JPH0537437Y2 - - Google Patents

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Publication number
JPH0537437Y2
JPH0537437Y2 JP1986157440U JP15744086U JPH0537437Y2 JP H0537437 Y2 JPH0537437 Y2 JP H0537437Y2 JP 1986157440 U JP1986157440 U JP 1986157440U JP 15744086 U JP15744086 U JP 15744086U JP H0537437 Y2 JPH0537437 Y2 JP H0537437Y2
Authority
JP
Japan
Prior art keywords
probe
socket
bent
circuit board
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1986157440U
Other languages
Japanese (ja)
Other versions
JPS6361788U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986157440U priority Critical patent/JPH0537437Y2/ja
Publication of JPS6361788U publication Critical patent/JPS6361788U/ja
Application granted granted Critical
Publication of JPH0537437Y2 publication Critical patent/JPH0537437Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Description

【考案の詳細な説明】 (産業上の利用分野) 本考案はICソケツトに関する。[Detailed explanation of the idea] (Industrial application field) The present invention relates to an IC socket.

(従来の技術とその問題点) 従来第4図に断面図として示す如きIC試験用
のソケツトが提案されている。かかるICソケツ
トにおいてはソケツト本体1に一定間隔で複数の
プローブ2が植設してある。また、該ソケツト本
体1の上側にはプローブ2を挿通し、ガイドピン
3で位置決めされたフローテイングプレート4が
設けてある。このフローテイングプレート4は前
記ガイドピン3で横方向の位置を規制されたまま
上下方向に摺動可能で、常時はガイドピン3の頭
部3aにばね5で弾圧されている。又フローテイ
ングプレート4の上面にはIC6の位置決めをす
る凹部4aが設けてある。
(Prior Art and its Problems) Conventionally, a socket for IC testing as shown in a sectional view in FIG. 4 has been proposed. In such an IC socket, a plurality of probes 2 are installed in a socket body 1 at regular intervals. Further, a floating plate 4 is provided above the socket main body 1, through which a probe 2 is inserted, and which is positioned by a guide pin 3. The floating plate 4 can slide vertically while its lateral position is restricted by the guide pin 3, and is normally pressed against the head 3a of the guide pin 3 by a spring 5. Further, a recess 4a for positioning the IC 6 is provided on the upper surface of the floating plate 4.

このICソケツトは、上記フローテイングプレ
ート4の凹部4aにIC6を載置し、その上側に
放熱板7を載置して両端を押え部材8で押圧して
IC6の接続端子をプローブ2の接触端に接触さ
せる構造である。
This IC socket is made by placing the IC 6 in the recess 4a of the floating plate 4, placing the heat dissipation plate 7 above it, and pressing both ends with the presser members 8.
The structure is such that the connection terminal of the IC 6 is brought into contact with the contact end of the probe 2.

このような構造のICソケツトを回路基板11
に実装する場合は回路基板11の穴12にプロー
ブ2の下側の接続端を全部挿入し、固定用の脚部
13の貫通孔13aにねじ14を通して回路基板
11に固定した後、回路基板11の回路にプロー
ブ2の接続端をハンダ付けする。
An IC socket with such a structure is installed on the circuit board 11.
When mounting on the circuit board 11, insert the entire lower connecting end of the probe 2 into the hole 12 of the circuit board 11, pass the screw 14 through the through hole 13a of the fixing leg 13, and fix it to the circuit board 11. Solder the connection end of probe 2 to the circuit.

しかしこの場合、プローブ2は載置するIC6
の接続端子と同一の間隔で配置してあるので、特
に近時ICが小形化し、その接続端子が高密度化
したものにあつては、その間隔は1mm以下の場合
もあり、この間隔で下端を回路基板11に接続す
るには、回路基板11の穴12も上記ICの端子
間隔と同一の必要がある。このため回路基板11
の穴12の近くのプリントパターンは極めて細か
なものにしなければならず、また穴12の周囲の
ハンダ付け用のラウンド部のパターンも相互に接
続してしまう状態となり、製作が困難な場合も生
ずるという問題があつた。
However, in this case, the probe 2 is
Since the spacing is the same as that of the connecting terminals of In order to connect the IC to the circuit board 11, the holes 12 in the circuit board 11 must also have the same spacing between the terminals of the IC. Therefore, the circuit board 11
The printed pattern near the hole 12 must be extremely fine, and the patterns of the round parts for soldering around the hole 12 may also be connected to each other, making production difficult. There was a problem.

本考案は上述のような問題を解決して回路基板
11の穴12の周辺パターンを細かくすることな
く、相互のパターンが接続してしまう状態も起ら
ないようにして、製作容易な程度のパターンでも
使用出来るICソケツトを提供することを目的と
する。
The present invention solves the above-mentioned problems and creates a pattern that is easy to manufacture without making the pattern around the hole 12 of the circuit board 11 finer and preventing the patterns from connecting with each other. The purpose is to provide an IC socket that can be used even in

(問題を解決するための手段) 本考案は上記目的を達成するために、プローブ
の上端の接触端は載置するIC6の端子と同一の
間隔で配列され、下端の回路基板11に接続する
接続端の一部又は全部は前記上端の接触端より大
きい間隔で配列されており、前記プローブの上端
の接触端及び下端の接続端は前記ソケツト本体の
上面および下面の中間において曲折して接続され
たものである。
(Means for Solving the Problem) In order to achieve the above-mentioned object, the present invention has an arrangement in which the contact ends at the upper end of the probe are arranged at the same spacing as the terminals of the IC 6 to be mounted, and the contact ends are connected to the circuit board 11 at the lower end. Some or all of the ends are arranged at intervals larger than the upper contact ends, and the upper contact end and the lower connection end of the probe are bent and connected in the middle between the upper and lower surfaces of the socket body. It is something.

なお曲折している部分としては前記プローブの
下端の接続端がない短縮プローブ21と、上端の
接触端のないリード片22と、前記短縮プローブ
21とリード片22とを接続する接続片23とで
形成したもの、若しくは前記プローブの中間部で
曲折し、この曲折部の上側及び下側の部分は互い
に平行状態で形成したもの等とすることが出来
る。
The bent portions include the shortened probe 21 that has no connecting end at the lower end of the probe, the lead piece 22 that has no contact end at the upper end, and the connecting piece 23 that connects the shortened probe 21 and the lead piece 22. Alternatively, the probe may be bent at the middle part of the probe, and the upper and lower portions of the bent part may be formed in parallel to each other.

(作用) 上述のように回路基板11に実装する場合、回
路基板11のパターンはIC6の端子のように細
かい配列ではないので、接続が極めて容易であ
る。
(Function) When mounting on the circuit board 11 as described above, since the pattern of the circuit board 11 is not arranged in a fine arrangement like the terminals of the IC 6, connection is extremely easy.

(実施例) 第1図は本考案の第1の実施例を示す要部断面
図、第2図はそのプローブの拡大斜視図で、プロ
ーブ部分以外は従来例の第4図と同じであるの
で、説明は省略する。
(Example) Fig. 1 is a sectional view of the main part showing the first embodiment of the present invention, and Fig. 2 is an enlarged perspective view of the probe. , the explanation is omitted.

プローブ部分は、従来のプローブ2と略同様で
あつて回路基板11に接続する接続端のない、即
ちソケツト本体1の取付面Mから突出しない短縮
プローブ21がIC6の端子6aと同じ間隔で配
列されている。また、これとは別にIC6の端子
6aに接触する接触端のない、即ちフローテイン
グプレート4が最下端に押下げられた場合でも、
上端がフローテイングプレート4の上面に突出し
ないリード片22が前記短縮プローブ21と平行
に適宜離隔して配列されている。これらの短縮プ
ローブ21及びリード片22のうち、対応する1
組の相互間は接続片23がハンダ付け等で接続さ
れ、電気的に導通されている。
The probe portion is substantially the same as the conventional probe 2, and has shortened probes 21 which do not have a connection end connected to the circuit board 11, that is, do not protrude from the mounting surface M of the socket body 1, and are arranged at the same spacing as the terminals 6a of the IC 6. ing. In addition, even if there is no contact end that contacts the terminal 6a of the IC 6, that is, the floating plate 4 is pushed down to the lowest end,
Lead pieces 22 whose upper ends do not protrude above the upper surface of the floating plate 4 are arranged parallel to the shortening probe 21 and spaced apart from each other as appropriate. Of these shortened probes 21 and lead pieces 22, the corresponding one
Connection pieces 23 are connected to each other by soldering or the like to provide electrical continuity between the pairs.

なお上述の短縮プローブ21及びリード片22
はソケツト本体1の下面において、接着剤25で
固定してあり、上記接続片23はこの接着剤25
の下面に、あるいは下面と同一に埋め込んで固定
してある。
Note that the above-mentioned shortened probe 21 and lead piece 22
is fixed on the lower surface of the socket body 1 with an adhesive 25, and the connecting piece 23 is attached to the adhesive 25.
It is embedded and fixed on the bottom surface of the , or flush with the bottom surface.

またプローブ2をIC6の端子全部にそれぞれ
接触するように配置する必要がない場合には、必
要個所のみの配置となるので、隣接のプローブ2
までの距離が大きい所は従来例のままのプローブ
2でも良く、隣合つているように距離の小さい個
所にのみ本考案の曲折したプローブを使用しても
良い。
In addition, if it is not necessary to arrange the probe 2 so that it contacts all the terminals of the IC 6, it is necessary to arrange the probe 2 only at the necessary places, so the adjacent probe 2
The conventional probe 2 may be used in areas where the distance is large, or the bent probe of the present invention may be used only in adjacent areas where the distance is small.

第3図は本考案の第2の実施例で、前記の短縮
プローブ21、リード片22及び接続片23を一
体化した曲折プローブ24で、この曲折部分の上
側の接触端側と下側の接続端側とは相互に平行と
なるように曲折してある。この実施例の場合、プ
ローブの曲折部分は第1図の接着剤25による固
定位置に設けられるように作られている。
FIG. 3 shows a second embodiment of the present invention, which is a bent probe 24 that integrates the shortened probe 21, the lead piece 22 and the connecting piece 23, and connects the upper contact end side and the lower side of this bent part. The ends are bent so that they are parallel to each other. In this embodiment, the bent portion of the probe is made to be in a fixed position with the adhesive 25 of FIG.

(考案の効果) 上述のようにICソケツトを回路基板11に実
装する場合、回路基板11のパターンはIC6の
端子間隔のように小さくする必要がないので、回
路基板11の製作が容易となるばかりでなく、
ICソケツトを実装する場合でも取付が容易でか
つ確実である。
(Effect of the invention) When the IC socket is mounted on the circuit board 11 as described above, the pattern of the circuit board 11 does not need to be made as small as the terminal spacing of the IC 6, so manufacturing of the circuit board 11 becomes easier. Not, but
Even when mounting an IC socket, installation is easy and reliable.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の第1の実施例のICソケツト
の要部断面図、第2図は第1図のプローブの拡大
斜視図、第3図は第2の実施例の曲折プローブの
斜視図、第4図は従来のICソケツトの断面図で
ある。 1……ソケツト本体、2……プローブ、6……
IC、21……短縮プローブ、22……リード片、
23……接続片、24……曲折プローブ。
Fig. 1 is a cross-sectional view of the main parts of an IC socket according to the first embodiment of the present invention, Fig. 2 is an enlarged perspective view of the probe of Fig. 1, and Fig. 3 is a perspective view of the bending probe of the second embodiment. , FIG. 4 is a sectional view of a conventional IC socket. 1...Socket body, 2...Probe, 6...
IC, 21... shortened probe, 22... lead piece,
23... Connection piece, 24... Bent probe.

Claims (1)

【実用新案登録請求の範囲】 1 フローテイングプレートの上面に載置された
ICの端子に上端の接触端が下方から接触する
複数のプローブをソケツト本体に植設したIC
ソケツトにおいて、前記プローブの上端の接触
端は載置するICの端子と同一の間隔で配列さ
れ、下端の回路基板に接続する接続端の一部又
は全部は前記上端の接触端より大きい間隔で配
列されており、前記プローブの上端の接触端及
び下端の接続端は前記ソケツト本体の上面及び
下面の中間において曲折して接続されてなる
ICソケツト。 2 前記曲折している部分が前記プローブの下端
の接続端がない短縮プローブと、上端の接触端
のないリード片と、前記短縮プローブとリード
片との間を接続する接続片とで形成された実用
新案登録請求の範囲第1項記載のICソケツト。 3 前記曲折している部分が前記プローブの中間
部で自体曲折し、この曲折部の上側及び下側の
部分は互いに平行状態で形成された実用新案登
録請求の範囲第1項記載のICソケツト。
[Scope of claims for utility model registration] 1. Placed on the top surface of the floating plate.
An IC with multiple probes embedded in the socket body whose upper contact ends contact the IC terminals from below.
In the socket, the upper contact ends of the probes are arranged at the same spacing as the terminals of the IC to be placed, and some or all of the lower end connection ends connected to the circuit board are arranged at larger intervals than the upper contact ends. The upper contact end and the lower connecting end of the probe are bent and connected in the middle between the upper and lower surfaces of the socket body.
IC socket. 2. The bent portion is formed by a shortened probe having no connecting end at the lower end of the probe, a lead piece having no contact end at the upper end, and a connecting piece connecting between the shortened probe and the lead piece. An IC socket as described in Claim 1 of the Utility Model Registration Claim. 3. The IC socket according to claim 1, wherein the bent portion is bent at the intermediate portion of the probe, and upper and lower portions of the bent portion are parallel to each other.
JP1986157440U 1986-10-14 1986-10-14 Expired - Lifetime JPH0537437Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986157440U JPH0537437Y2 (en) 1986-10-14 1986-10-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986157440U JPH0537437Y2 (en) 1986-10-14 1986-10-14

Publications (2)

Publication Number Publication Date
JPS6361788U JPS6361788U (en) 1988-04-23
JPH0537437Y2 true JPH0537437Y2 (en) 1993-09-21

Family

ID=31079988

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986157440U Expired - Lifetime JPH0537437Y2 (en) 1986-10-14 1986-10-14

Country Status (1)

Country Link
JP (1) JPH0537437Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW400666B (en) * 1997-01-29 2000-08-01 Furukawa Electric Co Ltd IC socket

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593029A (en) * 1982-06-23 1984-01-09 Hitachi Cable Ltd Manufacture of preform for optical fiber retaining plane of polarization
US4508405A (en) * 1982-04-29 1985-04-02 Augat Inc. Electronic socket having spring probe contacts
JPS6029373B2 (en) * 1977-07-25 1985-07-10 宇部興産株式会社 Method for producing hydroxybenzaldehyde compound
JPS60142529A (en) * 1983-12-28 1985-07-27 Yokowo Mfg Co Ltd Inspecting apparatus for circuit substrate

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029373U (en) * 1983-07-30 1985-02-27 日本電気ホームエレクトロニクス株式会社 contact probe pin

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029373B2 (en) * 1977-07-25 1985-07-10 宇部興産株式会社 Method for producing hydroxybenzaldehyde compound
US4508405A (en) * 1982-04-29 1985-04-02 Augat Inc. Electronic socket having spring probe contacts
JPS593029A (en) * 1982-06-23 1984-01-09 Hitachi Cable Ltd Manufacture of preform for optical fiber retaining plane of polarization
JPS60142529A (en) * 1983-12-28 1985-07-27 Yokowo Mfg Co Ltd Inspecting apparatus for circuit substrate

Also Published As

Publication number Publication date
JPS6361788U (en) 1988-04-23

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