JPH0396043U - - Google Patents

Info

Publication number
JPH0396043U
JPH0396043U JP398090U JP398090U JPH0396043U JP H0396043 U JPH0396043 U JP H0396043U JP 398090 U JP398090 U JP 398090U JP 398090 U JP398090 U JP 398090U JP H0396043 U JPH0396043 U JP H0396043U
Authority
JP
Japan
Prior art keywords
semiconductor device
mechanical pressure
performs
quality
utility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP398090U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP398090U priority Critical patent/JPH0396043U/ja
Publication of JPH0396043U publication Critical patent/JPH0396043U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案の一実施例である半導体装置
の試験装置の断面図、第2図はこの考案の他の実
施例を示す半導体装置の試験装置の断面図である
。 図において、1は評価を行なう対象となる半導
体装置、2は機械的圧力を加える加圧治具、3は
半導体装置を保持する保持治具を示す。なお、図
中、同一符号は同一、または相当部分を示す。
FIG. 1 is a cross-sectional view of a semiconductor device testing apparatus which is one embodiment of this invention, and FIG. 2 is a cross-sectional view of a semiconductor device testing apparatus which is another embodiment of this invention. In the figure, 1 is a semiconductor device to be evaluated, 2 is a pressure jig that applies mechanical pressure, and 3 is a holding jig that holds the semiconductor device. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体装置の品質、信頼性評価テストを行う半
導体装置の試験装置において、半導体装置に機械
的圧力を加えるようにしたことを特徴とする半導
体装置の試験装置。
1. A semiconductor device testing device that performs a quality and reliability evaluation test of a semiconductor device, the device being characterized in that it applies mechanical pressure to the semiconductor device.
JP398090U 1990-01-19 1990-01-19 Pending JPH0396043U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP398090U JPH0396043U (en) 1990-01-19 1990-01-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP398090U JPH0396043U (en) 1990-01-19 1990-01-19

Publications (1)

Publication Number Publication Date
JPH0396043U true JPH0396043U (en) 1991-10-01

Family

ID=31507754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP398090U Pending JPH0396043U (en) 1990-01-19 1990-01-19

Country Status (1)

Country Link
JP (1) JPH0396043U (en)

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