JPH0415061U - - Google Patents
Info
- Publication number
- JPH0415061U JPH0415061U JP5391390U JP5391390U JPH0415061U JP H0415061 U JPH0415061 U JP H0415061U JP 5391390 U JP5391390 U JP 5391390U JP 5391390 U JP5391390 U JP 5391390U JP H0415061 U JPH0415061 U JP H0415061U
- Authority
- JP
- Japan
- Prior art keywords
- ultrasonic probe
- inspected
- ultrasonic
- test piece
- support base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 11
- 238000007689 inspection Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000002604 ultrasonography Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
第１図ないし第９図は本考案の第１の実施例を
示し、第１図は超音波検査装置の縦断面図、第２
図はスキヤナを示す斜視図、第３図はテストピー
スを示す斜視図、第４図はテストピースに対する
超音波プローブのＸ軸方向の位置を調整する状態
を示す平面図、第５図は超音波プローブをテスト
ピースに平行に調節する状態を示す平面図、第６
図はオシロスコープに表示された反射波の状態を
示す波形図、第７図イは超音波プローブのＹ軸方
向の位置を調整する状態を示す平面図、第７図ロ
は反射波の変化を示す波形図、第８図は超音波プ
ローブの被検査体に対するＸ軸方向の位置を調整
する状態を示す超音波検査装置の縦断面図、第９
図は超音波プローブのＺ軸方向の位置を調整する
状態を示す超音波検査装置の縦断面図、第１０図
は本考案の第２の実施例を示すテストピースの斜
視図、第１１図は本考案の第３の実施例を示すテ
ストピースの斜視図、第１２図および第１３図は
従来技術を示し、第１２図は超音波プローブによ
る被検査体の検査状態を示す平面図、第１３図は
第１２図中の矢示−方向断面図である。
３……被検査体、１１……超音波検査装置、１
３……スキヤナ本体、２０……超音波プローブ、
２２……回転支持台、２２Ａ……支持面、２５，
３１，４１……テストピース、２６，３３Ａ，４
３Ａ……初期設定面。
1 to 9 show a first embodiment of the present invention, in which FIG. 1 is a vertical cross-sectional view of an ultrasonic inspection device, and FIG.
The figure is a perspective view showing the scanner, Figure 3 is a perspective view showing the test piece, Figure 4 is a plan view showing how the position of the ultrasonic probe is adjusted in the X-axis direction with respect to the test piece, and Figure 5 is the ultrasonic wave. 6th plan view showing a state in which the probe is adjusted parallel to the test piece;
The figure is a waveform diagram showing the state of the reflected wave displayed on the oscilloscope, Figure 7 A is a plan view showing the state of adjusting the position of the ultrasound probe in the Y-axis direction, and Figure 7 B shows changes in the reflected wave. A waveform diagram, FIG. 8 is a vertical sectional view of the ultrasonic inspection apparatus showing a state in which the position of the ultrasonic probe in the X-axis direction with respect to the object to be inspected is adjusted, and FIG.
The figure is a longitudinal cross-sectional view of the ultrasonic testing apparatus showing the state in which the position of the ultrasonic probe in the Z-axis direction is adjusted, FIG. 10 is a perspective view of a test piece showing the second embodiment of the present invention, and FIG. 11 is a A perspective view of a test piece showing a third embodiment of the present invention, FIGS. 12 and 13 show the prior art, FIG. The figure is a sectional view in the direction of the arrow in FIG. 12. 3...Object to be inspected, 11...Ultrasonic inspection device, 1
3...Scanner main body, 20...Ultrasonic probe,
22...Rotating support base, 22A...Supporting surface, 25,
31, 41...Test piece, 26, 33A, 4
3A...Initial settings screen.
Claims (1)
水平方向および垂直方向に回動可能に構成された
スキヤナ本体と、該スキヤナ本体の先端側に取付
けられ、被検査体に向けて超音波を発信すること
により該被検査体の検査を行う超音波プローブと
、前記被検査体を支持し、該被検査体を超音波プ
ローブに対して回転させる回転支持台とからなる
超音波検査装置において、前記回転支持台には、
前記超音波プローブの初期設定を行うときに、前
記被検査体に替えてテストピースを設け、該テス
トピースには回転支持台の直径方向に伸長して回
転支持台の中心軸に対し対称形状をなし、該回転
支持台の支持面に対して所定角度をもつた初期設
定面を形成し、前記超音波プローブから該テスト
ピースの初期設定面に向けて超音波を発信しつつ
、前記スキヤナ本体を作動させることにより、初
期設定面からの反射波に基づき前記超音波プロー
ブの初期設定を行う構成としたことを特徴とする
超音波検査装置。 The scanner body is configured to be movable in three axes (X, Y, and Z directions) and rotatable in the horizontal and vertical directions. An ultrasonic inspection device consisting of an ultrasonic probe that inspects the object to be inspected by emitting sound waves, and a rotating support base that supports the object to be inspected and rotates the object to be inspected relative to the ultrasonic probe. In the rotary support base,
When performing the initial settings of the ultrasonic probe, a test piece is provided in place of the object to be inspected, and the test piece has a shape extending in the diameter direction of the rotating support and having a symmetrical shape with respect to the central axis of the rotating support. None, an initial setting surface is formed at a predetermined angle with respect to the support surface of the rotary support base, and the scanner body is moved while transmitting ultrasonic waves from the ultrasonic probe toward the initial setting surface of the test piece. An ultrasonic inspection apparatus characterized in that, when activated, the ultrasonic probe is initialized based on reflected waves from an initialization surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5391390U JP2505272Y2 (en) | 1990-05-23 | 1990-05-23 | Ultrasonic inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5391390U JP2505272Y2 (en) | 1990-05-23 | 1990-05-23 | Ultrasonic inspection equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0415061U true JPH0415061U (en) | 1992-02-06 |
| JP2505272Y2 JP2505272Y2 (en) | 1996-07-24 |
Family
ID=31575511
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5391390U Expired - Fee Related JP2505272Y2 (en) | 1990-05-23 | 1990-05-23 | Ultrasonic inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2505272Y2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015526742A (en) * | 2012-09-05 | 2015-09-10 | ユナイテッド テクノロジーズ コーポレイションＵｎｉｔｅｄ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｃｏｒｐｏｒａｔｉｏｎ | Floating head contour following holder for ultrasonic inspection |
| WO2017006702A1 (en) * | 2015-07-09 | 2017-01-12 | Ntn株式会社 | Method for manufacturing outer joint member for constant velocity universal joint and ultrasound flaw detection method for welded section |
| JP2021076500A (en) * | 2019-11-11 | 2021-05-20 | 株式会社東芝 | Ultrasonic flaw detector and inspection method for jet pump beam |
-
1990
- 1990-05-23 JP JP5391390U patent/JP2505272Y2/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015526742A (en) * | 2012-09-05 | 2015-09-10 | ユナイテッド テクノロジーズ コーポレイションＵｎｉｔｅｄ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｃｏｒｐｏｒａｔｉｏｎ | Floating head contour following holder for ultrasonic inspection |
| WO2017006702A1 (en) * | 2015-07-09 | 2017-01-12 | Ntn株式会社 | Method for manufacturing outer joint member for constant velocity universal joint and ultrasound flaw detection method for welded section |
| JP2017020561A (en) * | 2015-07-09 | 2017-01-26 | Ntn株式会社 | Manufacturing method of outside joint member of constant velocity universal joint, and ultrasonic scratch inspection method of weld part |
| JP2021076500A (en) * | 2019-11-11 | 2021-05-20 | 株式会社東芝 | Ultrasonic flaw detector and inspection method for jet pump beam |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2505272Y2 (en) | 1996-07-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |