JPH04277518A - Thermosetting resin composition and its cured product - Google Patents
Thermosetting resin composition and its cured productInfo
- Publication number
- JPH04277518A JPH04277518A JP6234991A JP6234991A JPH04277518A JP H04277518 A JPH04277518 A JP H04277518A JP 6234991 A JP6234991 A JP 6234991A JP 6234991 A JP6234991 A JP 6234991A JP H04277518 A JPH04277518 A JP H04277518A
- Authority
- JP
- Japan
- Prior art keywords
- formula
- resin
- resins
- resin composition
- epoxy resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000011342 resin composition Substances 0.000 title claims description 16
- 229920001187 thermosetting polymer Polymers 0.000 title claims description 14
- 239000003822 epoxy resin Substances 0.000 claims abstract description 49
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 49
- 239000005011 phenolic resin Substances 0.000 claims abstract description 27
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 claims abstract description 5
- 125000001183 hydrocarbyl group Chemical group 0.000 claims abstract 3
- 125000001624 naphthyl group Chemical group 0.000 claims description 17
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 13
- 125000005843 halogen group Chemical group 0.000 claims description 5
- 125000004432 carbon atom Chemical group C* 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910052799 carbon Chemical group 0.000 claims description 2
- 229920001568 phenolic resin Polymers 0.000 abstract description 16
- 239000000203 mixture Substances 0.000 abstract description 14
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 abstract description 8
- 230000009477 glass transition Effects 0.000 abstract description 6
- 239000005007 epoxy-phenolic resin Substances 0.000 abstract description 4
- 229910052736 halogen Inorganic materials 0.000 abstract 1
- 150000002367 halogens Chemical class 0.000 abstract 1
- LMBFAGIMSUYTBN-MPZNNTNKSA-N teixobactin Chemical compound C([C@H](C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](CO)C(=O)N[C@H](CCC(N)=O)C(=O)N[C@H]([C@@H](C)CC)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](CO)C(=O)N[C@H]1C(N[C@@H](C)C(=O)N[C@@H](C[C@@H]2NC(=N)NC2)C(=O)N[C@H](C(=O)O[C@H]1C)[C@@H](C)CC)=O)NC)C1=CC=CC=C1 LMBFAGIMSUYTBN-MPZNNTNKSA-N 0.000 abstract 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 22
- 229920005989 resin Polymers 0.000 description 17
- 239000011347 resin Substances 0.000 description 17
- 239000004065 semiconductor Substances 0.000 description 12
- 238000000465 moulding Methods 0.000 description 11
- 239000011256 inorganic filler Substances 0.000 description 10
- 229910003475 inorganic filler Inorganic materials 0.000 description 10
- 238000002156 mixing Methods 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 4
- 229910052801 chlorine Inorganic materials 0.000 description 4
- 150000002430 hydrocarbons Chemical group 0.000 description 4
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 4
- FZZQNEVOYIYFPF-UHFFFAOYSA-N naphthalene-1,6-diol Chemical compound OC1=CC=CC2=CC(O)=CC=C21 FZZQNEVOYIYFPF-UHFFFAOYSA-N 0.000 description 4
- 229910000679 solder Inorganic materials 0.000 description 4
- -1 3,3,3-trifluoropropyl group Chemical group 0.000 description 3
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical group [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 3
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 3
- 238000005452 bending Methods 0.000 description 3
- 239000003638 chemical reducing agent Substances 0.000 description 3
- 239000000460 chlorine Substances 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 229920001577 copolymer Polymers 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 229920003986 novolac Polymers 0.000 description 3
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- 239000006087 Silane Coupling Agent Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 125000000217 alkyl group Chemical group 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 2
- 229910052794 bromium Inorganic materials 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 229930003836 cresol Natural products 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 230000002209 hydrophobic effect Effects 0.000 description 2
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 150000002989 phenols Chemical class 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 238000011417 postcuring Methods 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- SMQUZDBALVYZAC-UHFFFAOYSA-N salicylaldehyde Chemical compound OC1=CC=CC=C1C=O SMQUZDBALVYZAC-UHFFFAOYSA-N 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 229920002379 silicone rubber Polymers 0.000 description 2
- 239000004945 silicone rubber Substances 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- 239000001993 wax Substances 0.000 description 2
- BRLQWZUYTZBJKN-UHFFFAOYSA-N Epichlorohydrin Chemical compound ClCC1CO1 BRLQWZUYTZBJKN-UHFFFAOYSA-N 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 125000002723 alicyclic group Chemical group 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910000410 antimony oxide Inorganic materials 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- 125000005998 bromoethyl group Chemical group 0.000 description 1
- 239000006229 carbon black Substances 0.000 description 1
- 239000004203 carnauba wax Substances 0.000 description 1
- 235000013869 carnauba wax Nutrition 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 125000001309 chloro group Chemical group Cl* 0.000 description 1
- 125000004218 chloromethyl group Chemical group [H]C([H])(Cl)* 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 229910002026 crystalline silica Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 235000014113 dietary fatty acids Nutrition 0.000 description 1
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 239000000194 fatty acid Substances 0.000 description 1
- 229930195729 fatty acid Natural products 0.000 description 1
- 150000004665 fatty acids Chemical class 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 238000004898 kneading Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000006082 mold release agent Substances 0.000 description 1
- VTRUBDSFZJNXHI-UHFFFAOYSA-N oxoantimony Chemical compound [Sb]=O VTRUBDSFZJNXHI-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 238000001721 transfer moulding Methods 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Compositions Of Macromolecular Compounds (AREA)
- Phenolic Resins Or Amino Resins (AREA)
- Epoxy Resins (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、溶融粘度が低く、成形
特性に優れ、かつ、機械的強度、ガラス転移温度が高く
、しかも低吸湿性、低線膨張性、高接着性を有する硬化
物を与え、特に薄型の半導体パッケージ用として好適に
用いられる熱硬化性樹脂組成物に関する。[Industrial Application Field] The present invention provides a cured product that has low melt viscosity, excellent molding properties, high mechanical strength, and high glass transition temperature, as well as low hygroscopicity, low linear expansion, and high adhesiveness. The present invention relates to a thermosetting resin composition suitable for use particularly in thin semiconductor packages.
【0002】0002
【従来の技術及び発明が解決しようとする課題】従来、
エポキシ樹脂、エポキシ樹脂の硬化剤としてのフェノー
ル樹脂及び無機質充填材を配合した熱硬化性樹脂組成物
が半導体パッケージ用に使用されている。[Prior art and problems to be solved by the invention] Conventionally,
A thermosetting resin composition containing an epoxy resin, a phenol resin as a hardening agent for the epoxy resin, and an inorganic filler is used for semiconductor packages.
【0003】しかし、近年半導体パッケージの薄型化に
伴ない、種々の問題が発生している。例えば、フラット
パッケージをプリント基板に実装する際にパッケージを
高温の半田浴に浸漬するが、この際従来の熱硬化性樹脂
組成物によるパッケージでは熱衝撃によりパッケージに
クラックが発生したり、また、プリント基板にフラット
パッケージを実装する前にパッケージが吸湿していた場
合、高温の半田浴に浸漬した際にパッケージ中で水蒸気
爆発が起こり、クラックが発生するという問題が指摘さ
れている。そこで、このような問題の対策としてフレー
ムと樹脂との両面から改良が検討されており、樹脂に関
しては、機械的強度が高く、ガラス転移温度が高いとい
った性能に加え、吸湿性が低いこと、線膨張係数が小さ
いこと、フレームとの接着性が良好なことなどの性能が
求められている。本発明者らはすでにこのような性能を
持ったエポキシ樹脂組成物として、特願平2−1559
6号、同2−160489号、同2−292715号に
ナフタレン環を含有するエポキシ樹脂やフェノール樹脂
を主成分とするものが薄型パッケージ用の樹脂として従
来にない優れた特徴を持っていることを提案した。更に
、特開昭62−143920号、特開平2−23591
8号公報にも同様の提案が記載されている。しかし、こ
れらのナフタレン環を含有するエポキシ樹脂やフェノー
ル樹脂は、重合度が高いことから軟化点が高く、この種
の樹脂を用いてエポキシ樹脂組成物を製造する場合、無
機質充填材の充填量に限界が生じることもあり、また、
ピン数の多いパッケージをモールドする場合、樹脂の溶
融粘度が高いためアイランドを変形させるおそれもある
。However, as semiconductor packages have become thinner in recent years, various problems have arisen. For example, when a flat package is mounted on a printed circuit board, the package is immersed in a high-temperature solder bath. At this time, packages made of conventional thermosetting resin compositions may crack due to thermal shock, or It has been pointed out that if a flat package absorbs moisture before it is mounted on a board, a water vapor explosion will occur in the package when it is immersed in a high-temperature solder bath, causing cracks. Therefore, as a countermeasure to this problem, improvements are being considered from both the frame and the resin.As for the resin, in addition to performance such as high mechanical strength and high glass transition temperature, it also has low hygroscopicity and wire resistance. Performance requirements include a small coefficient of expansion and good adhesion to the frame. The present inventors have already published Japanese Patent Application No. 1559/1999 as an epoxy resin composition having such performance.
No. 6, No. 2-160489, and No. 2-292715 show that epoxy resins containing naphthalene rings and phenol resins as main components have excellent characteristics that have not been seen before as resins for thin packages. Proposed. Furthermore, JP-A-62-143920, JP-A-2-23591
A similar proposal is also described in Publication No. 8. However, these naphthalene ring-containing epoxy resins and phenolic resins have a high softening point due to their high degree of polymerization, and when producing epoxy resin compositions using these types of resins, the amount of inorganic filler filled must be There may be limitations, and
When molding a package with a large number of pins, there is a risk that the island may be deformed due to the high melt viscosity of the resin.
【0004】更に、1,6−ジヒドロキシナフタレンを
グリシジルエーテル化したエポキシ樹脂も市販されてお
り、このエポキシ樹脂は溶融粘度が非常に低いことから
樹脂組成物に多量の充填材を配合することができ、その
ため膨張係数を著しく低下させることはできる。しかし
、このエポキシ樹脂を主成分とする樹脂組成物で封止し
た半導体デバイスは耐湿性が悪く、かつその硬化物は高
温、特に200℃以上の温度で減量が大きいという欠点
がある。Furthermore, epoxy resins made by converting 1,6-dihydroxynaphthalene into glycidyl ether are also commercially available, and since this epoxy resin has a very low melt viscosity, it is possible to incorporate a large amount of filler into the resin composition. Therefore, the expansion coefficient can be significantly reduced. However, a semiconductor device encapsulated with a resin composition containing this epoxy resin as a main component has a drawback that its moisture resistance is poor, and its cured product loses a large amount of weight at high temperatures, particularly at temperatures of 200° C. or higher.
【0005】[0005]
【課題を解決するための手段及び作用】本発明者は上記
事情に鑑み、より高性能の熱硬化性樹脂組成物を得るた
め鋭意検討を重ねた結果、下記(I)式で示されるナフ
タレン環含有エポキシ樹脂及びフェノール樹脂が高い剛
直性を持つ疎水性の大きいナフタレン環をもつことから
反応性が良好で、かつ、溶融粘度が低く、エポキシ樹脂
やその硬化剤として作用するフェノール樹脂として、か
かるナフタレン環含有エポキシ樹脂及び/又はフェノー
ル樹脂を配合することにより、無機質充填材の充填量を
大幅に増加させることができ、このように充填材量を多
くしても成形特性に優れている上、高機械的強度、高ガ
ラス転移温度で低吸湿性、低線膨張係数、高接着性を有
する硬化物を与え、半導体パッケージ用として好適な熱
硬化性樹脂組成物が得られることを知見し、本発明をな
すに至ったものである。[Means and effects for solving the problems] In view of the above circumstances, the present inventors have made extensive studies to obtain a thermosetting resin composition with higher performance, and have found that the naphthalene ring represented by the following formula (I) Since the epoxy resins and phenolic resins contained therein have a large hydrophobic naphthalene ring with high rigidity, they have good reactivity and low melt viscosity, and these naphthalene resins are used as phenolic resins that act as epoxy resins and their curing agents. By blending a ring-containing epoxy resin and/or a phenolic resin, the amount of inorganic filler can be greatly increased. It was discovered that a thermosetting resin composition suitable for use in semiconductor packages can be obtained, giving a cured product having mechanical strength, high glass transition temperature, low hygroscopicity, low coefficient of linear expansion, and high adhesiveness, and the present invention This is what we have come to do.
【0006】[0006]
【化2】
(但し、式中R0は水素原子又はグリシジル基、R1は
水素原子、ハロゲン原子又は炭素数1〜6の非置換又は
置換の1価炭化水素基、R2は水素原子又は炭素数1〜
6の非置換又は置換の1価炭化水素基である。)[Formula 2] (However, in the formula, R0 is a hydrogen atom or a glycidyl group, R1 is a hydrogen atom, a halogen atom, or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 6 carbon atoms, and R2 is a hydrogen atom or a carbon number 1 ~
6 unsubstituted or substituted monovalent hydrocarbon groups. )
【00
07】以下、本発明について更に詳しく説明すると、本
発明に係る熱硬化性樹脂組成物は、エポキシ樹脂及びそ
の硬化剤としてのフェノール樹脂として下記(I)式の
構造式で示されるナフタレン環含有エポキシ樹脂及び/
又はフェノール樹脂を配合するものである。
これらナフタレン環含有エポキシ樹脂及びフェノール樹
脂は高い剛直性を持つ疎水性の大きいナフタレン環をも
つことから、従来のナフタレン環を含む樹脂と異なり、
反応性が良好でかつ溶融粘度の低い材料である。00
[07] To explain the present invention in more detail below, the thermosetting resin composition according to the present invention comprises a naphthalene ring-containing epoxy represented by the structural formula (I) below as an epoxy resin and a phenol resin as a curing agent for the epoxy resin. resin and/or
Alternatively, a phenol resin may be added. These naphthalene ring-containing epoxy resins and phenolic resins have a highly rigid and highly hydrophobic naphthalene ring, so unlike conventional naphthalene ring-containing resins,
It is a material with good reactivity and low melt viscosity.
【0008】[0008]
【化3】[Chemical formula 3]
【0009】ここで、(I)式中のR0は水素原子又は
グリシジル基である。また、R1は水素原子、ハロゲン
原子又は炭素数1〜6の非置換又は置換の1価炭化水素
基であり、具体的には水素原子、塩素原子、臭素原子、
メチル基、エチル基、n−プロピル基、イソプロピル基
、n−ブチル基、t−ブチル基などの低級アルキル基あ
るいはこれらの基の水素原子の一部又は全部がフッ素、
塩素、臭素等のハロゲン原子で置換されたクロロメチル
基、ブロモエチル基、3,3,3−トリフルオロプロピ
ル基等が挙げられる。更に、R2は水素原子又は炭素数
1〜6の非置換又は置換の1価炭化水素基であり、例え
ば水素原子、メチル基、エチル基、n−プロピル基、イ
ソプロピル基、n−ブチル基、t−ブチル基などの低級
アルキル基、フェニル基などのアリール基あるいはこれ
らの基の水素原子の一部又は全部が前記と同様のハロゲ
ン原子等で置換された基等が挙げられる。Here, R0 in formula (I) is a hydrogen atom or a glycidyl group. Further, R1 is a hydrogen atom, a halogen atom, or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 6 carbon atoms, and specifically, a hydrogen atom, a chlorine atom, a bromine atom,
Lower alkyl groups such as methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, t-butyl group, or some or all of the hydrogen atoms of these groups are fluorine,
Examples include a chloromethyl group, a bromoethyl group, and a 3,3,3-trifluoropropyl group substituted with a halogen atom such as chlorine or bromine. Further, R2 is a hydrogen atom or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 6 carbon atoms, such as a hydrogen atom, methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, t Examples include lower alkyl groups such as -butyl groups, aryl groups such as phenyl groups, and groups in which some or all of the hydrogen atoms of these groups are substituted with the same halogen atoms as mentioned above.
【0010】このような(I)式のエポキシ樹脂及びフ
ェノール樹脂として具体的には、下記の化合物が例示さ
れる。Specific examples of such epoxy resins and phenol resins of formula (I) include the following compounds.
【0011】[0011]
【化4】[C4]
【0012】なお、上記(I)式のエポキシ樹脂及びフ
ェノール樹脂は、半導体封止用に用いる場合、加水分解
性塩素が1000ppm以下、望ましくは500ppm
以下、ナトリウム、カリウムは10ppm以下であるこ
とが好ましい。加水分解性塩素が1000ppm以上、
ナトリウム、カリウムが10ppm以上の樹脂で半導体
装置を封止し、長時間高温高湿下に半導体装置を放置し
た場合、耐湿性が劣化する傾向がある。[0012] When the epoxy resin and phenol resin of the above formula (I) are used for semiconductor encapsulation, the hydrolyzable chlorine content is 1000 ppm or less, preferably 500 ppm.
Hereinafter, it is preferable that sodium and potassium are 10 ppm or less. Hydrolyzable chlorine is 1000 ppm or more,
When a semiconductor device is sealed with a resin containing 10 ppm or more of sodium or potassium and left in a high temperature and high humidity environment for a long time, the moisture resistance tends to deteriorate.
【0013】上述した(I)式のナフタレン環含有フェ
ノール樹脂は、1,6−ジヒドロキシナフタレンとフェ
ノール、クレゾール等のフェノール性水酸基を有する化
合物、更にはホルマリン、サリチルアルデヒドとを通常
の方法で縮合反応させることで容易に合成することがで
きる。この場合、1,6−ジヒドロキシナフタレンとフ
ェノール類などとの配合比率は1:0.8〜1:1.2
とすることが好ましく、配合比率が上記割合をはずれる
と目的とするナフタレン環含有フェノール樹脂が得られ
ず、生成物中における1,6−ジヒドロキシナフタレン
とフェノール類との組成比率が原料の配合比率と異なっ
た樹脂や重合体が得られる場合がある。更に、(I)式
のナフタレン環含有エポキシ樹脂は、上述のようにして
得られた(I)式のナフタレン環含有フェノール樹脂に
エピクロルヒドリンを反応させて従来のエポキシ樹脂と
同様の操作及び反応条件で容易に合成することができる
。The above-mentioned naphthalene ring-containing phenolic resin of formula (I) is prepared by condensing 1,6-dihydroxynaphthalene with a compound having a phenolic hydroxyl group such as phenol or cresol, or with formalin or salicylaldehyde in a conventional manner. It can be easily synthesized by In this case, the blending ratio of 1,6-dihydroxynaphthalene and phenols, etc. is 1:0.8 to 1:1.2.
If the blending ratio deviates from the above ratio, the desired naphthalene ring-containing phenolic resin will not be obtained, and the composition ratio of 1,6-dihydroxynaphthalene and phenols in the product will not match the blending ratio of the raw materials. Different resins and polymers may be obtained. Furthermore, the naphthalene ring-containing epoxy resin of formula (I) can be obtained by reacting the naphthalene ring-containing phenol resin of formula (I) obtained as described above with epichlorohydrin under the same operation and reaction conditions as conventional epoxy resins. Can be easily synthesized.
【0014】本発明では、樹脂の低粘度化のため(I)
式のエポキシ樹脂及びフェノール樹脂が組成物中のエポ
キシ樹脂及びフェノール樹脂全体の50重量%以上であ
ることが好ましく、50重量%に満たないと樹脂の溶融
粘度が高くなり、無機質充填材の充填量を上げることが
できなかったり、成形時のトラブルを引き起こすことに
なる場合がある。In the present invention, in order to reduce the viscosity of the resin, (I)
It is preferable that the epoxy resin and phenol resin of the formula account for 50% by weight or more of the total epoxy resin and phenol resin in the composition. If it is less than 50% by weight, the melt viscosity of the resin will increase and the amount of inorganic filler filled will increase. It may not be possible to raise the temperature, or it may cause trouble during molding.
【0015】本発明においては、(I)式のエポキシ樹
脂やフェノール樹脂のほかに従来から使用されているそ
の他のエポキシ樹脂やフェノール樹脂も併用して用いる
ことができる。In the present invention, in addition to the epoxy resin and phenol resin of formula (I), other conventionally used epoxy resins and phenol resins can also be used in combination.
【0016】この場合、その他のエポキシ樹脂は1分子
中にエポキシ基を少なくとも2個有するものであれば如
何なるものであっても良く、例えば、ビスフェノールA
型エポキシ樹脂、ノボラック型エポキシ樹脂、脂環式エ
ポキシ樹脂、グリシジル型エポキシ樹脂や、下記式で示
されるエポキシ樹脂が挙げられる。また、これらエポキ
シ樹脂を適宜組み合わせても良い。In this case, the other epoxy resin may be any resin as long as it has at least two epoxy groups in one molecule; for example, bisphenol A
Examples include epoxy resins such as type epoxy resins, novolac type epoxy resins, alicyclic epoxy resins, glycidyl type epoxy resins, and epoxy resins represented by the following formulas. Further, these epoxy resins may be combined as appropriate.
【0017】[0017]
【化5】[C5]
【0018】これらエポキシ樹脂は軟化点が50℃〜1
00℃でエポキシ当量が100〜400を有するものが
望ましい。These epoxy resins have a softening point of 50°C to 1
It is desirable to have an epoxy equivalent of 100 to 400 at 00°C.
【0019】また、その他のフェノール樹脂は(I)式
のナフタレン環含有フェノール樹脂と同様にエポキシ樹
脂の硬化剤として作用するもので、例えばフェノールノ
ボラック樹脂、クレゾールノボラック樹脂、トリフェノ
ールメタンなどのフェノール性水酸基を2個以上有する
ものや、下記に示される構造のものが使用可能である。Other phenolic resins act as curing agents for epoxy resins in the same way as the naphthalene ring-containing phenolic resin of formula (I), such as phenolic novolak resins, cresol novolak resins, triphenolmethane, etc. Those having two or more hydroxyl groups and those having the structure shown below can be used.
【0020】[0020]
【化6】[C6]
【0021】更に、前記フェノール樹脂の中でも軟化点
が60℃〜120℃を有するものが好ましく、水酸基当
量としては90〜150のものが望ましい。Further, among the above-mentioned phenolic resins, those having a softening point of 60°C to 120°C are preferable, and those having a hydroxyl equivalent of 90 to 150 are preferable.
【0022】なお、難燃化のためブロム化エポキシ樹脂
などの臭素を含有するエポキシ樹脂やフェノール樹脂な
どを使用することもできる。[0022] For flame retardancy, bromine-containing epoxy resins such as brominated epoxy resins, phenolic resins, etc. can also be used.
【0023】本発明において、フェノール樹脂((I)
式のナフタレン環含有フェノール樹脂及びその他のフェ
ノール樹脂)の使用量は、エポキシ樹脂((I)式のナ
フタレン環含有エポキシ樹脂及びその他のエポキシ樹脂
)のエポキシ基と水酸基の当量比が0.5から2の範囲
であれば如何なる量でも良いが、通常エポキシ樹脂10
0重量部に対し30〜100重量部、特に40〜70重
量部であることが好ましい。30重量部未満では十分な
強度が得られない場合があり、一方100重量部を超え
ると未反応のフェノール樹脂が残って耐湿性を低下させ
る場合がある。In the present invention, phenolic resin ((I)
The amount of the naphthalene ring-containing phenolic resin and other phenolic resins (formula (I)) to be used is such that the equivalent ratio of epoxy groups to hydroxyl groups in the epoxy resin (naphthalene ring-containing epoxy resin and other epoxy resins of formula (I)) is from 0.5 to 0.5. Any amount may be used as long as it is within the range of 2, but usually the epoxy resin is 10
It is preferably 30 to 100 parts by weight, particularly 40 to 70 parts by weight relative to 0 parts by weight. If it is less than 30 parts by weight, sufficient strength may not be obtained; on the other hand, if it exceeds 100 parts by weight, unreacted phenol resin may remain, reducing moisture resistance.
【0024】本発明の熱硬化性樹脂組成物には、その硬
化物に可とう性を付与するため低応力化剤を添加するこ
とが好ましい。低応力化剤としては、例えば下記(II
)式で示されるシリコーン変性樹脂、メタクリル酸メチ
ル−スチレン−ブタジエン共重合体、スチレン−エチレ
ン−ブテン−スチレン共重合体などの熱可塑性樹脂、シ
リコーンゲルやシリコーンゴムなどの微粉末を添加する
ことができる。It is preferable to add a stress reducing agent to the thermosetting resin composition of the present invention in order to impart flexibility to the cured product. As the stress reducing agent, for example, the following (II
), thermoplastic resins such as methyl methacrylate-styrene-butadiene copolymer, styrene-ethylene-butene-styrene copolymer, and fine powders such as silicone gel and silicone rubber can be added. can.
【0025】[0025]
【化7】
(但し、R0は(I)式と同様であり、nは0以上の整
数である。)embedded image (However, R0 is the same as in formula (I), and n is an integer of 0 or more.)
【0026】また、二液タイプのシリコーンゴムやシリ
コーンゲルで無機質充填材表面を処理してもよいが、中
でも上記(II)式のシリコーン変性樹脂やスチレン−
ブタジエン−メタクリル酸メチル共重合体がエポキシ樹
脂の低応力化に効果がある。Furthermore, the surface of the inorganic filler may be treated with a two-component type silicone rubber or silicone gel, but among these, silicone-modified resin of the formula (II) above or styrene-modified resin may be used.
Butadiene-methyl methacrylate copolymer is effective in reducing stress in epoxy resins.
【0027】これらの低応力化剤の使用量は通常熱硬化
性樹脂組成物全体の0.5〜10重量%、特に1〜5重
量%であることが好ましい。0.5重量%に満たない配
合量では十分な耐熱衝撃性を与えない場合があり、一方
10重量%を超えると機械的強度が低下する場合がある
。The amount of these stress reducing agents used is usually 0.5 to 10% by weight, particularly preferably 1 to 5% by weight, based on the entire thermosetting resin composition. If the amount is less than 0.5% by weight, sufficient thermal shock resistance may not be provided, while if it exceeds 10% by weight, mechanical strength may decrease.
【0028】本発明では更に無機質充填材を添加するこ
とができる。無機質充填材は封止材の膨張係数を小さく
し、半導体素子に加わる応力を低下させるためのもので
ある。具体例としては破砕状、球状の形状を持った溶融
シリカ、結晶性シリカが主に用いられるが、この外にア
ルミナ、チッ化ケイ素、チッ化アルミなども使用可能で
ある。なお、硬化物の低膨張化と成形性を両立させるた
めには球状と破砕品のブレンド、あるいは球状品のみを
用いた方がよい。なお、無機質充填材の平均粒径として
は5〜20ミクロンのものが好ましい。、また、この種
の無機質充填材はあらかじめシランカップリング剤で表
面処理して使用したほうがよい。In the present invention, an inorganic filler can be further added. The inorganic filler is used to reduce the expansion coefficient of the sealing material and reduce the stress applied to the semiconductor element. As specific examples, crushed or spherical fused silica and crystalline silica are mainly used, but alumina, silicon nitride, aluminum nitride, etc. can also be used. In order to achieve both low expansion and moldability of the cured product, it is better to use a blend of spherical and crushed products, or only spherical products. Note that the average particle size of the inorganic filler is preferably 5 to 20 microns. Moreover, it is better to use this type of inorganic filler after surface treatment with a silane coupling agent in advance.
【0029】無機質充填材の充填量はエポキシ樹脂とフ
ェノール樹脂との合計量100重量部に対し200〜1
600重量部が好ましく、200重量部未満では膨張係
数が大きくなり、半導体素子に加わる応力が増大し、素
子特性の劣化を招く場合があり、また1600重量部を
超えると成形時の粘度が高くなり、成形性が悪くなる場
合がある。The amount of inorganic filler to be filled is 200 to 1 part by weight per 100 parts by weight of the total amount of epoxy resin and phenol resin.
600 parts by weight is preferable; if it is less than 200 parts by weight, the expansion coefficient will increase, stress applied to the semiconductor element will increase, and device characteristics may deteriorate; if it exceeds 1,600 parts by weight, the viscosity during molding will increase. , moldability may deteriorate.
【0030】本発明の組成物には硬化触媒を添加するこ
とが好ましく、例えばイミダゾールもしくはその誘導体
、ホスフィン誘導体、シクロアミジン誘導体が代表例と
して挙げられる。触媒量としてはエポキシ樹脂100重
量部に対し0.001〜5重量部、特に0.1〜2重量
部とすることが好ましく、0.001重量部未満では短
時間で硬化させることができない場合があり、5重量部
を超えると硬化速度が早すぎて良好な成形品が得られな
い場合がある。It is preferable to add a curing catalyst to the composition of the present invention, typical examples of which include imidazole or its derivatives, phosphine derivatives, and cycloamidine derivatives. The amount of catalyst is preferably 0.001 to 5 parts by weight, particularly 0.1 to 2 parts by weight, based on 100 parts by weight of the epoxy resin, and if it is less than 0.001 parts by weight, curing may not be possible in a short time. If the amount exceeds 5 parts by weight, the curing speed may be too fast and a good molded product may not be obtained.
【0031】本発明の熱硬化性樹脂組成物には、上記成
分以外に必要に応じその他の任意成分、例えばカルナバ
ワックス、高級脂肪酸、合成ワックス類などの離型剤、
更にシランカップリング剤、酸化アンチモン、リン化合
物などを配合しても良い。In addition to the above-mentioned components, the thermosetting resin composition of the present invention may optionally contain other optional components such as a mold release agent such as carnauba wax, higher fatty acids, and synthetic waxes.
Furthermore, a silane coupling agent, antimony oxide, a phosphorus compound, etc. may be added.
【0032】本発明の組成物は、上記した各成分を加熱
ロールによる溶融混練、ニーダーによる溶融混練、連続
押し出し機による溶融混練などを行なうことで製造する
ことができる。なお、成分の配合順序に特に制限はない
。The composition of the present invention can be produced by melt-kneading the above-mentioned components using heated rolls, a kneader, a continuous extruder, or the like. Note that there is no particular restriction on the order of blending the components.
【0033】このようにして得られる本発明のエポキシ
樹脂組成物は、DIP型、フラツトパック型、PLCC
型,SO型等の半導体パッケージに有効で、この場合、
従来より採用されている成形法、例えばトランスファー
成形、インジェクション成形、注型法等を採用して行な
うことができる。なお、本発明のエポキシ樹脂組成物の
成形温度は150〜180℃、ポストキュアーは150
〜185℃で2〜16時間行なうことが好ましい。The epoxy resin composition of the present invention thus obtained can be used in DIP type, flat pack type, PLCC type, etc.
It is effective for semiconductor packages such as type, SO type, etc. In this case,
This can be carried out by employing conventional molding methods such as transfer molding, injection molding, and casting. The molding temperature of the epoxy resin composition of the present invention is 150 to 180°C, and the post-cure temperature is 150°C.
Preferably, the reaction is carried out at ˜185° C. for 2 to 16 hours.
【0034】[0034]
【発明の効果】本発明の熱硬化性樹脂組成物は、(I)
式のナフタレン環含有エポキシ樹脂及び/又はフェノー
ル樹脂を配合したことにより、低溶融粘度で成形特性に
優れ、かつ、高機械的強度、高ガラス転移温度を有し、
耐湿性、耐熱性、接着性に優れた硬化物を与える。従っ
て、本発明組成物は特に薄型の半導体パッケージ用とし
て好適に使用することができる。[Effects of the Invention] The thermosetting resin composition of the present invention has (I)
By blending the naphthalene ring-containing epoxy resin and/or phenol resin of the formula, it has low melt viscosity and excellent molding properties, as well as high mechanical strength and high glass transition temperature.
Provides a cured product with excellent moisture resistance, heat resistance, and adhesion. Therefore, the composition of the present invention can be particularly suitably used for thin semiconductor packages.
【0035】[0035]
【実施例】以下、実施例と比較例を示し、本発明を具体
的に説明するが、本発明は下記実施例に制限されるもの
ではない。なお、以下の例において部はいずれも重量部
を示す。[Examples] The present invention will be specifically explained below with reference to Examples and Comparative Examples, but the present invention is not limited to the following Examples. In addition, in the following examples, all parts indicate parts by weight.
【0036】〔実施例、比較例〕表1に示す成分に加え
、γ−グリシドキシプロピルトリメトキシシラン1.5
部、ワックスE1.5部、カーボンブラック1.0部、
トリフェニルホスフィン0.8部を加えて得られた配合
物を熱二本ロールで均一に溶融混練して、8種の熱硬化
性樹脂組成物を製造した(実施例1〜5、比較例1〜3
)。[Example, Comparative Example] In addition to the components shown in Table 1, γ-glycidoxypropyltrimethoxysilane 1.5
parts, wax E 1.5 parts, carbon black 1.0 parts,
The mixture obtained by adding 0.8 part of triphenylphosphine was uniformly melt-kneaded using two heated rolls to produce eight types of thermosetting resin compositions (Examples 1 to 5, Comparative Example 1). ~3
).
【0037】これらのエポキシ樹脂組成物について以下
の(イ)〜(ニ)の諸特性を測定した。
(イ)スパイラルフロー
EMMI規格に準じた金型を使用して175℃、70k
g/cm2の条件で測定した。
(ロ)機械的強度(曲げ強度、曲げ弾性率)JISK6
911に準じて175℃、70kg/cm2、成形時間
2分の条件で10×100×4mmの抗折棒を成形し、
180℃で4時間ポストキュアーしたもので測定した。
(ハ)ガラス転移温度、膨張係数
175℃、70kg/cm2、成形時間2分の条件で4
×4×15mmの試験片を成形し、180℃で4時間ポ
ストキュアーしたものを用い、ディラトメーターにより
毎分5℃で昇温させることにより測定した。
(ニ)吸湿後の吸湿量と半田クラック性及び耐湿性17
5℃、70kg/cm2、成形時間2分の条件でアルミ
ニウム配線腐食測定用の耐湿性試験用半導体装置を厚さ
2mmのフラットパッケージに封止し、180℃で4時
間ポストキュアーした。このパッケージを85℃/85
%RHの雰囲気中に72時間放置して吸湿処理を行なっ
た後、吸湿量を測定し、これを260℃の半田浴に10
秒浸漬した。この時に発生するパッケージのクラック発
生数を確認したのち、良品のみを120℃の飽和水蒸気
雰囲気中に所定時間放置し、不良発生率を調べた。
(ホ)接着性
42アロイ板に直径15mm、高さ5mmの円筒成形品
を175℃、70kg/cm2、成形時間2分の条件で
成形し、180℃で4時間ポストキュアーした後、プッ
シュプルゲージで成形物と42アロイ板の剥離力を測定
した。The following properties (a) to (d) were measured for these epoxy resin compositions. (a) Using a mold that complies with spiral flow EMMI standards at 175°C and 70k.
It was measured under the condition of g/cm2. (b) Mechanical strength (bending strength, bending modulus) JISK6
A bending rod of 10 x 100 x 4 mm was molded under the conditions of 175°C, 70 kg/cm2, and 2 minutes of molding time according to 911.
Measurements were made after post-curing at 180°C for 4 hours. (c) Glass transition temperature, expansion coefficient 175℃, 70kg/cm2, molding time 2 minutes 4
A test piece of 4 x 15 mm was molded, post-cured at 180°C for 4 hours, and measured using a dilatometer by raising the temperature at 5°C per minute. (d) Moisture absorption amount after moisture absorption, solder crack resistance and moisture resistance 17
A semiconductor device for moisture resistance testing for aluminum wiring corrosion measurement was sealed in a flat package with a thickness of 2 mm under the conditions of 5° C., 70 kg/cm 2 and a molding time of 2 minutes, and post-cured at 180° C. for 4 hours. This package is 85℃/85
%RH atmosphere for 72 hours to perform moisture absorption treatment, measure the amount of moisture absorption, and place it in a solder bath at 260°C for 10 hours.
Dipped for seconds. After confirming the number of cracks that occurred in the package at this time, only the non-defective products were left in a saturated steam atmosphere at 120° C. for a predetermined period of time, and the defect occurrence rate was examined. (e) Adhesion A cylindrical molded product with a diameter of 15 mm and a height of 5 mm was molded on a 42 alloy plate under the conditions of 175°C, 70 kg/cm2, and a molding time of 2 minutes, and after post-curing at 180°C for 4 hours, a push-pull gauge was used. The peel force between the molded product and the 42 alloy plate was measured.
【0038】[0038]
【表1】[Table 1]
【0039】[0039]
【化8】[Chemical formula 8]
【0040】[0040]
【化9】
** BERN−S:臭素化エポキシ樹脂(日本化薬
株式会社製)[Chemical formula 9] ** BERN-S: Brominated epoxy resin (manufactured by Nippon Kayaku Co., Ltd.)
Claims (1)
含有エポキシ樹脂及び/又はフェノール樹脂を含有して
なることを特徴とする熱硬化性樹脂組成物。 【化1】 (但し、式中R0は水素原子又はグリシジル基、R1は
水素原子、ハロゲン原子又は炭素数1〜6の非置換又は
置換の1価炭化水素基、R2は水素原子又は炭素数1〜
6の非置換又は置換の1価炭化水素基である。)【請求
項2】 請求項1記載の熱硬化性樹脂組成物を硬化さ
せることにより得られる硬化物。1. A thermosetting resin composition comprising a naphthalene ring-containing epoxy resin and/or a phenol resin represented by the following formula (I). [Formula 1] (However, in the formula, R0 is a hydrogen atom or a glycidyl group, R1 is a hydrogen atom, a halogen atom, or an unsubstituted or substituted monovalent hydrocarbon group having 1 to 6 carbon atoms, and R2 is a hydrogen atom or a carbon number 1 ~
6 unsubstituted or substituted monovalent hydrocarbon groups. ) [Claim 2] A cured product obtained by curing the thermosetting resin composition according to Claim 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6234991A JP2616265B2 (en) | 1991-03-05 | 1991-03-05 | Thermosetting resin composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6234991A JP2616265B2 (en) | 1991-03-05 | 1991-03-05 | Thermosetting resin composition |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04277518A true JPH04277518A (en) | 1992-10-02 |
JP2616265B2 JP2616265B2 (en) | 1997-06-04 |
Family
ID=13197559
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6234991A Expired - Lifetime JP2616265B2 (en) | 1991-03-05 | 1991-03-05 | Thermosetting resin composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2616265B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006093203A1 (en) * | 2005-03-02 | 2006-09-08 | Dainippon Ink And Chemicals, Inc. | Epoxy resin composition, cured object obtained therefrom, semiconductor-encapsulating material, novel phenolic resin, and novel epoxy resin |
US7985822B2 (en) | 2004-09-01 | 2011-07-26 | Dainippon Ink And Chemicals, Inc. | Epoxy resin composition,cured article thereof, semiconductor sealing material, novel phenol resin, novel epoxy resin,method for producing novel phenol resin, and method for producing novel epoxy resin |
-
1991
- 1991-03-05 JP JP6234991A patent/JP2616265B2/en not_active Expired - Lifetime
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7985822B2 (en) | 2004-09-01 | 2011-07-26 | Dainippon Ink And Chemicals, Inc. | Epoxy resin composition,cured article thereof, semiconductor sealing material, novel phenol resin, novel epoxy resin,method for producing novel phenol resin, and method for producing novel epoxy resin |
US8263714B2 (en) | 2004-09-01 | 2012-09-11 | Dainippon Ink And Chemicals, Inc. | Epoxy resin composition, cured article thereof, semiconductor sealing material, novel phenol resin, novel epoxy resin, method for producing novel phenol resin, and method for producing novel epoxy resin |
WO2006093203A1 (en) * | 2005-03-02 | 2006-09-08 | Dainippon Ink And Chemicals, Inc. | Epoxy resin composition, cured object obtained therefrom, semiconductor-encapsulating material, novel phenolic resin, and novel epoxy resin |
JP2006274236A (en) * | 2005-03-02 | 2006-10-12 | Dainippon Ink & Chem Inc | Epoxy resin composition, cured object obtained therefrom, semiconductor-encapsulating material, novel phenolic resin, and novel epoxy resin |
KR100893562B1 (en) * | 2005-03-02 | 2009-04-17 | 디아이씨 가부시끼가이샤 | Epoxy resin composition, cured object obtained therefrom, semiconductor-encapsulating material, novel phenolic resin, and novel epoxy resin |
US8420749B2 (en) | 2005-03-02 | 2013-04-16 | Dainippon Ink And Chemicals, Inc. | Epoxy resin composition and cured article thereof, semiconductor encapsulation material, novel phenol resin, and novel epoxy resin |
US8440781B2 (en) | 2005-03-02 | 2013-05-14 | Dainippon Ink And Chemicals, Inc. | Epdxy resin composition and cured article thereof, semiconductor encapsulation material, novel phenol resin, and novel epdoxy resin |
Also Published As
Publication number | Publication date |
---|---|
JP2616265B2 (en) | 1997-06-04 |
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