JPH0416801A - Half mirror - Google Patents
Half mirrorInfo
- Publication number
- JPH0416801A JPH0416801A JP12172190A JP12172190A JPH0416801A JP H0416801 A JPH0416801 A JP H0416801A JP 12172190 A JP12172190 A JP 12172190A JP 12172190 A JP12172190 A JP 12172190A JP H0416801 A JPH0416801 A JP H0416801A
- Authority
- JP
- Japan
- Prior art keywords
- semi
- optical
- transparent mirror
- different
- optical materials
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 70
- 239000000463 material Substances 0.000 claims abstract description 42
- 230000005540 biological transmission Effects 0.000 claims description 12
- 238000005259 measurement Methods 0.000 abstract description 13
- 229910052732 germanium Inorganic materials 0.000 abstract description 2
- 229910052710 silicon Inorganic materials 0.000 abstract description 2
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 abstract 1
- IOLCXVTUBQKXJR-UHFFFAOYSA-M potassium bromide Chemical compound [K+].[Br-] IOLCXVTUBQKXJR-UHFFFAOYSA-M 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 2
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 2
- 229910001634 calcium fluoride Inorganic materials 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000001131 transforming effect Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Optical Filters (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Elements Other Than Lenses (AREA)
Abstract
Description
【発明の詳細な説明】
［産業上の利用分野］
本発明は半透鏡、特に広い測定波数域をカバーする半透
鏡の改良に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semi-transparent mirror, and particularly to an improvement of a semi-transparent mirror that covers a wide measurement wavenumber range.
［従来の技術］
フーリエ変換分光光度計等に用いられる三光束干渉計に
は、一般に半透鏡が用いられている。[Prior Art] A semi-transparent mirror is generally used in a three-beam interferometer used in a Fourier transform spectrophotometer or the like.
第５図には一般的な三光束干渉計の概略構成が示されて
いる。FIG. 5 shows a schematic configuration of a general three-beam interferometer.
同図に示す三光束干渉計は、光源１ｏと、半透鏡１２と
、固定鏡１４と、走査鏡１６とを含む。The three-beam interferometer shown in the figure includes a light source 1o, a semi-transparent mirror 12, a fixed mirror 14, and a scanning mirror 16.
そして、光源１０よりの入射光１８に対して前記半透鏡
１２は４５度傾いて配置されている。該半透鏡１２は、
入射光１８の一部を透過光２ｏとして走査鏡１６に導光
し、また入射光１８の一部を反射光２２として固定鏡１
４に導光する。The semi-transparent mirror 12 is arranged at an angle of 45 degrees with respect to the incident light 18 from the light source 10. The semi-transparent mirror 12 is
A part of the incident light 18 is guided to the scanning mirror 16 as transmitted light 2o, and a part of the incident light 18 is guided to the fixed mirror 1 as reflected light 22.
4.
そして、前記固定＠１４及び走査鏡１６からの反射光は
再度半透鏡１２に入射し、各鏡１４１６からの光の干渉
光２４が所望の測定系に導光される。Then, the reflected light from the fixed @ 14 and the scanning mirror 16 enters the semi-transparent mirror 12 again, and the interference light 24 of the light from each mirror 1416 is guided to a desired measurement system.
ここで、前記走査鏡１６を矢印１方向（透過光２０と平
行方向）に移動させると、干渉光２４の干渉状態が変化
するため、反射鏡１６の位置を正確に測定することがで
き、また反射鏡１６を例えば光ディスク等のサンプルと
することにより、薄膜厚の測定等を行なうことができ、
更に該干渉光をフーリエ変換することによって分光スペ
クトルを得ることができる。Here, when the scanning mirror 16 is moved in the direction of the arrow 1 (parallel to the transmitted light 20), the interference state of the interference light 24 changes, so the position of the reflecting mirror 16 can be accurately measured. By using the reflective mirror 16 as a sample such as an optical disk, it is possible to measure the thin film thickness, etc.
Furthermore, a spectroscopic spectrum can be obtained by Fourier transforming the interference light.
なお、前記半透鏡１２は通常極めて薄い膜であるため、
臭化カリウムＫＢｒ、 フッ化カルシウムＣａＦ２、水
晶、ガラスなとからなる基板２６上に載置され、半透鏡
の光学的特性を補償する補償板２８と該基板２６により
挟持されている。Note that since the semi-transparent mirror 12 is usually an extremely thin film,
It is placed on a substrate 26 made of potassium bromide KBr, calcium fluoride CaF2, quartz, or glass, and is sandwiched between the substrate 26 and a compensation plate 28 that compensates for the optical characteristics of the semi-transparent mirror.
［発明が解決しようとする課題］
ところで、一般に半透鏡の高い実効効率を持つ領域は、
該半透鏡に蒸着された光学材料の光学定数に依存し、通
常一種類の半透鏡では比較的狭い波数域でしか高い効率
を得ることかできない。[Problem to be solved by the invention] Generally speaking, the area in which a semi-transparent mirror has a high effective efficiency is
Depending on the optical constants of the optical material deposited on the semi-transparent mirror, a single type of semi-transparent mirror can usually achieve high efficiency only in a relatively narrow wavenumber range.
すなわち、第６図にも示すように、従来の半透鏡ては高
効率の領域はある特定の波数領域に限られ、例えば光学
材料Ａの薄膜半透鏡を用いた場合には図中点線で示すよ
うにσ、〜σ２ｃｍ−’、光学材料Ｂの薄膜半透鏡を用
いた場合には図中実線で示すように６８〜６４ｃｍ−１
の範囲でしか高効率を維持できない。That is, as shown in Fig. 6, the high efficiency region of conventional semi-transparent mirrors is limited to a certain specific wave number region. As shown by the solid line in the figure, σ is ~σ2cm-', and when using a thin film semi-transparent mirror made of optical material B, it is 68~64cm-1 as shown by the solid line in the figure.
High efficiency can only be maintained within the range of .
一方、測定対象となる試料には、測光波数域の広い測定
が必要になるものも少なくない。On the other hand, there are many samples to be measured that require measurement over a wide photometric wavenumber range.
このため従来においては、三光束干渉計の半透鏡は広い
測定波数域をカバーするために様々な種類のものを組合
わせて使用し、特に赤外波数域にあっては比較的広い波
数にわたって測定しようとすると、測定波数域に対応し
て異なる光学材料よりなる数種類の半透鏡が必要となる
。そこで従来は広い帯域にわたる測定は半透鏡を交換し
なから行なう必要があった。しかし、干渉計の光学的最
適調整状態を保持するため、或いは装置構成の簡易化を
図る面からも半透鏡の交換はできる限り避ける必要があ
る。For this reason, in the past, various types of semi-transparent mirrors for three-beam interferometers were used in combination to cover a wide measurement wavenumber range, and especially in the infrared wavenumber range, measurements were made over a relatively wide wavenumber range. If this were to be done, several types of semi-transparent mirrors made of different optical materials would be required depending on the measurement wavenumber range. Therefore, in the past, measurements over a wide band had to be performed after replacing the semi-transparent mirror. However, in order to maintain the optimal optical adjustment state of the interferometer or to simplify the device configuration, it is necessary to avoid replacing the semi-transparent mirror as much as possible.
本発明は前記従来技術の課題に鑑みなされたものであり
、その目的は一枚の半透鏡て広い測光波数領域をカバー
することのできる半透鏡を提供することにある。The present invention has been made in view of the problems of the prior art, and its purpose is to provide a semi-transparent mirror that can cover a wide photometric wavenumber range with a single semi-transparent mirror.
［課題を解決するための手段］
前記目的を達成するために本発明にがかる半透鏡は、光
学的反射・透過特性の異なる複数種の光学材料から形成
されたことを特徴とする。[Means for Solving the Problems] In order to achieve the above object, a semi-transparent mirror according to the present invention is characterized in that it is formed from a plurality of types of optical materials having different optical reflection and transmission characteristics.
ここで、本発明にかかる半透鏡は、入射光束に対して同
心円状の幾何学的配置に光学的反射・透過特性の異なる
複数種の光学材料を位置させて形成することが好適であ
る。Here, the semi-transparent mirror according to the present invention is preferably formed by arranging a plurality of types of optical materials having different optical reflection/transmission characteristics in a geometrical arrangement concentric with respect to the incident light beam.
また、半透鏡の鏡面の中心に対して対象に光学的反射・
透過特性の異なる複数種の光学材料を配置させることか
好適である。In addition, optical reflection and
It is preferable to arrange a plurality of types of optical materials having different transmission characteristics.
また、半透鏡の鏡面にランダムに、異なる光学的反射・
透過特性を有する複数種の光学材料を配置させることが
好適である。In addition, different optical reflections and
It is preferable to arrange a plurality of types of optical materials having transmission characteristics.
なお、光学的反射・透過特性は、異なる光学定数を有す
る光学材料を用いること、ないし同一の光学定数を有す
る光学材料を異なる塵みて用いること等により、相違さ
せることができる。Note that the optical reflection/transmission characteristics can be made different by using optical materials having different optical constants, or by using different types of optical materials having the same optical constant.
［作 用］
本発明にがかる半透鏡は前述したように、−枚の半透鏡
に光学的反射・透過特性の異なる複数種の光学材料を位
置させているので、各部分によってそれぞれ効率の良い
波数域を得ることができる。[Function] As described above, in the semi-transparent mirror according to the present invention, multiple types of optical materials having different optical reflection and transmission characteristics are placed on the two semi-transparent mirrors, so each part can be used to adjust the wave number with high efficiency. area.
このため、三光束干渉計に半透鏡を用いた場合等にも、
−の半透鏡により広い測定波数域をカバーすることが可
能となり、各波数域毎に半透鏡を交換する必要かなくな
る。For this reason, even when using a semi-transparent mirror in a three-beam interferometer,
- It is possible to cover a wide measurement wave number range with the semi-transparent mirror, and there is no need to replace the semi-transparent mirror for each wave number range.
［実施例］ 以下、図面に基づき本発明の好適な実施例を説明する。[Example] Hereinafter, preferred embodiments of the present invention will be described based on the drawings.
第１図には本発明の一実施例にかかかる半透鏡が示され
ている。FIG. 1 shows a semi-transparent mirror according to an embodiment of the present invention.
本実施例においては、半透鏡１１２が同心円状の二分割
されており、中心部分１１２ａに光学材料Ａ１また円周
部分１１２ｂに光学材料Ｂかそれぞれ位置している。In this embodiment, the semi-transparent mirror 112 is concentrically divided into two parts, and an optical material A1 is located in the center part 112a, and an optical material B is located in the circumferential part 112b.
このため、第２図に示すように波数σ、〜σ４に至る広
い帯域で測定が可能となる。Therefore, as shown in FIG. 2, measurements can be made in a wide band ranging from wave numbers σ to σ4.
すなわち、一般に三光束干渉計における平行平面サンド
イッチ構造の半透鏡においては、第３図に示すようにＳ
偏光とＰ偏光が生している。従って半透鏡の光学的実効
効率η。（σ）はＳ偏光とＰ偏光のそれぞれの効率η８
．η、の平均であり、自然光に対して、
η。（σ）＝（η、＋η９） ■と表わすこ
とができる。That is, in general, in a semi-transparent mirror with a parallel plane sandwich structure in a three-beam interferometer, the S
Polarized light and P-polarized light are produced. Therefore, the effective optical efficiency of the semi-transparent mirror η. (σ) is the efficiency η8 of S-polarized light and P-polarized light, respectively.
．． η, and for natural light, η. It can be expressed as (σ)=(η, +η9) (2).
ここで、η、、η２は半透鏡光学材料のＳ偏光Ｐ偏光に
対する反射率Ｒ１（σ）及び透過率Ｔ’（σ）（ただし
ｊ＝ｓ、ｐ）を用いて、
ηＩ（σ）＝４ＲＩ（σ）ＴＩ（σ） （ｊ＝ｓ、ｐ
） ■で表わさせる。Here, η,, η2 are the reflectance R1(σ) and transmittance T'(σ) (j=s, p) of the semi-transparent optical material for S-polarized light and P-polarized light, and ηI(σ)=4RI (σ)TI(σ) (j=s, p
) Let it be expressed as ■.
例えば、単層薄膜で構成される半透鏡では（ｊ：ｓ、ｐ
）
θ＝４πｃｒｎ＋（ｃｒ）ｄ ｃｏｓｉ、
■ｎｚ（σ）：光学定数
ｄ ：単層膜厚
１１ ：基板と第１境界での屈折角
ＲＡ、（σ）、基板と半透鏡膜との境界面のｊ偏光に対
するエネルギー反
対重
で表されることとなる。For example, in a semi-transparent mirror composed of a single-layer thin film (j: s, p
) θ=4πcrn+(cr)d cosi,
■nz (σ): Optical constant d: Single layer thickness 11: Refraction angle RA at the substrate and first boundary, (σ), expressed as the energy opposite gravity for j-polarized light at the interface between the substrate and the semi-transparent mirror film. The Rukoto.
なお、理想的にはＲ＝１／２．Ｔ＝１７２であり、η＝
４ＲＴ＝１になる。Note that ideally R=1/2. T=172 and η=
4RT=1.
このように、前記■及び０式より半透鏡の効率を決定す
る重要な因子はｎ＋（σ）とｄであることが理解される
。In this way, it is understood from the above equations (1) and 0 that the important factors that determine the efficiency of the semi-transparent mirror are n+(σ) and d.
従って、光学定数の異なる光学材料を用いるか、或いは
光学材料は同じでも厚さを異ならせることによって広い
波数領域での測定が可能となる。Therefore, by using optical materials with different optical constants, or by using the same optical materials but with different thicknesses, measurement in a wide wavenumber range becomes possible.
なお、光学材料としては一般にゲルマニウムＧｅ シリ
コンＳｉ、酸化鉄Ｆｅ２０ａ等か用いられる。Note that germanium Ge, silicon Si, iron oxide Fe20a, etc. are generally used as the optical material.
第４図には本発明の他の実施例にかかる半透鏡が示され
ている。FIG. 4 shows a semi-transparent mirror according to another embodiment of the invention.
同図（Ａ）に示す半透鏡は、円形半透鏡２１２の中心を
軸に等形扇状に４分割して扇状部２１２ａ ２１２ｂ
、２１２ｃ、２１２ｄを形成し、対向する一対の扇状部
２１２ａ、２１２ｃに光学材料Ａを、また扇状部２１２
ｂ、２１２ｄに光学材料Ｂを蒸着している。この結果、
光学材料Ａ及び光学材料Ｂのそれぞれの高効率の波数域
が有効に活用できる。The semi-transparent mirror shown in FIG. 2A is divided into four equal fan-shaped parts with the center of the circular semi-transparent mirror 212 as an axis, and fan-shaped parts 212a 212b.
, 212c, 212d, and the optical material A is applied to the pair of opposing fan-shaped parts 212a, 212c, and the fan-shaped part 212
b, optical material B is deposited on 212d. As a result,
The highly efficient wave number ranges of optical material A and optical material B can be effectively utilized.
また、同図（Ｂ）に示す半透鏡は、円形半透鏡３１２の
中心を軸に等形扇状に８分割して扇状部３１２ａ、３１
２ｂ、−３１２ｈを形成し、対向する一対の扇状部３１
２ａ、３１２ｅに光学材料Ａを、扇状部３１２ｂ、３１
２ｆに光学材料Ｂを、扇状部３１２ｃ、３１２ｇに光学
材料Ｃを蒸着している。この結果、光学材料Ａ、Ｂ、Ｃ
のそれぞれの高効率の波数域が有効に活用できる。In addition, the semi-transparent mirror shown in FIG.
A pair of fan-shaped portions 31 forming 2b and -312h and facing each other.
Optical material A is applied to 2a and 312e, and fan-shaped parts 312b and 31
Optical material B is deposited on 2f, and optical material C is deposited on fan-shaped parts 312c and 312g. As a result, optical materials A, B, C
Each highly efficient wavenumber range can be effectively utilized.
同図（Ｃ）に示す半透鏡は、円形半透鏡４１２を同心円
状に６分割し、各分割部４１２ａ、４１２ｂ、・・・４
１２ｆにそれぞれ光学材料Ａ−Ｆを蒸着している。The semi-transparent mirror shown in FIG. 4C has a circular semi-transparent mirror 412 concentrically divided into six parts, and each divided part 412a, 412b, . . . 4
Optical materials A to F are deposited on 12f, respectively.
同図（Ｄ）に示す半透鏡は、円形半透鏡５１２にランダ
ムに複数の光学材料を蒸着している。具体的には、半透
鏡５１２に網目状のスクリーンを付した状態で蒸着を行
ない、該スクリーンを順次移動させて複数の光学材料を
蒸着させる。In the semi-transparent mirror shown in FIG. 5D, a plurality of optical materials are randomly deposited on a circular semi-transparent mirror 512. Specifically, vapor deposition is performed with a mesh screen attached to the semi-transparent mirror 512, and the screen is sequentially moved to deposit a plurality of optical materials.
尚、以上のようにＮ種の構成光学材料からなる半透鏡の
実効効率は、
で表される。Note that, as described above, the effective efficiency of the semi-transparent mirror made of N types of constituent optical materials is expressed as follows.
従って、全体の光学的実効効率の低下は見られない。Therefore, no reduction in the overall optical effective efficiency is observed.
１２゜
２１２、 ３１２． ４１２． ５１２・・・ 半透鏡
［発明の効果］
以上説明したように本発明にかかる半透鏡は、異なる光
学的反射・透過特性の光学材料を複数種位置させたので
、広い波数領域において高い光学的実効効率を得ること
ができる。12°212, 312. 412. 512... Semi-transparent mirror [Effect of the invention] As explained above, the semi-transparent mirror according to the present invention has a plurality of types of optical materials with different optical reflection/transmission characteristics, so it has high optical effectiveness in a wide wave number range. You can gain efficiency.
Claims (5)
から形成されたことを特徴とする半透鏡。(1) A semi-transparent mirror characterized by being formed from multiple types of optical materials having different optical reflection and transmission characteristics.
て同心円状の幾何学的配置に光学的反射・透過特性の異
なる複数種の光学材料を配置させたことを特徴とする半
透鏡。(2) The semi-transparent mirror according to claim 1, wherein a plurality of types of optical materials having different optical reflection and transmission characteristics are arranged in a geometrical arrangement concentric with respect to the incident light beam.
中心に対して対象に、光学的反射・透過特性の異なる複
数種の光学材料を配置させたことを特徴とする半透鏡。(3) The semi-transparent mirror according to claim 1, wherein a plurality of types of optical materials having different optical reflection and transmission characteristics are arranged symmetrically with respect to the center of the mirror surface of the semi-transparent mirror.
ランダムに、光学的反射・透過特性の異なる複数種の光
学材料を配置させたことを特徴とする半透鏡。(4) The semi-transparent mirror according to claim 1, wherein a plurality of optical materials having different optical reflection and transmission characteristics are randomly arranged on the mirror surface of the semi-transparent mirror.
、光学的反射・透過特性は、異なる光学定数を有する光
学材料を用いること、ないし同一の光学定数を有する光
学材料を異なる厚みで用いることにより相違させたこと
を特徴とする半透鏡。(5) In the semi-transparent mirror according to any one of claims 1 to 4, the optical reflection/transmission characteristics can be determined by using optical materials having different optical constants or by using optical materials having the same optical constant with different thicknesses. A semi-transparent mirror characterized by being different depending on its use.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02121721A JP3117450B2 (en) | 1990-05-10 | 1990-05-10 | Semi-transparent mirror |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02121721A JP3117450B2 (en) | 1990-05-10 | 1990-05-10 | Semi-transparent mirror |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0416801A true JPH0416801A (en) | 1992-01-21 |
| JP3117450B2 JP3117450B2 (en) | 2000-12-11 |
Family
ID=14818239
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP02121721A Expired - Fee Related JP3117450B2 (en) | 1990-05-10 | 1990-05-10 | Semi-transparent mirror |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3117450B2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5535230A (en) * | 1994-04-06 | 1996-07-09 | Shogo Tzuzuki | Illuminating light source device using semiconductor laser element |
| US6064525A (en) * | 1997-03-25 | 2000-05-16 | Glaverbel | Optical device including a dichromatic mirror |
| JP2007225392A (en) * | 2006-02-22 | 2007-09-06 | Spectratech Inc | Optical interference device |
| WO2018011591A1 (en) * | 2016-07-13 | 2018-01-18 | Oxford University Innovation Limited | Interferometric scattering microscopy |
| US12111456B2 (en) | 2019-10-10 | 2024-10-08 | Refeyn Ltd | Methods and apparatus for optimised interferometric scattering microscopy |
-
1990
- 1990-05-10 JP JP02121721A patent/JP3117450B2/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5535230A (en) * | 1994-04-06 | 1996-07-09 | Shogo Tzuzuki | Illuminating light source device using semiconductor laser element |
| US6064525A (en) * | 1997-03-25 | 2000-05-16 | Glaverbel | Optical device including a dichromatic mirror |
| JP2007225392A (en) * | 2006-02-22 | 2007-09-06 | Spectratech Inc | Optical interference device |
| WO2018011591A1 (en) * | 2016-07-13 | 2018-01-18 | Oxford University Innovation Limited | Interferometric scattering microscopy |
| KR20190028448A (en) * | 2016-07-13 | 2019-03-18 | 옥스포드 유니버시티 이노베이션 리미티드 | Interferometer scattering microscope |
| JP2019520612A (en) * | 2016-07-13 | 2019-07-18 | オックスフォード ユニヴァーシティ イノヴェーション リミテッド | Interference scattering microscope |
| US10775597B2 (en) | 2016-07-13 | 2020-09-15 | Oxford University Innovation Limited | Interferometric scattering microscopy |
| EP3923054A1 (en) * | 2016-07-13 | 2021-12-15 | Oxford University Innovation Limited | Interferometric scattering microscopy |
| US12111456B2 (en) | 2019-10-10 | 2024-10-08 | Refeyn Ltd | Methods and apparatus for optimised interferometric scattering microscopy |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3117450B2 (en) | 2000-12-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |