JPH04114637U - Measuring device with data duplication mechanism - Google Patents

Abstract

(57) [Summary] [Purpose] To provide a measuring device equipped with a data duplication mechanism that can safely ensure correct data even if data is lost due to bit inversion or the like. [Structure] In a measurement device that stores the data necessary for measurement in a non-volatile memory, the data storage area is duplicated in the non-volatile memory, and the data in each area of the non-volatile memory is compared to detect errors. A measuring device equipped with a data duplication mechanism, characterized in that it is equipped with a control means for replacing data in a detected area with data in an area in which no errors are detected.

Description

[Detailed explanation of the idea]

0001

[Industrial application field]

The present invention relates to measurement equipment, and in particular to measuring data that occurs during data storage in non-volatile memory. Equipped with a data structure that can safely repair data changes due to cut reversal, etc. Concerning a measuring device.

0002

[Conventional technology]

In measurement equipment, backup power is required to save panel settings and correction values. Unnecessary non-volatile memory is widely used. However, non-volatile memory During storage, data changes (bit inversion) may occur due to charge leakage, etc.

0003 For this reason, when storing important data in non-volatile memory, data changes may occur. You need data protection that can detect and repair any occurrences.

0004

[Problem that the idea aims to solve]

Conventionally, checks using sum values, which have been widely used, do not detect changes in data. can be detected, but the location of the error cannot be detected. Therefore, data repair You cannot take revenge.

[0005] Additionally, parity checking can also detect error positions. death However, non-volatile memory erases data in units of words during data rewriting. Write after. Therefore, if the device is powered off during data recovery, In such cases, there is a problem in that the damage caused by data destruction becomes greater.

[0006] The present invention was made with attention to these points, and its purpose is to Even if data is lost due to data transfer, the correct data can be safely secured. The object of the present invention is to provide a measuring device equipped with a data duplication mechanism capable of performing data duplication.

[0007]

[Means to solve the problem]

This invention solves the above problems by storing the data necessary for measurement in non-volatile memory. In the measuring device, Non-volatile memory with dual data storage areas, Errors are detected by comparing the data in each area of non-volatile memory, and the error is detected. control means for replacing the data in the area where the error has been detected with the data in the area where no error has been detected. A measuring device equipped with a data duplication mechanism characterized by:

[0008]

[Effect]

In this invention, the data stored in non-volatile memory is duplicated and If a data change (error) occurs due to write reversal, etc., the data in any area Whether a data change has occurred is detected based on the sum value. and the error is detected The data in the area where the error was detected is replaced with the data in the area where no error has been detected. As a result , ensuring correct data.

[0009]

【Example】

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

0010 FIG. 1 is a configuration diagram showing an embodiment of the present invention, and FIG. 2 is a diagram showing an apparatus having the configuration shown in FIG. 1. Figure 3 is a PAD (Problem Analysis Diagram) showing the flow of operation. FIG. 2 is an explanatory diagram showing an example of a data structure.

[0011] As shown in Figure 1, the man-machine section 1, such as the CRT and keyboard, is the CPU board. 2, and this CPU board 2 is connected to the clock generation board via the bus. 3 and a waveform output board 4 equipped with non-volatile memory are connected. Furthermore, this figure In this case, a 4-channel waveform output board is used.

0012 In addition, the nonvolatile memory in the waveform output board 4 is duplicated as shown in FIG. It has two data areas (area A/area B). In this figure, the waveform generation The case of attenuator correction value data is shown. Also, other than that, Board ID, software version, hard version, etc. are also stored in both areas. There is.

[0013] Here, with reference to the problem analysis diagram in Figure 2, we will explain how to detect errors in data in non-volatile memory. , restoration (data restoration processing routine) will be explained. In addition, in the following explanation, Consider the case where EEPROM is used as volatile memory.

[0014] <Initialization of error flag> First, the error flag in the data recovery processing routine in the CPU is initialized to 0. Set to .

[0015] <Error detection in area A> Next, check the checksum for area A of the non-volatile memory. And Ella - is detected, the error flag is set to 1.

[0016] <Error detection in area B> Next, check the checksum for area B of the non-volatile memory. And Ella - is detected, add 2 to the error flag.

[0017] <Master/slave settings> Here, based on the error detection result (error flag value), the duplicated data is Performs master/slave setting processing.

[0018] If the error flag is 0, both areas A and B in nonvolatile memory are normal. Then, proceed to the normal processing routine.

[0019] If the error flag is 1, a data error has occurred in area A, and area B is correct. It shows that it is normal. Therefore, set area A to the slave side and set area B to the slave side. Set on the star side.

[0020] If the error flag is 2, a data error has occurred in area B, and area A is correct. It shows that it is normal. Therefore, set area B on the slave side and area A on the slave side. Set on the star side.

[0021] If the error flag is 3, there is a data error in both areas A and B in the nonvolatile memory. Since this has occurred, execute the error handling routine.

[0022] <Data recovery> If either area is normal (error flag value = 1, 2), the above Rewrite the slave side with the data set as master in master/slave processing Ru. In other words, the addresses from the beginning to the beginning of the repair history are generated sequentially, and the master and One word of data is read from both the slave and the slave. Then, compare both data. and replace slave data with master data where differences are detected. . Then, if no difference is detected between both data, or if a difference is detected and the data is When data rewriting is completed, calculate the sum value.

[0023] <Repair history update> Then, increase the repair history of the area set on the master side by one, and Store in. This records that the data has been repaired.

[0024] <Updating the sum value> Here, the sum value is calculated based on the repair history data, and the sum value storage location of areas A and B is calculated. Store in.

[0025] <Normal processing routine> After completing the above data correction processing, return to the normal processing routine and continue normal processing. go

[0026] As described above, according to this embodiment, data is generated by bit inversion during data storage. Changes can be detected. Also, if the power of the device was cut off during the repair process, Even if the I can do that. Therefore, improving the reliability of measurement equipment using non-volatile memory effective.

[0027]

[Effect of the idea]

As explained in detail above, according to the present invention, data can be changed by bit reversal, etc. Data duplication mechanism that can safely ensure correct data even if data is missing It is possible to realize a measuring device equipped with

[Brief explanation of drawings]

FIG. 1 is a configuration diagram showing an embodiment of the present invention.

FIG. 2 is an explanatory diagram showing an example of a processing flow in an embodiment of the present invention.

FIG. 3 is an explanatory diagram showing an example of data arrangement of a device according to an embodiment of the present invention.

[Explanation of symbols]

1 Man-Machine Department 2 CPU board 3 Clock generation board 4 Waveform output board

Claims (1)

[Scope of utility model registration request] 1. In a measuring device that stores data necessary for measurement in a non-volatile memory, an error is detected by comparing data in each area of the non-volatile memory with a non-volatile memory having a dual data storage area, A measuring device equipped with a data duplication mechanism, characterized in that it is equipped with a control means for replacing data in an area where an error has been detected with data in an area where no error has been detected.