JPH0427482B2 - - Google Patents

Info

Publication number
JPH0427482B2
JPH0427482B2 JP55107576A JP10757680A JPH0427482B2 JP H0427482 B2 JPH0427482 B2 JP H0427482B2 JP 55107576 A JP55107576 A JP 55107576A JP 10757680 A JP10757680 A JP 10757680A JP H0427482 B2 JPH0427482 B2 JP H0427482B2
Authority
JP
Japan
Prior art keywords
image
deformed
scanning
grating
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55107576A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5730903A (en
Inventor
Masanori Idesawa
Toyohiko Yatagai
Masane Suzuki
Kyoshi Suzuki
Hideharu Ooshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
RIKEN
Original Assignee
Fujinon Corp
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujinon Corp, RIKEN filed Critical Fujinon Corp
Priority to JP10757680A priority Critical patent/JPS5730903A/ja
Publication of JPS5730903A publication Critical patent/JPS5730903A/ja
Publication of JPH0427482B2 publication Critical patent/JPH0427482B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP10757680A 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis Granted JPS5730903A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10757680A JPS5730903A (en) 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10757680A JPS5730903A (en) 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis

Publications (2)

Publication Number Publication Date
JPS5730903A JPS5730903A (en) 1982-02-19
JPH0427482B2 true JPH0427482B2 (OSRAM) 1992-05-12

Family

ID=14462667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10757680A Granted JPS5730903A (en) 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis

Country Status (1)

Country Link
JP (1) JPS5730903A (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166807A (ja) * 1983-03-14 1984-09-20 Yamatake Honeywell Co Ltd 形状確認装置
JPS61231139A (ja) * 1985-04-06 1986-10-15 Nippon Steel Corp 高強度フエライト系耐熱鋼

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4925106B1 (OSRAM) * 1971-03-13 1974-06-27
JPS52116263A (en) * 1976-03-25 1977-09-29 Rikagaku Kenkyusho Method of indicating and processing threeedimensional information on objects

Also Published As

Publication number Publication date
JPS5730903A (en) 1982-02-19

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