JPH0415911A - Substrate heating device of molecular beam epitaxy system - Google Patents

Substrate heating device of molecular beam epitaxy system

Info

Publication number
JPH0415911A
JPH0415911A JP11759290A JP11759290A JPH0415911A JP H0415911 A JPH0415911 A JP H0415911A JP 11759290 A JP11759290 A JP 11759290A JP 11759290 A JP11759290 A JP 11759290A JP H0415911 A JPH0415911 A JP H0415911A
Authority
JP
Japan
Prior art keywords
substrate
foreign matter
heating device
molecular beam
shielding plates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11759290A
Other languages
Japanese (ja)
Inventor
Muneo Furuse
宗雄 古瀬
Nushito Takahashi
主人 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11759290A priority Critical patent/JPH0415911A/en
Publication of JPH0415911A publication Critical patent/JPH0415911A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an epitaxially developed film with few foreign matters by installing shielding plates to prevent foreign matters from falling or scattering between a substrate and foreign matter generation parts of power transmissions in a substrate heating device for preventing foreign matters from attaching the substrate which is developed epitaxially or from mixing into the source of molecular beam. CONSTITUTION:Foreign matter shielding plates 9 and 10 are installed between foreign matter generation parts of power transmissions and a substrate 1. Foreign matter generated at gears a7 and b8 installed in a rotary introducer 6 and at a bearing 11 is caught by the shielding plates 9 and 10 while it falls in the gravity direction. Because of the projected shape of the shielding plate toward the gravity direction, the foreign matter which falls upon the shielding plates 9 and 10 does not scatter in a vacuum chamber. With the foreign matter kept from falling on the substrate 1 which is epitaxially developed, a good- quality epitaxially developed film can be obtained.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は5分子線エピタキシ装置の基板加熱装置に係り
、特に、成長する基板で異物の付着を起因とする欠陥を
低減するのに好適な1分子線エピタキシ装置の基板加熱
装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a substrate heating device for a five-molecular beam epitaxy device, and is particularly suitable for reducing defects caused by adhesion of foreign matter on a growing substrate. The present invention relates to a substrate heating device for a single molecular beam epitaxy device.

〔従来の技術〕[Conventional technology]

従来の装置は5特開昭62−73706号公報に記載の
ように、基板の受渡しにおいて自動化と高精度化を中心
にして、基板の受渡しや自転の機構部は歯車やベアリン
グを用いて構成されている。すなわち、従来の装置は真
空中で油潤滑を使用せずに。
As described in Japanese Patent Application Laid-Open No. 62-73706, the conventional device focuses on automation and high precision in board delivery, and the mechanical parts for board delivery and rotation are constructed using gears and bearings. ing. That is, the conventional equipment is in vacuum without using oil lubrication.

正確な基板の受は渡しや自転運動が可能となるように工
夫されている。しかし、ばね、ローラ、歯車などのよう
に真空中で摺動する部分から発生する異物に関してはあ
まり考慮されず、異物の遮蔽板等は取り付けていなかっ
た。また、基板加熱装置から発生する異物の拡散を防止
する機構に関しては、特開平1−114679号公報に
記載のように、異物が発生すると考えられるねじ部をベ
ローズでカバーし、異物を外部に飛散させないようにし
ていた。この方法によって基板ホルダのねし部から発生
した異物が原因の欠陥は少なくなったと考えられる。し
かし、基板加熱装置で異物の発生する可能性が大きいベ
アリングや歯車については何ら考慮されていない。また
、ベローズ等の異物の飛散を防止させる機構を基板加熱
装置に設けた場合、直線運動する機構には適用が可能で
あるが、基板を回転させるために用いるヘアリング等の
摺動部に関しては、適用が困難である。また、ベローズ
等を真空装置内に導入して動かすと、この部分から異物
が発生する可能性がある。
Accurate board supports have been devised to allow for hand-over and rotational movements. However, little consideration was given to foreign matter generated from parts such as springs, rollers, gears, etc. that slide in a vacuum, and no foreign matter shielding plates were installed. In addition, regarding a mechanism for preventing the diffusion of foreign matter generated from a substrate heating device, as described in Japanese Patent Application Laid-Open No. 1-114679, the screw portion where foreign matter is likely to be generated is covered with a bellows, and the foreign matter is scattered outside. I was trying not to let it happen. It is thought that this method reduced the number of defects caused by foreign matter generated from the neck portion of the substrate holder. However, no consideration is given to bearings and gears, which have a high possibility of generating foreign matter in the substrate heating device. In addition, if the substrate heating device is equipped with a mechanism to prevent foreign matter from scattering, such as a bellows, it can be applied to a mechanism that moves linearly, but it cannot be applied to a sliding part such as a hair ring used to rotate the substrate. , difficult to apply. Further, when a bellows or the like is introduced into a vacuum device and moved, foreign matter may be generated from this part.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上記従来技術による分子線エピタキシ装置の基板加熱装
置は、基板を高精度で受は渡す機構や均一に加熱する機
構に重点を重いており、基板を自転させる際に動力伝達
装置のお互いに接触する部分から発生する異物が原因と
考えられる、成長したG a A s膜に発生する欠陥
に関してはあまり考慮されていなかった。すなわち、従
来技術の基板加熱装置では、基板を加熱するヒータから
の熱が、基板を自転させる動力伝達装置にふく射で伝わ
らないように熱シールド板を取り付けている。しかし、
動力伝達装置に使用されている歯車やベアリングなどの
、お互いに接触する部分からは摩耗粉が発生し重力方向
に落下する。これらの異物に関して従来の装置では何等
考慮されておらず、異物が基板に付着することがあった
。その結果、成長したエピタキシ膜に、異物が原因と考
えられる欠陥が発生するという不具合が生じていた。
The substrate heating device of the molecular beam epitaxy device according to the above-mentioned conventional technology places emphasis on a mechanism for receiving and passing the substrate with high precision and a mechanism for uniformly heating the substrate, and the power transmission devices contact each other when the substrate is rotated. Not much consideration was given to defects occurring in the grown GaAs film, which are thought to be caused by foreign matter generated from the parts. That is, in the conventional substrate heating device, a heat shield plate is attached to prevent the heat from the heater that heats the substrate from being transmitted to the power transmission device that rotates the substrate. but,
Abrasion particles are generated from parts of gears and bearings used in power transmission devices that come into contact with each other, and fall in the direction of gravity. Conventional devices do not give any consideration to these foreign substances, and the foreign substances may adhere to the substrate. As a result, a defect occurred in the grown epitaxial film, which was thought to be caused by foreign matter.

また、従来技術の基板加熱装置では、動力伝達装置から
発生した異物が、Ga、As等の分子線源のるつぼ内に
落下する可能性もあった。その結果、エピタキシ成長膜
内に異物に起因した不純物が取り込まれ、結晶品質が劣
化するという不具合も生じる。
Furthermore, in the conventional substrate heating apparatus, there was a possibility that foreign matter generated from the power transmission device would fall into the crucible of the molecular beam source of Ga, As, or the like. As a result, impurities caused by foreign substances are incorporated into the epitaxially grown film, resulting in a problem of deterioration of crystal quality.

本発明の目的は、動力伝達装置のお互いに接触する部分
から発生する異物が、エピタキシ成長する基板や分子線
源に到達しないように分子線エピタキシ装置の基板加熱
装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a substrate heating device for a molecular beam epitaxy apparatus that prevents foreign matter generated from mutually contacting parts of a power transmission device from reaching a substrate to be epitaxially grown or a molecular beam source.

〔課題を解決するための手段〕[Means to solve the problem]

動力伝達装置から発生する異物が、基板に付着したり分
子線源に混入しないようにするために、本発明にかかる
分子線エピタキシ装置の等仮加熱装置では、動力伝達装
置のお互いに接触する動力伝達機構部分の下方に、重力
方向に対して凸状となる異物の落下や飛散を防止する遮
蔽板を取り付けた。また、この遮蔽板を基板ホルダの外
周部や、シュラウドに取り付けることによっても異物の
落下や飛散を防止するという目的は達成される。
In order to prevent foreign matter generated from the power transmission device from adhering to the substrate or entering the molecular beam source, in the temporary heating device of the molecular beam epitaxy device according to the present invention, the power of the power transmission devices that come into contact with each other is A shielding plate was installed below the transmission mechanism to prevent foreign objects from falling or scattering due to their convex shape in the direction of gravity. The purpose of preventing foreign matter from falling or scattering can also be achieved by attaching this shielding plate to the outer circumference of the substrate holder or to the shroud.

〔作用〕[Effect]

本発明では、基板加熱装置における動力伝達装置の異物
発生部と基板との間に、異物の落下や拡散を防止するた
めの遮蔽板を設けているので、基板の自転などの際に発
生した異物を、前記遮蔽板に捕集できるので基板上に落
下して付着したり、分子線源のるつぼ内に落下すること
がなくなる。
In the present invention, a shielding plate is provided between the foreign matter generation part of the power transmission device in the substrate heating device and the substrate to prevent foreign matter from falling or spreading, so foreign matter generated when the substrate rotates on its axis, etc. can be collected on the shielding plate, thereby preventing it from falling and adhering to the substrate or falling into the crucible of the molecular beam source.

〔実施例〕〔Example〕

以下1本発明の各実施例を第1図から第4図を用いて説
明する。
Embodiments of the present invention will be described below with reference to FIGS. 1 to 4.

まず第1図は、本発明の基板加熱装置の一例を示したも
ので、動力伝達装置の異物発生部と基板1との間に、異
物の遮蔽板9及び10を設けた場合の縦断面図である。
First, FIG. 1 shows an example of the substrate heating device of the present invention, and is a longitudinal sectional view when foreign material shielding plates 9 and 10 are provided between the foreign material generating part of the power transmission device and the substrate 1. It is.

この実施例では、回転導入機6に取り付けられた歯車a
7.歯車b8及びベアリング11から発生した異物が、
重力方向へ落下する際この遮蔽板9及び】Oに捕集され
、さらに、遮蔽板9及び10が重力方向に対して凸形と
なっているため、遮蔽板9及び10上に落下した異物が
真空室内に飛散するのを防ぐことができるような構造と
なっている。その結果、異物はエピタキシ成長する基板
1上に落下することはなくなり、良質のエピタキシ成長
膜を得ることができる。
In this embodiment, the gear a attached to the rotation introducing machine 6 is
7. Foreign matter generated from gear b8 and bearing 11 is
When the foreign matter falls in the direction of gravity, it is collected by the shielding plates 9 and ]O, and since the shielding plates 9 and 10 are convex in the direction of gravity, the foreign matter that falls onto the shielding plates 9 and 10 is collected. The structure is such that it can prevent it from scattering into the vacuum chamber. As a result, foreign matter will not fall onto the substrate 1 on which epitaxial growth is to be performed, and a high-quality epitaxial growth film can be obtained.

第2図は、本発明の他の実施例を示したもので、基板ホ
ルダ3の外周部に、重力方向に対して凸形の遮蔽板c1
5を配置したものである。この結果。
FIG. 2 shows another embodiment of the present invention, in which a shielding plate c1 having a convex shape with respect to the gravity direction is provided on the outer peripheral part of the substrate holder 3.
5 is arranged. As a result.

重力伝達装置の歯車a7.歯車b8及びベアリング11
から発生した異物が、重力方向へ落下する際この基板ホ
ルダ3に配置された遮蔽板c15に捕集され、エピタキ
シ成長する基板1に入り込むことはなくなる。
Gravity transmission gear gear a7. Gear b8 and bearing 11
When falling in the direction of gravity, foreign matter generated from the substrate holder 3 is collected by the shielding plate c15 disposed on the substrate holder 3, and does not enter the substrate 1 to be epitaxially grown.

第3図は、基板加熱装置を取り囲む液体窒素シニラウド
5に5重力方向番二対して凸形の遮蔽板d16を配置し
たものである。この結果、前記動力伝達装置の歯車a7
.歯車b8及びベアリング11から発生した異物が重力
方向へ落下する際。
In FIG. 3, convex shielding plates d16 are arranged in the liquid nitrogen cylindrical chamber 5 surrounding the substrate heating device in five gravity directions. As a result, gear a7 of the power transmission device
.. When foreign matter generated from gear b8 and bearing 11 falls in the direction of gravity.

この遮蔽板d16によって捕集され、エピタキシ成長す
る基板1に入り込むことはなくなる。
It is collected by this shielding plate d16 and does not enter the substrate 1 to be epitaxially grown.

第4図は、遮蔽板e17を電気的に接地電位から絶縁し
、この遮蔽板e17に電流導入端子12から電位を付加
したものである。これにより、帯電した異物は遮蔽板e
17に電気的に捕集されるので、動力伝達装置の歯車a
7.歯車b8及びベアリング11から発生する異物が重
力方向に落下した際、この遮蔽板e17によって捕集さ
れ、エピタキシ成長する基板1に入り込むことはなくな
る。
In FIG. 4, the shield plate e17 is electrically insulated from the ground potential, and a potential is applied to the shield plate e17 from the current introduction terminal 12. This allows the charged foreign matter to be removed from the shielding plate e.
17, so the gear a of the power transmission device
7. When foreign substances generated from the gear b8 and the bearing 11 fall in the direction of gravity, they are collected by the shielding plate e17 and do not enter the substrate 1 on which epitaxial growth is to be performed.

なお、本実施例では1重力方向に凸形とした遮蔽板a、
b、c、d、e9,10,15,16゜17の断面形状
を半円形のものとしたが、矩形断面等の周辺部をL型と
したものでも遮蔽板a、b。
In addition, in this embodiment, the shielding plate a, which is convex in the direction of gravity,
Although the cross-sectional shapes of b, c, d, e9, 10, 15, and 16°17 are semicircular, shielding plates a and b may also be used if the peripheral portion is L-shaped, such as a rectangular cross section.

c、d、e9,10,15,16.17として有効であ
る。
Valid as c, d, e9, 10, 15, 16.17.

また、本実施例で述へた遮蔽板a、b、c、d。In addition, the shielding plates a, b, c, and d described in this embodiment.

e9.10,15,16.17を磁化させるコトにより
、帯磁した摩耗粉を磁力により捕集できるので、異物飛
散防止の効果がさらに強化させられる。
By magnetizing e9.10, 15, and 16.17, magnetized wear particles can be collected by magnetic force, and the effect of preventing scattering of foreign matter is further enhanced.

〔発明の効果〕〔Effect of the invention〕

本発明により、動力伝達装置のお互いに接触する部分か
ら発生した異物が、エピタキシ成長する基板に付着した
り1分子線源に混入するということがなくなるので、エ
ピタキシ成長膜に異物に起因した欠陥が発生しなくなる
。さらに、不純物混入による結晶品質の劣化も生じない
ので、低欠陥高品質の薄膜を成長させることができる。
According to the present invention, foreign matter generated from the parts of the power transmission device that come into contact with each other is prevented from adhering to the epitaxially grown substrate or being mixed into the single molecule beam source, so there are no defects caused by the foreign matter in the epitaxially grown film. It will no longer occur. Furthermore, since there is no deterioration of crystal quality due to impurity contamination, a high quality thin film with few defects can be grown.

その結果、非常に低欠陥のエピタキシ成長した膜を得る
ことが可能となる。
As a result, it becomes possible to obtain an epitaxially grown film with very low defects.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の分子線エピタキシ装置の基
板加熱装置の断面図、第2図は基板ホルダに異物の遮蔽
板を設けた基板加熱装置の断面図、第3図はシュラウド
に異物の遮蔽板を設けた基板加熱装置の断面図、第4図
は静電吸着可能な異物の遮蔽板を設けた基板加熱装置の
断面図である。 1・・・基板、2・・・ヒータ、3・・・基板ボルダ、
4・・ボルダ支持具、5・・シュラウド、6・・・回転
導入機。 7・・・歯車、8・・・歯車、9・・・遮蔽板、10・
遮蔽板。 1トベアリング、12・・支柱、13・ターミナル、1
4−・電流導入端子、15・・・遮蔽板、16・・・遮
蔽板、17遮蔽板。 代理人 弁理士 ノJX用勝男、 第 1 閲 z 第2 ■ z 15−JL歎玖C 芋 図 廓・Lk赦t
Fig. 1 is a sectional view of a substrate heating device of a molecular beam epitaxy apparatus according to an embodiment of the present invention, Fig. 2 is a sectional view of a substrate heating device in which a foreign matter shielding plate is provided on a substrate holder, and Fig. 3 is a sectional view of a substrate heating device in which a foreign matter shielding plate is provided on a substrate holder. FIG. 4 is a sectional view of a substrate heating apparatus provided with a shielding plate for foreign matter. FIG. 4 is a sectional view of a substrate heating apparatus provided with a shielding plate for foreign matter that can be electrostatically attracted. 1... Board, 2... Heater, 3... Board boulder,
4. Boulder support, 5. Shroud, 6. Rotating introduction machine. 7... Gear, 8... Gear, 9... Shielding plate, 10.
Shield. 1. Bearing, 12.. Support, 13. Terminal, 1.
4-- Current introduction terminal, 15... Shielding plate, 16... Shielding plate, 17 Shielding plate. Agent: Patent attorney Katsuo JX, 1st review 2nd ■ z 15-JL 歎玖C Imozukan/Lk forgiveness

Claims (1)

【特許請求の範囲】 1、基板を保持する基板ホルダと、前記基板ホルダに保
持された前記基板と、前記基板を加熱するヒータと、前
記基板を自転させるための動力伝達装置より成り、前記
基板のエピタキシ成長面を重力方向として分子線エピタ
キシ装置の基板加熱装置において、 前記基板を自転させる際に、前記動力伝達装置のお互い
に接触する部分と前記基板との間に、前記基板を自転さ
せる際に前記動力伝達装置のお互いに接触する部分から
発生する異物の捕集を可能とする機能を付加した遮蔽板
を設けたことを特徴とする分子線エピタキシ装置の基板
加熱装置。
[Scope of Claims] 1. Consists of a substrate holder for holding a substrate, the substrate held by the substrate holder, a heater for heating the substrate, and a power transmission device for rotating the substrate; In a substrate heating device of a molecular beam epitaxy apparatus, with the epitaxy growth surface of the substrate in the direction of gravity, when the substrate is rotated, a portion of the power transmission device that contacts each other and the substrate is provided between the substrate and the substrate. 1. A substrate heating device for a molecular beam epitaxy apparatus, characterized in that a shielding plate is provided with a shielding plate having a function of collecting foreign matter generated from mutually contacting portions of the power transmission device.
JP11759290A 1990-05-09 1990-05-09 Substrate heating device of molecular beam epitaxy system Pending JPH0415911A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11759290A JPH0415911A (en) 1990-05-09 1990-05-09 Substrate heating device of molecular beam epitaxy system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11759290A JPH0415911A (en) 1990-05-09 1990-05-09 Substrate heating device of molecular beam epitaxy system

Publications (1)

Publication Number Publication Date
JPH0415911A true JPH0415911A (en) 1992-01-21

Family

ID=14715635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11759290A Pending JPH0415911A (en) 1990-05-09 1990-05-09 Substrate heating device of molecular beam epitaxy system

Country Status (1)

Country Link
JP (1) JPH0415911A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007271279A (en) * 2006-03-30 2007-10-18 Japan Agengy For Marine-Earth Science & Technology Cryopreservation container
US8739556B2 (en) 2008-10-17 2014-06-03 Taiyo Nippon Sanso Corporation Cryopreservation device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007271279A (en) * 2006-03-30 2007-10-18 Japan Agengy For Marine-Earth Science & Technology Cryopreservation container
US8739556B2 (en) 2008-10-17 2014-06-03 Taiyo Nippon Sanso Corporation Cryopreservation device

Similar Documents

Publication Publication Date Title
EP1630261B1 (en) Substrate holder for a vapour deposition system
GB1490481A (en) Particle implantation
US10197478B2 (en) Sample carrier and method for processing a sample
JPH0415911A (en) Substrate heating device of molecular beam epitaxy system
DE3211051A1 (en) DEVICE AND METHOD FOR MOLECULAR RAY DEPOSITION ON A VARIETY OF SUBSTRATES
JP2006332505A (en) Sample holder, inspection device and inspection method using it
JPS62195548A (en) Sample device and its production
CN112786521A (en) Static conductive substrate holding device
JPH02262171A (en) Developing device
EP0693715A3 (en) Developing apparatus
DE2917282A1 (en) MAGNETIC BRUSH DEVELOPER DEVICE
DE69829641T2 (en) Device for monitoring the growth of a crystal
JP2820957B2 (en) Semiconductor manufacturing apparatus and semiconductor device manufacturing method
Tanaka et al. Time-resolved high-resolution electron microscopy of step-diffusion of tungsten atoms on MgO (001) surfaces
JPH0673269B2 (en) Method and apparatus for forming phosphor layer of picture tube panel
Klyman Solid State Synthesis of Cobalt-Antimony-Q Crystals
US20080265184A1 (en) Ion beam blocking component and ion beam blocking device having the same
JPH0678584B2 (en) Contamination prevention wafer rotating tool
JPS55117177A (en) Developing device
Healy et al. The initial phases of epitaxy of fcc Fe/Cu (100): supersurface and subsurface island formation
JPH01197951A (en) Scanning type electron microscope
JPS624318A (en) Adjustment of forming beam rotation in charged beam exposure apparatus
JPH0313577A (en) Substrate holder for sputtering device
JP3945141B2 (en) Charged particle beam equipment
Patsch et al. Investigation of epitaxial process-induced stacking faults on silicon wafers by surface analytical methods