JPH04204068A - Apparatus for testing switch - Google Patents
Apparatus for testing switchInfo
- Publication number
- JPH04204068A JPH04204068A JP2329222A JP32922290A JPH04204068A JP H04204068 A JPH04204068 A JP H04204068A JP 2329222 A JP2329222 A JP 2329222A JP 32922290 A JP32922290 A JP 32922290A JP H04204068 A JPH04204068 A JP H04204068A
- Authority
- JP
- Japan
- Prior art keywords
- detection circuit
- power supply
- switch
- test
- load state
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims abstract description 43
- 230000003287 optical effect Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、一般遮断器に所定の負荷責務を与える開閉器
試験装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a switch test device that applies a predetermined load duty to a general circuit breaker.
従来の装置は(Hitachi Reviet+ Vo
l19 Na 2のp67のFig 17 New 5
ynthetic test circuitswit
hACrecovery voltage 5ourc
e、)に示す構成となっている。すなわち、本公知例は
電流源及び電圧源をもち試験用開閉器に電流源及び電圧
源より試験用開閉器に所定の負荷責務を与え開閉器の遮
断能力を測定する試験設備となっている。The conventional device is (Hitachi Reviet+ Vo
Fig 17 New 5 of p67 of l19 Na 2
ynthetic test circuitswit
hACrecovery voltage 5ourc
The configuration is shown in e.). That is, this known example is a test equipment that has a current source and a voltage source, and applies a predetermined load duty to the test switch from the current source and voltage source to measure the breaking ability of the switch.
上記従来技術は、開閉器における所定の負荷責務を与え
るための調整が難しく、ノイズに対して弱いという欠点
があった。The above-mentioned conventional technology has the disadvantage that it is difficult to adjust the switch to provide a predetermined load duty and is susceptible to noise.
本発明の目的は、一般遮断器の所定負荷責務を効率的に
与え、更に、試験用負荷の開閉時に発生するノイズに対
し誤動作を生じない試験装置を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a test device that efficiently provides a predetermined load duty of a general circuit breaker and that does not malfunction due to noise generated when switching a test load.
上記目的を達成するために、本発明は電源検出回路、遅
延回路、負荷状態検出回路を個別ユニットと構成とし、
試験開始装置の信号で共通の試験開始信号検出回路を用
いて個別ユニットを動作させることにより試験用開閉器
に所定の負荷責務を効率良く与える′ことが出来るよう
にしたものである。In order to achieve the above object, the present invention configures a power supply detection circuit, a delay circuit, and a load state detection circuit as individual units,
By operating individual units using a common test start signal detection circuit using a signal from a test start device, it is possible to efficiently apply a predetermined load duty to a test switch.
電源検出回路は、主電源の印加条件を検出、遅延回路は
、試験開始時刻を設定、負荷状態検出回路は、試験用開
閉器の負荷状態を検出する。The power supply detection circuit detects the application conditions of the main power supply, the delay circuit sets the test start time, and the load state detection circuit detects the load state of the test switch.
この個別ユニットが連動することにより該当する開閉器
の負荷責務を最適に、かつ、効率的に与えることが可能
である。By interlocking these individual units, it is possible to optimally and efficiently provide the load responsibility of the corresponding switch.
又、各ユニット間を光接続で絶縁することにより開閉器
の開閉動作時に発生するノイズから開閉器試験装置を分
離することが出来る。Furthermore, by insulating each unit with optical connections, the switch test device can be isolated from noise generated during the switching operation of the switch.
以下、本発明の一実施例を第1図を用いて説明する。 An embodiment of the present invention will be described below with reference to FIG.
1は主電源、2は制御用開閉器、3は試験用開閉器、4
は検出器を示す。1 is the main power supply, 2 is the control switch, 3 is the test switch, 4
indicates a detector.
試験開始装置7より与えられた開始信号は試験開始信号
検出回路8で検出され電源状態を検出する電源検出回路
9に与えられる。A start signal given by the test start device 7 is detected by a test start signal detection circuit 8 and given to a power supply detection circuit 9 that detects the power state.
この電源検出回路9は、試験用開閉器3に規定される印
加条件に主電源1がなっていることを判断し、印加条件
に達した時刻に制御用開閉器2を閉じる。This power supply detection circuit 9 determines that the main power supply 1 meets the application conditions specified in the test switch 3, and closes the control switch 2 at the time when the application conditions are met.
続いて、試験開始装置7より与えられた別の開始信号は
試験開始信号検出回路10で検出され。Subsequently, another start signal given by the test start device 7 is detected by the test start signal detection circuit 10.
遅延回路11に与えられる。試験開始信号よりの所定の
時刻で試験開閉器3を閉じる。これにより試験用開閉器
3に印加条件で設定された責務が与えられることになる
。続いて試験開始装置7より与えられた別の開始信号に
より試験開始信号検出回路12が動作し所定の時刻で試
験用開閉器3に与えられた責務状態を検出する検出器4
を経由して負荷状態検出回路13で負荷の状態を検出す
る。The signal is applied to the delay circuit 11. The test switch 3 is closed at a predetermined time from the test start signal. As a result, the test switch 3 is given the responsibility set by the application conditions. Subsequently, the test start signal detection circuit 12 is activated by another start signal given from the test start device 7, and the detector 4 detects the duty state given to the test switch 3 at a predetermined time.
The load state is detected by the load state detection circuit 13 via the load state detection circuit 13.
この負荷状態により、更に、負荷状態の重畳を補助電源
5により行うため、負荷状態検出回路13より印加開閉
器6を閉じ試験用開閉器3に負荷を重畳させて、特定さ
れた負荷状態を生み出すことが出来る。Based on this load state, in order to superimpose the load state using the auxiliary power supply 5, the load state detection circuit 13 closes the application switch 6 and superimposes the load on the test switch 3, thereby producing the specified load state. I can do it.
本実施例では、試験用開閉器3の閉じることに着目して
記載したが各試験開始信号検出回路と電源検出回路9.
遅延回路11.負荷状態検出回路13の各ペアの組合せ
により希望する主電源状態。Although this embodiment has been described with a focus on closing the test switch 3, each test start signal detection circuit and power supply detection circuit 9.
Delay circuit 11. A desired main power supply state is determined by the combination of each pair of load state detection circuits 13.
タイミング、負荷の責務状態で任意に制御用開閉器2.
試験用開閉器3及び印加開閉器6を開閉することが可能
である。2. Control switch arbitrarily depending on the timing and duty state of the load.
It is possible to open and close the test switch 3 and the application switch 6.
本発明の別の実施例を第2図に示す。Another embodiment of the invention is shown in FIG.
1は主電源として交流電源を用い、2は制御用開閉器、
3は試験用開閉器、4は検出器として交流器を使用して
いる。1 uses AC power as the main power supply, 2 uses a control switch,
3 uses a test switch, and 4 uses an alternator as a detector.
試験開始装置7としてスイッチ7a〜7Cを用いている
。15は直流電源を示し、7a〜7Cを閉じることによ
り直流電源15の電圧が試験開始信号として、試験開始
信号検出回路8,10゜12に伝達される。Switches 7a to 7C are used as the test starting device 7. Reference numeral 15 indicates a DC power supply, and by closing 7a to 7C, the voltage of the DC power supply 15 is transmitted as a test start signal to the test start signal detection circuits 8 and 10.
7aを閉じると、試験開始信号検出回路8より電源検出
回路9に開始信号は与えられる。ここで電源検出回路9
は主電源1と同期して交流信号を発生する信号用交流電
源14の位相状態を検出し、特定の位相で制御用開閉器
2を閉じる。When 7a is closed, a start signal is given from the test start signal detection circuit 8 to the power supply detection circuit 9. Here, the power supply detection circuit 9
detects the phase state of the signal AC power supply 14 that generates an AC signal in synchronization with the main power supply 1, and closes the control switch 2 at a specific phase.
又、スイッチ7bを閉じることにより試験開始信号を与
えられた試験開始信号検出回路10は、遅延回路11に
信号を伝達し、遅延回路11で遅れ時間を調整し、試験
用開閉器3を閉じる。Further, the test start signal detection circuit 10, which has been given the test start signal by closing the switch 7b, transmits the signal to the delay circuit 11, adjusts the delay time in the delay circuit 11, and closes the test switch 3.
これにより試験用開閉器3に電流が与えられる。As a result, a current is applied to the test switch 3.
この電流状態を検出器4で検出し、負荷状態検出回路1
3を経由して所定の時刻に印加開閉器6を閉じて、コン
デンサで構成された補助電源Sより試験用開閉器3に重
畳された電流を与える。This current state is detected by the detector 4, and the load state detection circuit 1
3, the application switch 6 is closed at a predetermined time, and a superimposed current is applied to the test switch 3 from the auxiliary power supply S constituted by a capacitor.
このことにより試験用開閉器3に応じた所定の負荷責務
を与えることが出来る。Thereby, a predetermined load duty can be given according to the test switch 3.
又、組合せにより所定の負荷状態での試験用開閉器の遮
断試験も可能である。In addition, by combining these, it is possible to perform a breaking test on a test switch under a predetermined load condition.
本実施例では、開閉器試験装置全体の開閉器の開閉時に
発生するノイズ耐量を向上させるため。In this embodiment, the purpose is to improve the noise tolerance generated during opening and closing of the switch of the entire switch test equipment.
直流電源15の負極側16の点と、主電源l、制御用開
閉器2.試験用開閉器3.検出器4にて構成される回路
及び補助電源5.印加開閉器6で構成される回路の接地
点17は絶縁された状態で使用している。A point on the negative pole side 16 of the DC power supply 15, the main power supply l, and the control switch 2. Test switch 3. A circuit constituted by the detector 4 and an auxiliary power supply 5. The grounding point 17 of the circuit constituted by the application switch 6 is used in an insulated state.
また、試験開始信号検出回路8,10.12と電源検出
回路9.遅延回路11.負荷状態検出回路13の各接続
は光接続で実施することによりノイズ耐量を向上させて
いる。Also, test start signal detection circuits 8, 10.12 and power supply detection circuits 9. Delay circuit 11. Each connection of the load state detection circuit 13 is implemented by optical connection to improve noise resistance.
本発明によれば、電源検出回路、遅延回路、負荷状態検
出回路の個別ユニットを組合せ連動して制御出来るので
、複雑な負荷責務を与える必要がある場合に、効率的に
開閉器の試験を実施出来るAccording to the present invention, since the individual units of the power supply detection circuit, delay circuit, and load state detection circuit can be combined and controlled in conjunction with each other, switchgear tests can be carried out efficiently when it is necessary to give complex load duties. I can do it
第1図は本発明の一実施例のブロック図、第2図は本発
明の他の実施例のブロック図を示す。
8.10.12・・・試験開始信号検出回路、9・・・
電源検出回路、11・・・遅延回路、13・・・負荷状
態検出回路。FIG. 1 shows a block diagram of one embodiment of the invention, and FIG. 2 shows a block diagram of another embodiment of the invention. 8.10.12...Test start signal detection circuit, 9...
Power supply detection circuit, 11... Delay circuit, 13... Load state detection circuit.
Claims (1)
開閉器とを含む負荷状態検出装置において、試験開始装
置とそれに接続された複数の試験開始信号検出回路とそ
れぞれの前記試験開始信号検出回路と組合わされた電源
検出回路、遅延回路及び検出器に接続された負荷状態検
出回路を有し、負荷状態に応じて負荷状態検出回路より
印加開閉器を閉じて補助電源より試験用開閉器に所定の
責務を与えることを特徴とする開閉器試験装置。1. In a load state detection device including a main power supply, a control switch connected to the main power supply, and a test switch, a test start device, a plurality of test start signal detection circuits connected to the test start device, and the respective test start signals It has a power supply detection circuit combined with a detection circuit, a delay circuit, and a load state detection circuit connected to the detector, and depending on the load state, the load state detection circuit closes the application switch and the auxiliary power supply closes the test switch. A switch test device characterized in that a switch is given a predetermined responsibility.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2329222A JPH04204068A (en) | 1990-11-30 | 1990-11-30 | Apparatus for testing switch |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2329222A JPH04204068A (en) | 1990-11-30 | 1990-11-30 | Apparatus for testing switch |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04204068A true JPH04204068A (en) | 1992-07-24 |
Family
ID=18219017
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2329222A Pending JPH04204068A (en) | 1990-11-30 | 1990-11-30 | Apparatus for testing switch |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04204068A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102323543A (en) * | 2011-06-13 | 2012-01-18 | 重庆斯凯力科技有限公司 | Virtual instrument-based temperature controlled switch testing system and method |
CN104142471A (en) * | 2013-09-05 | 2014-11-12 | 国家电网公司 | Measuring device for action delay of dry contact of electronic equipment |
CN106990352A (en) * | 2017-03-06 | 2017-07-28 | 新华三技术有限公司 | Closing detecting apparatus and communication equipment |
CN109444732A (en) * | 2018-11-21 | 2019-03-08 | 格力电器(武汉)有限公司 | A kind of micro-switch testing device and method |
-
1990
- 1990-11-30 JP JP2329222A patent/JPH04204068A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102323543A (en) * | 2011-06-13 | 2012-01-18 | 重庆斯凯力科技有限公司 | Virtual instrument-based temperature controlled switch testing system and method |
CN104142471A (en) * | 2013-09-05 | 2014-11-12 | 国家电网公司 | Measuring device for action delay of dry contact of electronic equipment |
CN106990352A (en) * | 2017-03-06 | 2017-07-28 | 新华三技术有限公司 | Closing detecting apparatus and communication equipment |
CN109444732A (en) * | 2018-11-21 | 2019-03-08 | 格力电器(武汉)有限公司 | A kind of micro-switch testing device and method |
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