flaw inspection device
JPH0763699A (en) Flaw inspection apparatus
KR20100026619A (en) Glass inspection apparatus and inspection method thereof
JP2000205847A (en) Method and device for inspecting surface flaw
JPS63169542A (en) Inspecting method for surface abnormality of concrete structure
JP3051001B2 (en) Defect inspection equipment
JPH07306160A (en) Method for inspecting quality of plain material
JP2002090307A (en) Surface defect inspection device and inspected result display method for surface defect inspection device
JP2005157960A (en) Number counting method and number counting device for round bar
JP2002090306A (en) Self-diagnostic method for surface inspection device
JPH0450754A (en) Detecting device for display for defect flaw identification of steel plate
JP2001347315A (en) Method of manufacturing for coil having defect marking, method for marking defect and method for operating coil having defect marking