JPH04190873A - Coating device - Google Patents

Coating device

Info

Publication number
JPH04190873A
JPH04190873A JP2321909A JP32190990A JPH04190873A JP H04190873 A JPH04190873 A JP H04190873A JP 2321909 A JP2321909 A JP 2321909A JP 32190990 A JP32190990 A JP 32190990A JP H04190873 A JPH04190873 A JP H04190873A
Authority
JP
Japan
Prior art keywords
coating
resist
liquid
storage container
mixed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2321909A
Other languages
Japanese (ja)
Other versions
JP2806626B2 (en
Inventor
Chiharu Shiraishi
白石 千春
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Tokyo Electron Kyushu Ltd
Original Assignee
Tokyo Electron Ltd
Tokyo Electron Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd, Tokyo Electron Kyushu Ltd filed Critical Tokyo Electron Ltd
Priority to JP32190990A priority Critical patent/JP2806626B2/en
Publication of JPH04190873A publication Critical patent/JPH04190873A/en
Application granted granted Critical
Publication of JP2806626B2 publication Critical patent/JP2806626B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)

Abstract

PURPOSE:To prevent a coating liq. from being mixed with air bubbles and permit an appropriate amt. of the coating liq. to be replenished as required by a method wherein the existence of the bubbles mixed in the coating liq. being sent from a receiving container to a transparent pipe can be detected by a sensor. CONSTITUTION:A gas is sent pressurized from a nitrogen gas supply system 26 to a receiving container 24 contg. a coating liq. 23 therein to send out the coating liq. 23 from a pipe 16. The pipe 16 is at least partially provided with a transparent pipe 27 formed of a transparent body, whereby the existence of the bubbles 31 mixed in the coating liq. 23 being sent from a receiving container 34 to the transparent pipe 27 is detected by a sensor 30 consisting of a light emitting element 28 and a light receiving element 29. As a result, this method prevents the coating liq. from being mixed with the air bubbles and permits an appropriate amt. of the coating liq. to be replenished as required.

Description

【発明の詳細な説明】 [産業上の利用分野コ 本発明は塗布装置に係わる。[Detailed description of the invention] [Industrial application fields] The present invention relates to a coating device.

[従来の技術] 一般に半導体製造における半導体ウェハ上に積層された
薄膜にパターンを形成する工程では、半導体ウエノ)に
レジストを塗布し、パターンに形成されたマスクを通し
て露光後現像し、エツチングを行い、薄膜をパターン形
状に形成している。これらのレジスト塗布あるいは現像
に用いられるレジスト塗布装置あるいは現像装置は、収
納容器に収納されたレジスト液あるいは現像液の一定量
をノズルからチャック上に真空吸着される半導体ウェハ
上に滴下し、チャックが高速回転することにより半導体
ウェハ上に滴下されたレジストあるいは現像液を全面に
均一に塗布するようになっている。
[Prior Art] Generally, in the process of forming a pattern on a thin film stacked on a semiconductor wafer in semiconductor manufacturing, a resist is applied to a semiconductor wafer, exposed through a mask formed in a pattern, developed, and etched. The thin film is formed into a pattern. A resist coating device or a developing device used for resist coating or development drops a certain amount of resist solution or developer stored in a storage container from a nozzle onto a semiconductor wafer that is vacuum-adsorbed onto a chuck. By rotating at high speed, the resist or developer dropped onto the semiconductor wafer is uniformly applied over the entire surface.

[発明が解決しようとする課題] しかしながら、集積回路か超高集積化されるに伴い、塗
布むらが大きく影響してしまう。塗布むらは高粘土のレ
ジスト液中あるいは現像液中に含まれる気泡が大きな原
因となる場合があり、また−度混入した気泡はなかなか
除去できず、気泡除去の努力がなされている。特に第3
図に示すように収納容器1からレジスト液あるいは現像
液2を配管3に送出するのに窒素ガス等のガスを配管4
から収納容器1に圧送させて行っているため、収納容器
1中に残留するレジスト液あるいは現像液2か少なくな
ってくると、気泡が混入しゃすがった。そのため、配管
3にタンク5を設け、タンク5の液量を液量センサ6な
どで検出し、収納容器1中のレジスト液あるいは現像液
の残量を検出して気泡のノズルへの流出を防止していた
[Problems to be Solved by the Invention] However, as integrated circuits become extremely highly integrated, coating unevenness becomes a significant influence. In some cases, uneven coating is caused by air bubbles contained in a high-clay resist solution or developer solution, and it is difficult to remove air bubbles once they have been mixed in, so efforts are being made to remove the air bubbles. Especially the third
As shown in the figure, a gas such as nitrogen gas is supplied to the pipe 4 to send the resist solution or developer 2 from the storage container 1 to the pipe 3.
Since the resist solution or the developer 2 remaining in the storage container 1 becomes low, air bubbles get mixed in and sag. Therefore, a tank 5 is provided in the piping 3, and the liquid level in the tank 5 is detected by a liquid level sensor 6, etc., and the remaining amount of resist solution or developer in the storage container 1 is detected to prevent air bubbles from flowing out to the nozzle. Was.

しかし、残量が少なくなった場合に、ともすれば混入し
てしまう気泡の検出はなされず、半導体ウェハ上に塗布
される塗膜が不均一になってしまうこともしばしばあっ
た。そのため、製品の歩留りか悪くなってしまった。
However, when the remaining amount is low, air bubbles that may otherwise be mixed in are not detected, and the coating film applied to the semiconductor wafer often becomes non-uniform. As a result, the yield of the product deteriorated.

本発明は上記の欠点を解消するためになされたものであ
って、気体で圧送されて配管に供給される塗布液の収納
容器中に残量する液体量が僅かなことを検出でき、しか
も液体中に気泡か混入しても直ちに気泡が検出でき、製
品の歩留りを向上させる塗布装置を提供することを目的
とする。
The present invention has been made to solve the above-mentioned drawbacks, and is capable of detecting a small amount of liquid remaining in a storage container for a coating liquid that is fed under pressure with gas and supplied to piping. An object of the present invention is to provide a coating device that can immediately detect air bubbles even if they are mixed in, and improve the yield of products.

[課題を解決するための手段] 上記の目的を達成するため本発明の塗布装置は、塗布液
の収納された収納容器に気体を圧送することにより前記
塗布液を配管から送出する塗布装置において、前記配管
の少なくとも一部は透明体で構成される透明管を備え、
前記収納容器から前記透明管に送出される前記塗布液中
に混入される泡の存在を検出するセンサを備えたもので
ある。
[Means for Solving the Problems] In order to achieve the above object, the coating device of the present invention is a coating device that sends out the coating liquid from a pipe by pumping gas into a storage container in which the coating liquid is stored. At least a portion of the piping includes a transparent tube made of a transparent body,
The apparatus is equipped with a sensor that detects the presence of bubbles mixed into the coating liquid sent from the storage container to the transparent tube.

[作用] 収納容器中に収納された塗布液を気体を圧入することに
より、収納容器に接続された配管を通って液体を収納容
器外に送出させる塗布装置の配管の少なくとも一部を透
明管で形成する。この透明管に投受光素子等のセンサを
設ける。配管中にある程度の大きさの気泡が存在すると
、気泡により受光素子に入射される光量が変化するため
、気泡の有無を検知できる。気泡か検出されると収納容
器中の液体の残量が少ないことを知ることができ、その
ため収納容器に液体を供給して常に気泡が混入されない
一定量の液体を供給することができる。
[Function] At least a part of the piping of the coating device is made of a transparent tube, which sends the liquid out of the storage container through the piping connected to the storage container by injecting gas into the coating liquid stored in the storage container. Form. A sensor such as a light emitting/receiving element is provided in this transparent tube. When air bubbles of a certain size are present in the piping, the amount of light incident on the light receiving element changes due to the air bubbles, so the presence or absence of air bubbles can be detected. When air bubbles are detected, it can be known that the remaining amount of liquid in the storage container is small, and therefore a constant amount of liquid without air bubbles can be supplied to the storage container at all times.

[実施例] 本発明の塗布装置を半導体製造工程のレジスト塗布装置
に適用した一実施例を図面を参照して説明する。
[Example] An example in which the coating apparatus of the present invention is applied to a resist coating apparatus for a semiconductor manufacturing process will be described with reference to the drawings.

第1図に示すレジスト塗布装置7は、真空吸着等によっ
てウェハ8を載置固定し、モータの回転軸に固定される
上面円板状のチャック10を備える。チャック10の上
方には吐出ノズル11が水平移動機構に接続されて設け
られ、ダミーディスペンスを行うため、チャック10の
上方からウェハ8の外側位置に退避できるようになって
いる。
The resist coating device 7 shown in FIG. 1 mounts and fixes a wafer 8 by vacuum suction or the like, and includes a chuck 10 having a disc-shaped upper surface and fixed to a rotating shaft of a motor. A discharge nozzle 11 is provided above the chuck 10 and connected to a horizontal movement mechanism, and can be retracted from above the chuck 10 to a position outside the wafer 8 in order to perform dummy dispensing.

チャック10の周囲にはチャック10を包囲するように
カップ12が設けられ、吐出ノズル11からウェハ8上
に滴下されたレジストをウェハ8全面に延伸するため、
チャック10を回転させる際ウェハ8の周縁から余剰の
レジストか周囲に飛散するのを防止している。さらに、
カップ12の下方にはカップ12ではね返ったレジスト
が再びウェハ8上に付着するのを防止するため、カップ
12の下方に向って気体流を形成するよう図示しない排
気装置に接続される排気口等が設けられる。
A cup 12 is provided around the chuck 10 so as to surround the chuck 10, and in order to spread the resist dropped onto the wafer 8 from the discharge nozzle 11 over the entire surface of the wafer 8.
When the chuck 10 is rotated, excess resist is prevented from scattering around the periphery of the wafer 8. moreover,
Below the cup 12, in order to prevent the resist that has bounced off the cup 12 from adhering to the wafer 8 again, there is an exhaust port connected to an exhaust device (not shown) to form a gas flow downwards in the cup 12. is provided.

また、カップ12はウェハ8とチャック10上に図示し
ない搬送機構により搬入出する際、図の位置より下降し
てウェハ8の搬入出を容易にするように図示しない上下
動機構を備える。吐出ノズル11はレジスト滴下後に吐
出ノズル11に残存するレジストの液たれを防止するた
め、残存するレジストを吸引するためのサックバックバ
ルブ13、一定量のレジスト液を送り出すためのエアシ
リンダ14により駆動されるベローズポンプ15、配管
16を適温に暖めるための温度調整用のウォータジャケ
ット17、バルブ18を介して脱気装置19に接続され
るフィルタ20、バルブ21及び液体検出装置22等か
配管16を介して液体であるレジスト液23の収納容器
24に接続される。
Further, the cup 12 is provided with a vertical movement mechanism (not shown) so as to be lowered from the position shown in the figure to facilitate loading/unloading of the wafer 8 when the cup 12 is loaded/unloaded onto the wafer 8 and the chuck 10 by a transport mechanism (not shown). In order to prevent the resist remaining in the discharge nozzle 11 from dripping after dropping the resist, the discharge nozzle 11 is driven by a suckback valve 13 for suctioning the remaining resist, and an air cylinder 14 for discharging a certain amount of resist liquid. A bellows pump 15, a water jacket 17 for temperature adjustment to warm the piping 16 to an appropriate temperature, a filter 20, a valve 21, a liquid detection device 22, etc. connected to the deaerator 19 via the valve 18, etc. The resist liquid 23 is connected to a container 24 containing a liquid resist liquid 23 .

レジスト液収納容器24には配管25を介して気体であ
る窒素ガス供給系26が連結される。
A nitrogen gas supply system 26, which is a gas, is connected to the resist liquid storage container 24 via a pipe 25.

上記のようなレジスト塗布装置7の収納容器23には第
2図に示すように少なくとも一部を透明体で構成される
透明管27か挿入される。この透明管27部分に設けら
れる液体検出装置22は投光素子28及び受光素子29
から成るセンサ30を備える。図のように透光型に限ら
ず投受元素28.29を同一部に設ける反射型に構成し
てもよい。投光素子28からの発光はレジスト液23中
に混入する気泡31の存在で気泡31がレンズの働きを
するため受光素子29に入射される光量が変化する。透
明配管27は例えば内径4mmであれば気泡31は1m
mmm下のものまで検出可能である。液体検出装置22
は、さらにセンサ30が受光素子29からの入力値を予
め定められた情報と比較して気泡31の存在を検知する
と、検知信号を出力するCPUを備え、CPUからの警
告音発生信号により警告音を鳴動させる警告音発生装置
32が設けられる。
As shown in FIG. 2, a transparent tube 27, at least a portion of which is made of a transparent material, is inserted into the storage container 23 of the resist coating device 7 as described above. The liquid detection device 22 provided in the transparent tube 27 includes a light emitting element 28 and a light receiving element 29.
A sensor 30 is provided. As shown in the figure, the structure is not limited to the transmissive type, but may be a reflective type in which the transmitting and receiving elements 28 and 29 are provided in the same part. Due to the presence of air bubbles 31 mixed in the resist liquid 23, the light emitted from the light projecting element 28 changes the amount of light incident on the light receiving element 29 because the air bubbles 31 function as a lens. For example, if the inner diameter of the transparent pipe 27 is 4 mm, the air bubble 31 is 1 m long.
It is possible to detect objects down to mm. Liquid detection device 22
further includes a CPU that outputs a detection signal when the sensor 30 compares the input value from the light receiving element 29 with predetermined information and detects the presence of bubbles 31, and generates an alarm sound by an alarm sound generation signal from the CPU. A warning sound generating device 32 is provided to make a sound.

以上のような構成のレジスト塗布装置7の動作を説明す
る。
The operation of the resist coating device 7 configured as above will be explained.

カップ12を図の位置より下降させ、チャック10上に
ウェハ8を図示しない搬送機構により搬入させる。カッ
プ12が図の位置に上昇して塗布可能状態となる。吐出
ノズル11が水平移動機構によりウェハ8の中心部上方
まで移動されレジスト液の供給を行なう。窒素ガス供給
系26がらレジスト液23の収納容器24に配管25を
挿入し、配管25から収納容器24に窒素ガスを圧入さ
せる。レジスト液23は収納容器24から透明管27に
圧送される。この時収納容器24内にレジスト液23の
液量が十分に確保されていれば気泡31がレジスト液2
3中に混入されずにレジスト液が送出される。そしてセ
ンサ30により気泡31が検知されなければレジスト液
23は透明管27に送出続行される。そしてバルブ21
、フィルタ20を介しウォータジャケット17により適
温に加熱され、ベローズポンプ15に供給される。フィ
ルタ20ではレジスト中に含まれるパーティクルあるい
はごく微小のセンサ30で検出されなかった気泡か濾過
され、脱気装置19より除去される。ベローズポンプ1
5に供給されたレジスト液23は、エアシリンダ14に
より駆動されるベローズポンプ15により、所定量か配
管16に送出され、吐出ノズル11からチャック10上
のウェハ8に滴下される。その後、サックバックバルブ
13により吐出ノズル11に滴下されずに残留するレジ
スト液が吸引されウェハ8上に液だれするのを防止する
。そしてチャック10がモータ9により高速回転し、レ
ジストが塗布される。塗布終了後、カップ12が下降し
、ウェハ8の搬入出が行われ、上記の工程が反復される
。そして収納容器24内のレジスト液23か消費され、
残量か僅かになると、透明管27中に気泡31が発生す
ると、投光素子28からの発光を受光する受光素子21
に入射される光量が変化しセンサ30により気泡の検知
信号がCPUに送出される。CPIJは警告音発生装置
32に警告音発生信号を出力し、警告音が鳴動される。
The cup 12 is lowered from the position shown in the figure, and the wafer 8 is carried onto the chuck 10 by a transport mechanism (not shown). The cup 12 rises to the position shown in the figure and becomes ready for application. The discharge nozzle 11 is moved above the center of the wafer 8 by a horizontal movement mechanism to supply resist liquid. A piping 25 is inserted into the storage container 24 for the resist liquid 23 from the nitrogen gas supply system 26, and nitrogen gas is forced into the storage container 24 from the piping 25. The resist liquid 23 is pumped from the storage container 24 into the transparent tube 27 . At this time, if a sufficient amount of the resist liquid 23 is secured in the storage container 24, the air bubbles 31 will be removed from the resist liquid 23.
3, the resist solution is delivered without being mixed in. If no air bubbles 31 are detected by the sensor 30, the resist liquid 23 continues to be delivered to the transparent tube 27. and valve 21
, is heated to an appropriate temperature by the water jacket 17 via the filter 20, and is supplied to the bellows pump 15. Particles contained in the resist or very small air bubbles not detected by the sensor 30 are filtered by the filter 20 and removed by the degassing device 19. Bellows pump 1
A predetermined amount of the resist liquid 23 supplied to the resist liquid 23 is delivered to the piping 16 by a bellows pump 15 driven by an air cylinder 14, and is dripped onto the wafer 8 on the chuck 10 from the discharge nozzle 11. Thereafter, the resist liquid remaining without being dropped into the discharge nozzle 11 is sucked by the suckback valve 13 to prevent the liquid from dripping onto the wafer 8. Then, the chuck 10 is rotated at high speed by the motor 9, and the resist is applied. After the coating is completed, the cup 12 is lowered, the wafer 8 is loaded and unloaded, and the above steps are repeated. Then, the resist liquid 23 in the storage container 24 is consumed,
When the amount remaining becomes small and bubbles 31 are generated in the transparent tube 27, the light receiving element 21 receives the light emitted from the light projecting element 28.
The amount of light incident on the sensor 30 changes, and the sensor 30 sends a bubble detection signal to the CPU. The CPIJ outputs a warning sound generation signal to the warning sound generating device 32, and the warning sound is sounded.

それによりオペレータはレジスト液23の収納容器14
内の残量が少ないことを知り、バルブ21を閉じて収納
容器24にレジスト液23を充填する。そしてバルブ2
1を開き、フィルタ20に接続される脱気装置19によ
り、配管に流入したエアを除去し、レジスト塗布を再開
する。この気泡の検知と共に透明管27の光電検出に適
宜色フィルタを設はコントラストを付してもよい。
Thereby, the operator can open the storage container 14 for the resist liquid 23.
Knowing that the amount remaining in the resist liquid 23 is small, the valve 21 is closed and the storage container 24 is filled with the resist liquid 23. and valve 2
1 is opened, air flowing into the pipe is removed by a deaerator 19 connected to the filter 20, and resist coating is restarted. In addition to this air bubble detection, a color filter may be provided or a contrast may be added to the photoelectric detection of the transparent tube 27 as appropriate.

本発明によれば、従来気泡の検知は行えなかったため、
オペレータが目視しなければならながったところ、検知
手段により知ら知められるため作業効率も非常に向上さ
せることができ、気泡が混入したレジスト液をウェハに
塗布して塗布むらが生し歩留りが悪いということも排除
できるようになった。
According to the present invention, since bubbles could not be detected conventionally,
Instead of the operator having to visually check, the work efficiency can be greatly improved because the operator is notified by the detection means, and the resist solution containing air bubbles is applied to the wafer, resulting in uneven coating and yield. It has become possible to rule out that this is a bad thing.

以上の説明は本発明の塗布装置の一実施例であって、本
発明はレジスト塗布装置に限らす、収納容器から供給さ
れる塗布液か用いられるものならば例えば現像液の塗布
等何れのものにも適用することができ、特に気泡が混入
すると除去しにくい高粘性の液体を用いるものには好適
に採用することができる。さらに、LCD基板、プリン
ト基板等にも適用できる。
The above description is one embodiment of the coating device of the present invention, and the present invention is limited to a resist coating device.It can be applied to any coating solution supplied from a storage container, for example, to coating a developer, etc. It can also be applied to liquids with high viscosity that are difficult to remove when air bubbles are mixed in. Furthermore, it can be applied to LCD boards, printed circuit boards, etc.

[発明の効果] 以上の説明からも明らかなように、本発明の塗布装置に
よれば、気体を圧入することにより収納容器内の塗布液
を供給する場合、塗布液に混入される気泡を検出して残
量の少ないことを検知し、オペレータに検知する手段を
設けたため、塗布液に気泡が混入されるのを防止し、必
要に応じて液量の補充を適切に行うことができる。
[Effects of the Invention] As is clear from the above description, according to the coating device of the present invention, when supplying the coating liquid in the storage container by pressurizing gas, air bubbles mixed into the coating liquid can be detected. Since the operator is provided with means for detecting that the remaining amount is low, it is possible to prevent air bubbles from being mixed into the coating liquid and to appropriately replenish the amount of liquid as necessary.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の塗布装置を適用した一実施例を示す構
成図、第2図は第1図に示す一実施例の要部を示す図、
第3図は従来例を示す図である。 16・・・・・・配管 22・・・・・・液体検出装置 23・・・・・・レジスト液(気体) 24・・・・・・収納容器 26・・・・・・窒素ガス供給系(気体)27・・・・
・・透明管 30・・・・・・センサ 代理人 弁理士  守 谷 −雄 第1図 !12rI!J
FIG. 1 is a block diagram showing an embodiment to which the coating device of the present invention is applied, FIG. 2 is a diagram showing main parts of the embodiment shown in FIG. 1,
FIG. 3 is a diagram showing a conventional example. 16... Piping 22... Liquid detection device 23... Resist liquid (gas) 24... Storage container 26... Nitrogen gas supply system (Gas) 27...
...Transparent tube 30...Sensor agent Patent attorney Moritani Figure 1! 12rI! J

Claims (1)

【特許請求の範囲】[Claims] 塗布液の収納された収納容器に気体を圧送することによ
り前記塗布液を配管から送出する塗布装置において、前
記配管の少なくとも一部は透明体で構成される透明管を
備え、前記収納容器から前記透明管に送出される前記塗
布液中に混入される泡の存在を検出するセンサを備えた
ことを特徴とする塗布装置。
A coating device that sends out the coating liquid from a pipe by force-feeding gas to a storage container in which the coating liquid is stored, wherein at least a part of the piping includes a transparent tube made of a transparent body, A coating device comprising a sensor that detects the presence of bubbles mixed into the coating liquid delivered to a transparent tube.
JP32190990A 1990-11-26 1990-11-26 Coating device Expired - Fee Related JP2806626B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32190990A JP2806626B2 (en) 1990-11-26 1990-11-26 Coating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32190990A JP2806626B2 (en) 1990-11-26 1990-11-26 Coating device

Publications (2)

Publication Number Publication Date
JPH04190873A true JPH04190873A (en) 1992-07-09
JP2806626B2 JP2806626B2 (en) 1998-09-30

Family

ID=18137758

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32190990A Expired - Fee Related JP2806626B2 (en) 1990-11-26 1990-11-26 Coating device

Country Status (1)

Country Link
JP (1) JP2806626B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5938847A (en) * 1996-09-03 1999-08-17 Tokyo Electron Limited Method and apparatus for coating a film on an object being processed
WO2007086459A1 (en) * 2006-01-25 2007-08-02 Origin Electric Company, Limited Liquid substance supply device and liquid substance supply method
US7317504B2 (en) 2004-04-08 2008-01-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2008010892A (en) * 2003-06-11 2008-01-17 Asml Netherlands Bv Lithography device and method of manufacturing device
JP2008270255A (en) * 2007-04-16 2008-11-06 Oki Electric Ind Co Ltd Resist piping and resist coating equipment
US8023100B2 (en) 2004-02-20 2011-09-20 Nikon Corporation Exposure apparatus, supply method and recovery method, exposure method, and device producing method
JP2011242328A (en) * 2010-05-20 2011-12-01 Ricoh Co Ltd Bubble detection tool, bubble detector, and bubble detection method
JP2016103590A (en) * 2014-11-28 2016-06-02 東京エレクトロン株式会社 Substrate processing method and substrate processing device

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6268013B1 (en) 1996-09-03 2001-07-31 Tokyo Electron Limited Coating a resist film, with pretesting for particle contamination
US5938847A (en) * 1996-09-03 1999-08-17 Tokyo Electron Limited Method and apparatus for coating a film on an object being processed
JP2010239158A (en) * 2003-06-11 2010-10-21 Asml Netherlands Bv Lithographic projection apparatus
US9964858B2 (en) 2003-06-11 2018-05-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9110389B2 (en) 2003-06-11 2015-08-18 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2008010892A (en) * 2003-06-11 2008-01-17 Asml Netherlands Bv Lithography device and method of manufacturing device
JP2010258470A (en) * 2003-06-11 2010-11-11 Asml Netherlands Bv Lithography projection apparatus
JP5076497B2 (en) * 2004-02-20 2012-11-21 株式会社ニコン Exposure apparatus, liquid supply method and recovery method, exposure method, and device manufacturing method
US8023100B2 (en) 2004-02-20 2011-09-20 Nikon Corporation Exposure apparatus, supply method and recovery method, exposure method, and device producing method
US7317504B2 (en) 2004-04-08 2008-01-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8117981B2 (en) 2006-01-25 2012-02-21 Origin Electric Company, Limited Liquid material supplying apparatus and liquid material supplying method
JP2007196109A (en) * 2006-01-25 2007-08-09 Origin Electric Co Ltd Apparatus and method for supplying liquid material
WO2007086459A1 (en) * 2006-01-25 2007-08-02 Origin Electric Company, Limited Liquid substance supply device and liquid substance supply method
JP2008270255A (en) * 2007-04-16 2008-11-06 Oki Electric Ind Co Ltd Resist piping and resist coating equipment
JP2011242328A (en) * 2010-05-20 2011-12-01 Ricoh Co Ltd Bubble detection tool, bubble detector, and bubble detection method
JP2016103590A (en) * 2014-11-28 2016-06-02 東京エレクトロン株式会社 Substrate processing method and substrate processing device

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