JPH0391984U - - Google Patents

Info

Publication number
JPH0391984U
JPH0391984U JP43990U JP43990U JPH0391984U JP H0391984 U JPH0391984 U JP H0391984U JP 43990 U JP43990 U JP 43990U JP 43990 U JP43990 U JP 43990U JP H0391984 U JPH0391984 U JP H0391984U
Authority
JP
Japan
Prior art keywords
switch
terminal
test module
test
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP43990U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP43990U priority Critical patent/JPH0391984U/ja
Publication of JPH0391984U publication Critical patent/JPH0391984U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】
第１図はこの考案の実施例を示す接続図、第２
図乃至第４図はそれぞれ従来の装置を示す接続図
である。

Claims (1)

  1. 【実用新案登録請求の範囲】 試験装置本体に、被試験ＩＣ素子の一つのピン
    と対応して第１、第２、第３端子が設けられ、 その第１端子は第１スイツチを通じて直流試験
    モジユールのセンス線に接続されると共に第２ス
    イツチを通じてデジタル試験モジユールに接続さ
    れ、 上記第２端子は第３スイツチを通じて接地され
    ると共に第４スイツチを通じて上記直流試験モジ
    ユールのフオース線に接続され、 上記第３端子はリレー駆動回路に接続され、 上記センス線と上記フオース線とが第５スイツ
    チを通じて接続されているＩＣ試験装置。
JP43990U 1990-01-08 1990-01-08 Pending JPH0391984U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP43990U JPH0391984U (ja) 1990-01-08 1990-01-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP43990U JPH0391984U (ja) 1990-01-08 1990-01-08

Publications (1)

Publication Number Publication Date
JPH0391984U true JPH0391984U (ja) 1991-09-19

Family

ID=31504387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP43990U Pending JPH0391984U (ja) 1990-01-08 1990-01-08

Country Status (1)

Country Link
JP (1) JPH0391984U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002350508A (ja) * 2001-05-30 2002-12-04 Advantest Corp 半導体デバイス試験装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002350508A (ja) * 2001-05-30 2002-12-04 Advantest Corp 半導体デバイス試験装置
JP4627924B2 (ja) * 2001-05-30 2011-02-09 株式会社アドバンテスト 半導体デバイス試験装置

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