JPH0426342U - - Google Patents
Info
- Publication number
- JPH0426342U JPH0426342U JP6671490U JP6671490U JPH0426342U JP H0426342 U JPH0426342 U JP H0426342U JP 6671490 U JP6671490 U JP 6671490U JP 6671490 U JP6671490 U JP 6671490U JP H0426342 U JPH0426342 U JP H0426342U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample plate
- surrounds
- airtight
- case
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001816 cooling Methods 0.000 claims description 4
- 230000005855 radiation Effects 0.000 claims description 4
- 230000000694 effects Effects 0.000 claims 2
- 230000002093 peripheral effect Effects 0.000 claims 2
- 238000002441 X-ray diffraction Methods 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990066714U JP2559622Y2 (ja) | 1990-06-22 | 1990-06-22 | 試料低温装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990066714U JP2559622Y2 (ja) | 1990-06-22 | 1990-06-22 | 試料低温装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0426342U true JPH0426342U (cs) | 1992-03-02 |
| JP2559622Y2 JP2559622Y2 (ja) | 1998-01-19 |
Family
ID=31599657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990066714U Expired - Fee Related JP2559622Y2 (ja) | 1990-06-22 | 1990-06-22 | 試料低温装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2559622Y2 (cs) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57136149A (en) * | 1981-02-18 | 1982-08-23 | Rigaku Denki Kk | Device for supporting low temperature sample in x ray diffraction device |
| JPS58167439U (ja) * | 1982-04-30 | 1983-11-08 | 株式会社島津製作所 | 試料導入装置 |
-
1990
- 1990-06-22 JP JP1990066714U patent/JP2559622Y2/ja not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57136149A (en) * | 1981-02-18 | 1982-08-23 | Rigaku Denki Kk | Device for supporting low temperature sample in x ray diffraction device |
| JPS58167439U (ja) * | 1982-04-30 | 1983-11-08 | 株式会社島津製作所 | 試料導入装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2559622Y2 (ja) | 1998-01-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |