JPH04126175U - Insulated contact pin - Google Patents

Abstract

(57) [Summary] [Structure] A movable part 2 that has a contact part 3a at the tip and is supported by the support part 1 so as to be freely pushed, and a contact part 3a of this movable part 2.
and an insulating part 3 that covers a portion close to the . When measuring a circuit under test that has multiple test points in close proximity,
Even if adjacent contact pins are bent or the like, there is no risk of short-circuiting due to the presence of the insulating portion 3. [Effect] Even when measuring a circuit under test where multiple test points are concentrated, short circuits between contact pins can be prevented.

Description

[Detailed explanation of the idea]

0001

[Industrial application field]

This invention relates to contact pins for circuit testing, especially for multiple test pins with short distances. Insulated contact pin used for testing printed wiring boards with stop points Regarding

0002

[Conventional technology]

Conventionally, this type of contact pin for circuit testing has a support part 11 as shown in FIG. Are the movable part 12 supported by the movable part 12 and the contact part 13a provided at the tip of the same conductor? It is composed of.

0003

[Problem that the idea aims to solve]

In the conventional contact pin for circuit testing mentioned above, the entire movable part including the contact part is conductive. Since multiple test points are small on the printed wiring board that is the object under test, If the contact pins are concentrated within an area, at least one of the contact pins that are close to each other The drawback is that even a slight bend in one direction can cause a short circuit.

0004

[Means to solve the problem]

The insulated contact pin of the present invention has a support portion, a contact portion at the tip, and the support portion. In a contact pin consisting of a movable part supported so as to be freely pushed into a holding part, A portion of the movable portion that is close to the contact portion is covered with an insulator.

[0005]

【Example】

Next, the present invention will be explained with reference to the drawings.

[0006] Figure 1 shows an embodiment of the present invention, in which (a) is a top view and (b) is a front view. Figure 2 shows the connection situation between this example and the printed wiring board containing the circuit under test. FIG.

[0007] This embodiment has a support part 1, a contact part 3a at the tip, and is self-pushing into the support part 1. A movable part 2 that is currently supported, and an insulator that covers the part of this movable part 2 that is close to the contact part 3a. It has an insulating part 3 consisting of an edge. In other words, the movable part 2 is pushed against the support part 1. An insulating part 3 and a contact part 3a are formed at the tip of the movable part 2. There is.

[0008] In FIG. 2 showing the usage situation of this embodiment, the auxiliary board 4 has a circuit according to this embodiment. A plurality of test contact pins 10 are attached. The printed wiring board 5 is In the substrate containing the test circuit and the element 7, the circuit test of this example is applied to the conductive part 7a. The contact portion 3a of the experimental contact pin 10 is in contact with the contact portion 3a. Wire 6 connects to the measuring device, etc. It is connected to the circuit test contact pin 10 to transmit signals, and the detection operation is performed. carrying out the work.

[0009] Furthermore, the operation of the circuit test contact pin 10 of this embodiment will be described in detail. auxiliary A plurality of circuit test contact pins are inserted into the mounting holes drilled at appropriate intervals on the board 4. When testing the printed wiring board 5, insert and fix the supporting parts 1 of the connectors 10 respectively. move the auxiliary board 4 and print the contact part 3a of the contact pin 10 for circuit testing. The contact point contacts the circuit under test of the wiring board 5 and the conductive portion 7a of the element 7. Wiring later 6, exchange the required signals between the measuring instrument, etc. and the circuit test contact pin 10. By doing so, the desired test can be achieved.

0010 According to this embodiment, printed wiring having adjacent test points It is possible to connect measuring instruments, etc. to the board 5 without providing necessary plugs, etc. In addition, the insulating portion 3 can prevent short circuits between adjacent contact pins. can.

[0011]

[Effect of the idea]

As explained above, the present invention has an insulating part in the movable part, so there is no short circuit. Printed wiring with multiple test points close together at a distance that may cause When testing circuit boards, measurements such as circuit testing equipment are directly connected to printed wiring boards. This has the effect of making it possible to continue. This invention also improves the mounting density of printed wiring boards. It has the effect of improving the manufacturing process.

[Brief explanation of drawings]

FIG. 1 shows an embodiment of the present invention, with FIG. 1(a) being a top view and FIG. 1(b) being a front view.

FIG. 2 is a front view showing a connection state between the present embodiment and a printed wiring board having a circuit under test.

FIG. 3 is a front view showing an example of a conventional contact pin.

[Explanation of symbols]

1,11 Support part 2,12 Movable part 3 Insulator section 3a, 13a contact part 4 Auxiliary board 5 Printed wiring board 6 Wiring 7 elements 10 Contact pin for circuit testing

Claims (1)

[Scope of utility model registration request] 1. A contact pin comprising a support part and a movable part having a contact part at its tip and supported so as to be freely pushed into the support part, wherein a portion of the movable part near the contact part is insulated. An insulated contact pin characterized by being covered with an object.