JPH0371099U - - Google Patents
Info
- Publication number
- JPH0371099U JPH0371099U JP13412589U JP13412589U JPH0371099U JP H0371099 U JPH0371099 U JP H0371099U JP 13412589 U JP13412589 U JP 13412589U JP 13412589 U JP13412589 U JP 13412589U JP H0371099 U JPH0371099 U JP H0371099U
- Authority
- JP
- Japan
- Prior art keywords
- slat
- case
- balance weight
- vertical blind
- center
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
Landscapes
- Blinds (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989134125U JPH0810156Y2 (ja) | 1989-11-17 | 1989-11-17 | 縦型ブラインドのバランスウェート |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989134125U JPH0810156Y2 (ja) | 1989-11-17 | 1989-11-17 | 縦型ブラインドのバランスウェート |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0371099U true JPH0371099U (en, 2012) | 1991-07-17 |
| JPH0810156Y2 JPH0810156Y2 (ja) | 1996-03-27 |
Family
ID=31681486
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989134125U Expired - Lifetime JPH0810156Y2 (ja) | 1989-11-17 | 1989-11-17 | 縦型ブラインドのバランスウェート |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0810156Y2 (en, 2012) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002174670A (ja) * | 2000-12-05 | 2002-06-21 | Advantest Corp | 半導体試験装置 |
| JP2002243809A (ja) * | 2001-02-09 | 2002-08-28 | Advantest Corp | アナログ・デジタル混成ｉｃ用テストシステム |
| JP2002243808A (ja) * | 2001-02-09 | 2002-08-28 | Advantest Corp | アナログ・デジタル混成ｉｃ用テストシステム |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57106897U (en, 2012) * | 1980-12-19 | 1982-07-01 | ||
| JPS63119798U (en, 2012) * | 1987-01-28 | 1988-08-03 |
-
1989
- 1989-11-17 JP JP1989134125U patent/JPH0810156Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57106897U (en, 2012) * | 1980-12-19 | 1982-07-01 | ||
| JPS63119798U (en, 2012) * | 1987-01-28 | 1988-08-03 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002174670A (ja) * | 2000-12-05 | 2002-06-21 | Advantest Corp | 半導体試験装置 |
| JP2002243809A (ja) * | 2001-02-09 | 2002-08-28 | Advantest Corp | アナログ・デジタル混成ｉｃ用テストシステム |
| JP2002243808A (ja) * | 2001-02-09 | 2002-08-28 | Advantest Corp | アナログ・デジタル混成ｉｃ用テストシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0810156Y2 (ja) | 1996-03-27 |