JPH0415002U - - Google Patents
Info
- Publication number
- JPH0415002U JPH0415002U JP5546290U JP5546290U JPH0415002U JP H0415002 U JPH0415002 U JP H0415002U JP 5546290 U JP5546290 U JP 5546290U JP 5546290 U JP5546290 U JP 5546290U JP H0415002 U JPH0415002 U JP H0415002U
- Authority
- JP
- Japan
- Prior art keywords
- rods
- plate
- shape measuring
- measuring device
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5546290U JPH0415002U (pt) | 1990-05-28 | 1990-05-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5546290U JPH0415002U (pt) | 1990-05-28 | 1990-05-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0415002U true JPH0415002U (pt) | 1992-02-06 |
Family
ID=31578436
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5546290U Pending JPH0415002U (pt) | 1990-05-28 | 1990-05-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0415002U (pt) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2023000339A (ja) * | 2021-06-17 | 2023-01-04 | Ｎｅｃプラットフォームズ株式会社 | 計測システム、計測方法、計測用プログラム |
-
1990
- 1990-05-28 JP JP5546290U patent/JPH0415002U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2023000339A (ja) * | 2021-06-17 | 2023-01-04 | Ｎｅｃプラットフォームズ株式会社 | 計測システム、計測方法、計測用プログラム |