JPH04109313U - Laser interferometer measurement object adjustment table - Google Patents

Laser interferometer measurement object adjustment table

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Publication number
JPH04109313U
JPH04109313U JP1781591U JP1781591U JPH04109313U JP H04109313 U JPH04109313 U JP H04109313U JP 1781591 U JP1781591 U JP 1781591U JP 1781591 U JP1781591 U JP 1781591U JP H04109313 U JPH04109313 U JP H04109313U
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Japan
Prior art keywords
stand
pedestal
measured
adjustment
axis
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JP1781591U
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Japanese (ja)
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JP2546026Y2 (en
Inventor
重徳 大井
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富士写真光機株式会社
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Abstract

(57)【要約】 〔目的〕 同一サイズの被験物を次々に検査するための
操作性の向上とコンパクト化を図る。 〔構成〕 スタンド上(1)上に取付けられる基台
(5)上に支柱(2)に沿って立ち上る立壁(6)を設
け、この立壁(6)からレーザー導光光学系の光軸を越
えて突出し立壁に沿って上下動可能に受台(7)を設
け、受台(7)の上面に左右にスライドするスライド台
(19)を設けてある。このスライド台(19)上にX
軸及びY軸の各方向の調整を図るXYステージ(8)を
取付けてある。
(57) [Summary] [Purpose] To improve operability and make the system more compact for testing test objects of the same size one after another. [Structure] A standing wall (6) that rises along the pillar (2) is provided on the base (5) that is attached to the stand (1). A pedestal (7) is provided so as to be movable up and down along the protruding vertical wall, and a slide pedestal (19) that slides from side to side is provided on the upper surface of the pedestal (7). X on this slide stand (19)
An XY stage (8) is attached for adjustment in each direction of the axis and the Y axis.

Description

【考案の詳細な説明】[Detailed explanation of the idea]

【0001】0001

【産業上の利用分野】[Industrial application field]

この考案は、レーザー干渉計の被測定物調整台に関するものである。 This invention relates to a measuring object adjustment table for a laser interferometer.

【0002】0002

【従来の技術】[Conventional technology]

従来の被測定物調整台は、スタンドから立上る支柱に干渉計本体を取付け、干 渉計のレーザー光を下方に出射するレーザー干渉計においては、図8に示すよう にX軸及びY軸の各方向への調整を図るXYステージ100を基台101上に設 け、XYステージ100上にZ軸方向(上下方向)の調整を図る立壁102を設 け、この立壁102上に被測定物載置用の載置台103を設けていた。 In the conventional DUT adjustment stand, the interferometer body is attached to a support that rises from the stand. In a laser interferometer that emits the laser beam of the interferometer downward, as shown in Figure 8, An XY stage 100 for adjustment in each direction of the X axis and Y axis is installed on a base 101. A vertical wall 102 is provided on the XY stage 100 for adjustment in the Z-axis direction (vertical direction). A mounting table 103 for mounting an object to be measured was provided on this vertical wall 102.

【0003】0003

【考案が解決しようとする課題】[Problem that the idea aims to solve]

従来の被測定物調整台は、被測定物を交換する時に被測定物をその光軸方向に 動かしていたので、被測定物と基準レンズとが接触していずれか一方又は両方が 破損する場合があった。 そこで、この考案は、被測定物を交換する時に、基準レンズとの接触を防ぐと ともに、被測定物の測定時における操作性の向上、特に同一種類の被測定物を次 々に測定するための操作性の向上とコンパクト化を図ったレーザー干渉計の被測 定物調整台を提供することを目的とする。 Conventional workpiece adjustment tables align the workpiece in the direction of its optical axis when replacing the workpiece. As the object was being moved, the object to be measured and the reference lens may come into contact and cause one or both of them to It could get damaged. Therefore, this idea was developed to prevent contact with the reference lens when replacing the measured object. Both improve operability when measuring objects to be measured, especially when measuring the same type of object next time. A laser interferometer with improved operability and compactness for various measurements The purpose is to provide a fixed object adjustment table.

【0004】0004

【課題を解決するための手段】[Means to solve the problem]

上述の目的を達成するため、この考案は、少なくともレーザーとレーザー導光 光学系を備えた干渉計本体をスタンドから立上る支柱に取付け、前記レーザー導 光光学系から出射されるレーザー光束中に被測定物載置用の載置台を設けたレー ザー干渉計の被測定物調整台であって、前記スタンド上に取付けられる基台上に 前記支柱に沿って立ち上る立壁を設け、前記立壁から前記レーザー導光光学系の 光軸を越えて突出し前記立壁に沿って上下動可能に受台を設け、前記受台の上面 に左右にスライドするスライド台を設け、前記スライド台上にX軸及びY軸の各 方向の調整を図るXYステージを取付けたものである。 To achieve the above objectives, this invention uses at least a laser and a laser light guide. The interferometer body equipped with the optical system is attached to a support that rises from the stand, and the laser guide A laser with a mounting table for placing the object to be measured in the laser beam emitted from the optical optical system. A measurement object adjustment stand for a laser interferometer, which is mounted on a base that is attached to the stand. A standing wall rising along the pillar is provided, and the laser light guiding optical system is connected from the standing wall. A pedestal is provided that protrudes beyond the optical axis and is movable up and down along the vertical wall, and the top surface of the pedestal is A slide stand that slides left and right is provided on the slide stand, and each of the X-axis and Y-axis It is equipped with an XY stage for directional adjustment.

【0005】[0005]

【作用】[Effect]

この考案において、初めに基台の傾斜具合を調整してスタンドに取付けると、 レーザー導光光学系の光軸と立壁とが平行になり、この状態で基台をスタンド上 に固定する。Z軸方向の移動は、立壁に取付けた受台の上下移動で行い、X軸、 Y軸の各方向の移動はXYステージにより行う。次いで、被測定物をXYステー ジ上の載置台(又は2軸調整台の上面)に載置し、基準レンズの集光点に被測定 物の中心をもってくる。これにより、基準レンズの基準面からの反射光と被測定 物の被測定面からの反射光とによる干渉縞が発生する。この干渉縞を図示してい ないモニターを通して確認できたら上下方向を調整するZステージで被測定物を 光軸の方向へ移動させてゆく。小さな干渉縞が画面から逃げないようにXYステ ージを調整しながら、再び干渉縞が大きく見えはじめたらZステージの粗動調整 用の固定用つまみをロックする。次にZステージの微調整用のつまみ及びXYス テージの調整つまみで干渉縞を見やすくする。同一種類の被測定物を測定し、し かも被測定物が基準レンズに接近している場合には、スライド台をX方向(左右 方向)に移動させて、被測定物を基準レンズの光軸外に退避させる。被測定物が 基準レンズと充分な距離をへだてていることを確認してから、被測定物を次の被 測定物と交換する。交換後、スライド台を逆方向に移動させて、基準レンズの光 軸上に次の被測定物が位置するようにする。 In this idea, if you first adjust the inclination of the base and attach it to the stand, The optical axis of the laser guiding optical system is parallel to the vertical wall, and in this state, place the base on the stand. Fixed to. Movement in the Z-axis direction is performed by moving the pedestal attached to the vertical wall up and down, and Movement in each direction of the Y axis is performed by an XY stage. Next, place the object to be measured on the XY stay. Place the measured object on the mounting table (or the top surface of the 2-axis adjustment table) on the camera, and place it on the focal point of the reference lens. Bring the center of things. This allows the reflected light from the reference surface of the reference lens and the measured Interference fringes occur due to reflected light from the surface to be measured of the object. The diagram shows this interference pattern. Once the object is confirmed through the monitor, move the object to be measured using the Z stage that adjusts the vertical direction. Move it in the direction of the optical axis. To prevent small interference fringes from escaping the screen, While adjusting the stage, if the interference fringes start to appear large again, adjust the coarse movement of the Z stage. Lock the fixing knob. Next, adjust the knobs for fine adjustment of the Z stage and the XY stage. Make the interference fringes easier to see with the stage adjustment knob. Measure the same type of object and If the object to be measured is close to the reference lens, move the slide table in the X direction (left and right). direction) to move the object to be measured out of the optical axis of the reference lens. The object to be measured After confirming that the object is at a sufficient distance from the reference lens, move the object to the next object. Replace it with the object to be measured. After replacing, move the slide stand in the opposite direction and adjust the light from the reference lens. Position the next object to be measured on the axis.

【0006】[0006]

【実施例】【Example】

以下に、この考案の好適な一実施例を図面を参照にして説明する。 図1において、スタンド1から立上る支柱2に少なくともレーザーとレーザー 導光光学系を備えた干渉計本体3(図2参照)を取付け、干渉計のレーザーから 出射されたレーザー光をレーザー導光光学系を介して下方に導く。スタンド1上 に取付けられる基台5に支柱2に沿って立上り基台5と直角な立壁6を設けてあ る。この立壁6に上下動可能に基台5と平行に延びる受台7を設ける。この受台 7に設けたX軸及びY軸の各方向への調整を図るXYステージ8に2軸調整台9 を設ける。この2軸調整台9の上面9Aが被測定物Sの載置面を兼用する場合も あり(図6参照)、被測定物が小さい場合には前記上面9A上に載置台4を載置 する。この場合、載置台4は前記レーザー導光光学系の光路中に位置するように する。符号10はXYステージ8の調整つまみを示し、符号11は2軸調整台9 の調整つまみを夫々示す。また、符号3Aはレーザー導光光学系の光軸上であっ て、干渉計本体3のレーザー光出射出口に設けられた基準レンズを示す。受台7 の立壁6に取付く基端部7Aにはロッド12を介して移動ブロック13が取付け てある。ロッド12の下端には微調節用のつまみ14を設けてある。移動ブロッ ク13も立壁6に対して上下動可能に取付けてあり、固定用つまみ15により粗 調整ができるようになっている。この固定用つまみ15を解除することにより受 台7の粗調整を行い所定の位置に固定し、調整つまみ14により受台7の微調整 を行う。また、立壁6には位置決め用のストッパ16を設けてある。この例では 、受台7を上昇させすぎて基準レンズ3Aを破壊したりしないように、受台7の 上昇高さをこのストッパ16で規制している。支柱2には干渉計本体3の上下動 を図るための調整つまみ17を設けてある。立壁6と受台7との間にはバランサ ー18を設け、受台7が急激に落下するのを防ぐようになっている。このバラン サー18は薄い鋼板18Bを用い、この鋼板18Bは受台7の基端部7Aの中で コイル状に巻かれているものであり、スチールの巻き尺と同様の構造である。前 述のXYステージ8はスライド台19に取付けてあり、このスライド台19のス ライドはロックノブ20によりロックされるようになっている。 A preferred embodiment of this invention will be described below with reference to the drawings. In Figure 1, at least a laser and a laser Attach the interferometer body 3 (see Figure 2) equipped with a light guide optical system, and The emitted laser light is guided downward through a laser light guide optical system. Stand 1 top A standing wall 6 is provided along the pillar 2 and perpendicular to the base 5, which is attached to the base 5. Ru. A pedestal 7 is provided on this standing wall 6 and extends parallel to the base 5 so as to be movable up and down. This pedestal A two-axis adjustment table 9 is attached to the XY stage 8 provided in the XY stage 7 for adjustment in each direction of the will be established. In some cases, the upper surface 9A of this two-axis adjustment table 9 also serves as the mounting surface for the object to be measured S. Yes (see Figure 6), if the object to be measured is small, place the mounting table 4 on the upper surface 9A. do. In this case, the mounting table 4 is positioned in the optical path of the laser light guiding optical system. do. Reference numeral 10 indicates an adjustment knob of the XY stage 8, and reference numeral 11 indicates a two-axis adjustment table 9. The adjustment knobs are shown respectively. Moreover, the code 3A is on the optical axis of the laser light guiding optical system. A reference lens provided at the laser beam exit of the interferometer main body 3 is shown. pedestal 7 A moving block 13 is attached via a rod 12 to the base end 7A attached to the vertical wall 6. There is. A knob 14 for fine adjustment is provided at the lower end of the rod 12. moving block The lock 13 is also attached to the vertical wall 6 so that it can move up and down, and is roughly adjusted by a fixing knob 15. Adjustments can be made. By releasing this fixing knob 15, Make rough adjustments to the pedestal 7 and fix it in a predetermined position, then use the adjustment knob 14 to finely adjust the pedestal 7. I do. Further, the vertical wall 6 is provided with a stopper 16 for positioning. In this example , to prevent the pedestal 7 from rising too high and damaging the reference lens 3A. The rising height is regulated by this stopper 16. The vertical movement of the interferometer body 3 is mounted on the pillar 2. An adjustment knob 17 is provided for this purpose. A balancer is installed between the standing wall 6 and the pedestal 7. -18 is provided to prevent the pedestal 7 from falling suddenly. This balun The steel plate 18B is made of a thin steel plate 18B. It is wound into a coil, and has a similar structure to a steel tape measure. Before The XY stage 8 mentioned above is attached to a slide stand 19, and the slide stand 19 is The ride is designed to be locked by a lock knob 20.

【0007】 図3は正面から見た部分的な断面図であり、前述のロッド12の下端に微調整 用のつまみ14が固着され、このロッド12の上半分12Aはネジが切ってあり 、この上半分12Aのネジを切った部分がスリーブ24にねじ込まれる。移動ブ ロック13は、固定用つまみ15に固定されているので、ロッド12の一方向の 回転により、受台7を下方に押し下げる。これにより2軸調整台9が下方に下げ られて基準レンズ3Aを透過した波面と載置面9A上に載置された被測定物Sの 被測定面からの反射光の波面とを一致させる。この結果、基準レンズ3Aの基準 面からの反射光と被測定面からの反射光とによる干渉縞が観察できる。また、受 台7の下面にはゴム等の緩衝用脚部7Bを設けてある。スライド台19は、図3 〜5に示すように、受台7の台状部7Cに上下方向にブレないように規制され、 台状部7Cの長手方向に沿ってスライドするように取付けてある。[0007] FIG. 3 is a partial sectional view seen from the front, and fine adjustment is made to the lower end of the rod 12 mentioned above. The upper half 12A of this rod 12 is threaded. , the threaded portion of this upper half 12A is screwed into the sleeve 24. moving block Since the lock 13 is fixed to the fixing knob 15, the lock 13 is fixed to the fixing knob 15. The rotation pushes the pedestal 7 downward. This causes the 2-axis adjustment table 9 to be lowered downward. The wavefront transmitted through the reference lens 3A and the object to be measured S placed on the mounting surface 9A. Match the wavefront of the reflected light from the surface to be measured. As a result, the standard of the standard lens 3A is Interference fringes caused by the light reflected from the surface and the light reflected from the surface to be measured can be observed. Also, the reception A cushioning leg 7B made of rubber or the like is provided on the lower surface of the table 7. The slide table 19 is shown in Fig. 3. As shown in ~5, it is regulated by the platform part 7C of the pedestal 7 so as not to shake in the vertical direction, It is attached so as to slide along the longitudinal direction of the platform 7C.

【0008】 図6は側面図であり、基台5の四隅の一個所には球面ブッシュ21が設けてあ り、この球面ブッシュ21の個所を支点にして基台5は傾斜具合を調整できるよ うになっている。球面ブッシュ21を設けた個所以外の3個所には傾斜調整用の ネジ22を設け、球面ブッシュ21及び傾斜調整用のネジ22の外周側の四隅に は調整後基台5をスタンド1に固定するための固定用のネジ23を設けてある。 基台5の傾斜具合を調整するには、3本のネジ22を回転させ、スタンド1から の高さを夫々微調整する。このとき、レーザー干渉計を作動させてレーザー光が 立壁6に平行になる位置を探す。このような位置を探したら、ネジ23により基 台5をスタンド1に固定する。ここでは、ネジ22と球面ブッシュ21とが調節 手段を構成する。基台5の傾斜具合の調整は干渉計本体3に設けられ、コリメー ターレンズ等からなるレーザー導光光学系の光軸と立壁6とが平行になるように 調整し、このように調整した後固定ネジ23でスタンド1に基台5を固定する。[0008] FIG. 6 is a side view, in which a spherical bush 21 is provided at one of the four corners of the base 5. The inclination of the base 5 can be adjusted using the spherical bush 21 as a fulcrum. The sea urchin is turning. Three locations other than the location where the spherical bush 21 is provided are for tilt adjustment. Screws 22 are provided at the four outer corners of the spherical bushing 21 and the tilt adjustment screws 22. A fixing screw 23 is provided for fixing the base 5 to the stand 1 after adjustment. To adjust the inclination of the base 5, rotate the three screws 22 and remove it from the stand 1. Finely adjust the height of each. At this time, the laser interferometer is activated to emit laser light. Find a position parallel to the standing wall 6. After finding such a position, tighten the base with screw 23. Fix the table 5 to the stand 1. Here, the screw 22 and the spherical bush 21 are adjusted. constitute means. Adjustment of the inclination of the base 5 is provided in the interferometer body 3, and the collimator so that the optical axis of the laser light guiding optical system consisting of a mirror lens etc. and the vertical wall 6 are parallel to each other. After adjusting in this way, the base 5 is fixed to the stand 1 with the fixing screws 23.

【0009】 2軸調整台(載置台)9の上面(載置面)9Aがレーザー導光光学系と同軸上 にある基準レンズ3Aの光軸と直交するように調整する調整方法は、基準レンズ 3Aを取付ける前に干渉計本体3から平行光束が照射されているので、この光軸 と被測定物調整台のZステージ(移動ブロック13による上下動及びつまみ14 による微調節)による被測定物の移動が平行になるように調整する。その手順と して、最初に干渉計本体3には基準板も基準レンズ3Aも取りついていないよう にする。そして、干渉計本体3から照射されている光が上面9Aに当たっている ことが分かりその光束の周辺部がはっきりわかる程度に部屋を暗くする。干渉計 本体3の光量調整つまみを指で回転させ干渉計本体3から出射されるレーザー光 を最高に明るくする。その後、2軸調整台(載置台)9の上面9Aに直径64mm の円内に十字を記入したパターンを書いた板目紙を乗せる。次いで、Zステージ を粗動させて2軸調整台(載置台)9を最下部に移動させ、レーザー光束のφ6 4の外周円と上記板目紙の円形パターンを合致させる(紙を移動させる)。Zス テージを粗動させ、2軸調整台(載置台)9を最上部に移動させる。このときに レーザー光束の外周と板目紙の円形パターンの位置がずれている場合にはこれら が合致するように基台5の調節手段により調整する。Zステージを最上部及び最 下部に粗動させ両方の位置でもレーザー光束の外周と上記円形パターンが合致す るまで上述の動作を繰り返す。次に基台5をスタンド1に固定する。すなわち、 ネジ22とネジ23とは押しネジと引きネジの関係になって、お互いに力が加わ り基台5とスタンド1をがっちりと固定することとなる。固定用のネジ23が有 効に力を発揮するまで、つまり固定用のネジ23が基台5を引く直前まで軽く回 る範囲はそれぞれの固定用のネジ23を回し続ける。固定用のネジ23を回転す るのに力が掛かる様になったらZステージを最上部に移動し、上記レーザー光束 と円形パターンを合致させ観察しながら固定用のネジ23を1本ずつ交互に少し ずつ締めつける。1本のネジ23だけを一度に強く締めつけると基台5が傾いて しまうので上記光束と円形パターンがずれないことを確認しながら1本のネジ2 3を1回に1/10回転程度締めつけ、順序良く何度も回転させて平均に固定さ れるようにする。このようにして立壁6とレーザー導光光学系の光軸とが平行に なる。[0009] The top surface (mounting surface) 9A of the two-axis adjustment table (mounting table) 9 is coaxial with the laser light guiding optical system. The adjustment method for adjusting the reference lens 3A so that it is perpendicular to the optical axis shown in Before installing 3A, the parallel light beam is irradiated from the interferometer body 3, so this optical axis and the Z stage of the object adjustment table (vertical movement by moving block 13 and knob 14) (fine adjustment) so that the movement of the object to be measured is parallel. The procedure and First, make sure that neither the reference plate nor the reference lens 3A is attached to the interferometer body 3. Make it. The light emitted from the interferometer body 3 hits the top surface 9A. Darken the room to the extent that you can clearly see the periphery of the light beam. interferometer Rotate the light intensity adjustment knob on the main body 3 with your finger to adjust the laser beam emitted from the interferometer main body 3. make it the brightest. After that, on the top surface 9A of the two-axis adjustment table (mounting table) 9, Place a piece of paper with a pattern of crosses drawn inside the circle. Next, Z stage Coarsely move the 2-axis adjustment table (mounting table) 9 to the bottom, and adjust the diameter of the laser beam to φ6. Match the outer circumference of No. 4 with the circular pattern of the board paper (move the paper). Z-s The stage is roughly moved to move the two-axis adjustment table (mounting table) 9 to the top. At this time If the outer circumference of the laser beam and the circular pattern of the paperboard are misaligned, Adjust using the adjusting means of the base 5 so that the values match. Move the Z stage to the top and Coarsely move it to the bottom and make sure that the outer circumference of the laser beam and the circular pattern above match in both positions. Repeat the above operations until the Next, the base 5 is fixed to the stand 1. That is, The screw 22 and the screw 23 have a relationship of a push screw and a pull screw, and force is applied to each other. This means that the base 5 and stand 1 are firmly fixed. There is a screw 23 for fixing. Gently turn the fixing screw 23 until it exerts sufficient force, that is, until the fixing screw 23 is just before pulling the base 5. Continue to turn each fixing screw 23 within the specified range. Rotate the fixing screw 23. When the force starts to apply, move the Z stage to the top and Alternately tighten the fixing screws 23 one by one while observing the circular pattern. Tighten one by one. If you tighten only one screw 23 strongly at a time, the base 5 will tilt. Since it will be stored away, tighten one screw 2 while making sure that the above luminous flux and circular pattern do not deviate. Tighten 3 about 1/10 turn at a time, and rotate it many times in order until it is fixed evenly. make it possible to do so. In this way, the vertical wall 6 and the optical axis of the laser light guide optical system are made parallel to each other. Become.

【0010】 図1に示す載置台4を用いる場合は、被測定物が小口径のレンズ等のように小 さい場合であり、このような小口径のレンズを載置台4に載置し、基準レンズ3 Aの集光点に被測定物の中心を持ってくる。基準レンズ3Aからの反射光と被測 定面からの反射光とによる干渉縞が確認できたらZステージで被測定物を光軸の 方向へ移動させてゆく。小さな干渉縞が画面から逃げないようにXYステージ8 を調整してやり、再び干渉縞が大きく見えはじめたら粗動調整用の固定用つまみ 15をロックする。Z軸微調整用のつまみ14及びXYステージ8の調整つまみ 10で干渉縞を見やすくする。同一種類の被測定物を測定する場合、載置台4の 位置を動かさずに被測定物のみ交換すればだいたい上述した操作ははぶくことが できる。被測定物が基準レンズ3Aに接近している場合はスライド台19を利用 し、被測定物が基準レンズ3Aの内側に入る場合、被測定物と基準レンズ3Aと が接触していずれか一方又は両方が破損することを防止するために、位置決め用 のストッパー16を利用する。0010 When using the mounting table 4 shown in Fig. 1, the object to be measured is small, such as a small-diameter lens. In this case, such a small diameter lens is placed on the mounting table 4, and the reference lens 3 is placed on the mounting table 4. Bring the center of the object to be measured to the focal point of A. Reflected light from reference lens 3A and measured object Once the interference fringes due to the reflected light from the fixed surface are confirmed, move the object to be measured on the Z stage along the optical axis. move in the direction. XY stage 8 to prevent small interference fringes from escaping the screen If the interference fringes start to appear large again, turn the fixing knob for coarse adjustment. Lock 15. Z-axis fine adjustment knob 14 and XY stage 8 adjustment knob 10 to make the interference fringes easier to see. When measuring the same type of object to be measured, The above operations can be easily accomplished by simply replacing the object to be measured without changing its position. can. If the object to be measured is close to the reference lens 3A, use the slide stand 19. However, when the object to be measured is inside the reference lens 3A, the object to be measured and the reference lens 3A are In order to prevent one or both from coming into contact and being damaged, Use the stopper 16.

【0011】 図7はバランサー18の個所を示し、基端部7Aに設けたローラー18Aに薄 い鋼板18Bを巻き付けてあり、受台7の急激な落下を防止し、作業の安全を図 るようになっている。受台7は鋼板18Bで吊り下げられた恰好となる。[0011] FIG. 7 shows the location of the balancer 18, and the roller 18A provided at the base end 7A has a thin A steel plate 18B is wrapped around it to prevent the pedestal 7 from falling suddenly and to ensure work safety. It has become so. The pedestal 7 appears suspended by a steel plate 18B.

【0012】0012

【考案の効果】[Effect of the idea]

以上説明したように、この考案によれば、受台に取付けられた左右にスライド するスライド台にXYステージを取付けたので、被測定物を交換する際に、スラ イド台を移動させることにより被測定物と基準レンズとの接触を防止し、被測定 物を安全に交換することができる。また、スライド台のスライドにより被測定物 を交換すれば、X,Y,Zの各軸方向の粗調整は不要となり、微調整のみ行なえ ばよいので操作性が向上する。 As explained above, according to this invention, the slider attached to the pedestal can slide left and right. Since the XY stage is attached to the slide table for By moving the lens stand, the object to be measured and the reference lens are prevented from coming into contact with each other. Things can be exchanged safely. In addition, the object to be measured can be moved by sliding the slide table. If you replace the This improves operability.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】この考案の好適な実施例を示す斜視図。FIG. 1 is a perspective view showing a preferred embodiment of this invention.

【図2】干渉計本体部分を示す斜視図。FIG. 2 is a perspective view showing the interferometer main body.

【図3】一部断面の正面図。FIG. 3 is a partially sectional front view.

【図4】XYステージから上のものを除いた一部断面の
平面図。
FIG. 4 is a partially sectional plan view of the XY stage excluding the portion above.

【図5】スライド台取付個所の図4のA−A′線断面
図。
5 is a cross-sectional view taken along the line A-A' in FIG. 4 of the slide base attachment location.

【図6】一部断面の側面図。FIG. 6 is a partially sectional side view.

【図7】バランサーの個所を示す断面図。FIG. 7 is a sectional view showing the balancer.

【図8】従来の被測定物調整台を示す斜視図。FIG. 8 is a perspective view showing a conventional object adjustment table.

【符号の説明】[Explanation of symbols]

1 スタンド 2 支柱 3 干渉計本体 4 載置台 5 基台 6 立壁 7 受台 8 XYステージ 9 2軸調整台(載置台) 9A 2軸調整台の上面(載置面) 19 スライド台 1 stand 2 pillars 3 Interferometer body 4 Mounting table 5 Base 6 Standing wall 7 cradle 8 XY stage 9 2-axis adjustment stand (mounting stand) 9A Top surface of 2-axis adjustment table (placement surface) 19 Slide stand

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 少なくともレーザーとレーザー導光光学
系を備えた干渉計本体をスタンドから立上る支柱に取付
け、前記レーザー導光光学系から出射されるレーザー光
束中に被測定物載置用の載置台を設けたレーザー干渉計
の被測定物調整台であって、前記スタンド上に取付けら
れる基台上に前記支柱に沿って立ち上る立壁を設け、前
記立壁から前記レーザー導光光学系の光軸を越えて突出
し前記立壁に沿って上下動可能に受台を設け、前記受台
の上面に左右にスライドするスライド台を設け、前記ス
ライド台上にX軸及びY軸の各方向の調整を図るXYス
テージを取付けたことを特徴とするレーザー干渉計の被
測定物調整台。
1. An interferometer body including at least a laser and a laser light guide optical system is attached to a support that rises from a stand, and a support for placing an object to be measured is placed in the laser beam emitted from the laser light guide optical system. A stand for adjusting an object to be measured for a laser interferometer, which is equipped with a stand, wherein a standing wall rising along the support is provided on the base mounted on the stand, and the optical axis of the laser light guiding optical system is directed from the standing wall. A pedestal is provided that protrudes beyond the wall and is movable up and down along the vertical wall, a slide pedestal that slides left and right is provided on the top surface of the pedestal, and adjustment in each direction of the X-axis and Y-axis is made on the slide pedestal. A laser interferometer measurement object adjustment table that is equipped with a stage.
JP1781591U 1991-03-01 1991-03-01 Adjustment table for laser interferometer Expired - Lifetime JP2546026Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1781591U JP2546026Y2 (en) 1991-03-01 1991-03-01 Adjustment table for laser interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1781591U JP2546026Y2 (en) 1991-03-01 1991-03-01 Adjustment table for laser interferometer

Publications (2)

Publication Number Publication Date
JPH04109313U true JPH04109313U (en) 1992-09-22
JP2546026Y2 JP2546026Y2 (en) 1997-08-27

Family

ID=31904497

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1781591U Expired - Lifetime JP2546026Y2 (en) 1991-03-01 1991-03-01 Adjustment table for laser interferometer

Country Status (1)

Country Link
JP (1) JP2546026Y2 (en)

Also Published As

Publication number Publication date
JP2546026Y2 (en) 1997-08-27

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