JPH04116163A - Production of silver single crystal thin film and artificial metal lattice - Google Patents
Production of silver single crystal thin film and artificial metal latticeInfo
- Publication number
- JPH04116163A JPH04116163A JP23208690A JP23208690A JPH04116163A JP H04116163 A JPH04116163 A JP H04116163A JP 23208690 A JP23208690 A JP 23208690A JP 23208690 A JP23208690 A JP 23208690A JP H04116163 A JPH04116163 A JP H04116163A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- thin film
- single crystal
- silver
- crystal thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910052709 silver Inorganic materials 0.000 title claims abstract description 34
- 239000004332 silver Substances 0.000 title claims abstract description 32
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 title claims abstract description 31
- 239000010409 thin film Substances 0.000 title claims abstract description 31
- 239000013078 crystal Substances 0.000 title claims abstract description 29
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 12
- 239000002184 metal Substances 0.000 title claims abstract description 12
- 238000004519 manufacturing process Methods 0.000 title claims description 8
- 239000000758 substrate Substances 0.000 claims abstract description 44
- 239000010408 film Substances 0.000 claims abstract description 20
- 238000001659 ion-beam spectroscopy Methods 0.000 claims abstract description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 11
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 claims description 10
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 7
- 239000000395 magnesium oxide Substances 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 150000002739 metals Chemical class 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 150000003378 silver Chemical class 0.000 claims 1
- 239000002245 particle Substances 0.000 abstract description 2
- 238000012544 monitoring process Methods 0.000 abstract 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 10
- 238000002441 X-ray diffraction Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 238000000635 electron micrograph Methods 0.000 description 4
- 229910052763 palladium Inorganic materials 0.000 description 4
- 238000002128 reflection high energy electron diffraction Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000002003 electron diffraction Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、組成変調構造を有する金属人工格子のバッフ
ァー層の製造方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for manufacturing a buffer layer of a metal artificial lattice having a composition modulation structure.
(従来の技術)
銀薄膜のエピタキシャル成長はその表面構造や成長条件
への学術的興味、あるいはその低い電気抵抗から注目さ
れ研究されている。例えば、5i(111)基板上にA
g(111)を電子ビーム蒸着法により作製し、反射高
速電子線回折(RHEED)によりその結晶性を評価し
た例(ジャパニーズジャーナルオブアプライドフィジッ
クス(J、 J、 A、 P、)第17巻、第22号2
097頁)や、フッ酸洗浄した5i(100)基板上に
Ag(100)を基板温度室温で蒸着法により作製し、
低速電子線回折(LEED)によりその結晶性を評価し
た例(ジャパニーズジャーナルオブアプライドフィジッ
クス(J、 J、 A、 P、)第16巻、第3号51
9頁)、あるいは襞間したマイカ上に基板温度550に
でAg(111)を蒸着法により作製した例(シンソリ
ッドフィルムズ(Thin 5olid Films)
第81巻、L93頁)などがある。(Prior Art) Epitaxial growth of silver thin films has been attracting attention and research due to academic interest in its surface structure and growth conditions, or due to its low electrical resistance. For example, A on a 5i (111) substrate
Example of fabricating g(111) by electron beam evaporation and evaluating its crystallinity by reflection high-energy electron diffraction (RHEED) (Japanese Journal of Applied Physics (J, J, A, P,) Vol. 17, No. 22 No. 2
(p. 097), Ag(100) was prepared by vapor deposition on a 5i(100) substrate cleaned with hydrofluoric acid at a substrate temperature of room temperature,
Example of evaluating its crystallinity by low-speed electron diffraction (LEED) (Japanese Journal of Applied Physics (J, J, A, P,) Volume 16, No. 3, 51
(p. 9), or an example in which Ag (111) was fabricated on pleated mica by vapor deposition at a substrate temperature of 550°C (Thin 5solid Films).
Volume 81, page L93).
(発明が解決しようとする課題)
金属人工格子に於てその特殊な性質、例えば垂直磁気異
方性等の効果を高めるためには人工格子の結晶性を高め
ることが必要となる場合が多い。(Problems to be Solved by the Invention) In order to enhance the effects of special properties such as perpendicular magnetic anisotropy in a metal artificial lattice, it is often necessary to improve the crystallinity of the artificial lattice.
しかし、基板上に金属人工格子を結晶性よく成長させる
ことは必ずしも容易ではない。その場合には基板と金属
人工格子の間に表面平坦性のよい単結晶のバッファー層
を設けるのが有効である。However, it is not always easy to grow a metal superlattice with good crystallinity on a substrate. In that case, it is effective to provide a single crystal buffer layer with good surface flatness between the substrate and the metal superlattice.
本発明の目的は金属人工格子と基板との間に表面平坦性
のよい銀の単結晶薄膜のバッファー層を提供することに
ある。An object of the present invention is to provide a buffer layer of a silver single-crystal thin film with good surface flatness between a metal superlattice and a substrate.
(課題を解決するための手段)
本発明は、(1)基板温度が50℃以上250’C以下
で酸化マグネシウム(100)基板上、ないしシリコン
(100)基板上にイオンビームスパッタ法により形成
することを特徴とする銀(100)単結晶薄膜の製造方
法、(2)基板温度が50℃以上250℃以下でシリコ
ン(111)基板上にイオンビームスパッタ法により形
成することを特徴とする銀(111)単結晶薄膜の製造
方法、および(3)前記方法により作製した銀(100
)ないし銀(111)単結晶銀膜の上に2種類の金属を
交互に形成することを特徴とする金属人工格子の製造方
法である。(Means for Solving the Problems) The present invention provides (1) formation by ion beam sputtering on a magnesium oxide (100) substrate or a silicon (100) substrate at a substrate temperature of 50°C or more and 250'C or less; (2) A method for producing a silver (100) single crystal thin film, characterized in that the silver (100) single crystal thin film is formed by ion beam sputtering on a silicon (111) substrate at a substrate temperature of 50° C. or higher and 250° C. or lower. 111) A method for producing a single crystal thin film, and (3) a method for producing a silver (100
) to silver (111) This is a method for producing a metal superlattice, characterized by forming two types of metals alternately on a single crystal silver film.
(実施例)
以下本発明について実施例により説明する。第1図およ
び第2図は、本発明の鎖車結晶薄膜の模式図である。5
i(100)、あるいはMgO基板1上にAg(100
)単結晶膜2が、5i(111)基板1上にAg(11
1)が積層されている。本発明に当たっては第3図に示
したイオンビームスパッタ装置を用いた。真空チャンバ
ー10はカウフマン型イオン源11を装備し、Agター
ゲット5をスパッタする。スパッタされた粒子5′は天
板6で発散視野が制限され、更に真空チャンバー外部か
ら駆動されるシャッター7及び水晶振動子膜厚計8によ
り膜厚をモニターしなからシャッターの開閉により、A
g薄膜が形成される。9はヒーター、12は真空ポンプ
、13はゲートバルブ、14は基板ホルダーである。こ
の時、チャンバー内の真空度はlXl0 ’torr、
基板面内の膜厚分布を避けるために基板に60rppm
の回転を与えている。イオン源4の出力を600v、2
0mAとした時にAgの成膜速度は0.2A/seeで
あった。(Example) The present invention will be described below with reference to Examples. 1 and 2 are schematic diagrams of the chain wheel crystal thin film of the present invention. 5
i(100), or Ag(100) on MgO substrate 1
) single-crystal film 2 is formed on a 5i (111) substrate 1.
1) are laminated. In the present invention, an ion beam sputtering apparatus shown in FIG. 3 was used. The vacuum chamber 10 is equipped with a Kauffman type ion source 11 and sputters an Ag target 5. The sputtered particles 5' have a divergent field of view restricted by the top plate 6, and the film thickness is monitored by a shutter 7 and a crystal resonator film thickness meter 8 driven from outside the vacuum chamber.
g A thin film is formed. 9 is a heater, 12 is a vacuum pump, 13 is a gate valve, and 14 is a substrate holder. At this time, the degree of vacuum in the chamber is lXl0 'torr,
60 rpm on the substrate to avoid film thickness distribution within the substrate plane.
It gives a rotation of The output of ion source 4 is 600v, 2
At 0 mA, the Ag film formation rate was 0.2 A/see.
以上の条件で、まず基板としてMg0(100)を用い
、基板温度を一50℃から600℃の条件で1500A
の厚さの銀薄膜を作製し、X線回折および反射高速電子
線回折(RHEED)により、それぞれの膜の結晶性を
調べた。基板温度150℃のときのX線回折の結果を第
4図、電子顕微鏡写真を第6図(a)、(b)に示す。Under the above conditions, first, Mg0 (100) was used as the substrate, the substrate temperature was from -50℃ to 600℃, and the temperature was 1500A.
A thin silver film having a thickness of 100 ml was prepared, and the crystallinity of each film was examined by X-ray diffraction and reflection high-energy electron diffraction (RHEED). The results of X-ray diffraction at a substrate temperature of 150° C. are shown in FIG. 4, and the electron micrographs are shown in FIGS. 6(a) and (b).
第6図のRHEEDの2つのパターンは互いに45度離
れており、4回対称のパターンで、第6図(a)は(1
10)、第6図(b)は(100)から見たものである
。The two RHEED patterns in Figure 6 are 45 degrees apart from each other and have a 4-fold symmetry, and Figure 6(a) is (1
10), FIG. 6(b) is seen from (100).
鋭いAg(200)ピークが観測されたX線回折の結果
とあわせて考えると、銀の(100)単結晶薄膜ができ
ているのがわかる。(110)からみたストリーク間の
幅から銀の(110)の格子面間隔は2.88A、(1
00)からみたストリーク間の幅から銀の(100)の
格子面間隔は4.08Aである。この膜は、第6図のパ
ターンがストリークから成り、しかも表面は鏡面である
ことから平坦性の良いこともわかった。平坦性の良い鏡
面の銀の(100)単結晶薄膜は基板温度50℃〜25
0℃の間でのみ得られた。一方、基板温度が50℃より
低いときには銀薄膜は多結晶であった。また、250℃
より高い温度で作製した試料は(100)単結晶薄膜だ
が、試料表面が白濁し表面の平坦性が悪かった。また、
同様の結果がフッ酸洗浄をおこなった5i(100)基
板を用いた場合にも得られた。なおフッ酸洗浄をおこな
わずに5i(100)基板上に銀薄膜を作製すると表面
の一部が白濁し平坦性が悪くなる場合があった。When considered together with the results of X-ray diffraction in which a sharp Ag (200) peak was observed, it can be seen that a (100) single crystal thin film of silver was formed. From the width between the streaks as seen from (110), the (110) lattice spacing of silver is 2.88A, (1
The (100) lattice spacing of silver is 4.08A based on the width between the streaks when viewed from 00). It was also found that this film had good flatness because the pattern shown in FIG. 6 consisted of streaks and the surface was a mirror surface. Silver (100) single-crystal thin film with good flatness has a substrate temperature of 50°C to 25°C.
Obtained only between 0°C. On the other hand, when the substrate temperature was lower than 50° C., the silver thin film was polycrystalline. Also, 250℃
The sample prepared at a higher temperature was a (100) single crystal thin film, but the sample surface was cloudy and the surface flatness was poor. Also,
Similar results were obtained when using a 5i (100) substrate that had been cleaned with hydrofluoric acid. Note that if a silver thin film is produced on a 5i (100) substrate without hydrofluoric acid cleaning, a part of the surface may become cloudy and the flatness may deteriorate.
次に、基板としてフッ酸洗浄を行った5i(111)を
用い、基板温度を一50℃から600℃の条件で150
0Aの厚さの銀薄膜を作製し、X線回折およびRHEE
Dにより、それぞれの膜の結晶性を調べた。基板温度1
50℃のときの結果を第5図に、電子顕微鏡写真を第7
図(a)、(b)に示す。第7図の2つのパターンは互
いに30度離れており、6回対称のパターンで、第7図
(a)は(110)、第7図(b)は(221)から見
たものである。鋭いAg(111)ピークが観測された
X線回折の結果とあわせて考えると、銀の(111)単
結晶ができているのがわかる。(110)および(22
1)からみたストリーク間の輻から銀の(110)の格
子面間隔は2.88Aである。この膜は、第7図のパタ
ーンがストリークから成り、しかも表面が鏡面であるこ
とから平坦性もよいことがわかった。平坦性の良い鏡面
の銀の(111)単結晶薄膜は基板温度50’C〜25
0’Cの間でのみ得られた。一方、基板温度が50℃よ
り低いときには銀薄膜は多結晶であった。また、
250’Cより高温で作製した試料は(111)単結晶
薄膜だが、試料表面が白濁し表面の平坦性が悪かった。Next, using 5i (111) that had been cleaned with hydrofluoric acid as a substrate, the substrate temperature was set at 150°C to 600°C.
A silver thin film with a thickness of 0A was prepared, and X-ray diffraction and RHEE
The crystallinity of each film was examined using D. Substrate temperature 1
The results at 50°C are shown in Figure 5, and the electron micrograph is shown in Figure 7.
Shown in Figures (a) and (b). The two patterns in FIG. 7 are 30 degrees apart from each other and have six-fold symmetry, and FIG. 7(a) is seen from (110) and FIG. 7(b) is seen from (221). When considered together with the results of X-ray diffraction in which a sharp Ag (111) peak was observed, it can be seen that a (111) single crystal of silver is formed. (110) and (22
1) The (110) lattice spacing of silver from the convergence between streaks is 2.88A. It was found that this film had good flatness because the pattern shown in FIG. 7 consisted of streaks and the surface was a mirror surface. A silver (111) single crystal thin film with a mirror surface with good flatness is produced at a substrate temperature of 50'C to 25°C.
Obtained only between 0'C. On the other hand, when the substrate temperature was lower than 50° C., the silver thin film was polycrystalline. Further, although the sample prepared at a temperature higher than 250'C was a (111) single crystal thin film, the sample surface was cloudy and the surface flatness was poor.
なおフッ酸洗浄をおこなわずに5i(111)基板上に
銀薄膜を作製すると表面の一部が白濁し平坦性が悪くな
る場合があった。Note that if a silver thin film was produced on a 5i (111) substrate without hydrofluoric acid cleaning, a part of the surface would become cloudy and the flatness would deteriorate.
つぎにこのようにして作製した平坦性のよい銀星結晶薄
膜、Ag(100)あるいはAg(111)上にCo/
PdおよびCo/Au人工格子を作製しVSMおよびト
ルク磁力計で垂直磁気異方性エネルギーを求め、Mg0
(100)、5i(100)および5i(111)基板
上に直接Co/Pd人工格子を作製した場合と比較を行
った。作製したCo/PdおよびCo/Au人工格子は
すべて二元イオンビームスパッタ法で作製したものでC
o層が3A、 Pd層ないしAu層が60A、繰り返し
周期が40回である。その結果を第1表および第2表に
示す。Next, the silver star crystal thin film with good flatness prepared in this way, Co/
Pd and Co/Au superlattices were prepared, and the perpendicular magnetic anisotropy energy was determined using a VSM and a torque magnetometer, and Mg0
A comparison was made with cases in which Co/Pd artificial lattices were directly fabricated on (100), 5i (100), and 5i (111) substrates. The Co/Pd and Co/Au artificial lattices were all fabricated by binary ion beam sputtering.
The O layer is 3A, the Pd layer or Au layer is 60A, and the repetition period is 40 times. The results are shown in Tables 1 and 2.
第1表
第2表
表の通り、銀の単結晶薄膜をバッファー層として用いる
ことにより、Co/PdおよびCo/Au両者とも垂直
磁気異方性エネルギーが高く、特性のよい垂直磁化膜を
得ることができた。また、Co/PdではAg(111
)のほうが、Co/AuではAg(100)のほうが効
果が高い。As shown in Tables 1 and 2, by using a silver single-crystal thin film as a buffer layer, it is possible to obtain perpendicularly magnetized films with high perpendicular magnetic anisotropy energy and good characteristics for both Co/Pd and Co/Au. was completed. In addition, in Co/Pd, Ag(111
) is more effective than Co/Au, Ag(100) is more effective.
(発明の効果)
以上実施例にて説明したように本発明によれば、表面平
坦性のよい(100)、および(111)の銀星結晶薄
膜が得られ、これをバッファー層として用いることによ
り、従来のものより特性のよい金属人工格子を作製する
ことが出来るものである。(Effects of the Invention) As explained in the examples above, according to the present invention, silver star crystal thin films of (100) and (111) with good surface flatness can be obtained, and by using this as a buffer layer. , it is possible to produce a metal artificial lattice with better properties than conventional ones.
第1図および第2図は本発明の単結晶銀薄膜の構造を示
す模式図。第3図は本発明を実施するために用いたイオ
ンビームスパッタ装置の模式図。
第4図はMg0(100)基板上に作製したAg薄膜の
X線回折図、第6図(a)、(b)はその電子顕微鏡写
真、第5図は5i(111)基板上に作製したAg薄膜
のX線回折図、第7図(a)、(b)はその電子顕微鏡
写真。
図において、1はSi又はMgO基板、2はAg単結晶
膜、5はターゲット、7はシャッター、1oは真空チャ
ンバー、11はイオン源である。FIGS. 1 and 2 are schematic diagrams showing the structure of the single crystal silver thin film of the present invention. FIG. 3 is a schematic diagram of an ion beam sputtering apparatus used to carry out the present invention. Figure 4 is an X-ray diffraction diagram of the Ag thin film fabricated on the Mg0 (100) substrate, Figures 6 (a) and (b) are its electron micrographs, and Figure 5 is the Ag thin film fabricated on the 5i (111) substrate. The X-ray diffraction diagram of the Ag thin film, and FIGS. 7(a) and (b) are its electron micrographs. In the figure, 1 is a Si or MgO substrate, 2 is an Ag single crystal film, 5 is a target, 7 is a shutter, 1o is a vacuum chamber, and 11 is an ion source.
Claims (3)
ネシウム(100)基板上、ないしシリコン(100)
基板上にイオンビームスパッタ法により形成することを
特徴とする銀(100)単結晶薄膜の製造方法。(1) On a magnesium oxide (100) substrate or silicon (100) at a substrate temperature of 50°C or more and 250°C or less
A method for producing a silver (100) single crystal thin film, the method comprising forming a silver (100) single crystal thin film on a substrate by ion beam sputtering.
(111)基板上にイオンビームスパッタ法により形成
することを特徴とする銀(111)単結晶薄膜の製造方
法。(2) A method for producing a silver (111) single crystal thin film, which is characterized in that it is formed on a silicon (111) substrate by ion beam sputtering at a substrate temperature of 50° C. or higher and 250° C. or lower.
00)あるいは銀(111)単結晶膜を形成し、この銀
膜の上に2種類の金属を交互に形成することを特徴とす
る金属人工格子の製造方法。(3) Silver (1
00) or silver (111) single crystal film is formed, and two types of metals are alternately formed on this silver film.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP02232086A JP3074712B2 (en) | 1990-08-31 | 1990-08-31 | Method for producing silver single crystal thin film and metal artificial lattice |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP02232086A JP3074712B2 (en) | 1990-08-31 | 1990-08-31 | Method for producing silver single crystal thin film and metal artificial lattice |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04116163A true JPH04116163A (en) | 1992-04-16 |
JP3074712B2 JP3074712B2 (en) | 2000-08-07 |
Family
ID=16933782
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP02232086A Expired - Lifetime JP3074712B2 (en) | 1990-08-31 | 1990-08-31 | Method for producing silver single crystal thin film and metal artificial lattice |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3074712B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004533538A (en) * | 2000-07-10 | 2004-11-04 | オプネティクス コーポレイション | Double scan thin film processing system |
WO2023249493A1 (en) * | 2022-06-21 | 2023-12-28 | University Of South-Eastern Norway | Process for producing single crystal-like silver films |
-
1990
- 1990-08-31 JP JP02232086A patent/JP3074712B2/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004533538A (en) * | 2000-07-10 | 2004-11-04 | オプネティクス コーポレイション | Double scan thin film processing system |
WO2023249493A1 (en) * | 2022-06-21 | 2023-12-28 | University Of South-Eastern Norway | Process for producing single crystal-like silver films |
NO347559B1 (en) * | 2022-06-21 | 2024-01-15 | Univ Of South Eastern Norway | Process for producing single crystal silver films |
Also Published As
Publication number | Publication date |
---|---|
JP3074712B2 (en) | 2000-08-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5603766A (en) | Method for producing uniaxial tetragonal thin films of ternary intermetallic compounds | |
US20030126742A1 (en) | Method of fabrication of ZnO nanowires | |
CN100545314C (en) | Be used to prepare the in-situ treatment method of sapphire substrate of high-quality zinc oxide film | |
WO2002103815A1 (en) | Superconducting thin film having columnar pin retaining center using nano-dots | |
Headrick et al. | Ion-assisted nucleation and growth of GaN on sapphire (0001) | |
JPH04116163A (en) | Production of silver single crystal thin film and artificial metal lattice | |
KR100422333B1 (en) | Method for manufacturing a metal film having giant single crystals and the metal film | |
JP3841272B2 (en) | Sb2Te3 single crystal thin film and manufacturing method thereof | |
JP3773899B2 (en) | Magnetic semiconductor material and manufacturing method thereof | |
JPH09256139A (en) | Production of zinc oxide film | |
EP0485729B1 (en) | Soft magnetic film of iron and process of formation thereof | |
WO2003052159A1 (en) | Amorphous ferrosilicide film exhibiting semiconductor characteristics and method for producing the same | |
US5863661A (en) | Method of enhancing the c-axis perpendicular orientation of barium hexaferrite thin films and barium hexaferrite thin film recording media produced thereby | |
Kaverina et al. | Solid phase epitaxial growth anisotropy of vacuum‐deposited amorphous silicon | |
JP3916454B2 (en) | Method for producing β-FeSi2 thin film | |
JP2004307310A (en) | METHOD FOR MANUFACTURING Fe-Si-BASED THIN FILM, AND Fe-Si-BASED THIN FILM | |
JP4761090B2 (en) | Method for producing epitaxial multilayer film for soft X-ray mirror | |
JPH0721544A (en) | Magnetic recording medium and its production | |
JP2721869B2 (en) | Method for manufacturing diluted magnetic semiconductor thin film | |
JPH07335575A (en) | Manufacture of thin film | |
US4876144A (en) | Single crystal thin film | |
JP2636860B2 (en) | Method for manufacturing thin film for magneto-optical recording | |
JP3598360B2 (en) | Manufacturing method of magnetic fine wire | |
JP2777599B2 (en) | Manufacturing method of single crystal thin film | |
US20030209189A1 (en) | Magnetic material and method for preparation thereof |