JPH04171934A - Wet type processing equipment for semiconductor - Google Patents
Wet type processing equipment for semiconductorInfo
- Publication number
- JPH04171934A JPH04171934A JP30060690A JP30060690A JPH04171934A JP H04171934 A JPH04171934 A JP H04171934A JP 30060690 A JP30060690 A JP 30060690A JP 30060690 A JP30060690 A JP 30060690A JP H04171934 A JPH04171934 A JP H04171934A
- Authority
- JP
- Japan
- Prior art keywords
- pump
- filter
- pulsation
- buffer tank
- chemical liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 18
- 239000000126 substance Substances 0.000 claims abstract description 29
- 239000000428 dust Substances 0.000 claims abstract description 18
- 230000010349 pulsation Effects 0.000 claims abstract description 18
- 238000001914 filtration Methods 0.000 claims abstract description 11
- 238000000034 method Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 9
- 239000007788 liquid Substances 0.000 abstract description 8
- 230000003139 buffering effect Effects 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
Landscapes
- Weting (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体基板の湿式処理装置に関し、特に半導体
装置の製造等に使用されるエツチング及び洗浄の薬液循
環型湿式処理装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a wet processing apparatus for semiconductor substrates, and more particularly to a chemical circulation type wet processing apparatus for etching and cleaning used in the manufacture of semiconductor devices.
従来、この種の湿式処理装置は、第3図の様に、処理槽
3の薬液ポンプ1によりポンプの直後に設けられたフィ
ルター2を通して処理槽へ戻すことにより循環濾過を行
なっていた。Conventionally, in this type of wet processing apparatus, as shown in FIG. 3, circulation filtration has been performed by returning chemical liquid to the processing tank through a filter 2 provided immediately after the pump by a chemical pump 1 in a processing tank 3.
上述した従来の半導体湿式処理装置は、薬液を循環させ
る為のポンプの直後にフィルターを置いている為、ポン
プの脈動をそのままフィルターメツシュが受け、メツシ
ュの変形により、フィルターメツシュに一度捕捉した塵
埃を再流出させ、処理槽に戻った塵埃が半導体基板を引
き上げる際に再付着するという欠点がある。In the conventional semiconductor wet processing equipment described above, the filter is placed immediately after the pump for circulating the chemical solution, so the pulsation of the pump is directly received by the filter mesh, and due to the deformation of the mesh, it is captured once by the filter mesh. There is a drawback that the dust is re-flowed and the dust that returns to the processing tank is reattached when the semiconductor substrate is pulled up.
近年、集積回路の微細化に伴ない、塵埃の処理半導体基
板への再付着が半導体製造の大きな障害となっている。In recent years, with the miniaturization of integrated circuits, re-adhesion of dust to processed semiconductor substrates has become a major hindrance to semiconductor manufacturing.
本発明の目的は、フィルターの脈動による捕捉塵埃の再
流出を防止でき、その結果濾過スピードと濾過能力が向
上し、半導体基板処理中の塵埃除去が効果的に実施でき
、半導体基板を処理槽から引き上げる際の塵埃の再付着
を低減できる半導体湿式処理装置を提供することにある
。An object of the present invention is to prevent trapped dust from flowing out again due to pulsation of the filter, thereby improving filtration speed and filtration ability, effectively removing dust during semiconductor substrate processing, and removing semiconductor substrates from the processing tank. An object of the present invention is to provide a semiconductor wet processing device that can reduce re-adhesion of dust during lifting.
本発明の循環型湿式処理装置は、薬液をフィルターを通
して循環させる為のポンプと濾過する為のフィルターと
の間に、ポンプから発生する脈動を吸収する緩衝装置を
設けることにより、常に一定の圧力で薬液をフィルター
側へ送り、フィルターメツシュの脈動を防止するように
したこと特徴として構成される。The circulating wet treatment device of the present invention provides a buffer device between the pump for circulating the chemical solution through the filter and the filter for filtering it, which absorbs the pulsations generated from the pump, so that the pressure is always constant. The feature is that the chemical solution is sent to the filter side to prevent pulsation of the filter mesh.
なお脈動を吸収する緩衝装置としては薬液を循環させる
ためのポンプとフィルターとの間にN2加圧型緩衝槽を
入れるか、又はトルクモーターを使用した緩衝槽が用い
られ目的を達成することができる。As a buffer device for absorbing pulsation, the purpose can be achieved by inserting a N2 pressurized buffer tank between the pump for circulating the chemical solution and the filter, or by using a buffer tank using a torque motor.
次に、本発明について図面を参照して説明する。第1図
は本発明の一実施例の構成概略図である。本実施例は、
半導体基板を処理する処理槽6および循環ポンプ1から
発生する脈動を吸収するN2加圧型緩衝装置から成り、
処理槽内の薬液をポンプ1により緩衝槽7に送り、緩衝
槽7の薬液はフィルター3を通して処理槽6に戻すこと
により循環フィルタリングを行なう。Next, the present invention will be explained with reference to the drawings. FIG. 1 is a schematic diagram of an embodiment of the present invention. In this example,
It consists of a processing tank 6 for processing semiconductor substrates and an N2 pressurized buffer device that absorbs pulsations generated from the circulation pump 1.
The chemical solution in the processing tank is sent to the buffer tank 7 by the pump 1, and the chemical solution in the buffer tank 7 is returned to the processing tank 6 through the filter 3, thereby performing circulation filtering.
緩衝槽7は、ポンプ1により送られてくる薬液の圧力変
動を圧力制御装置4により常にモニターし、緩衝槽内に
与えるN2圧力を常に一定にする様に制御する。これに
よりフィルターメツシュへは常に一定の圧力で薬液を供
給する為、フィルターメツシュの脈動による捕捉塵埃の
再流出を防止することができる。The buffer tank 7 constantly monitors pressure fluctuations of the chemical solution sent by the pump 1 by the pressure control device 4, and controls the N2 pressure applied to the buffer tank to always be constant. As a result, the chemical solution is always supplied to the filter mesh at a constant pressure, so it is possible to prevent trapped dust from flowing out again due to pulsation of the filter mesh.
なお逆止弁2は、緩衝槽′7からポンプ1へ薬液が逆流
することを防止する為のものである。The check valve 2 is provided to prevent the chemical solution from flowing back into the pump 1 from the buffer tank '7.
第4図は循環フィルタリングによる薬液中の塵埃減少量
を従来技術と比較したグラフである。従来技術に比べ本
発明は、塵埃除去スピードが約2倍、最終的な薬液中の
塵埃量は1/3程度に改善できる。FIG. 4 is a graph comparing the amount of dust reduction in a chemical solution due to circulation filtering with that of the prior art. Compared to the conventional technology, the present invention can improve the dust removal speed by about twice and the amount of dust in the final chemical solution by about 1/3.
第2図は本発明の他の実施例の構成概略図である0本実
施例は、第1の実施例と同様にポンプ1とフィルター2
との間に緩衝槽を有することによりポンプの脈動を吸収
している。FIG. 2 is a schematic diagram of the configuration of another embodiment of the present invention. This embodiment has a pump 1 and a filter 2 similar to the first embodiment.
A buffer tank is provided between the pump and the pump to absorb the pulsation of the pump.
本実施例の緩衝槽は、**槽内の薬液をピストン5の圧
力によりフィルター3へ送る構造になっており、ポンプ
1が緩衝槽内の薬液に与える圧力変動はトルクモーター
4により検知し、ピストン5を通じて薬液に与える圧力
を常に一定に保つ様になっている。これにより、フィル
ターメツシュへは常に一定の圧力で薬液を供給する為、
フィルターメツシュの脈動による捕捉塵埃の再流出を防
止する。The buffer tank of this embodiment has a structure in which the chemical liquid in the tank is sent to the filter 3 by the pressure of the piston 5, and the pressure fluctuations applied to the chemical liquid in the buffer tank by the pump 1 are detected by the torque motor 4. The pressure applied to the chemical solution through the piston 5 is always kept constant. As a result, the chemical solution is always supplied to the filter mesh at a constant pressure.
Prevents trapped dust from flowing out again due to pulsation of the filter mesh.
本実施例は第1の実施例に比べ、N2ガスを使用してい
ない為、リーク等の問題がなくなる。Compared to the first embodiment, this embodiment does not use N2 gas, so there are no problems such as leakage.
以上説明した様に本発明は、ポンプとフィルターとの間
にポンプから発生する脈動を吸収する為の緩衝装置を設
けることにより、フィルターの脈動による捕捉塵埃の再
流出を防止する。これにより濾過スピードと濾過能力が
向上し、半導体基板処理中の塵埃除去を効果的に行ない
、半導体基板を処理槽から引き上げる際の塵埃の再付着
を低減させる効果がある。As explained above, the present invention prevents the trapped dust from flowing out again due to the pulsation of the filter by providing a buffer device between the pump and the filter to absorb the pulsation generated by the pump. This improves filtration speed and filtration ability, effectively removes dust during semiconductor substrate processing, and reduces re-adhesion of dust when semiconductor substrates are pulled up from the processing tank.
第1図は本発明の一実施例の構成概略図、第2図は本発
明の他の実施例の構成概略図、第3図は従来技術の構成
断面図、第4図は循環濾過による薬液中の塵埃減少量を
従来例と本実施例とを比較したグラフである。
1・・・ポンプ、2・・・逆止弁、3・・・フィルター
、4・・・圧力制御装置(トルクモーター)、5・・・
ビストン、6・・・処理槽、7・・・緩衝槽。Fig. 1 is a schematic diagram of the configuration of one embodiment of the present invention, Fig. 2 is a schematic diagram of the configuration of another embodiment of the present invention, Fig. 3 is a sectional view of the configuration of the prior art, and Fig. 4 is a chemical solution by circulation filtration. It is a graph comparing the amount of dust reduction inside the conventional example and the present example. 1... Pump, 2... Check valve, 3... Filter, 4... Pressure control device (torque motor), 5...
Viston, 6...processing tank, 7...buffer tank.
Claims (1)
装置において、薬液を循環させる際発生するフィルター
メッシュの脈動を抑える緩衝装置を有し、フィルターメ
ッシュに一度捕捉した塵埃の流出を防止することを特徴
とする半導体湿式処理装置。 2、薬液を循環させる際発生するフィルターメッシュ
の脈動を抑える緩衝装置として、薬液を循環させる為の
ポンプとフィルターとの間にN_2加圧型緩衝槽を備え
たことを特徴とする請求項1記載の半導体湿式処理装置
。 3、薬液を循環させる際発生するフィルターメッシュ
の脈動を抑える緩衝装置として、薬液を循環させる為の
ポンプとフィルターとの間にトルクモーターを使用した
緩衝槽を備えたことを特徴とする請求項1記載の半導体
湿式処理装置。[Claims] 1. A semiconductor wet processing device having a circulation filtering mechanism includes a buffer device that suppresses pulsation of the filter mesh that occurs when a chemical solution is circulated, and prevents dust once captured by the filter mesh from flowing out. A semiconductor wet processing device characterized by: 2. The method according to claim 1, characterized in that an N_2 pressurized buffer tank is provided between the pump for circulating the chemical solution and the filter as a buffer device for suppressing the pulsation of the filter mesh that occurs when the chemical solution is circulated. Semiconductor wet processing equipment. 3. Claim 1 characterized in that a buffer tank using a torque motor is provided between the pump for circulating the chemical solution and the filter as a buffer device for suppressing pulsation of the filter mesh that occurs when circulating the chemical solution. The semiconductor wet processing apparatus described above.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30060690A JPH04171934A (en) | 1990-11-06 | 1990-11-06 | Wet type processing equipment for semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30060690A JPH04171934A (en) | 1990-11-06 | 1990-11-06 | Wet type processing equipment for semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04171934A true JPH04171934A (en) | 1992-06-19 |
Family
ID=17886877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP30060690A Pending JPH04171934A (en) | 1990-11-06 | 1990-11-06 | Wet type processing equipment for semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04171934A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100394554C (en) * | 2002-04-23 | 2008-06-11 | 显像制造服务株式会社 | Wet processing tank and fluid supply system for liquid crystal display production equipment |
US11728188B2 (en) | 2019-08-23 | 2023-08-15 | Kioxia Corporation | Semiconductor manufacturing device |
-
1990
- 1990-11-06 JP JP30060690A patent/JPH04171934A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100394554C (en) * | 2002-04-23 | 2008-06-11 | 显像制造服务株式会社 | Wet processing tank and fluid supply system for liquid crystal display production equipment |
US11728188B2 (en) | 2019-08-23 | 2023-08-15 | Kioxia Corporation | Semiconductor manufacturing device |
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