JPH04138366A - Analyser possible in self-evaluation - Google Patents

Analyser possible in self-evaluation

Info

Publication number
JPH04138366A
JPH04138366A JP26157290A JP26157290A JPH04138366A JP H04138366 A JPH04138366 A JP H04138366A JP 26157290 A JP26157290 A JP 26157290A JP 26157290 A JP26157290 A JP 26157290A JP H04138366 A JPH04138366 A JP H04138366A
Authority
JP
Japan
Prior art keywords
sample
measurement
samples
analysis
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26157290A
Other languages
Japanese (ja)
Inventor
Hideyoshi Arashima
荒島 秀嘉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP26157290A priority Critical patent/JPH04138366A/en
Publication of JPH04138366A publication Critical patent/JPH04138366A/en
Pending legal-status Critical Current

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  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

PURPOSE:To automatically perform the self-evaluation of analytical capacity by measuring a group of samples twice by changing a measuring order and calculating autocorrelation with respect to the measured result. CONSTITUTION:In the first measurement, (N) samples arranged to a sample holding part 2 are successively measured from the first sample by an analyzing part 4 and the measured results are stored in a memory part 8 corresponding to sample numbers. In the second measurement, for example, random numbers are generated in a sample selecting part 6 so as to defer the order of the samples and the measuring order of the samples is differentiated to measure the samples in the same way to store the measured results in the memory part 8. After the second measurement, an operation part 10 calculates a regres sion equation by the regression analysis based on the measured values to calcu late autocorrelation. Then, the state of the analytical capacity of the apparatus is judged on the basis of the preset reference value of autocorrelation and the evaluating measurement thereof is automatically carried out. By this constitu tion, the reliability of the apparatus is confirmed for a long period of time to be kept.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は臨床検査用の電解質分析装置などの分析装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an analyzer such as an electrolyte analyzer for clinical testing.

(従来の技術) 電解質分析装置では分析性能の測定や評価は主として製
造者側で行なっており、顧客側では単純な操作ですむ再
現性の評価が行なわれている程度である。
(Prior Art) In electrolyte analyzers, the analytical performance is mainly measured and evaluated by the manufacturer, and the customer only evaluates the reproducibility, which requires simple operations.

一般に、分析装置には分析性能を自己評価するためのプ
ログラムは備えられていない。
Generally, analyzers are not equipped with programs for self-evaluation of analytical performance.

(発明が解決しようとする課題) 実際の分析状態で分析性能の精密さを評価しようとする
と、何らかの評価手法に栽づいて手動で実行することは
できるか、操作が煩雑であり、また測定者により評価結
果に差異が生しる恐れがある。
(Problems to be Solved by the Invention) When trying to evaluate the accuracy of analytical performance under actual analytical conditions, it is not possible to develop some kind of evaluation method and manually execute it. There is a risk that differences may occur in the evaluation results.

本発明は実際の分析状態で分析性能を自動的に自己評価
する機能を備えた分析装置を提供することを[]的とす
るものである。
An object of the present invention is to provide an analyzer having a function of automatically self-evaluating analytical performance under actual analytical conditions.

(課題を解決するための手段) 第1図に本発明を示す。(Means for solving problems) The invention is illustrated in FIG.

2は複数の試料を保持し任意の試料を試料採取部へ位置
決めできる試料保持部、4は試料保持部2の試料採取位
置の試料を採取して定量分析する分析部、6は一群の試
料について測定順序を変えた2回の測定を行なうように
試料保持部2の動作を制御する試料選択部、8は分析部
による定器分析結果を試料番号に対応づけて記憶する記
憶部、10は記憶部8から分析結果を呼び出して2回の
測定結果について自己相関を算出する演算部である。
2 is a sample holder that holds multiple samples and can position any sample to the sample collection section; 4 is an analysis section that collects the sample at the sample collection position of sample holder 2 for quantitative analysis; and 6 is for a group of samples. A sample selection section controls the operation of the sample holding section 2 so as to perform two measurements with different measurement orders; 8 is a storage section that stores the results of instrument analysis by the analysis section in association with sample numbers; 10 is a storage section; This is a calculation unit that calls the analysis results from the unit 8 and calculates the autocorrelation for the two measurement results.

(作用) 試料保持部2に並へられたN個の試料について、1回に
1の測定では1番11からN番目までの試料をその順に
分析部4で1ll11定し、その測定結果を試料番号に
対応させて記憶部8に記憶させていく。
(Function) Regarding the N samples arranged in the sample holding section 2, in one measurement at a time, the samples 111 to N are determined in that order in the analysis section 4, and the measurement results are transferred to the sample. The information is stored in the storage unit 8 in correspondence with the number.

次に、2回目の測定を行なうときは、測定順序を異なら
せる。例えば試料選択部6に乱数を発生する部分を設け
ておき、乱数に従って2回[」の6111定順序を決め
る。そのように決められた順序で2回目の測定を行ない
、分析部4による測定結果も試料番号と対応づけて記憶
部8に記憶させていく。
Next, when performing the second measurement, the measurement order is changed. For example, the sample selection section 6 is provided with a section that generates random numbers, and the 6111 fixed order of 2 times ['' is determined according to the random numbers. A second measurement is performed in the determined order, and the measurement results by the analysis section 4 are also stored in the storage section 8 in association with the sample number.

1回目の測定値をX] 輸=1〜N)、2回11の測定
値をy] (i=1〜N)とする。1は試料番刊である
。演算部10では2回の測定値から、回帰式として :3 Y i = +i +b X 1 か算出される。算出結果は表示される。
Let the first measurement value be X] (i=1 to N), and the second measurement value 11 be y] (i=1 to N). 1 is the sample number. The arithmetic unit 10 calculates the regression equation: 3 Y i = +i +b X 1 from the two measured values. The calculation results are displayed.

(実施例) 第2図は一実施例を表わす。(Example) FIG. 2 represents one embodiment.

12は試料保持部のターンテーブルであり、その円周に
沿って複数個の試料容器14が配置される。16はター
ンチーフル12を回転させるモタである。ターンテーブ
ル12に1妾近してターンテーブル]2の回転位置を検
出する位置検出器18が設けられている。位置検出器1
8の検出44号により、コンピュータ20ては試料採取
位置にある試料の番号が判断される。
Reference numeral 12 denotes a turntable of a sample holding section, and a plurality of sample containers 14 are arranged along the circumference of the turntable. 16 is a motor that rotates the turntable 12. A position detector 18 is provided close to the turntable 12 to detect the rotational position of the turntable 2. Position detector 1
8, the computer 20 determines the number of the sample at the sample collection position.

試料採取位置の試料−に方には試才゛トを採取する試料
注入用ノズル22か設けられ、ノズル22は」1下方向
に移動して試料容器から試料を採取し、回転して分析部
28に注入する。24はノズル22の移動を15μ動す
るモータである。モータ16,24はコンピュータ20
からの信号によりモータ制!制 御回路26により制御される。
A sample injection nozzle 22 for collecting a sample is provided on the sample side of the sample collection position. Inject into 28. 24 is a motor that moves the nozzle 22 by 15μ. The motors 16 and 24 are connected to the computer 20
Motor control by the signal from! It is controlled by a control circuit 26.

28は分析部であり、電解質分析装置ではセンサとして
電極を備えている。分析部28による定旦分析結果は増
幅回路などのアナログ回路及びΔ/D変換器30を経て
コンピュータ20に取り込まれる。32はCRTやプリ
ンタなどの表示装置である。
Reference numeral 28 denotes an analysis section, which is equipped with an electrode as a sensor in the electrolyte analyzer. The regular analysis results by the analysis section 28 are taken into the computer 20 via an analog circuit such as an amplifier circuit and a Δ/D converter 30. 32 is a display device such as a CRT or a printer.

第1図における試料選択部6、記憶部8及び演算部10
はコンピュータ20により実現される。
Sample selection section 6, storage section 8 and calculation section 10 in FIG.
is realized by the computer 20.

次に一実施例の動作を第3図により説明する。Next, the operation of one embodiment will be explained with reference to FIG.

測定開始が指示されると、測定試料番号が1に設定され
、ターンテーブル12が回転して番号1の試料が試料採
取位置に位置決めされる。その試料が採取され分析部2
8で測定される。その1llll定結果はテジタル信号
に変換されてコンピュータ20へ取り込まれ、試料番号
と測定値が記憶される。
When the start of measurement is instructed, the measurement sample number is set to 1, the turntable 12 is rotated, and the sample numbered 1 is positioned at the sample collection position. The sample is collected and analyzed in the analysis department 2.
Measured at 8. The 1llll determination result is converted into a digital signal and taken into the computer 20, where the sample number and measurement value are stored.

次に、S定試料番号に1が加算されて、次の番号の試料
が試料採取位置に位置決めされ、同様にして測定され、
その測定値も試料番号とともにコンピュータ20に記憶
されていく。
Next, 1 is added to the S constant sample number, and the sample with the next number is positioned at the sample collection position and measured in the same manner.
The measured values are also stored in the computer 20 along with the sample number.

以下、同様にして試料番号順に化1定が進められ、全て
の試料について1回1」の測定が終了すると、2回目の
測定に進む。
Thereafter, chemical constants are similarly proceeded in the order of sample numbers, and when one measurement for all samples is completed, the process proceeds to the second measurement.

2回目の411定では試料のdlす定順序を変えるため
に、例えば乱数列が発生し、その乱数列により2回目の
測定順序が決められる。そして、決められた測定順序に
従って試料が測定されていき、それらの測定値も試料番
号とともにコンピュータ2゜に記憶されていく。
In the second 411 measurement, for example, a random number sequence is generated in order to change the sample dl determination order, and the second measurement order is determined by the random number sequence. Then, the samples are measured according to the determined measurement order, and the measured values are also stored in the computer 2° along with the sample number.

2回目の測定が全ての試料について終了すると、演算が
行なわれる。
Once the second measurement is completed for all samples, calculations are performed.

演算では回帰分析により前述の(1)式により回帰式か
求められ、(2)式により自己相関Sy・Xが求められ
る。演算結果はCRTに表示され、プリンタに印字され
る。
In the calculation, the regression equation is determined by the above-mentioned equation (1) through regression analysis, and the autocorrelation Sy.X is determined by the equation (2). The calculation results are displayed on a CRT and printed on a printer.

演算結果を表示する際、・分析性能の評価基準として自
己相関5y−xの基Q10値を製造側において予め定め
ておき、又は使用者が設定しておき、演算された自己相
関結果が評価基僧を満たさなかった場合にはその分析装
置の分析性能が低下したことを警報として表示するよう
にしてもよい。
When displaying the calculation results, - The base Q10 value of autocorrelation 5y-x is predetermined by the manufacturer or set by the user as an evaluation standard for analytical performance, and the calculated autocorrelation result is used as the evaluation standard. If the condition is not satisfied, a warning may be displayed indicating that the analysis performance of the analyzer has decreased.

(発明の効果) 本発明では分析性能の評価測定を自動的に行なわせるよ
うにしたので、分析装置の信頼性を長期間にわたって確
認し維持することに操作者の手間をかけずにすみ、また
評価のための操作にばらつきをなくして安定した分析性
能評価をすることが可能になる。
(Effects of the Invention) In the present invention, since the evaluation measurement of analytical performance is automatically performed, the operator does not have to worry about confirming and maintaining the reliability of the analytical device over a long period of time. It becomes possible to perform stable analysis performance evaluation by eliminating variations in evaluation operations.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明を示すブロック図、第2図は一実施例を
丞すブロック図、第3図は一実施例の動作を示すフロー
チャート図である。 2・・・試料保持部、4・・・・・分析部、6・ ・・
試料選択部、8・・・・記憶部、10・・・・・演算部
、12・・・・ターンテーブル、14・・・・・・試料
容器、20コンピユータ、28・・・・分析部。 特許出願人 株式会社島津製作所
FIG. 1 is a block diagram showing the present invention, FIG. 2 is a block diagram showing one embodiment, and FIG. 3 is a flowchart showing the operation of one embodiment. 2...Sample holding section, 4...Analysis section, 6...
Sample selection unit, 8... Storage unit, 10... Calculation unit, 12... Turntable, 14... Sample container, 20 Computer, 28... Analysis unit. Patent applicant: Shimadzu Corporation

Claims (1)

【特許請求の範囲】[Claims] (1)複数の試料を保持し任意の試料を試料採取部へ位
置決めできる試料保持部と、試料保持部の試料採取位置
の試料を採取して定量分析する分析部と、一群の試料に
ついて測定順序を変えた2回の測定を行なうように試料
保持部の動作を制御する試料選択部と、分析部による定
量分析結果を試料番号に対応づけて記憶する記憶部と、
記憶部から分析結果を呼び出して2回の測定結果につい
て自己相関を算出する演算部とを備えた分析装置。
(1) A sample holding part that holds multiple samples and can position any sample to the sample collection part, an analysis part that collects the sample at the sample collection position of the sample holding part and performs quantitative analysis, and a measurement order for a group of samples. a sample selection section that controls the operation of the sample holding section so as to perform two measurements with different values; a storage section that stores quantitative analysis results by the analysis section in association with sample numbers;
An analysis device comprising: a calculation unit that retrieves analysis results from a storage unit and calculates an autocorrelation for two measurement results.
JP26157290A 1990-09-29 1990-09-29 Analyser possible in self-evaluation Pending JPH04138366A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26157290A JPH04138366A (en) 1990-09-29 1990-09-29 Analyser possible in self-evaluation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26157290A JPH04138366A (en) 1990-09-29 1990-09-29 Analyser possible in self-evaluation

Publications (1)

Publication Number Publication Date
JPH04138366A true JPH04138366A (en) 1992-05-12

Family

ID=17363778

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26157290A Pending JPH04138366A (en) 1990-09-29 1990-09-29 Analyser possible in self-evaluation

Country Status (1)

Country Link
JP (1) JPH04138366A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006292698A (en) * 2005-04-15 2006-10-26 Hitachi High-Technologies Corp Precision management method of autoanalyzer for clinical inspection, and the autoanalyzer
WO2013069298A1 (en) * 2011-11-09 2013-05-16 ベックマン コールター, インコーポレイテッド Automatic analyzer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6463860A (en) * 1987-09-04 1989-03-09 Hitachi Ltd Automatic analyser

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6463860A (en) * 1987-09-04 1989-03-09 Hitachi Ltd Automatic analyser

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006292698A (en) * 2005-04-15 2006-10-26 Hitachi High-Technologies Corp Precision management method of autoanalyzer for clinical inspection, and the autoanalyzer
WO2013069298A1 (en) * 2011-11-09 2013-05-16 ベックマン コールター, インコーポレイテッド Automatic analyzer

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