JPH04285864A - Frequency measuring apparatus - Google Patents

Frequency measuring apparatus

Info

Publication number
JPH04285864A
JPH04285864A JP7377491A JP7377491A JPH04285864A JP H04285864 A JPH04285864 A JP H04285864A JP 7377491 A JP7377491 A JP 7377491A JP 7377491 A JP7377491 A JP 7377491A JP H04285864 A JPH04285864 A JP H04285864A
Authority
JP
Japan
Prior art keywords
frequency
oscillator
measuring device
low
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7377491A
Other languages
Japanese (ja)
Inventor
Shinichi Kono
伸一 河野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP7377491A priority Critical patent/JPH04285864A/en
Publication of JPH04285864A publication Critical patent/JPH04285864A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain the title apparatus wherein a high-precision frequency mea surement may be attained with a low-precision frequency measuring device. CONSTITUTION:A frequency measuring apparatus is constituted of an oscillator 1 to be measured, a reference oscillator 2 oscillating frequency as near as possible to the oscillation frequency of the oscillator 1 to be measured, a mixer 3 multiplying the output of the oscillator 1 to be measured by the output of the reference oscillator 2, an LPF 4 taking out only the low frequency component of the output of the mixer 3 and a frequency measuring device 6 measuring the output frequency of the LPF 4. A schmitt trigger buffer 5 may be inserted on the output side of the LPF 4.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は周波数測定装置に関し、
特に低精度でしかも低周波数用の周波数測定器を用いて
高い周波数を高精度に測定可能とした周波数測定装置に
関する。
[Industrial Application Field] The present invention relates to a frequency measuring device.
In particular, the present invention relates to a frequency measuring device that is capable of measuring high frequencies with high accuracy using a low-accuracy frequency measuring device for low frequencies.

【0002】0002

【従来の技術】従来の周波数測定装置では、例えば図2
に示すように被測定発振器1の発振周波数を直接測定す
るための周波数測定器11として構成されたものがある
。又、図3のように周波数分周器13を周波数測定器1
2の前段に挿入し、被測定発振器1の周波数を分周して
低周波にして測定する装置もある。
[Prior Art] In a conventional frequency measuring device, for example, as shown in FIG.
As shown in FIG. 1, there is a frequency measuring device 11 configured to directly measure the oscillation frequency of the oscillator 1 under test. Also, as shown in FIG. 3, the frequency divider 13 is connected to the frequency measuring device 1
There is also a device that is inserted before the oscillator 2 and divides the frequency of the oscillator under test 1 to make it a lower frequency for measurement.

【0003】0003

【発明が解決しようとする課題】上述した図2に示す周
波数測定装置では、周波数測定器11には周波数測定精
度以上(通常では測定精度の10倍以上)の高精度が必
要とされ、かつ被測定発振器1の発振周波数以上が測定
可能な周波数測定範囲が要求される。特に、発振周波数
を高精度で測定する場合には、測定精度以上の高精度の
周波数測定器が必要とされるという問題がある。このこ
とは、図3の分周器13を用いて周波数測定を行う周波
数測定器12の場合でも、高周波数測定範囲は緩和され
るものの、高精度が要求される点は同様である。本発明
の目的は、低精度の周波数測定器で高精度に周波数測定
を実現可能とした周波数測定装置を提供することにある
[Problems to be Solved by the Invention] In the frequency measuring device shown in FIG. 2 described above, the frequency measuring device 11 is required to have high accuracy higher than the frequency measurement accuracy (usually 10 times or more the measurement accuracy), and A frequency measurement range in which the oscillation frequency of the measurement oscillator 1 or higher can be measured is required. In particular, when measuring the oscillation frequency with high precision, there is a problem in that a frequency measuring device with higher precision than the measurement precision is required. This is the same in the case of the frequency measuring device 12 that measures frequencies using the frequency divider 13 in FIG. 3, although the high frequency measurement range is relaxed, but high accuracy is required. SUMMARY OF THE INVENTION An object of the present invention is to provide a frequency measuring device that can measure frequencies with high precision using a low-precision frequency measuring device.

【0004】0004

【発明が解決しようとする課題】本発明の周波数測定装
置は、周波数が測定される被測定発振器と、この被測定
発振器の発振周波数に可及的に近い周波数を発振する基
準発振器と、前記被測定発振器と基準発振器の出力を乗
算するミキサと、このミキサ出力の低周波成分のみを取
り出す低域ろ波器と、この低域ろ波器の出力周波数を測
定する周波数測定器とで構成される。必要に応じて、低
域ろ波器の出力側にシュミット・トリガ・バッファを介
挿することができる。
SUMMARY OF THE INVENTION The frequency measuring device of the present invention comprises: an oscillator to be measured whose frequency is to be measured; a reference oscillator that oscillates at a frequency as close as possible to the oscillation frequency of the oscillator to be measured; Consists of a mixer that multiplies the outputs of the measurement oscillator and reference oscillator, a low-pass filter that extracts only the low-frequency components of this mixer output, and a frequency measuring device that measures the output frequency of this low-pass filter. . If necessary, a Schmitt trigger buffer can be inserted at the output side of the low-pass filter.

【0005】[0005]

【作用】本発明によれば、被測定発振器の発振周波数と
、基準発振器の発振周波数との差を周波数測定器で測定
するため、低周波数及び低精度の周波数測定器での測定
が可能となる。
[Operation] According to the present invention, since the difference between the oscillation frequency of the oscillator under test and the oscillation frequency of the reference oscillator is measured with a frequency measuring instrument, measurement can be performed using a frequency measuring instrument with low frequency and low accuracy. .

【0006】[0006]

【実施例】次に、本発明について図面を参照して説明す
る。図1は本発明の構成を示すブロック図である。同図
において、1はVCXO(水晶発振型電圧制御発振器)
等の被測定発振器1であり、これには被測定発振器1の
発振周波数と可及的に近く、周波数精度の高い基準発振
器2を設け、これら発振器1,2の出力をミキサ3に入
力する。そして、このミキサ3において各発振器1,2
の出力を乗算することで、各出力の周波数成分の和と差
を出力する。更に、このミキサ3の出力をLPF(低域
ろ波器)4を通すことにより和の成分を減衰させて差の
成分のみを取り出し、この差の成分をシュミット・トリ
ガ・バッファ5を通した上で周波数測定器6において周
波数測定を行っている。このシュミット・トリガ・バッ
ファ5は、前記LPF4の出力に含まれている高調波成
分によって周波数測定器6が誤測定するのを避けるため
に、高調波成分を除去する機能を有する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained with reference to the drawings. FIG. 1 is a block diagram showing the configuration of the present invention. In the figure, 1 is a VCXO (crystal oscillation type voltage controlled oscillator)
A reference oscillator 2 having an oscillation frequency as close as possible to the oscillation frequency of the oscillator 1 to be measured and having high frequency accuracy is provided to the oscillator 1 to be measured, and the outputs of these oscillators 1 and 2 are input to a mixer 3. In this mixer 3, each oscillator 1, 2
By multiplying the outputs of , the sum and difference of the frequency components of each output are output. Furthermore, the output of this mixer 3 is passed through an LPF (low pass filter) 4 to attenuate the sum component and extract only the difference component, and this difference component is passed through a Schmitt trigger buffer 5 and then filtered. The frequency is measured by the frequency measuring device 6. This Schmitt trigger buffer 5 has a function of removing harmonic components in order to prevent the frequency measuring device 6 from making erroneous measurements due to harmonic components contained in the output of the LPF 4.

【0007】したがって、この周波数測定装置では、周
波数測定器6において被測定発振器1と基準発振器2と
の周波数差を測定し、この周波数差と基準発振器2の発
振周波数を用いることで被測定発振器1の発振周波数を
算出することができる。そして、この測定に際しては、
周波数測定器6は周波数差を測定可能な低周波数の測定
器で良く、しかも基準発振器2の精度並の精度で測定で
きる。
Therefore, in this frequency measuring device, the frequency difference between the oscillator 1 under test and the reference oscillator 2 is measured in the frequency measuring device 6, and the oscillation frequency of the oscillator 2 is used to determine the oscillator 1 under test. The oscillation frequency of can be calculated. And when making this measurement,
The frequency measuring device 6 may be a low frequency measuring device capable of measuring frequency differences, and can measure with an accuracy comparable to that of the reference oscillator 2.

【0008】具体的に数値を用いて示すと、基準発振器
2の発振周波数     100MHZ 精度10−9
( 0.1HZ ) 被測定発振器1の発振周波数   100MHZ ±1
0KHZ (100MHZ ± 100ppm )上記
2周波数の差            ±10KHZ 
周波数測定器6の精度を10ppm としたとき±10
KHZ を測定したときの誤差 ± 0.1HZ (±10KHZ ×10ppm )基
準発振周波数( 100MHZ )に対する誤差(± 
0.1HZ )の割合  10−9 したがって、精度10ppm の測定器を用いて、基準
発振器並の精度(10−9オーダー)で周波数を測定す
ることができる。尚、周波数測定器6が誤動作するおそ
れがない場合には、シュミット・トリガ・バッファは省
略してもよい。
[0008] Specifically, using numerical values, the oscillation frequency of the reference oscillator 2 is 100 MHz, and the accuracy is 10-9.
(0.1Hz) Oscillation frequency of oscillator under test 1 100MHz ±1
0KHZ (100MHZ ± 100ppm) Difference between the above two frequencies ±10KHZ
±10 when the accuracy of the frequency measuring device 6 is 10 ppm
Error when measuring KHZ ± 0.1HZ (±10KHZ × 10ppm) Error (±
Therefore, using a measuring device with an accuracy of 10 ppm, it is possible to measure the frequency with an accuracy comparable to that of the reference oscillator (10-9 order). Note that the Schmitt trigger buffer may be omitted if there is no risk of the frequency measuring device 6 malfunctioning.

【0009】[0009]

【発明の効果】以上説明したように本発明は、被測定発
振器と基準発振器の各発振周波数の差を周波数測定器で
測定するため、低周波用の低精度の周波数測定器を用い
て基準発振器並の精度で被測定発振器の発振周波数を測
定できるという効果を有する。
Effects of the Invention As explained above, the present invention uses a low-precision frequency measuring device for low frequencies to measure the difference between the oscillation frequencies of the oscillator under test and the reference oscillator. This has the effect of being able to measure the oscillation frequency of the oscillator under test with average accuracy.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の一実施例のブロック図である。FIG. 1 is a block diagram of one embodiment of the present invention.

【図2】従来の周波数測定装置の一例のブロック図であ
る。
FIG. 2 is a block diagram of an example of a conventional frequency measurement device.

【図3】従来の周波数測定装置の他の例のブロック図で
ある。
FIG. 3 is a block diagram of another example of a conventional frequency measurement device.

【符号の説明】[Explanation of symbols]

1  被測定発振器 2  基準発振器 3  ミキサ 4  LPF 5  シュミット・トリガ・バッファ 6  周波数測定器 1 Oscillator under test 2 Reference oscillator 3 Mixer 4 LPF 5 Schmitt trigger buffer 6 Frequency measuring device

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  周波数が測定される被測定発振器と、
この被測定発振器の発振周波数に可及的に近い周波数を
発振する基準発振器と、前記被測定発振器と基準発振器
の出力を乗算するミキサと、このミキサ出力の低周波成
分のみを取り出す低域ろ波器と、この低域ろ波器の出力
周波数を測定する周波数測定器とで構成されることを特
徴とする周波数測定装置。
[Claim 1] An oscillator under test whose frequency is measured;
A reference oscillator that oscillates at a frequency as close as possible to the oscillation frequency of the oscillator under test, a mixer that multiplies the outputs of the oscillator under test and the reference oscillator, and a low-pass filter that extracts only the low frequency components of the mixer output. 1. A frequency measuring device comprising: a low-pass filter; and a frequency measuring device that measures the output frequency of the low-pass filter.
【請求項2】  低域ろ波器の出力側にシュミット・ト
リガ・バッファを介挿してなる請求項1の周波数測定装
置。
2. The frequency measuring device according to claim 1, further comprising a Schmitt trigger buffer inserted on the output side of the low-pass filter.
JP7377491A 1991-03-14 1991-03-14 Frequency measuring apparatus Pending JPH04285864A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7377491A JPH04285864A (en) 1991-03-14 1991-03-14 Frequency measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7377491A JPH04285864A (en) 1991-03-14 1991-03-14 Frequency measuring apparatus

Publications (1)

Publication Number Publication Date
JPH04285864A true JPH04285864A (en) 1992-10-09

Family

ID=13527895

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7377491A Pending JPH04285864A (en) 1991-03-14 1991-03-14 Frequency measuring apparatus

Country Status (1)

Country Link
JP (1) JPH04285864A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007010593A (en) * 2005-07-04 2007-01-18 Yokogawa Electric Corp Frequency measurement circuit, and vibration sensor type differential pressure/pressure transmitter using the same
JP2007057393A (en) * 2005-08-24 2007-03-08 Epson Toyocom Corp Frequency stability measuring system
JP2014052282A (en) * 2012-09-07 2014-03-20 Rohm Co Ltd Frequency measurement circuit

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54148576A (en) * 1978-05-15 1979-11-20 Mitsubishi Electric Corp Frequency calibrator
JPS5694275A (en) * 1979-12-28 1981-07-30 Fuji Electric Co Ltd Frequency detector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54148576A (en) * 1978-05-15 1979-11-20 Mitsubishi Electric Corp Frequency calibrator
JPS5694275A (en) * 1979-12-28 1981-07-30 Fuji Electric Co Ltd Frequency detector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007010593A (en) * 2005-07-04 2007-01-18 Yokogawa Electric Corp Frequency measurement circuit, and vibration sensor type differential pressure/pressure transmitter using the same
JP2007057393A (en) * 2005-08-24 2007-03-08 Epson Toyocom Corp Frequency stability measuring system
JP2014052282A (en) * 2012-09-07 2014-03-20 Rohm Co Ltd Frequency measurement circuit

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