JPH04225577A - Light emitting diode - Google Patents
Light emitting diodeInfo
- Publication number
- JPH04225577A JPH04225577A JP2408357A JP40835790A JPH04225577A JP H04225577 A JPH04225577 A JP H04225577A JP 2408357 A JP2408357 A JP 2408357A JP 40835790 A JP40835790 A JP 40835790A JP H04225577 A JPH04225577 A JP H04225577A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- light emitting
- emitting diode
- region
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims abstract description 15
- 238000009792 diffusion process Methods 0.000 claims description 27
- 230000000903 blocking effect Effects 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 4
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 abstract description 23
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract description 9
- 238000002347 injection Methods 0.000 abstract 1
- 239000007924 injection Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/0004—Devices characterised by their operation
- H01L33/0008—Devices characterised by their operation having p-n or hi-lo junctions
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は発光ダイオード、特に表
面発光型の発光ダイオードに関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a light emitting diode, particularly a surface emitting type light emitting diode.
【0002】0002
【従来の技術】複数のPN接合発光ダイオードを基板上
に配設されて成る発光ダイオードアレイは各発光ダイオ
ードを電気的に制御することにより比較的容易に画像情
報などを処理する利点を有しており、このためその改良
と共に種々の応用が考えられている。2. Description of the Related Art A light emitting diode array consisting of a plurality of PN junction light emitting diodes arranged on a substrate has the advantage that image information can be processed relatively easily by electrically controlling each light emitting diode. Therefore, improvements and various applications are being considered.
【0003】例えば、情報の出力機器としてのプリンタ
においては、より高速化高密度化が要求されており、こ
の要求を満足すべく発光ダイオードアレイを光源として
用いることが考えられている。For example, in a printer as an information output device, there is a demand for higher speed and higher density, and in order to satisfy this demand, it has been considered to use a light emitting diode array as a light source.
【0004】すなわち、ノンインパクトな光学プリンタ
としては光源にレーザを用いたレーザプリンタ及び光源
に発光ダイオードアレイを用いたLEDプリンタが知ら
れているが、レーザプリンタではレーザビームの走査に
回動可能なポリゴンミラーなどの機構とこれに対応した
複雑な光学系を必須とするのに対し、LEDプリンタで
は複数の発光ダイオードから成る発光ダイオードアレイ
の各発光ダイオードを電気的にオンオフ制御して駆動す
れば良く、このためレーザプリンタに比べて小型、高速
化かつ高信頼化が可能となっている。Namely, as non-impact optical printers, there are known laser printers that use a laser as a light source and LED printers that use a light emitting diode array as a light source. Whereas mechanisms such as polygon mirrors and corresponding complicated optical systems are required, LED printers can be driven by electrically controlling each light-emitting diode in a light-emitting diode array consisting of multiple light-emitting diodes. Therefore, compared to laser printers, they can be smaller, faster, and more reliable.
【0005】図5に従来のLEDプリンタ等に用いられ
る発光ダイオードの断面図を示す。図において、発光ダ
イオードはn−GaAs基板1上にn−GaAsP層9
をVPE(Vapor Phase Epitax
y)法により積層し、さらにSiN膜5をマスクとして
Zn拡散を行い島状のZn拡散領域8を形成することに
より構成され、n−GaAsP層9とこのZn拡散領域
8との界面がPN接合面を形成して発光領域となる。FIG. 5 shows a cross-sectional view of a light emitting diode used in a conventional LED printer or the like. In the figure, the light emitting diode consists of an n-GaAsP layer 9 on an n-GaAs substrate 1.
VPE (Vapor Phase Epitax)
y) method, and then Zn is diffused using the SiN film 5 as a mask to form an island-shaped Zn diffusion region 8, and the interface between the n-GaAsP layer 9 and this Zn diffusion region 8 forms a PN junction. It forms a surface and becomes a light emitting region.
【0006】そして、p−電極6及びn−電極7をそれ
ぞれ形成し、両電極間に所定の電圧を印加することによ
りPN接合面からの光が表面から出射される構成である
。The structure is such that a p-electrode 6 and an n-electrode 7 are formed respectively, and light from the PN junction surface is emitted from the surface by applying a predetermined voltage between the two electrodes.
【0007】[0007]
【発明が解決しようとする課題】しかしながら、このよ
うな表面発光型発光ダイオードにおいては、p−電極6
の下部は電流密度が一番高いため発光が最も多く生じて
いる場所であるが、ここから発した光はp−電極6によ
り反射されてしまうため外部に取り出されず、発光効率
が大きく低下してしまう問題があった。[Problems to be Solved by the Invention] However, in such a surface-emitting type light emitting diode, the p-electrode 6
The lower part of the electrode has the highest current density and is where the most light is emitted, but the light emitted from this area is reflected by the p-electrode 6 and is not taken out to the outside, resulting in a significant drop in luminous efficiency. There was a problem with it.
【0008】本発明は上記従来の課題に鑑みなされたも
のであり、その目的は表面発光型発光ダイオードにおい
て、電極下部における発光を抑制し、外部への発光に有
効な領域のみに電流を注入することにより極めて高い発
光効率を有する発光ダイオードを提供することにある。The present invention was made in view of the above-mentioned conventional problems, and its purpose is to suppress light emission at the bottom of the electrode in a surface-emitting type light emitting diode, and to inject current only into the area where light emission to the outside is effective. In particular, it is an object of the present invention to provide a light emitting diode having extremely high luminous efficiency.
【0009】[0009]
【課題を解決するための手段】上記目的を達成するため
に、本発明に係る発光ダイオードは基板上に形成される
P型あるいはN型半導体層と、この半導体層に形成され
る拡散領域と、前記拡散領域上に形成される電極と、を
有する発光ダイオードにおいて、前記電極下部に電流阻
止領域を有することを特徴とする。[Means for Solving the Problems] In order to achieve the above object, a light emitting diode according to the present invention includes a P-type or N-type semiconductor layer formed on a substrate, a diffusion region formed in this semiconductor layer, and an electrode formed on the diffusion region, characterized in that the light emitting diode has a current blocking region below the electrode.
【0010】0010
【作用】本発明の発光ダイオードはこのような構成を有
しており、電極下部に形成された電流阻止領域により電
極下部における発光を防止し、発光に有効な拡散領域の
みに電流を注入して発光させることにより、電極での反
射を少なくし、発光効率の向上を図るものである。[Function] The light emitting diode of the present invention has such a structure, and the current blocking region formed at the bottom of the electrode prevents light emission at the bottom of the electrode, and current is injected only into the diffusion region that is effective for light emission. By emitting light, reflection at the electrodes is reduced and luminous efficiency is improved.
【0011】[0011]
【実施例】以下、図面を用いながら本発明に係る発光ダ
イオードの好適な実施例を説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the light emitting diode according to the present invention will be described below with reference to the drawings.
【0012】図1には第1実施例の発光ダイオードの断
面図が示されており、n−GaAs基板1上にn−Al
GaAs層2、p−AlGaAs層3及びn−AlGa
As層4が順次MBE法などにより積層される。次に、
SiN膜5をマスクとしてZn拡散を行い島状の拡散領
域8aが分離形成され、さらに、再びZn拡散を行い両
拡散領域8aがZn領域で接続される。なお、拡散領域
8aはその深さがp−AlGaAs層3に達するように
設定され、接続領域8bはその深さがa−AlGaAs
層4の層厚よりも小さく設定される。Zn拡散を行うに
は、SiN膜5上に拡散源Znを含むZn0膜等をスパ
ッターリング法等により形成し、650℃〜800℃の
高温中に数時間放置してZnを熱拡散すれば良い。FIG. 1 shows a cross-sectional view of the light emitting diode of the first embodiment, in which n-Al is formed on an n-GaAs substrate 1.
GaAs layer 2, p-AlGaAs layer 3 and n-AlGa
As layers 4 are sequentially laminated by MBE method or the like. next,
Zn is diffused using the SiN film 5 as a mask to separate and form island-shaped diffusion regions 8a, and Zn is diffused again to connect both diffusion regions 8a with the Zn region. The depth of the diffusion region 8a is set to reach the p-AlGaAs layer 3, and the depth of the connection region 8b is set to reach the p-AlGaAs layer 3.
The layer thickness is set smaller than the layer thickness of layer 4. To perform Zn diffusion, it is sufficient to form a Zn0 film or the like containing a diffusion source Zn on the SiN film 5 by a sputtering method or the like, and leave it at a high temperature of 650° C. to 800° C. for several hours to thermally diffuse Zn. .
【0013】そして、p+コンタクト層が拡散領域8a
、接続領域8b上に積層された後p−電極6が形成され
、さらにn−GaAs基板1の下部にn−電極7が形成
され、本実施例の発光ダイオードが構成される。[0013] Then, the p+ contact layer is in the diffusion region 8a.
, a p-electrode 6 is formed on the connection region 8b, and an n-electrode 7 is further formed on the lower part of the n-GaAs substrate 1, thereby configuring the light emitting diode of this embodiment.
【0014】ここで、p−電極6とn−電極7間に電圧
を印加すると、p−電極6の下部においては基板表面か
ら順にp+ 、n、p、n、n型となり、逆バイアス構
造となるため電流が注入されずこの部分における発光を
抑えることができる。When a voltage is applied between the p-electrode 6 and the n-electrode 7, the lower part of the p-electrode 6 becomes p+, n, p, n, and n type in order from the substrate surface, resulting in a reverse bias structure. Therefore, no current is injected and light emission in this portion can be suppressed.
【0015】一方、このp−電極6の下部以外の拡散領
域8aにおいては、基板表面から順にp+ 、p、n、
n型となり、電流が基板表面のp+ 層を通して拡散領
域8a全面に注入されるため、n−AlGaAs層2と
p−AlGaAs層3との界面に形成されたPN接合面
において発光し、この光はp−電極6で反射されること
なく外部に取り出される。On the other hand, in the diffusion region 8a other than the lower part of the p- electrode 6, p+, p, n,
Since the current is injected into the entire diffusion region 8a through the p+ layer on the substrate surface, light is emitted at the PN junction formed at the interface between the n-AlGaAs layer 2 and the p-AlGaAs layer 3, and this light is It is taken out to the outside without being reflected by the p-electrode 6.
【0016】このように、本第1実施例においてはp−
電極6の下部に逆バイアス構造を有する電流阻止領域を
形成することにより、電極下部からの発光を抑え、かつ
この電極下部以外の拡散領域から効率的に発光を行わせ
ることにより極めて発光効率の高い発光ダイオードを得
ることができる。In this way, in the first embodiment, p-
By forming a current blocking region with a reverse bias structure at the bottom of the electrode 6, light emission from the bottom of the electrode is suppressed, and light is efficiently emitted from a diffusion region other than the bottom of the electrode, resulting in extremely high light emission efficiency. A light emitting diode can be obtained.
【0017】なお、本第1実施例においてn−AlGa
As層2、p−AlGaAs層3、n−AlGaAs層
4のAl、Ga、Asの組成比を適当に選ぶことにより
(p−AlGaAs層3のAlの組成比を少なくする)
、n−AlGaAs層4のバンドギャップをp−AlG
aAs3のバンドギャップよりも小さく設定することが
でき、このときPN接合面において発した光はn−Al
GaAs層4にて吸収されないため、外部発光効率をさ
らに高くすることができる。Note that in the first embodiment, n-AlGa
By appropriately selecting the composition ratios of Al, Ga, and As in the As layer 2, p-AlGaAs layer 3, and n-AlGaAs layer 4 (reducing the composition ratio of Al in the p-AlGaAs layer 3).
, the band gap of the n-AlGaAs layer 4 is set to p-AlG
The bandgap can be set smaller than that of aAs3, and at this time, the light emitted at the PN junction surface is
Since the light is not absorbed by the GaAs layer 4, the external light emission efficiency can be further increased.
【0018】図2に本発明の第2実施例に係る発光ダイ
オードの断面図を示す。本第2実施例においては上記第
1実施例において示したように発光が起こるPN接合面
が結晶成長により形成されるのではなく、熱拡散により
形成されるものである。すなわち、n−GaAs基板1
上にn−AlGaAs層2、p−AlGaAs層3、n
−AlGaAs層4が順次積層され、SiN膜5をマス
クとしてZn拡散領域8aがn−AlGaAs層2に達
するまで形成される。その後、上記第1実施例と同様に
して接続領域8bが拡散により形成され、この接続領域
8b上にp+ コンタクト層を介してp−電極6及びn
−GaAs基板1下部にn−電極7が形成される。FIG. 2 shows a cross-sectional view of a light emitting diode according to a second embodiment of the present invention. In the second embodiment, the PN junction surface where light emission occurs is not formed by crystal growth as shown in the first embodiment, but is formed by thermal diffusion. That is, the n-GaAs substrate 1
On top are an n-AlGaAs layer 2, a p-AlGaAs layer 3, and an n-AlGaAs layer 2.
-AlGaAs layers 4 are sequentially stacked, and Zn diffusion region 8a is formed using SiN film 5 as a mask until reaching n-AlGaAs layer 2. Thereafter, a connection region 8b is formed by diffusion in the same manner as in the first embodiment, and a p- electrode 6 and an n-electrode are formed on this connection region 8b via a p+ contact layer.
- An n- electrode 7 is formed under the GaAs substrate 1.
【0019】本第2実施例においても、上記第1実施例
と同様にp−電極6下部にはp+ 、n、p、n、n型
の逆バイアス構造を有する電流阻止領域が形成されてい
るためこの領域からは発光せず、拡散領域8aとn−A
lGaAs層2との界面に生じるじるPN接合面にて発
光が行われ、p−電極6にて反射されることなく外部に
取り出される。In the second embodiment, as in the first embodiment, a current blocking region having a p+, n, p, n, n type reverse bias structure is formed below the p- electrode 6. Therefore, no light is emitted from this region, and the diffusion region 8a and n-A
Light is emitted at the PN junction formed at the interface with the lGaAs layer 2, and is taken out to the outside without being reflected by the p-electrode 6.
【0020】なお、本第2実施例においても上記第1実
施例と同様にn−AlGaAs層4のバンドギャップを
小さく設定することにより光の吸収を抑えてより発光効
率を向上させることもできる。In the second embodiment, as in the first embodiment, the band gap of the n-AlGaAs layer 4 can be set small to suppress light absorption and improve the luminous efficiency.
【0021】図3及び図4には本発明の第3実施例が示
されており、本第3実施例においては発光領域の外周に
電極を配置し、この発光領域に形成された拡散領域に電
極から電流を供給するものである。A third embodiment of the present invention is shown in FIGS. 3 and 4. In this third embodiment, an electrode is arranged around the outer periphery of the light emitting region, and a diffusion region formed in the light emitting region is provided with an electrode. Electric current is supplied from the electrodes.
【0022】すなわち、図4に示されるように、n−G
aAs基板1上にn−AlGaAs層2、p−AlGa
As層3、n−AlGaAs層4が順次積層され、Si
N膜をマスクとして発光を得たい領域にZn拡散領域8
aを形成する。このとき、拡散領域8はp−AlGaA
s層3に達するまで拡散される。そして、SiN膜を除
去して接続領域8bを熱拡散により形成し、その後拡散
領域8aを囲むようにp−電極6を形成する。That is, as shown in FIG.
n-AlGaAs layer 2 and p-AlGa on aAs substrate 1
An As layer 3 and an n-AlGaAs layer 4 are sequentially laminated, and the Si
Using the N film as a mask, place a Zn diffusion region 8 in the region where you want to obtain light emission.
form a. At this time, the diffusion region 8 is p-AlGaA
It is diffused until it reaches the S layer 3. Then, the SiN film is removed and the connection region 8b is formed by thermal diffusion, and then the p-electrode 6 is formed so as to surround the diffusion region 8a.
【0023】そして、p−電極6とn−電極7間に電圧
を印加すると、p−電極6下部においては上記第1、第
2実施例と同様にして逆バイアス構造の電流阻止領域が
あるため発光は行われず、一方拡散領域8aでは順バイ
アス構成でその全面に電流が注入されるため連続的な発
光パターンを得ることができる。When a voltage is applied between the p-electrode 6 and the n-electrode 7, there is a current blocking region with a reverse bias structure under the p-electrode 6, as in the first and second embodiments. No light is emitted, and on the other hand, current is injected into the entire surface of the diffusion region 8a in a forward bias configuration, so that a continuous light emission pattern can be obtained.
【0024】なお、本第3実施例においてはp−電極6
と基板表面との接触面積を大きくとることができるため
、発光ダイオードのシリーズ抵抗を低下させることも可
能となっている。Note that in the third embodiment, the p-electrode 6
Since the contact area between the LED and the substrate surface can be increased, it is also possible to reduce the series resistance of the light emitting diode.
【0025】[0025]
【発明の効果】以上説明したように、本発明に係る発光
ダイオードによれば、表面からの発光に有効な領域のみ
に電流を注入することが可能となり、極めて高い発光効
率を得ることができる。As explained above, according to the light emitting diode according to the present invention, it is possible to inject current only into the area effective for light emission from the surface, and extremely high light emitting efficiency can be obtained.
【図1】本発明に係る発光ダイオードの第1実施例の断
面図。FIG. 1 is a sectional view of a first embodiment of a light emitting diode according to the present invention.
【図2】本発明に係る発光ダイオードの第2実施例の断
面図。FIG. 2 is a sectional view of a second embodiment of a light emitting diode according to the present invention.
【図3】本発明に係る発光ダイオードの第3実施例の平
面図。FIG. 3 is a plan view of a third embodiment of a light emitting diode according to the present invention.
【図4】本発明に係る発光ダイオードの第3実施例の断
面図。FIG. 4 is a sectional view of a third embodiment of a light emitting diode according to the present invention.
【図5】従来の発光ダイオードの断面図。FIG. 5 is a cross-sectional view of a conventional light emitting diode.
1 n−GaAs基板 2 n−AlGaAs層 3 p−AlGaAs層 4 n−AlGaAs層 5 SiN膜 6 p−電極 7 n−電極 8a 拡散領域 8b 接続領域 1 n-GaAs substrate 2 n-AlGaAs layer 3 p-AlGaAs layer 4 n-AlGaAs layer 5 SiN film 6 p-electrode 7 N-electrode 8a Diffusion area 8b Connection area
Claims (1)
半導体層と、この半導体層に形成される拡散領域と、前
記拡散領域上に形成される電極と、を有する発光ダイオ
ードにおいて、前記電極下部に電流阻止領域を有するこ
とを特徴とする発光ダイオード。1. A light emitting diode comprising a P-type or N-type semiconductor layer formed on a substrate, a diffusion region formed in this semiconductor layer, and an electrode formed on the diffusion region, wherein the electrode A light emitting diode characterized by having a current blocking region at the bottom.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2408357A JPH04225577A (en) | 1990-12-27 | 1990-12-27 | Light emitting diode |
US07/809,892 US5189496A (en) | 1990-12-27 | 1991-12-18 | Light-emitting diode with current-blocking |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2408357A JPH04225577A (en) | 1990-12-27 | 1990-12-27 | Light emitting diode |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04225577A true JPH04225577A (en) | 1992-08-14 |
Family
ID=18517818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2408357A Pending JPH04225577A (en) | 1990-12-27 | 1990-12-27 | Light emitting diode |
Country Status (2)
Country | Link |
---|---|
US (1) | US5189496A (en) |
JP (1) | JPH04225577A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008135793A (en) * | 2008-02-28 | 2008-06-12 | Oki Electric Ind Co Ltd | Semiconductor light-emitting apparatus and led array |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05251742A (en) * | 1992-03-04 | 1993-09-28 | Eastman Kodak Japan Kk | Light emitting device |
US5600157A (en) * | 1993-04-28 | 1997-02-04 | Oki Electric Industry Co., Ltd. | Light-emitting and light-sensing diode array device, and light-emitting and light-sensing diode with improved sensitivity |
SE509809C2 (en) * | 1995-11-03 | 1999-03-08 | Mitel Semiconductor Ab | LED with divided light emitting area |
JP3813010B2 (en) * | 1997-06-09 | 2006-08-23 | 沖電気工業株式会社 | Light emitting diode element and light emitting diode element array |
JP3717284B2 (en) * | 1997-09-22 | 2005-11-16 | 沖電気工業株式会社 | LIGHT EMITTING ELEMENT, LIGHT EMITTING ELEMENT ARRAY, AND LIGHT EMITTING ELEMENT MANUFACTURING METHOD |
JP2000022206A (en) * | 1998-07-01 | 2000-01-21 | Oki Electric Ind Co Ltd | Semiconductor light emitting device |
JP3986169B2 (en) * | 1998-07-09 | 2007-10-03 | 沖電気工業株式会社 | Semiconductor light emitting device |
US6653662B2 (en) * | 2000-11-01 | 2003-11-25 | Matsushita Electric Industrial Co., Ltd. | Semiconductor light-emitting device, method for fabricating the same, and method for driving the same |
JP2003188411A (en) * | 2001-12-20 | 2003-07-04 | Oki Degital Imaging:Kk | Light-emitting semiconductor device and manufacturing method thereof |
DE102004037868A1 (en) * | 2004-04-30 | 2005-11-24 | Osram Opto Semiconductors Gmbh | A radiation emitting and / or receiving semiconductor device and method for patterning a contact on a semiconductor body |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57148383A (en) * | 1981-03-09 | 1982-09-13 | Nec Corp | Semiconductor light-emitting element |
US4477824A (en) * | 1982-03-04 | 1984-10-16 | At&T Bell Laboratories | Light emitting device for optical switching |
US4719497A (en) * | 1984-06-15 | 1988-01-12 | Hewlett-Packard Company | High efficiency light-emitting diode |
JPS61220484A (en) * | 1985-03-27 | 1986-09-30 | Hitachi Ltd | Semiconductor light emitting device |
JPH01137679A (en) * | 1987-11-24 | 1989-05-30 | Matsushita Electric Ind Co Ltd | Semiconductor light emitting element |
-
1990
- 1990-12-27 JP JP2408357A patent/JPH04225577A/en active Pending
-
1991
- 1991-12-18 US US07/809,892 patent/US5189496A/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008135793A (en) * | 2008-02-28 | 2008-06-12 | Oki Electric Ind Co Ltd | Semiconductor light-emitting apparatus and led array |
Also Published As
Publication number | Publication date |
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US5189496A (en) | 1993-02-23 |
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