JPH01152257U - - Google Patents

Info

Publication number
JPH01152257U
JPH01152257U JP5020988U JP5020988U JPH01152257U JP H01152257 U JPH01152257 U JP H01152257U JP 5020988 U JP5020988 U JP 5020988U JP 5020988 U JP5020988 U JP 5020988U JP H01152257 U JPH01152257 U JP H01152257U
Authority
JP
Japan
Prior art keywords
holder
inspection device
holds
shoe
test material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5020988U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5020988U priority Critical patent/JPH01152257U/ja
Publication of JPH01152257U publication Critical patent/JPH01152257U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示す図、第2図
は第1図をAから見た断面図、第3図a及びbは
この考案の長孔と変形ピンの詳細図、第4図は従
来の検査装置を示す図、第5図は第4図をBから
見た断面図である。 図において、1は被検材、2は探触子、3はホ
ルダ、4はシユー、7はブラケツト、10は長孔
、11は変形ピンである。なお、各図中同一符号
は同一または相当部分を示す。
Fig. 1 is a diagram showing an embodiment of this invention, Fig. 2 is a sectional view of Fig. 1 seen from A, Fig. 3 a and b are detailed views of the long hole and deformable pin of this invention, Fig. 4 The figure shows a conventional inspection device, and FIG. 5 is a sectional view of FIG. 4 viewed from B. In the figure, 1 is a test material, 2 is a probe, 3 is a holder, 4 is a shoe, 7 is a bracket, 10 is a long hole, and 11 is a deformable pin. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 搬送される被検材を超音波探触子により走査探
傷する検査装置において、上記超音波探触子を保
持するホルダと、上記ホルダに取付けられ上記被
検材と接触するシユーと、上記ホルダに設けられ
た長孔と、上記長穴に挿入された変形ピンと、上
記変形ピンを保持するブラケツトを備えたことを
特徴とする検査装置。
In an inspection device that scans and flaws a transported test material with an ultrasonic probe, a holder that holds the ultrasonic probe, a shoe that is attached to the holder and comes into contact with the test material, and a shoe attached to the holder. An inspection device comprising: an elongated hole; a deformable pin inserted into the elongated hole; and a bracket that holds the deformed pin.
JP5020988U 1988-04-14 1988-04-14 Pending JPH01152257U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5020988U JPH01152257U (en) 1988-04-14 1988-04-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5020988U JPH01152257U (en) 1988-04-14 1988-04-14

Publications (1)

Publication Number Publication Date
JPH01152257U true JPH01152257U (en) 1989-10-20

Family

ID=31276274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5020988U Pending JPH01152257U (en) 1988-04-14 1988-04-14

Country Status (1)

Country Link
JP (1) JPH01152257U (en)

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