JPH0397677U - - Google Patents
Info
- Publication number
- JPH0397677U JPH0397677U JP663790U JP663790U JPH0397677U JP H0397677 U JPH0397677 U JP H0397677U JP 663790 U JP663790 U JP 663790U JP 663790 U JP663790 U JP 663790U JP H0397677 U JPH0397677 U JP H0397677U
- Authority
- JP
- Japan
- Prior art keywords
- electronic
- electronic circuit
- circuit
- probe pin
- testing device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 6
- 239000000523 sample Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP663790U JPH0397677U (de) | 1990-01-27 | 1990-01-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP663790U JPH0397677U (de) | 1990-01-27 | 1990-01-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0397677U true JPH0397677U (de) | 1991-10-08 |
Family
ID=31510309
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP663790U Pending JPH0397677U (de) | 1990-01-27 | 1990-01-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0397677U (de) |
-
1990
- 1990-01-27 JP JP663790U patent/JPH0397677U/ja active Pending