JPH04270949A - Apparatus for detecting flaw - Google Patents

Apparatus for detecting flaw

Info

Publication number
JPH04270949A
JPH04270949A JP5798291A JP5798291A JPH04270949A JP H04270949 A JPH04270949 A JP H04270949A JP 5798291 A JP5798291 A JP 5798291A JP 5798291 A JP5798291 A JP 5798291A JP H04270949 A JPH04270949 A JP H04270949A
Authority
JP
Japan
Prior art keywords
opening
light source
peripheral surface
box
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5798291A
Other languages
Japanese (ja)
Inventor
Sumihiko Kawashima
川島 純彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyobo Co Ltd
Original Assignee
Toyobo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyobo Co Ltd filed Critical Toyobo Co Ltd
Priority to JP5798291A priority Critical patent/JPH04270949A/en
Publication of JPH04270949A publication Critical patent/JPH04270949A/en
Pending legal-status Critical Current

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Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

PURPOSE:To detect not only a flaw such as the air bubble contained in a transparent film but also a flaw such as the fine surface flaw of said film. CONSTITUTION:A light source 11 is provided in a box body 10 having an opening part 16 and a shield plate 12 whose outer peripheral surface A is positioned outside the opening inner peripheral surface B of the opening part 16 is provided between the light source 11 and the opening part 16. A photographing apparatus is provided within the range surrounded by the segments L connecting the outer peripheral surface A of the shield plate 12 and the opening inner peripheral surface B of the opening part 16 at a great distance from the intersecting point (r) of the segments L outside the box body 10.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、フィルム等の透光性部
材の欠点を検出するための欠点検出装置に関するもので
ある。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a defect detection device for detecting defects in a translucent member such as a film.

【0002】0002

【従来技術】従来、フィルム等の欠点を検出するための
装置として、フィルム等の測定対象に下方から光を当て
、測定対象の上方に設けたCCDカメラ等の撮像装置に
て測定対象の像を撮影し、欠点を検出する方法(透過光
観察方式)が実用化されている。
[Prior Art] Conventionally, as a device for detecting defects in a film, etc., an object to be measured such as a film is illuminated with light from below, and an image of the object to be measured is captured using an imaging device such as a CCD camera installed above the object to be measured. A method of photographing and detecting defects (transmitted light observation method) has been put into practical use.

【0003】0003

【発明が解決しようとする課題】しかし、従来の欠点検
出装置では、フィルムを透過した光も撮像装置のレンズ
内に入るため、欠点の映像が見え難く、特にフィルム内
に含有された透明な気泡を検出することはできなかった
[Problems to be Solved by the Invention] However, with conventional defect detection devices, the light that has passed through the film also enters the lens of the imaging device, making it difficult to see images of defects. could not be detected.

【0004】したがって、この発明の目的は、透光性測
定対象内に含有された透明な気泡等の欠点を検出できる
と同時に、測定対象の表面傷等の欠点も精度よく検出で
きる欠点検出装置を提供することである。
Therefore, an object of the present invention is to provide a defect detection device that can detect defects such as transparent bubbles contained in a translucent measurement object, and can also accurately detect defects such as surface scratches on the measurement object. It is to provide.

【0005】[0005]

【課題を解決するための手段】この発明の欠点検出装置
は、開口部を有した箱体箱体内に光源を設け、光源と開
口部との間に外周面が前記開口部の開口内周面より外側
に位置した遮蔽板を設け、遮蔽板の外周面と開口部の開
口内周面とを結んだ線分の箱体の外部における交点より
遠方において線分で囲まれた範囲内に撮像装置を設けた
ものである。
[Means for Solving the Problems] A defect detection device of the present invention includes a light source provided in a box body having an opening, and an outer circumferential surface between the light source and the opening and an inner circumferential surface of the opening. A shielding plate located on the outer side is provided, and an imaging device is installed within the range surrounded by the line segment at a distance from the intersection of the line segment connecting the outer peripheral surface of the shielding plate and the inner peripheral surface of the opening on the outside of the box. It has been established.

【0006】本発明の作用を図1を用いて説明する。箱
体10内に設けた光源11から出た光は、それぞれ反射
面となった遮蔽板12の下面、底板内面13、側板内面
14で反射し、上板15の開口部16から外部へ照射さ
れる。この時、遮蔽板12の外周面Aと上板15の開口
部16の内周面Bとを結ぶ線分Lにおいて、光の射出角
θは最小となる。この様な射出角θが最小となる光線L
を、以後、最小射出角光線と呼ぶ。
The operation of the present invention will be explained using FIG. The light emitted from the light source 11 provided inside the box body 10 is reflected by the lower surface of the shielding plate 12, the inner surface of the bottom plate 13, and the inner surface of the side plate 14, which serve as reflective surfaces, and is irradiated to the outside through the opening 16 of the upper plate 15. Ru. At this time, in the line segment L connecting the outer circumferential surface A of the shielding plate 12 and the inner circumferential surface B of the opening 16 of the upper plate 15, the light emission angle θ becomes the minimum. The light ray L whose exit angle θ is the minimum
is hereinafter referred to as the minimum exit angle ray.

【0007】遮蔽板12の幅をa、上板15の開口部1
6の幅をc、上板15と遮蔽板12までの距離をbとす
る。また、最小射出角光線Lにおいて、その光線Lが交
わる点γと上壁15までの距離をX、交点γから任意の
距離Zにおける光線の広がりをVとする。この時、X、
Z、V、a、b、c、の関係は式■,■のようになる。 X=b×c/(a−c)              
      ・・・■V=c×Z/X=(a−c)×Z
/b        ・・・■
The width of the shielding plate 12 is a, and the opening 1 of the upper plate 15 is
The width of 6 is c, and the distance between the upper plate 15 and the shielding plate 12 is b. Further, in the minimum exit angle ray L, the distance between the point γ where the ray L intersects and the upper wall 15 is X, and the spread of the ray at an arbitrary distance Z from the intersection γ is V. At this time, X,
The relationships among Z, V, a, b, and c are as shown in the equations (■) and (■). X=b×c/(a-c)
...■V=c×Z/X=(a-c)×Z
/b...■

【0008】今、上板1
5からX+Zの位置に、有効口径Dのレンズを置いたと
すると、下式■の条件が満たされるならば、光源11か
らの光はレンズには入らない。 D<V                      
              ・・・■
[0008] Now, the upper plate 1
Assuming that a lens with an effective aperture D is placed at a position X+Z from 5, the light from the light source 11 will not enter the lens if the condition (2) below is satisfied. D<V
...■

【0009】し
たがって、式■の条件を満たすように、CCDカメラや
写真カメラ等の欠点像検出用撮像装置を設け、撮像装置
と箱体10との間に測定対象を置いて観察すると、測定
対象の表面に傷や内部気泡等の欠点がある場合は、その
部分で光が散乱し、欠点像のみ明るく浮かび上がり、非
常に鮮明な像が得られる。
Therefore, when an imaging device for defect image detection such as a CCD camera or a photo camera is provided so as to satisfy the condition of formula (2), and an object to be measured is placed between the imaging device and the box 10 and observed, If there are defects such as scratches or internal air bubbles on the surface, light will be scattered at those areas, and only the defect image will stand out brightly, resulting in a very clear image.

【0010】このようにして、従来不可能であった透明
フィルム内に含有された透明な気泡等の欠点を検出でき
ると同時に、従来難しかった微小な表面傷等の欠点も検
出できるようになる。
[0010] In this way, it is possible to detect defects such as transparent air bubbles contained within a transparent film, which was previously impossible, and at the same time, it is also possible to detect defects such as minute surface scratches, which were previously difficult to detect.

【0011】なお、箱体10の形状は立方体に限らず、
円柱状,球状等であってもよく、また遮蔽板12の下面
が反射面でなく、単に光を遮蔽するだけのものであって
、光源の光は箱体の内面のみで反射して開口部から照射
されるものであってもよい。
[0011] The shape of the box 10 is not limited to a cube;
It may be cylindrical, spherical, etc., and the lower surface of the shielding plate 12 is not a reflective surface but merely shields light, and the light from the light source is reflected only by the inner surface of the box and does not pass through the opening. It may be irradiated from.

【0012】さらに、測定対象は、透明フィルムに限ら
ず、透光性のものであればよく、しかもシート状のもの
でなくてもよい。また、測定する欠点も、気泡や表面傷
に限らず、内部の傷や不純物等の光を散乱し像を明るく
浮かび上がらせるものであれば検出できる。
Furthermore, the object to be measured is not limited to a transparent film, but may be any light-transmitting object, and may not be in the form of a sheet. Furthermore, the defects to be measured are not limited to bubbles and surface scratches, but can be detected as long as they scatter light and make the image appear brighter, such as internal scratches and impurities.

【0013】[0013]

【実施例】本発明の一実施例を図2を用いて説明する。 10は、上板15,側板17,底板18よりなる立方体
の箱体であり、上板15の内面19は黒の艶消し塗装等
の無反射処理が施されており、側板内面14ならびに底
板内面13は反射鏡としての機能を果たすようにアルミ
ニュウムコート等の処理が施されている。上板15には
円形の開口部16が形成されており、底板内面13には
光源11が設けられている。また、12は遮蔽板であり
、開口部16より外径が大な円形に形成されており、下
面が反射鏡としての機能を果たすようにアルミニュウム
コートなどの処理が施され、上面は黒の艶消し塗装等の
無反射処理が施されている。20は、遮蔽板12を保持
するための保持板であり、光が透過するようにガラス板
等の透明板にて形成されている。21はフィルム等の測
定対象であり、さらに22は欠点像を観察するためのC
CDカメラ等の撮像装置であって、前記■式の関係が満
たされるように配置される。
[Embodiment] An embodiment of the present invention will be described with reference to FIG. 10 is a cubic box consisting of a top plate 15, a side plate 17, and a bottom plate 18. The inner surface 19 of the top plate 15 is treated with anti-reflection treatment such as black matte coating, and the inner surface 14 of the side plate and the inner surface of the bottom plate are 13 is coated with aluminum or the like so that it functions as a reflecting mirror. A circular opening 16 is formed in the top plate 15, and a light source 11 is provided on the inner surface 13 of the bottom plate. In addition, 12 is a shielding plate, which is formed into a circular shape with an outer diameter larger than the opening 16. The lower surface is coated with aluminum so that it functions as a reflecting mirror, and the upper surface is coated with black gloss. Anti-reflective treatment such as erase painting has been applied. Reference numeral 20 denotes a holding plate for holding the shielding plate 12, and is made of a transparent plate such as a glass plate so that light can pass therethrough. 21 is an object to be measured such as a film, and 22 is a C for observing a defect image.
It is an imaging device such as a CD camera, and is arranged so that the relationship of the above-mentioned equation (2) is satisfied.

【0014】光源11の光は、遮蔽板12の下面,底板
内面13,側板内面14で反射し、上板15の開口部1
6を通り、測定対象21を照明する。照明された測定対
象21は撮像装置22で観察される。撮像装置22は、
前記■式の関係が満たされるように配置されているため
、撮像装置22には光源11の光は入射せず、欠点像の
みが明るく浮かび上がり、フィルム表面の微小な傷や、
内部の気泡も鮮明に検出できる。
The light from the light source 11 is reflected by the lower surface of the shielding plate 12, the inner surface 13 of the bottom plate, and the inner surface 14 of the side plates, and is reflected by the opening 1 of the upper plate 15.
6 and illuminates the measurement object 21. The illuminated measurement object 21 is observed by an imaging device 22 . The imaging device 22 is
Since the arrangement is such that the relationship of equation (2) above is satisfied, the light from the light source 11 does not enter the imaging device 22, and only the defective image stands out brightly, thereby preventing minute scratches on the film surface.
Air bubbles inside can also be clearly detected.

【0015】また、遮蔽板12の下面を反射面として、
光源11の光が遮蔽板12,底板18,側板17で反射
して開口部16から照射されるように構成したので、箱
体10の厚みを薄くでき、装置の小型化が図れる。なお
、開口部16,遮蔽板12は、円形に限らない。
[0015] Furthermore, the lower surface of the shielding plate 12 is used as a reflective surface,
Since the light from the light source 11 is reflected by the shielding plate 12, the bottom plate 18, and the side plate 17 and is irradiated from the opening 16, the thickness of the box 10 can be reduced, and the device can be made smaller. Note that the opening 16 and the shielding plate 12 are not limited to circular shapes.

【0016】[0016]

【発明の効果】この発明の欠点検出装置によると、測定
対象内に含有された気泡等の欠点を検出できると同時に
、測定対象の微小な表面傷等の欠点も検出できるという
効果が得られる。
According to the defect detection device of the present invention, it is possible to detect defects such as air bubbles contained in the object to be measured, and at the same time, it is possible to detect defects such as minute surface scratches on the object to be measured.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の原理の概要を示す説明図である。FIG. 1 is an explanatory diagram showing an overview of the principle of the present invention.

【図2】本発明の一実施例の断面図である。FIG. 2 is a cross-sectional view of one embodiment of the present invention.

【符号の説明】[Explanation of symbols]

10  箱体 11  光源 12  遮蔽板 16  開口部 22  撮像装置 10 Box body 11 Light source 12 Shielding plate 16 Opening 22 Imaging device

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  開口部を有した箱体と、この箱体内に
設けた光源と、この光源と前記開口部との間に設けられ
外周面が前記開口部の開口内周面より外側に位置した遮
蔽板と、この遮蔽板の外周面と前記開口部の開口内周面
とを結んだ線分の前記箱体の外部における交点より遠方
において前記線分で囲まれた範囲内に設けた撮像装置と
を備えた欠点検出装置。
1. A box having an opening, a light source provided inside the box, and a light source provided between the light source and the opening, the outer circumferential surface of which is located outside the inner circumferential surface of the opening. and an imaging device provided within a range surrounded by the line segment at a distance from an intersection on the outside of the box body of a line segment connecting the outer circumferential surface of the shield plate and the inner circumferential surface of the opening of the opening. A defect detection device comprising a device.
【請求項2】  上板に開口部を有し側板内面ならびに
底板内面が反射面となった立方体の箱体と、この箱体内
に設けた光源と、この光源と前記開口部との間に設けら
れ外周面が前記開口部の開口内周面より外側に位置しか
つ下面が反射面となった遮蔽板と、この遮蔽板の外周面
と前記開口部の開口内周面とを結んだ線分の前記箱体の
外部における交点より遠方において前記線分で囲まれた
範囲内に設けた撮像装置とを備えた欠点検出装置。
2. A cubic box with an opening in the top plate and reflective surfaces on the inner surfaces of the side plates and the bottom plate, a light source provided inside the box, and a light source provided between the light source and the opening. a shielding plate whose outer peripheral surface is located outside the inner peripheral surface of the opening and whose lower surface is a reflective surface, and a line segment connecting the outer peripheral surface of this shielding plate and the inner peripheral surface of the opening of the opening. and an imaging device provided within a range surrounded by the line segment at a distance from the intersection on the outside of the box.
JP5798291A 1991-02-27 1991-02-27 Apparatus for detecting flaw Pending JPH04270949A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5798291A JPH04270949A (en) 1991-02-27 1991-02-27 Apparatus for detecting flaw

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5798291A JPH04270949A (en) 1991-02-27 1991-02-27 Apparatus for detecting flaw

Publications (1)

Publication Number Publication Date
JPH04270949A true JPH04270949A (en) 1992-09-28

Family

ID=13071219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5798291A Pending JPH04270949A (en) 1991-02-27 1991-02-27 Apparatus for detecting flaw

Country Status (1)

Country Link
JP (1) JPH04270949A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020059426A1 (en) * 2018-09-21 2020-03-26 東レ株式会社 Sheet-like object defect inspection lighting, sheet-like object defect inspection device and sheet-like object defect inspection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020059426A1 (en) * 2018-09-21 2020-03-26 東レ株式会社 Sheet-like object defect inspection lighting, sheet-like object defect inspection device and sheet-like object defect inspection method
US11341630B2 (en) 2018-09-21 2022-05-24 Toray Industries, Inc. Lighting for defect inspection of sheet-shaped objects, defect inspection apparatus for sheet-shaped objects, and method of defect inspection of sheet-shaped objects

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