JPH0390081U - - Google Patents
Info
- Publication number
- JPH0390081U JPH0390081U JP15235089U JP15235089U JPH0390081U JP H0390081 U JPH0390081 U JP H0390081U JP 15235089 U JP15235089 U JP 15235089U JP 15235089 U JP15235089 U JP 15235089U JP H0390081 U JPH0390081 U JP H0390081U
- Authority
- JP
- Japan
- Prior art keywords
- probe card
- substrate
- ring
- opening
- probes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 4
- 239000011347 resin Substances 0.000 claims description 2
- 229920005989 resin Polymers 0.000 claims description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989152350U JP2524308Y2 (ja) | 1989-12-27 | 1989-12-27 | プローブカード |
| US07/548,401 US5055778A (en) | 1989-10-02 | 1990-07-05 | Probe card in which contact pressure and relative position of each probe end are correctly maintained |
| US07/735,214 US5134365A (en) | 1989-07-11 | 1991-07-24 | Probe card in which contact pressure and relative position of each probe end are correctly maintained |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989152350U JP2524308Y2 (ja) | 1989-12-27 | 1989-12-27 | プローブカード |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0390081U true JPH0390081U (nl) | 1991-09-13 |
| JP2524308Y2 JP2524308Y2 (ja) | 1997-01-29 |
Family
ID=31698619
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989152350U Expired - Lifetime JP2524308Y2 (ja) | 1989-07-11 | 1989-12-27 | プローブカード |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2524308Y2 (nl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1998010298A1 (fr) * | 1996-09-02 | 1998-03-12 | Seiko Epson Corporation | Dispositif d'inspection d'un panneau d'affichage a cristaux liquides, procede d'inspection d'un panneau d'affichage a cristaux liquides et procede de fabrication d'un panneau d'affichage a cristaux liquides |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59135739A (ja) * | 1983-01-25 | 1984-08-04 | Toshiba Corp | 半導体素子の測定装置 |
-
1989
- 1989-12-27 JP JP1989152350U patent/JP2524308Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59135739A (ja) * | 1983-01-25 | 1984-08-04 | Toshiba Corp | 半導体素子の測定装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1998010298A1 (fr) * | 1996-09-02 | 1998-03-12 | Seiko Epson Corporation | Dispositif d'inspection d'un panneau d'affichage a cristaux liquides, procede d'inspection d'un panneau d'affichage a cristaux liquides et procede de fabrication d'un panneau d'affichage a cristaux liquides |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2524308Y2 (ja) | 1997-01-29 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |