JPH04143676A - Electronic parts measuring system - Google Patents
Electronic parts measuring systemInfo
- Publication number
- JPH04143676A JPH04143676A JP26676890A JP26676890A JPH04143676A JP H04143676 A JPH04143676 A JP H04143676A JP 26676890 A JP26676890 A JP 26676890A JP 26676890 A JP26676890 A JP 26676890A JP H04143676 A JPH04143676 A JP H04143676A
- Authority
- JP
- Japan
- Prior art keywords
- function
- measurement
- control
- host computer
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims abstract description 87
- 238000012545 processing Methods 0.000 claims abstract description 37
- 238000004891 communication Methods 0.000 claims abstract description 15
- 230000005540 biological transmission Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は電子部品測定システムに関し、特に上位コンピ
ュータとの情報交換を行なう電子部品測定システムに関
する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an electronic component measuring system, and more particularly to an electronic component measuring system that exchanges information with a host computer.
従来、例えばタンタル固体電解コンデンサ等の素子の静
電容量測定システムは、処理制御装置と記憶媒体を有す
るコンピュータとはオフラインにより手動で結合される
構成になっている。Conventionally, a system for measuring the capacitance of an element such as a tantalum solid electrolytic capacitor, for example, has a configuration in which a processing control device and a computer having a storage medium are manually coupled offline.
第2図はかかる従来の一例を説明するための測定システ
ムのブロック図である。FIG. 2 is a block diagram of a measurement system for explaining an example of such a conventional measurement system.
第2図に示す如く、この測定システムは被測定素子と接
続する測定部8の端子を切り替える測定制御部7と、測
定順序を制御する測定制御機能4と測定制御機能7に指
示を出し測定結果を集計する中央処理機能2を有する処
理制御装置1と、測定規格情報及び測定結果を記憶する
記憶媒体10、入力装置11、出力装置12を有する上
位コンピュータ9とから構成されている。As shown in FIG. 2, this measurement system includes a measurement control unit 7 that switches the terminals of the measurement unit 8 connected to the device under test, a measurement control function 4 that controls the measurement order, and a measurement control function 7 that instructs the measurement results. It is composed of a processing control device 1 having a central processing function 2 for totalizing the data, and a host computer 9 having a storage medium 10 for storing measurement standard information and measurement results, an input device 11, and an output device 12.
作業者は、各被測定素子のキーワードを上位コンピュー
タ9の入力装置11より入力することにより出力装置1
2に測定規格情報を出力した後、その情報をもとに処理
制御装置1に判定情報を設定することにより被測定素子
の静電容量を測定し、得られた測定結果を上位コンピュ
ータ9の入力装置11より再び入力していた。The operator inputs keywords for each device to be measured from the input device 11 of the host computer 9 to the output device 1.
After outputting measurement standard information to 2, the capacitance of the device under test is measured by setting judgment information in the processing control device 1 based on that information, and the obtained measurement results are input to the host computer 9. The information was input again from device 11.
また、処理制御装置1の中央処理機能2と測定制御機能
は互いに独立しては機能せず、どちらかの機能が作動中
の時には他方の機能は休止している構成であった。Further, the central processing function 2 and the measurement control function of the processing control device 1 do not function independently of each other, and when one function is in operation, the other function is inactive.
この従来の測定システムでは、作業者が上位コンピュー
タ出力装置から出力された測定規格情報に基づき処理制
御装置の条件を設定したり、あるいは、得られた測定結
果情報を上位コンピュータの入力装置から直接入力操作
を行なっているため、設定・入力操作のわずられしさと
設定の誤操作による素子不良判定の発生という欠点があ
った。In this conventional measurement system, the operator sets the conditions of the processing control device based on the measurement standard information output from the host computer's output device, or directly inputs the obtained measurement result information from the host computer's input device. Because of the manual operation, there are disadvantages in that setting and input operations are cumbersome and element failure is determined due to erroneous setting operations.
また、処理制御装置の中央処理機能と測定制御機能が独
立でないなめ、各機能の構成が複雑になり維持管理に多
大な手間を要したり、測定効率が低下するという問題点
があった。Furthermore, since the central processing function and the measurement control function of the processing control device are not independent, there are problems in that the configuration of each function becomes complicated, requiring a great deal of effort to maintain and manage, and that measurement efficiency decreases.
本発明の目的は、かかる入力操作を簡略化し、誤捜査を
なくすとともに、各機能の独立性を高めることにより機
能構成要素を簡略化し維持管理を容易にし、さらに各機
能を多重動作させることにより測定効率を向上させた測
定システムを提供することにある。The purpose of the present invention is to simplify such input operations, eliminate erroneous investigations, simplify the functional components by increasing the independence of each function and facilitate maintenance, and furthermore, perform measurement by multiplexing each function. The objective is to provide a measurement system with improved efficiency.
本発明の電子部品測定システムは、測定装置の機械的動
作を制御する機構部制御機能と、被測定物の測定順序を
制御する測定制御機能とデータ伝送を行なう通信機能と
、前記機構部制御機能 測定制御機能及び通信機能を統
括する中央処理機能とを有する処理制御装置と前記機構
部制御機能の指示により被測定物を移動させる機構部と
前記測定制御機能の指示により被測定物の測定端子を切
り替える測定制御部と、判定部と前記通信機能と論理的
に接続され、記憶媒体を有する上位コンピュータとを備
え、前記上位コンピュータの記憶媒体上に記憶された測
定制御情報を前記処理制御装置に伝送する伝送機能と、
測定制御情報をもとに測定結果を判定する判定機能と判
定結果を前記上位コンピュータに伝送して記憶媒体に記
憶させる記憶機能を備え、前記処理制御装置の機構部制
御機能、測定制御機能1通信機能及び中央処理機能がそ
れぞれ独立に動作する機能とを備えている。The electronic component measuring system of the present invention includes a mechanism control function for controlling the mechanical operation of a measuring device, a measurement control function for controlling the measurement order of the object to be measured, a communication function for transmitting data, and the mechanism control function. A processing control device having a central processing function that controls a measurement control function and a communication function, a mechanism section that moves the object to be measured according to instructions from the mechanism section control function, and a mechanism section that moves the measurement terminal of the object to be measured according to instructions from the measurement control function. A measurement control unit for switching, a host computer logically connected to the determination unit and the communication function and having a storage medium, and transmitting measurement control information stored on the storage medium of the host computer to the processing control device. transmission function,
It is equipped with a determination function for determining a measurement result based on measurement control information and a storage function for transmitting the determination result to the host computer and storing it in a storage medium, and includes a mechanism control function of the processing control device, and a measurement control function 1 communication. The central processing function and the central processing function each operate independently.
次に、本発明の実施例について図面を参照して詳細に説
明する。Next, embodiments of the present invention will be described in detail with reference to the drawings.
第1図は本発明の一実施例を説明するための測定システ
ムのブロック図である。FIG. 1 is a block diagram of a measurement system for explaining one embodiment of the present invention.
第1図に示すように、本実施例の電子部品測定システム
は、中央処理機能2と機構部制御機能3と測定制御機能
4と通信機能5を含む処理制御装置1と、被測定物(図
示省略〉を測定部8へ搬入・搬出する機構部6と測定部
8にセットされた複数の被測定物の測定端子を切り替え
る測定制御部と、記憶媒体10を有する上位コンピュー
タ9とから構成されており、その動作はまず作業者が処
理制御装置1の入力装置(図示省略)から機構部制御機
能、測定制御機能を起動し、測定を開始する。As shown in FIG. 1, the electronic component measuring system of this embodiment includes a processing control device 1 including a central processing function 2, a mechanism control function 3, a measurement control function 4, and a communication function 5, and an object to be measured (not shown). (omitted)> is comprised of a mechanism section 6 for carrying in and out of the measurement section 8, a measurement control section for switching the measurement terminals of a plurality of objects to be measured set in the measurement section 8, and a host computer 9 having a storage medium 10. First, the operator starts the mechanism control function and the measurement control function from the input device (not shown) of the processing control device 1 to start measurement.
次に処理制御装置1の入力装置から測定すべき素子のキ
ーワードを入力し通信機能5を動作させ、キーワードを
上位コンピュータ9に伝送する。Next, a keyword of the element to be measured is inputted from the input device of the processing control device 1, the communication function 5 is operated, and the keyword is transmitted to the host computer 9.
上位コンピュータ9は受信したキーワードよりあらかじ
め登録された素子の測定規格情報を記憶媒体10から読
出し処理制御装置1の通信機能5宛に伝送する。通信機
能5は受信した測定規格情報を中央処理機能2に引き渡
し、待機状態となる。The host computer 9 reads the measurement standard information of the device registered in advance from the storage medium 10 based on the received keyword and transmits it to the communication function 5 of the processing control device 1. The communication function 5 passes the received measurement standard information to the central processing function 2 and enters a standby state.
中央処理機能2は受は取った測定規格情報を補助記憶(
図示省略)に対比し、再び素子のキーワードを入力する
という動作を繰り返す。The central processing function 2 stores the received measurement standard information in auxiliary memory (
(not shown), the operation of inputting the keyword of the element again is repeated.
他方、中央処理機能2とは非同期に動作していた機構部
制御機能3は、非測定素子の終了を検知すると中央処理
機能2と測定制御機能4へ測定完了の信号を発する。On the other hand, the mechanism control function 3, which has been operating asynchronously with the central processing function 2, issues a measurement completion signal to the central processing function 2 and the measurement control function 4 when it detects the end of the non-measuring element.
測定完了通知を受は取った測定制御機能4は測定結果を
中央処理機能1に引き渡し待機状態となる。The measurement control function 4, which has received the measurement completion notification, hands over the measurement results to the central processing function 1 and enters a standby state.
中央処理機能2は、機構部制御機能3からの測定完了信
号と測定制御機能4からの測定結果と、各素子の測定規
格情報がすべてそろった時点で測定結果の判定を実施し
、素子のキーワードを測定結果情報に付加した後、通信
機能5を動作させ、上位コンピュータ9宛に伝送する。The central processing function 2 judges the measurement results when the measurement completion signal from the mechanism control function 3, the measurement results from the measurement control function 4, and the measurement standard information of each element are all collected, and determines the keyword of the element. After adding the measurement result information to the measurement result information, the communication function 5 is activated and the information is transmitted to the host computer 9.
上位コンピュータ9は測定結果情報を受信すると、素子
のキーワードにより情報を分類した後、記憶媒体10に
記憶し且つ必要に応じて判定結果情報を出力装置(図示
省略)に出力する。When the host computer 9 receives the measurement result information, it classifies the information based on the keyword of the element, stores it in the storage medium 10, and outputs the determination result information to an output device (not shown) if necessary.
以上説明したように、本発明は処理制御装置から素子の
キーワードを入力することにより自動的に測定規格情報
を上位コンピュータから引き出して、非同期に測定され
た測定結果と照合判定し、得られた測定結果情報を自動
的に上位コンピュータの記憶媒体に登録することができ
るので以下に示す効果がある。As explained above, the present invention automatically retrieves measurement standard information from a host computer by inputting a keyword of an element from a processing control device, compares it with asynchronously measured measurement results, and determines the measurement standard information. Since the result information can be automatically registered in the storage medium of the host computer, the following effects can be achieved.
(1)わずられしい測定規格情報の設定や測定結果情報
の入力が軽減され使い易くなる。(1) The complicated setting of measurement standard information and the input of measurement result information are reduced, making it easier to use.
(2)測定規格の後設定に起因する素品不良の発生がな
くなるので歩留が向上する。(2) Yield is improved because defects in component parts due to post-setting of measurement standards are eliminated.
(3)処理制御装置の各機能が多重に動作するので、測
定効率が向上する。(3) Since each function of the processing control device operates multiplexed, measurement efficiency is improved.
第1図は、本発明の一実施例を説明するためのシステム
を示すブロック図である。
1・・・処理制御装置、2・・・中央処理機能、3・・
・機構部制御機能、4・・・測定制御機能、5・・・通
信機能、6・・・機構部、7・・・測定制御部、8・・
・測定部、9・・・上位コンピュータ、10・・・記憶
媒体、11・・・入力装置、12・・・出力装置。FIG. 1 is a block diagram showing a system for explaining one embodiment of the present invention. 1... Processing control device, 2... Central processing function, 3...
・Mechanism control function, 4...Measurement control function, 5...Communication function, 6...Mechanism section, 7...Measurement control section, 8...
- Measuring unit, 9... Upper computer, 10... Storage medium, 11... Input device, 12... Output device.
Claims (1)
被測定物の測定順序を制御する測定制御機能及びデータ
伝送を行なう通信機能と、前記機構部制御機能、測定制
御機能及び通信機能を統括する中央処理機能とを有する
処理制御装置と前記機構部制御機能の指示により被測定
物を移動させる機構部と前記測定制御機能の指示により
被測定物の測定端子を切り替える測定制御部と、測定部
及び前記通信機能とが論理的に接続され、記憶媒体を有
する上位コンピュータとからなる測定システムにおいて
、前記上位コンピュータの記憶媒体上に記憶された測定
制御情報を前記処理制御装置に伝送する伝送機能と、測
定制御情報をもとに測定結果を判定する判定機能と、判
定結果を前記上位コンピュータに伝送し、記憶媒体に記
憶させる記憶機能を備えることを特徴とする電子部品測
定システム。 2、前記機構部制御機能と測定制御部と通信機能と中央
処理機能を独立に多重動作させたことを特徴とする請求
項1記載の電子部品測定システム。[Scope of Claims] 1. A mechanism control function for controlling the mechanical operation of the measuring device, a measurement control function for controlling the measurement order of the object to be measured, a communication function for transmitting data, and the mechanism control function, measurement A processing control device having a central processing function that controls a control function and a communication function; a mechanism unit that moves the object to be measured according to instructions from the mechanism section control function; and a mechanism section that switches measurement terminals of the object to be measured according to instructions from the measurement control function. In a measurement system comprising a measurement control unit and a host computer to which the measurement unit and the communication function are logically connected and has a storage medium, the measurement control information stored on the storage medium of the host computer is controlled by the processing control. An electronic component characterized by having a transmission function for transmitting data to a device, a determination function for determining a measurement result based on measurement control information, and a storage function for transmitting the determination result to the host computer and storing it in a storage medium. measurement system. 2. The electronic component measuring system according to claim 1, wherein the mechanical unit control function, the measurement control unit, the communication function, and the central processing function are independently operated in a multiplex manner.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26676890A JPH04143676A (en) | 1990-10-04 | 1990-10-04 | Electronic parts measuring system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26676890A JPH04143676A (en) | 1990-10-04 | 1990-10-04 | Electronic parts measuring system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04143676A true JPH04143676A (en) | 1992-05-18 |
Family
ID=17435434
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26676890A Pending JPH04143676A (en) | 1990-10-04 | 1990-10-04 | Electronic parts measuring system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04143676A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59228729A (en) * | 1983-06-09 | 1984-12-22 | Toshiba Corp | Method and device for measuring semiconductor |
JPS63298178A (en) * | 1987-05-29 | 1988-12-05 | Advantest Corp | Ic test system |
-
1990
- 1990-10-04 JP JP26676890A patent/JPH04143676A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59228729A (en) * | 1983-06-09 | 1984-12-22 | Toshiba Corp | Method and device for measuring semiconductor |
JPS63298178A (en) * | 1987-05-29 | 1988-12-05 | Advantest Corp | Ic test system |
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