JPH04213841A - Resin cutting method and device for resin sealed semiconductor element - Google Patents

Resin cutting method and device for resin sealed semiconductor element

Info

Publication number
JPH04213841A
JPH04213841A JP40119790A JP40119790A JPH04213841A JP H04213841 A JPH04213841 A JP H04213841A JP 40119790 A JP40119790 A JP 40119790A JP 40119790 A JP40119790 A JP 40119790A JP H04213841 A JPH04213841 A JP H04213841A
Authority
JP
Japan
Prior art keywords
resin
semiconductor element
laser beam
sealed semiconductor
cutting method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP40119790A
Other languages
Japanese (ja)
Inventor
Mitsuo Furuhata
降籏 光男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP40119790A priority Critical patent/JPH04213841A/en
Publication of JPH04213841A publication Critical patent/JPH04213841A/en
Pending legal-status Critical Current

Links

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PURPOSE:To easily remove the burr of molded resin jutting out of the lead peripheral part of a package by non-contact step within a short time assuming the semiconductor element resin-sealed by a molding step as a target element. CONSTITUTION:The title resin cutting device is composed of a laser oscillator 4, a light-guiding channel 5 guiding the laser beams 9 emitted from the laser oscillator 4, a condenser 7 fixed to the end of the light-guiding channel and a field stopping mask interposed in the light-guiding channel on the position in front of the condenser 7. Finally, the burred position of a semiconductor element is irradiated with the laser beams emitted from the laser oscillator 4 so as to remove the burr by the processing mechanisms for the steps such as heating, melting down and separating.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、モールド成形法で樹脂
封止された樹脂封止型半導体素子を対象に、そのパッケ
ージのリード周辺部分にはみ出した成形樹脂のバリを除
去するレジンカット方法,およびその装置に関する。
[Industrial Application Field] The present invention relates to a resin cutting method for removing burrs of molded resin protruding from the surrounding area of the leads of a package for a resin-sealed semiconductor element that has been resin-sealed by a molding method. and regarding its equipment.

【0002】0002

【従来の技術】頭記した樹脂封止型半導体素子では、樹
脂パッケージのモールド成形の際に成形金型の隙間から
流出した成形材料がリード周辺に付着してバリを生成す
る。このバリの発生状況を図3に示すと、図において、
1はリードフレーム、2はリードフレーム1にマウント
されたチップ(図示せず)を封止した樹脂パッケージ、
3が樹脂パッケージ2からはみ出した成形樹脂のバリ(
斜線で表してある部分)であり、バリ3は樹脂パッケー
ジ2から引出したリードの根元周辺部分に付着している
2. Description of the Related Art In the above-mentioned resin-sealed semiconductor device, when a resin package is molded, the molding material that flows out of the gap in the molding die adheres to the periphery of the leads and forms burrs. Figure 3 shows how this burr occurs.
1 is a lead frame; 2 is a resin package in which a chip (not shown) mounted on the lead frame 1 is sealed;
3 is the burr of the molded resin protruding from the resin package 2 (
The burr 3 is attached to the periphery of the base of the lead drawn out from the resin package 2 (indicated by diagonal lines).

【0003】一方、前記したバリは製品の外観を損うの
みならず、リードに半田ディップ,メッキを施す際の障
害となることから、通常は製品の仕上げ工程でバリを除
去するようにしている。この場合のバリ取り方法として
、従来では研磨剤を使ってバリを除去するバレル方式、
あるいは高圧水を吹付けてバリを除去する高圧水ブラス
ト方式などのレジンカット方法が一般に実施されている
On the other hand, the burrs described above not only impair the appearance of the product, but also become an obstacle when soldering and plating the leads, so burrs are usually removed during the finishing process of the product. Conventional deburring methods in this case include the barrel method, which uses abrasives to remove the burrs;
Alternatively, a resin cutting method such as a high-pressure water blasting method in which burrs are removed by spraying high-pressure water is generally practiced.

【0004】0004

【発明が解決しようとする課題】ところで、前記した従
来のレジンカット法のうち、バレル方式は研磨剤を使用
するために製品に研磨剤の粉末が付着したり、研磨に伴
って製品の表面にも細かな傷が発生するという難点があ
り、特に製品に付着した粉末はバリ取りの後に洗浄する
後処理が必要となる。また、高圧水ブラスト方式では、
高圧水を吹付ける前に薬品を使用してバリを浮かす前処
理が必要である。このように従来のレジンカット法では
、前処理,後処理を含めてバリ取りには多くの手間と時
間がかかる。
[Problems to be Solved by the Invention] Among the conventional resin cutting methods mentioned above, the barrel method uses an abrasive, so the powder of the abrasive may adhere to the product, or the surface of the product may be damaged during polishing. However, the problem is that small scratches occur, and powder adhering to the product requires post-processing to remove burrs and then wash it. In addition, with the high-pressure water blast method,
Before spraying with high-pressure water, it is necessary to pre-treat the burrs using chemicals to float them. As described above, in the conventional resin cutting method, deburring including pre-processing and post-processing requires a lot of effort and time.

【0005】本発明は上記の点にかんがみなされたもの
であり、短時間で簡単にバリを除去できるようにした樹
脂封止型半導体素子のレジンカット方法,および装置を
提供することを目的とする。
The present invention has been made in consideration of the above points, and an object of the present invention is to provide a resin-cutting method and apparatus for a resin-sealed semiconductor element, which makes it possible to easily remove burrs in a short period of time. .

【0006】[0006]

【課題を解決するための手段】上記課題を解決するため
に、本発明のレジンカット方法は、バリの発生部分にレ
ーザビームを照射してバリを除去するものとする。
[Means for Solving the Problems] In order to solve the above problems, the resin cutting method of the present invention removes burrs by irradiating a laser beam onto a portion where burrs are generated.

【0007】ここで、バリ発生箇所以外の製品部分にレ
ーザ光が照射されるのを防ぐために、レーザビームの光
路上に照射範囲を規制するマスクを置き、該マスクを透
過させてレーザビームをバリ部分にのみ選択的に照射す
るのがよい。
[0007] In order to prevent the laser beam from irradiating parts of the product other than the areas where burrs occur, a mask is placed on the optical path of the laser beam to restrict the irradiation range, and the laser beam is transmitted through the mask. It is best to selectively irradiate only certain areas.

【0008】また、前記方法を実施するための本発明の
レジンカット装置は、レーザ発振器と、該レーザ発振器
から出射したレーザビームを導光する導光路と、導光路
の先端に取付けた集光レンズと、集光レンズの手前位置
で導光路に介挿した視野絞り用マスクとから構成するも
のとする。
Further, the resin cutting apparatus of the present invention for carrying out the above method includes a laser oscillator, a light guide path for guiding the laser beam emitted from the laser oscillator, and a condenser lens attached to the tip of the light guide path. and a field diaphragm mask inserted into the light guide path at a position in front of the condenser lens.

【0009】[0009]

【作用】上記のようにバリの発生部分に外部からレーザ
ビームを照射することにより、成形樹脂のバリはレーザ
による加熱,溶融,蒸発の加工メカニズムで除去される
。また、マスクはレーザビームの照射範囲をバリ発生部
に規制し、それ以外の製品部分にレーザビームが照射さ
れるのを防ぐように働く。これにより、製品の表面に付
着している成形樹脂のバリを非接触式,かつ短時間で除
去できる。
[Operation] As described above, by irradiating the portion where burrs occur with a laser beam from the outside, the burrs of the molded resin are removed by the processing mechanism of heating, melting, and evaporation by the laser. Further, the mask serves to restrict the irradiation range of the laser beam to the burr-generating area and prevent the laser beam from irradiating other parts of the product. This makes it possible to remove burrs from the molding resin adhering to the surface of the product in a non-contact manner and in a short time.

【0010】0010

【実施例】以下本発明の実施例を図面に基づいて説明す
る。図1はレジンカット装置の構成を示すものであり、
図において、4はレーザ発振器、5はレーザ発振器4か
ら引出したレーザビームの導光路、6は導光路5のコー
ナ部に設けた反射ミラー、7は導光路5の先端に取付け
た集光レンズ、8は集光レンズ7の手前側で導光路5の
途中に介挿した視野絞り用の金属製マスクである。また
、図2で示すように、前記マスク8には2箇所にレーザ
ビームの透過穴8a,8bが開口しており、各透過穴8
a,8bがそれぞれ樹脂パッケージ2の両側から引出し
たリードフレーム1の根元部に対応している。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Examples of the present invention will be described below with reference to the drawings. Figure 1 shows the configuration of the resin cutting device.
In the figure, 4 is a laser oscillator, 5 is a light guide path for the laser beam extracted from the laser oscillator 4, 6 is a reflection mirror provided at the corner of the light guide path 5, 7 is a condenser lens attached to the tip of the light guide path 5, 8 is a metal mask for a field stop inserted in the middle of the light guide path 5 on the near side of the condensing lens 7. Further, as shown in FIG. 2, the mask 8 has two laser beam transmission holes 8a and 8b, and each transmission hole 8
A and 8b correspond to the base portions of the lead frame 1 pulled out from both sides of the resin package 2, respectively.

【0011】次に前記構成によるレジンカット動作につ
いて説明する。まず、レジンカットする半導体素子を集
光レンズ7の真下に来るように位置決めし、ここでレー
ザ発振器4を励起するとレーザ発振器4から出射したレ
ーザビーム9は導光路5の中を進み、マスク8の透過穴
8a,8bを透過した後に集光レンズ7を経て図3に示
したバリ3の発生箇所に照射される。そして、レーザビ
ーム9の照射を受けた成形樹脂のバリ3は加熱,溶融,
蒸発してリードフレーム1から除去される。なお、マス
ク8の透過穴8a,8b以外ではレーザビーム9が遮光
されるので、バリ発生箇所以外の製品部分、例えば樹脂
パッケージ2にレーザビームが照射して不要にスクライ
ブされることはない。なお、図示実施例における光学系
の導光路5として光ファイバを採用することも可能であ
る。
Next, the resin cutting operation with the above configuration will be explained. First, the semiconductor element to be resin cut is positioned directly below the condensing lens 7, and when the laser oscillator 4 is excited here, the laser beam 9 emitted from the laser oscillator 4 travels through the light guide path 5 and passes through the mask 8. After passing through the transmission holes 8a and 8b, the light passes through the condenser lens 7 and is irradiated onto the location where the burr 3 is generated as shown in FIG. The burrs 3 of the molded resin irradiated with the laser beam 9 are then heated, melted,
It is evaporated and removed from the lead frame 1. Note that since the laser beam 9 is blocked in areas other than the transmission holes 8a and 8b of the mask 8, the laser beam does not irradiate parts of the product other than the areas where burrs occur, such as the resin package 2, thereby preventing unnecessary scribing. Note that it is also possible to employ an optical fiber as the light guide path 5 of the optical system in the illustrated embodiment.

【0012】0012

【発明の効果】以上述べたように本発明のレジンカット
方法,および装置においては、樹脂封止型半導体素子の
樹脂パッケージからリード周辺にはみ出した成形樹脂の
バリに向けてレーザビームを照射するようにしたので、
バリを非接触式,かつ短時間のレーザ照射で簡単に除去
することができ、従来方式と比べて仕上げ作業の工数削
減,並びに能率の大幅な向上化が図れる。
[Effects of the Invention] As described above, in the resin cutting method and apparatus of the present invention, a laser beam is directed toward the burrs of the molded resin protruding from the resin package of a resin-sealed semiconductor element around the leads. So,
Burrs can be easily removed by non-contact and short-time laser irradiation, reducing the number of finishing steps and significantly improving efficiency compared to conventional methods.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の実施例によるレジンカット装置の構成
FIG. 1 is a configuration diagram of a resin cutting device according to an embodiment of the present invention.

【図2】図1におけるマスクの平面図[Figure 2] Plan view of the mask in Figure 1

【図3】樹脂封止型半導体素子の平面図[Figure 3] Plan view of resin-sealed semiconductor element

【符号の説明】[Explanation of symbols]

1    リードフレーム 2    樹脂パッケージ 3    バリ 4    レーザ発振器 5    導光路 7    集光レンズ 8    マスク 9    レーザビーム 1 Lead frame 2 Resin package 3   Bali 4 Laser oscillator 5 Light guide path 7. Condensing lens 8 Mask 9 Laser beam

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】モールド成形法で樹脂封止された樹脂封止
型半導体素子を対象に、そのパッケージのリード周辺部
分にはみ出した成形樹脂のバリを除去するレジンカット
方法であって、バリの生じた部分にレーザビームを照射
してバリを除去することを特徴とする樹脂封止型半導体
素子のレジンカット方法。
[Claim 1] A resin cutting method for removing burrs of the molding resin protruding from the periphery of the leads of a package of a resin-sealed semiconductor element that has been resin-sealed by a molding method. A resin-cutting method for a resin-sealed semiconductor element, the method comprising removing burrs by irradiating a laser beam onto a portion of the resin-sealed semiconductor element.
【請求項2】請求項1に記載のレジンカット方法におい
て、レーザビームの光路上に照射範囲を規制するマスク
を置き、該マスクを透過させてレーザビームをバリ部分
にのみ選択的に照射することを特徴とする樹脂封止型半
導体素子のレジンカット方法。
2. In the resin cutting method according to claim 1, a mask for regulating the irradiation range is placed on the optical path of the laser beam, and the laser beam is transmitted through the mask to selectively irradiate only the burr portion. A resin cutting method for a resin-sealed semiconductor element, characterized by:
【請求項3】レーザ発振器と、該レーザ発振器から出射
したレーザビームを導光する導光路と、該導光路の先端
に取付けた集光レンズと、集光レンズの手前位置で導光
路に介挿した視野絞り用マスクとからなることを特徴と
する樹脂封止型半導体素子のレジンカット装置。
3. A laser oscillator, a light guide path for guiding the laser beam emitted from the laser oscillator, a condensing lens attached to the tip of the light guide, and a condensing lens inserted into the light guide at a position in front of the condensing lens. 1. A resin cutting device for resin-sealed semiconductor elements, comprising a field stop mask.
JP40119790A 1990-12-11 1990-12-11 Resin cutting method and device for resin sealed semiconductor element Pending JPH04213841A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP40119790A JPH04213841A (en) 1990-12-11 1990-12-11 Resin cutting method and device for resin sealed semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP40119790A JPH04213841A (en) 1990-12-11 1990-12-11 Resin cutting method and device for resin sealed semiconductor element

Publications (1)

Publication Number Publication Date
JPH04213841A true JPH04213841A (en) 1992-08-04

Family

ID=18511047

Family Applications (1)

Application Number Title Priority Date Filing Date
JP40119790A Pending JPH04213841A (en) 1990-12-11 1990-12-11 Resin cutting method and device for resin sealed semiconductor element

Country Status (1)

Country Link
JP (1) JPH04213841A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004343038A (en) * 2003-05-12 2004-12-02 Jettech Ltd Semiconductor package having cutting groove on side flash, method of forming this cutting groove, deflashing method in semiconductor package having cutting groove
JP2011222684A (en) * 2010-04-08 2011-11-04 Mitsubishi Electric Corp Method for manufacturing semiconductor device
JP2017041572A (en) * 2015-08-20 2017-02-23 株式会社オートネットワーク技術研究所 Composite material molded body and reactor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004343038A (en) * 2003-05-12 2004-12-02 Jettech Ltd Semiconductor package having cutting groove on side flash, method of forming this cutting groove, deflashing method in semiconductor package having cutting groove
JP2011222684A (en) * 2010-04-08 2011-11-04 Mitsubishi Electric Corp Method for manufacturing semiconductor device
JP2017041572A (en) * 2015-08-20 2017-02-23 株式会社オートネットワーク技術研究所 Composite material molded body and reactor
WO2017030084A1 (en) * 2015-08-20 2017-02-23 株式会社オートネットワーク技術研究所 Composite material molding and reactor
US10825591B2 (en) 2015-08-20 2020-11-03 Autonetworks Technologies, Ltd. Composite material molded article and reactor

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